Om Omni ni Sc Scan SX \ an SX \ MX MX2 Tr 2 Trai ai ni ni ng Pr ng Pr og ogram ram Phased Array Probes Phased Array Probes V4.1B2T9 V4.1B2T9 Chris Magruder Chris Magruder
OmOmniniScScan SX \an SX \ MXMX2 Tr2 Traiainining Prng ProgogramramPhased Array ProbesPhased Array Probes
V4.1B2T9V4.1B2T9
Chris MagruderChris Magruder
OmnOmniSciScan SX \an SX \ MX2 TrMX2 Trainaining –ing – PhaPhased Arsed Array Pray Proberobes Oves Overvirviewew
Material in this section of the training program is a summary of phased array Material in this section of the training program is a summary of phased array probesprobes
typically used in OmniScan SX\MX2 applications. The information is taken primarilytypically used in OmniScan SX\MX2 applications. The information is taken primarilyfrom of the Olympus probe catalog and is intended to provide an overview of thefrom of the Olympus probe catalog and is intended to provide an overview of thevarious probe features tvarious probe features that optimize different applications.hat optimize different applications.
OmnOmniSciScan SX \an SX \ MX2 TrMX2 Trainaining –ing – PhaPhased Arsed Array Pray Proberobes Oves Overvirviewew
Material in this section of the training program is a summary of phased array Material in this section of the training program is a summary of phased array probesprobes
typically used in OmniScan SX\MX2 applications. The information is taken primarilytypically used in OmniScan SX\MX2 applications. The information is taken primarilyfrom of the Olympus probe catalog and is intended to provide an overview of thefrom of the Olympus probe catalog and is intended to provide an overview of thevarious probe features tvarious probe features that optimize different applications.hat optimize different applications.
OmnOmniSciScan SX \an SX \ MX2 TraMX2 Trainiining –ng – PhaPhased Arrsed Array Proay Probes Obes Oververvieview conw cont.t.
Phased array probes come in a variety of shapes and sizes for different applications.Phased array probes come in a variety of shapes and sizes for different applications.
The most common types are listed below.The most common types are listed below.
Typical array probes from Olympus have a frequency range between 1-13 MHz andTypical array probes from Olympus have a frequency range between 1-13 MHz andhave between 8-256 elements.have between 8-256 elements.
The number of total elements of the probe is The number of total elements of the probe is limited by the second number in thelimited by the second number in theinstrument configuration. (32:128)instrument configuration. (32:128)
The maximum number of elements of a probe used with an OmniScan MX2 is 128The maximum number of elements of a probe used with an OmniScan MX2 is 128and maximum for an OmniScan SX is currently 64.and maximum for an OmniScan SX is currently 64.
There are 4 primary 1D probe types for use with OmniScan SX\MX2 applications:There are 4 primary 1D probe types for use with OmniScan SX\MX2 applications:
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OmnOmniSciScan San SX \X \ MX2 TMX2 Trainraining ing –– 1D Li1D Lineanear Arrr Array Pay Proberobess
1D Linear array probes are the most widely used for industrial inspection and the1D Linear array probes are the most widely used for industrial inspection and the
only type that is supported directly in the OmniScan SX\MX2 software (Wizards).only type that is supported directly in the OmniScan SX\MX2 software (Wizards).
Phased array probes other than 1D linear must use focal laws generated from anPhased array probes other than 1D linear must use focal laws generated from anexternal calculator for import into MX2.external calculator for import into MX2.
OmniScan SX \ MX2 Training – 1D Linear Array Probes cont.
1D linear array probes are defined by the following parameters:
– Size or “Pitch” of the elements. (.25-2mm)
– Number of elements. (8, 16, 32, 64, 128, 256)
– Frequency. (1-17 MHz)
– Radius focused or flat.
– Reference point. (Only required for use without wedge and does not affect PA calculator)
OmniScan SX \ MX2 Training – 1D Linear Array Probes cont.
The dimensional parameters of a 1D linear phased array probe are defined as
follows:
A = Aperture. Total length of all elements in active plane. (Pitch X element count)
H = Element height in the passive plane. Also called element elevation.
P = Pitch. Center to center distance between two adjacent elements.
E = Size. The width of an individual element.
G = Gap. The spacing between two adjacent elements.
OmniScan SX \ MX2 Training – 1D Linear Array Probes - Aperture
The OmniScan SX\MX2 probe database includes the pitch and total elements to
prevent configurations that exceed the capacity of the instrument.
The number of elements available for 1 focal law and the total number of elementsavailable on the probe are directly related to the instrument configuration. (16:16,16:64, 32:128, etc.) This is covered in a later section.
A = Aperture. Total length of all elements in active plane. (Pitch X element count)
H = Element height in the passive plane. Also called element elevation.
P = Pitch. Center to center distance between two adjacent elements.
E = Size. The width of an individual element.
G = Gap. The spacing between two adjacent elements.
OmniScan SX \ MX2 Training – 1D Linear Array Probes – Element Pitch
The pitch of the probe is directly related to the maximum size (Aperture) of the beam
based on the available pulsers of the acquisition module. (16:64, 32:32, etc.)
Below are two low frequency deep penetration probes that differ in both pitch andtotal number of elements. (A4 and A5)
Only a 32:XXX acquisition module can utilize all 32 elements of the A5 probe for asector scan. More elements of a smaller size increase beam steering limits, energy,and focusing. (32X .75mm = 24mm aperture)
A 16:XXX acquisition module can create a larger aperture using the A4 probebecause the pitch is larger. Larger element pitch reduces beam steering. Fewer
elements reduces focus. (16X 2mm = 32mm)
A4 A5
OmniScan SX \ MX2 Training – 1D Linear Array Probes – Pitch cont.
Most probe\wedge combinations for angle
beam inspection are designed for a steeringrange of approximately 30-75 degrees.
As the size of the element pitch is reduced,beam steering is improved.
Defining the limits of any probe\wedgecombination with respect to beam steeringis dependent on many factors including
sound path required for the application, sizeof reflector, and what is an acceptable A-scan signal to noise ratio for any onecustomer.
For this reason, the OmniScan SX\MX2software does not attempt to limit or predictacceptable steering limits in the software.