Mixed-Signal Option for the Teradyne Integra J750 Test System May08-12 Emily Evers Vincent Tai.

Mixed-Signal Option for the Teradyne Integra J750 Test System

May08-12

Emily Evers

Vincent Tai

Problem Statement

The Teradyne system has been updated to allow for analog circuits to be tested, but there are no working test files for ADC, DAC and Op-Amps.

Concept Sketch and System Block Diagram

Hardware

IG-XL Software

Devices

Documentation

Hardware

Software

System Description

Devices Analog-to-Digital (ADC) Digital-to-Analog (DAC) Op-Amp

Hardware Device Interface Board

(DIB) Connects daughter

board to tester via pogo pins

Daughter Board Connects device to DIB

IG-XL Software Test Plan

Pin and Channel Map AC and DC Specs Timing

Pattern Documentation

Updated Cookbook Commented IG-XL files

4

User Interface and Operating Environment

User Interface IG-XL Software Cookbook DIB

Operating Environment The room environment

needs to be kept at a consistent temperature of 25°C ± 3°

Electrostatic discharge wrist bands must be worn when using the tester

Access code

Requirements

Functional Cookbook be written for

the new users Testing procedures

covers the devices: Analog-to-Digital (ADC) Digital-to-Analog (DAC) Op-Amp

Nonfunctional Documentation in

English Test program for devices

and similar ones Cookbook for specified

devices Easy to trouble shooting

Market Survey

Teradyne website Previous team’s website Teradyne lab manuals

Work Breakdown Structure Review Status

Previous work Teradyne Training Material

IC Interface Daughter Board DIB

Test Plan Development Create IG-XL code for

testing devices Debug previous code Add current limits New test plans Execute testing

Documentation Create Mixed-Signal Option

Cookbook Create maps for daughter

board, DIB and socket converters

Reporting

Project Schedule

Resource Requirements

Resource Team Faculty Advisor: Dr. Weber Faculty Advisor: Dr. Smith

Team effortReview Status

IC Interface DAC ADC Op-Amp Documentation Reporting Total hours

Emily Evers 30.75 17 7 29 5 15 31.5 135.25

Vincent Tai 22 18.5 10 20 15 10 15 110.5

Total 52.75 35.5 17 49 20 25 46.5 245.75

10

Resource Requirements

Financial requirementsItem Cost

Materials

Poster $35.00

Devices $130.00

Daughterboard $200.00

Subtotal $365.00

Labor($10.00/hr)

Emily Evers $1352.5

Vincent Tai $1105

Subtotal $3562.5

Total $3927.5

11

Risks

Risk: Problems learning program Limited team members

Risk Management: Read Teradyne manuals and previous groups

documentation Time management

Design MethodInputs Process Outputs

Parts

ADC DAC Op-Amp

AD7892AD7470

AD5440AD5447

AD823

Hardware

Software

Cookbook

ADC & DAC

INL & DNL

Results

Input/Output Signals

Calculations

Op-Amp

BandwidthOffset Voltages

Intermodulation TestsIG-XL Program J750 Tester

Interfaces

Computer

DIBDaughterboard

Socket converter

Input and Output Specification

Input DAC

LTC1450 Op-Amp

AD823 ADC

AD7470

Output Input signals Output signals Calculations

ADC INL and DNL

DAC INL and DNL

Op-Amp Offset Voltage Bandwidth Intermodulation

Distortion

Hardware, Software, and User Interface Specification

Hardware Daughterboard DIB Socket converter

User Interface Updated Cookbook IG-XL test files

Software Pattern Tool IG-XL

Pin and Channel Maps AC, DC, and Global

Specs Time sets and Pin

Levels Test Procedures

Test Specification

Component Test Test individual IG-XL source and capture

System Test Test IG-XL test file and pattern

17

Detailed Design

DAC Schematic

18

Detailed Design

Op-Amp Schematic

19

Detailed Design

ADC Schematic

20

Build – Pin Map

Define pins on IG-XL

21

Build – Channel Map

Define connections from daughterboard to tester DAC

22

Build – Channel Map

Op-Amp

23

Build – Channel Map

ADC

24

Build – Board Wiring

25

Build – AC Specs

Specify AC variables

26

Build – DC Specs

Specify DC variables

27

Build – Pin Levels

User specify voltage level for high/low logic level.

Build – Time Sets Create timing basis for pattern Allow for testing on digital pins

28

Build – Test Procedures Set up user defined tests

29

Build – Test Instances Set up IG-XL template tests Input data for user defined tests

30

Build – Pattern Uses time sets from IG-XL file User defined inputs Can be used to start analog and digital source and capture

signals

31

Build – Pattern

Several sheets are used in the pattern file Pin Lists Imports (time sets) Instruments

32

Test

System testing was done using an oscilloscope

33

Test

Test

Teradyne System Testing Functional Test Continuity Test

35

Test

Functional and Continuity Outputs

36

37

Earned Value Analysis

Budgeted Cost of Work Scheduled: $4365 Actual Cost of Work Performed: $3650 Budgeted Cost of Work Performed: $3895

Cost Variance: $3530 Schedule Variance: -$470 Cost Performance Index: 1.067 Schedule Performance Index: 89.23%

38

Lessons Learned

Team Work The value of hands-on experience Verify Input Signals:

Use oscilloscope and multimeter.

Conclusions

Accomplishments Updated CprE 210 D-flip flop test Created an interface mapping of the current

boards ADC

Wired daughter board Created IG-XL test file Ran tests

40

Conclusion

Accomplishments DAC

Wired daughterboard Created IG-XL test file

Op-Amp Wired daughterboard Created IG-XL test file

Updated Cookbook

Conclusions

Future Work Run tests on DAC and Op-amp

Fix if needed Finish ADC test file