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Optimization Challenges in Transistor Sizing Chandu Visweswariah IBM Thomas J. Watson Research Center Yorktown Heights, NY Acknowledgments The entire EinsTuner team at IBM, especially Andy Conn of the Applied Mathematics department at IBM Research
49

Optimization Challenges in Transistor Sizing Chandu Visweswariah IBM Thomas J. Watson Research Center Yorktown Heights, NY Acknowledgments The entire.

Jan 20, 2016

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Page 1: Optimization Challenges in Transistor Sizing Chandu Visweswariah IBM Thomas J. Watson Research Center Yorktown Heights, NY Acknowledgments The entire.

Optimization Challengesin Transistor Sizing

Chandu Visweswariah

IBM Thomas J. Watson Research Center

Yorktown Heights, NY

Acknowledgments

The entire EinsTuner team at IBM, especially Andy Conn of the Applied Mathematics department at IBM Research

Page 2: Optimization Challenges in Transistor Sizing Chandu Visweswariah IBM Thomas J. Watson Research Center Yorktown Heights, NY Acknowledgments The entire.

Two acts focusing on optimization• Act I: what we have done with existing

nonlinear optimization techniques– what is EinsTuner?– how does it work?– what is its impact?

• Act II: what we would love to do and currently cannot– numerical noise– capacity– robustness, scaling, weighting, degeneracy– recursive minimax support– mixed integer continuous problems

Page 3: Optimization Challenges in Transistor Sizing Chandu Visweswariah IBM Thomas J. Watson Research Center Yorktown Heights, NY Acknowledgments The entire.

Act I: What is EinsTuner?• A static, formal, transistor sizing tool geared

towards custom high-performance digital circuits– static: based on static transistor-level timing

analysis, so implicitly takes into account all paths through the logic

– custom: timing based on real time-domain simulation of all possible transitions through each clump of strongly-connected transistors

– formal: guaranteed optimal• “local” according to engineers• “global” according to mathematicians

– transistor-level, therefore inherently flat– see DAC ’99, ICCAD ’99, SIAM J. Opt 9/99

Page 4: Optimization Challenges in Transistor Sizing Chandu Visweswariah IBM Thomas J. Watson Research Center Yorktown Heights, NY Acknowledgments The entire.

Features of EinsTuner• Extensive (sweeping and fine-grained)

grouping, ratio-ing and no-touch commands

• 25K transistor capacity (60K variables)

• Allows delay, area, ratio, input loading, slew and transistor width constraints

• Allows minimization of delay, area or linear combination thereof

• Easy-to-use; full GUI support; good fit into (semi-custom and custom) methodologies

• Timer benefits such as accuracy for custom circuits, pattern-matching, state analysis

Page 5: Optimization Challenges in Transistor Sizing Chandu Visweswariah IBM Thomas J. Watson Research Center Yorktown Heights, NY Acknowledgments The entire.

EinsTuner: formal static optimizer

Embedded time-domain simulator

SPECS

Static transistor-level timerEinsTLT

Nonlinearoptimizer

LANCELOT

Transistor andwire sizes

Function andgradient values

Page 6: Optimization Challenges in Transistor Sizing Chandu Visweswariah IBM Thomas J. Watson Research Center Yorktown Heights, NY Acknowledgments The entire.

Components of EinsTuner

Read netlist; create timing graph (EinsTLT)Formulate pruned optimization problemFeed problem to nonlinear optimizer (LANCELOT)

Snap-to-grid; back-annotate; re-time

Solve optimization problem, call simulatorfor delays/slews and gradients thereof

Obtain converged solution

Fast simulation and incrementalsensitivity computation (SPECS)

12

3

Page 7: Optimization Challenges in Transistor Sizing Chandu Visweswariah IBM Thomas J. Watson Research Center Yorktown Heights, NY Acknowledgments The entire.

]464

,363

[max6

s.t.]

252,

151[max

5s.t.

]686

,585

[max8

s.t.]

676,

575[max

7s.t.

)]8

,7

([maxmin

dATdATATdATdATATdATdATATdATdATAT

ATAT

1AT

2AT

15d

25d

3AT

4AT

36d

46d

57d

68d

58d 67d

5AT

6AT

7AT

8AT

Static optimization formulation

Page 8: Optimization Challenges in Transistor Sizing Chandu Visweswariah IBM Thomas J. Watson Research Center Yorktown Heights, NY Acknowledgments The entire.

1f2f

x0x

z

x

*z

Digression: minimax optimization

)( s.t.)( s.t.

min

])}(),(max{[min

2

1

,

21

xfzxfz

z

xfxfx

zx

Page 9: Optimization Challenges in Transistor Sizing Chandu Visweswariah IBM Thomas J. Watson Research Center Yorktown Heights, NY Acknowledgments The entire.

)],min[max( 87 ATAT

],max[ 6865858 dATdATAT

],max[ 6765757 dATdATAT

],max[ 2521515 dATdATAT

],max[ 4643636 dATdATAT

Remapped problem

8

7

s.t.

s.t.

min

ATz

ATz

z

6868

5858

dATAT

dATAT

6767

5757

dATAT

dATAT

2525

1515

dATAT

dATAT

4646

3636

dATAT

dATAT

1AT

2AT

15d

25d

3AT

4AT

36d

46d

57d

68d

58d 67d

5AT

6AT

7AT

8AT

Page 10: Optimization Challenges in Transistor Sizing Chandu Visweswariah IBM Thomas J. Watson Research Center Yorktown Heights, NY Acknowledgments The entire.

Springs and planks analogy

z7AT

8AT

5AT6AT

1AT 2AT 3AT 4AT15d 25d

36d 46d

57d67d 58d 68d

Page 11: Optimization Challenges in Transistor Sizing Chandu Visweswariah IBM Thomas J. Watson Research Center Yorktown Heights, NY Acknowledgments The entire.

Springs and planks analogy

z7AT

8AT

5AT6AT

1AT 2AT 3AT 4AT15d 25d

36d 46d

57d67d 58d 68d z

7AT8AT

5AT6AT

1AT 2AT 3AT 4AT15d 25d

36d 46d

57d67d 58d 68d z

7AT8AT

5AT6AT

1AT 2AT 3AT 4AT15d 25d

36d 46d

57d67d 58d 68d z

7AT8AT

5AT6AT

1AT 2AT 3AT 4AT15d 25d

36d 46d

57d67d 58d 68d

Page 12: Optimization Challenges in Transistor Sizing Chandu Visweswariah IBM Thomas J. Watson Research Center Yorktown Heights, NY Acknowledgments The entire.

Algorithm demonstration: inv3

Page 13: Optimization Challenges in Transistor Sizing Chandu Visweswariah IBM Thomas J. Watson Research Center Yorktown Heights, NY Acknowledgments The entire.

Algorithm demonstration: 1b ALU

Page 14: Optimization Challenges in Transistor Sizing Chandu Visweswariah IBM Thomas J. Watson Research Center Yorktown Heights, NY Acknowledgments The entire.

),,,(

),,,(

),,,(

),,,(

rinjpn

fij

fj

finjpn

rij

rj

rinjpn

fij

ri

fj

finjpn

rij

fi

rj

slewcoutwwsslew

slewcoutwwsslew

slewcoutwwdATAT

slewcoutwwdATAT

i j

pn ww ,

jcout

Constraint generation

Page 15: Optimization Challenges in Transistor Sizing Chandu Visweswariah IBM Thomas J. Watson Research Center Yorktown Heights, NY Acknowledgments The entire.

Statement of the problem

arc geach timinfor ),( s.t.

arc timingeachfor),( s.t.POsallfor s.t.

min

SWijsjs

SWijdiATjATiRATiATz

z

POs allfor POmax s.t.

nets internal allfor internalmax s.t.

FETs allfor maxmin s.t.gates allfor max)(min s.t.PIs allfor itarget)(ipincap s.t.

targetarea s.t.

SiS

SiS

WiWWWi

WW

Page 16: Optimization Challenges in Transistor Sizing Chandu Visweswariah IBM Thomas J. Watson Research Center Yorktown Heights, NY Acknowledgments The entire.

LANCELOT• State-of-the-art general-purpose

nonlinear optimizer

• Trust-region method

• Exploitation of group partial separability; augmented Lagrangian merit function

• Handles general linear/nonlinear equalities/inequalities and objective functions

• Simple bounds handled by projections

• Several choices of preconditioners, exact/inexact BQP solution, etc.

Page 17: Optimization Challenges in Transistor Sizing Chandu Visweswariah IBM Thomas J. Watson Research Center Yorktown Heights, NY Acknowledgments The entire.

LANCELOT algorithms

Simple bounds

a

b

Trust-region

kx

u

f

wv

2x

1x

bx

ax

xxf

2

1

21

0

0

),(min

Page 18: Optimization Challenges in Transistor Sizing Chandu Visweswariah IBM Thomas J. Watson Research Center Yorktown Heights, NY Acknowledgments The entire.

Demonstration of degeneracy

z

Page 19: Optimization Challenges in Transistor Sizing Chandu Visweswariah IBM Thomas J. Watson Research Center Yorktown Heights, NY Acknowledgments The entire.

Demonstration of degeneracy

z

Deg

ener

acy!

Page 20: Optimization Challenges in Transistor Sizing Chandu Visweswariah IBM Thomas J. Watson Research Center Yorktown Heights, NY Acknowledgments The entire.

Why do we need pruning?

Page 21: Optimization Challenges in Transistor Sizing Chandu Visweswariah IBM Thomas J. Watson Research Center Yorktown Heights, NY Acknowledgments The entire.

Pruning: an example

frf

rfr

frf

rfr

frf

rfr

f

r

dATATdATATdATATdATATdATATdATAT

ATzATzz

1212

1212

2323

2323

3434

3434

4

4

s.t. s.t. s.t. s.t. s.t. s.t.

s.t. s.t.min

rfrf

frfr

dddATzdddATz

z

3423121

3423121

s.t. s.t.

min

1 2 3 4

Page 22: Optimization Challenges in Transistor Sizing Chandu Visweswariah IBM Thomas J. Watson Research Center Yorktown Heights, NY Acknowledgments The entire.

Block-based vs. path-based timing

463436

462426

461416

453435

452425

451415

ddATATddATATddATATddATATddATATddATAT

Blo

ck-b

ased P

ath-based

12

3

4

5

6

34342424

1414

4646

4545

dATATdATATdATAT

dATAT

dATAT

Page 23: Optimization Challenges in Transistor Sizing Chandu Visweswariah IBM Thomas J. Watson Research Center Yorktown Heights, NY Acknowledgments The entire.

Detailed pruning example

123

456

7

8

9

10

11

12

13

14

15

16

Page 24: Optimization Challenges in Transistor Sizing Chandu Visweswariah IBM Thomas J. Watson Research Center Yorktown Heights, NY Acknowledgments The entire.

Detailed pruning example

1

2

3

7 9 11 14

4

5

6

8 10 13 16

Sink12 15Source

Edges = 26Nodes = 16 (+2)

Page 25: Optimization Challenges in Transistor Sizing Chandu Visweswariah IBM Thomas J. Watson Research Center Yorktown Heights, NY Acknowledgments The entire.

Detailed pruning example

7 9 11 141

2

345

6 8 10 13 16

Sink12 15Source

Edges = 26 20Nodes = 16 10

Page 26: Optimization Challenges in Transistor Sizing Chandu Visweswariah IBM Thomas J. Watson Research Center Yorktown Heights, NY Acknowledgments The entire.

Detailed pruning example

1

2

3

7 9 11

45

6 8 10 13

Sink12Source

14

16

15

14

Edges = 20 17Nodes = 10 7

Page 27: Optimization Challenges in Transistor Sizing Chandu Visweswariah IBM Thomas J. Watson Research Center Yorktown Heights, NY Acknowledgments The entire.

Detailed pruning example

9 11 14

45

6 8 10 1316

Sink12

15Source

14

1,72,7

3,7

Edges = 17 16Nodes = 7 6

Page 28: Optimization Challenges in Transistor Sizing Chandu Visweswariah IBM Thomas J. Watson Research Center Yorktown Heights, NY Acknowledgments The entire.

Detailed pruning example

9 11,14

45

6 8 10 1316

Sink12

15Source

14

1,72,7

3,7

Edges = 16 15Nodes = 6 5

Page 29: Optimization Challenges in Transistor Sizing Chandu Visweswariah IBM Thomas J. Watson Research Center Yorktown Heights, NY Acknowledgments The entire.

Detailed pruning example

9 11,14

45

6 8 1013,16

Sink12

15Source

14

1,72,7

3,7

Edges = 15 14Nodes = 5 4

Page 30: Optimization Challenges in Transistor Sizing Chandu Visweswariah IBM Thomas J. Watson Research Center Yorktown Heights, NY Acknowledgments The entire.

Detailed pruning example

9 11,14

45

6 8

10

10,13,16

Sink12

15Source

14

1,72,7

3,7

Edges = 14 13Nodes = 4 3

Page 31: Optimization Challenges in Transistor Sizing Chandu Visweswariah IBM Thomas J. Watson Research Center Yorktown Heights, NY Acknowledgments The entire.

Detailed pruning example

9 11,14

45

6 810,13,16

SinkSource

10,12,14

12,15

10,12,15

12,141,7

2,7

3,7

Edges = 13 13Nodes = 3 2

Page 32: Optimization Challenges in Transistor Sizing Chandu Visweswariah IBM Thomas J. Watson Research Center Yorktown Heights, NY Acknowledgments The entire.

Pruning vs. no pruning

Page 33: Optimization Challenges in Transistor Sizing Chandu Visweswariah IBM Thomas J. Watson Research Center Yorktown Heights, NY Acknowledgments The entire.

No time to mention...• Simultaneous switching

• Tuning of transmission-gate MUXes

• Adjoint sensitivity computation

• The role of pattern matching

• Strength calculations/symmetrized stacks

• State analysis

• Detection of impossible problems

• Latches

• Uncertainty-aware tuning

Page 34: Optimization Challenges in Transistor Sizing Chandu Visweswariah IBM Thomas J. Watson Research Center Yorktown Heights, NY Acknowledgments The entire.

EinsTuner impact• Better circuits

– 15%+ on previously hand-tuned circuits!

• Improved productivity in conjunction with semi-custom design flow (see Northrop et al, DAC ’01)

• Better understanding of tradeoffs– lifts designers’ thinking to a higher level

• Currently being applied to third generation of z-series (S/390) and PowerPC microprocessors to benefit from EinsTuner

Page 35: Optimization Challenges in Transistor Sizing Chandu Visweswariah IBM Thomas J. Watson Research Center Yorktown Heights, NY Acknowledgments The entire.

What we could do with a robust, fast,high-capacity, noise-immune,

degeneracy-immune, easy-to-use,non-finicky nonlinear optimizer

Act II: If only...

What we areable to do

Rich source ofresearch problems

Page 36: Optimization Challenges in Transistor Sizing Chandu Visweswariah IBM Thomas J. Watson Research Center Yorktown Heights, NY Acknowledgments The entire.

Open research problems

Voltage

Time

• Immunity to numerical noise

Page 37: Optimization Challenges in Transistor Sizing Chandu Visweswariah IBM Thomas J. Watson Research Center Yorktown Heights, NY Acknowledgments The entire.

Numerical noise• Need a formal basis for optimization in the

presence of inevitable numerical noise

• Formal methods for measuring noise level

• Tie all tolerances to a multiple of noise level– tolerances for bounds– tolerances for updating multipliers, etc.– stopping criteria

• Currently our optimization is a race against noise and the conclusion is not pleasing!

• All optimization decisions noise-based

Page 38: Optimization Challenges in Transistor Sizing Chandu Visweswariah IBM Thomas J. Watson Research Center Yorktown Heights, NY Acknowledgments The entire.

Numerical noise• Inject various types of

noise (correlated and uncorrelated) with different amplitude into function and gradient evaluation of analytic optimization problems

• Easy experimentation thus possible to test theories of noise-immune optimization

Page 39: Optimization Challenges in Transistor Sizing Chandu Visweswariah IBM Thomas J. Watson Research Center Yorktown Heights, NY Acknowledgments The entire.

Capacity• Today, our biggest problem has about

30,000 transistors, 70,000 variables and 70,000 constraints

• Runs for as long as a week!

• We go to great lengths to reduce problem size– in the tuner code– in the pre-processor– in our methodology

Page 40: Optimization Challenges in Transistor Sizing Chandu Visweswariah IBM Thomas J. Watson Research Center Yorktown Heights, NY Acknowledgments The entire.

What higher capacity would permit• Tuning of larger macros

• Early mode considerations

• Manufacturability– replicate constraints and variables at each

process corner– rich possibilities in choice of objective function

• Explicit (circuit) noise constraints

• Benefits of explicit grouping constraints in post-optimality analysis

Page 41: Optimization Challenges in Transistor Sizing Chandu Visweswariah IBM Thomas J. Watson Research Center Yorktown Heights, NY Acknowledgments The entire.

Digression: noise constraints

• Combine Harmony and EinsTuner– essential for dynamic circuits (see TCAD 6/00)– replace rules-of-thumb by actual noise

constraints for static circuits

0}),({ dtNMtxvet

stL

v

t

NML

t1 t2

],[inallfor),( 21 tttNMtxv L

area = 0

ts te

Page 42: Optimization Challenges in Transistor Sizing Chandu Visweswariah IBM Thomas J. Watson Research Center Yorktown Heights, NY Acknowledgments The entire.

Robustness• Scaling

– requires unit change in all variables to have roughly same order of magnitude of impact

– need non-uniform trust-region; would subsume 2-step updating [Conn et al, SIAM J. Opt. 9/99]

– very difficult in general

• Weighting– essential in any large-scale optimizer– need problem-size-dependent weights

• Sensitivity to choices should be minimized– finicky behavior not helpful in engineering

application

Page 43: Optimization Challenges in Transistor Sizing Chandu Visweswariah IBM Thomas J. Watson Research Center Yorktown Heights, NY Acknowledgments The entire.

Ease of use• Nonlinear optimizers should stop assuming

they are the “master” program

• There is no standard API for nonlinear optimization packages

• Aspects such as error/message handling and memory management are important; FORTRAN does not help

• Not easy to help the optimizer with domain-specific knowledge– e.g., availability of information about Lagrange

multipliers in recursive minimax problems

Page 44: Optimization Challenges in Transistor Sizing Chandu Visweswariah IBM Thomas J. Watson Research Center Yorktown Heights, NY Acknowledgments The entire.

Mixed integer/continuous problems• Assignment of low threshold voltage

devices

• Swapping pin order in multi-input gates (combinatorial problem)

• Working from a discrete gate library

• Discrete choice of taper ratios

• In general, the type of re-structuring that a logic synthesis program may consider

Page 45: Optimization Challenges in Transistor Sizing Chandu Visweswariah IBM Thomas J. Watson Research Center Yorktown Heights, NY Acknowledgments The entire.

Recursive minimax support

• Need a way to force “timing correctness”– arrival times and slews at lowest feasible value– one of them tight at every stage– product of slacks = 0?

.

.

.

,,2,1),(T s.t.

,,2,1),( s.t.,,2,1),( s.t.

min

KkxkjdkATjA

JjxjidjATiATIixizdiATz

z

Page 46: Optimization Challenges in Transistor Sizing Chandu Visweswariah IBM Thomas J. Watson Research Center Yorktown Heights, NY Acknowledgments The entire.

Degeneracy and redundancy• Nonlinear optimizers easy to mislead

• Most engineering problems have plenty of inherent degeneracy and redundancy

• Can optimizers be made less sensitive to degeneracy?

• Example:

is degenerate because

0(x) s.t.)(min

cxf

0(x) s.t. c

])[()( 21 xcxf xx

Page 47: Optimization Challenges in Transistor Sizing Chandu Visweswariah IBM Thomas J. Watson Research Center Yorktown Heights, NY Acknowledgments The entire.

Practical considerations• Detection of impossible problems

– bound problems– obviously impossible constraints– not-so-obviously impossible constraints that need a

little function evaluation to detect

• Post-optimality analysis– final values of Lagrange multipliers can be used to

give the designer guidance on obtaining further improvement

– may need to re-solve for multipliers at end– information needs to be collected and presented to

designer in nice form– formulation of problem may change to take

advantage of this analysis

Page 48: Optimization Challenges in Transistor Sizing Chandu Visweswariah IBM Thomas J. Watson Research Center Yorktown Heights, NY Acknowledgments The entire.

Conclusion (Act I)• Can robustly carry out static circuit tuning

• Consistent and high-quality results

• Improvement in designers’ productivity

• Moves designers’ thinking to a higher level

• Presently impacting third generation ofz-series (S/390) and PowerPC microprocessors

Page 49: Optimization Challenges in Transistor Sizing Chandu Visweswariah IBM Thomas J. Watson Research Center Yorktown Heights, NY Acknowledgments The entire.

Conclusion (Act II)• Open problems in nonlinear optimization

whose solution will have a real impact– numerical noise– capacity– robustness, scaling, weighting– ease of use, common API– discrete variables– support for recursive minimax problems– degeneracy– post-optimality analysis– detection of impossible problems