of Acquisition NASA Goddard · Source of Acquisition NASA Goddard Space Flight Center Stephen Meyer, Stephen Buchner,, Harvey Moseley, Knute Ray, Jim Tuttle, Ed Quinn, Ernie Buchanan,

Source of Acquisition NASA Goddard Space Flight Center

Stephen Meyer, Stephen Buchner,, Harvey Moseley, Knute Ray, Jim Tuttle, Ed Quinn, Ernie Buchanan,

Dave Bloom, Tom Hait, Mike Pearce, David A. Rapchun

To be presented by Stephen Meyer and Stephen Buchner at Radiation and Its Effects on Components and Systems (RADECS) 2006, Athens Greece, September 27-29,2006

1

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To be presented by Stephen Meyer and Stephen Buchner at Radiation and Its Effects on Components and Systems (RADECS) 2006, Athens Greece, September 27-29.2006

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To be presented by Stephen Meyer and Stephen Buchner at Radiation and its Effects on Components and Systems (RADECS) 2006, Athens Greece, September 27-29,2006. 1

https://ntrs.nasa.gov/search.jsp?R=20070022224 2020-02-08T15:26:33+00:00Z

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To be presented by Stephen Meyer and Stephen Buchner at Radiation and Its Effects on Components and Systems (RADECS) 21333 Athens Greece. September 27-29, 2006

3

Telescope Focus

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I To be presented by Stephen Meyer and Stephen Buchner at Radiation and Its Effects on Components and Systems (RADECS) 2006, Athens Greece, September 2729,2006

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To be presented by Stephen Meyer and Stephen Buchner at Radiation and Its Effects on Components and Systems (RADECS) 2006, Athens Greece, September 27-29,2006. 2

To be presented by Stephen Meyer and Stephen Buchner at Radiation and Its Effects on 5 Components and Systems (RADECS) 2006, Athens Greece, September 27-29,2006


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To be presented by Stephen Meyerand Stephen Buchner at Radiation and Its Effects on Components and Systems (RADECS) 2006, Athens Greece, September 27-29,2006

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0 TID Effects (1 pm process) in gate and field oxides. - Electrons exit oxide - Holes are trapped at generation site


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0 Above approximately 3x4 O6 Voltskm, the holes and protons are mobile.

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TIME AFTER PULSE (8)


9

Both TID and SEE at the same time

Devices at 30 K during irradiation

Heavy ion needed for Single Event Dielectric Breakdown (SEDB) test


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Proton (63 MeV) Fluence (cm") To be presented by Stephen Meyer and Stephen Buchner at Radiation and Its Effects on components and Systems (RADECS) 2006, Athens Greece, September 27-29,2006

11

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v + c L

3 (I) 0) m Y m (I) -I

To be presented by Stephen Meyer and Stephen Buchner at Radiation and Its Effects on Components and Systems (RAOECS) 2006, Athens Greece, September 27-29,2006 I

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To be presented by Stephen Meyer and Stephen Buchner at Raoiation and Its Effects on Components and Systems (RADECS) 2006, Athens Greece, September 27-29.2006

13

0 Features - 1 .O pm, Single Poly/Double Metal, HV CMOS - Closed transistors via ion implantation to suppress

leakage currents in “bird’s beak region of NMOSFETs

- Gate oxide thickness reduced by 50% 1100 A for HV transistor (SEGR)

e 200 A for LV transistor

0 Added Functions - Mask to isolate faulty outputs - Comparator to measure Vout


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To be presented by Stephen Meyer and Stephen Buchner at Kaaiatlon and Its tttects on Components and Systems (RADECS) 2006, Athens Greece, September 27-29,2006 I 16

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m Performed at 30 K in a dewar

0 Co60 (gamma ray source)

Dose rate was -7 krad(Si)/hr

- Eight devices

- Up to 200 krad(Si)

To be presented by Stephen Meyer and Stephen Buchner at Radiation and Its Effects on Components and Systems (RADECS) 2006, Athens Greece, September 27-29.2006

17

Total Current Through Eight Devices

t t t t Tested While Irradiated with Gamma Rays

To be presented by Stephen Meyer and Stephen Buchner at Radiation and Its Effects on Components and Systems (RADECS) 2006, Athens Greece. September 27-29,2006

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Total Current Through Eight Devices I

t t t t I Tested While Irradiated with Gamma Rays I

1 To be presented by Stephen Meyer and Stephen Buchner at Radiation and Its Effects on Components and Systems (RADECS) 2006, Athens Greece, September 27-29,2006

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Channel Uniformity 200 KRad

10

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Channel Nurnber

To be presented by Stephen Meyer and Stephen Buchner at Radlatlon and Its Effects on Components and Systems (RADECS) 2006, Athens Greece, September 27-29.2006

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2 .c P) .- I c =I 9. c a 0

0 50 100 150 200

Total Dose [krad(Si)] To be presented by Stephen Meyer and Stephen Buchner at Radiation and Its Effects on Components and Systems (RADECS) 2006, Athens Greece. September 27-29,2006

40 V

40 V

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To be presented by Stephen Meyer and Stephen Buchner at Radiation arid Its Effects on 22 Components and Systems (RADECS) 2006, Athens Greece, September 27-29,2006

To be presented by Stephen Meyer and Stephen Buchner at Radiation and Its Effects on Components and Systems (RADECS) 2006, Athens Greece, September 27-29,2006.

To be presented by Stephen Meyer and Stephen Buchner at Radiation and Its Effects on Components and Systems (RADECS) 2006, Athens Greece, September 27-29,2006 I 23

I To be presented by Stephen Meyer and Stephen Buchner at Radiation and Its Effects on Components and Systems (RADECS) 2006, Athens Greece, September 27-29,2006

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* The original HV583 level shifter - a COTS part -was not suitable for JWST because the supply currents exceeded specs after 20 krad( Si) .The HV584 - functionally similar to the HV583 -was designed using RHBD approach that reduced the leakage currents to within acceptable levels and had only a small effect on the level-shifted output voltage.


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of Acquisition NASA Goddard · Source of Acquisition NASA Goddard Space Flight Center Stephen Meyer, Stephen Buchner,, Harvey Moseley, Knute Ray, Jim Tuttle, Ed Quinn, Ernie Buchanan,

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