for scanning probe microscopes (AFM, MFM, CS-AFM, STM, SNOM, etc.) Surface imaging, analysis & metrology software SPM MountainsMap® Real time 3D multi-channel imaging with overlays Correction of measurement anomalies and artifacts Intelligent filters for achieving highest image quality State of the art analysis of nanosurface geometry and roughness Optional modules for advanced applications including force curve analysis Smart user interface guides you from idea to action with minimum effort Easy integration into lab environments with powerful automat ion features
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