Stanford University 11.12.2013 Methodologies to Study the Scalability and Reliability Physics of Phase-Change Memory Rakesh Jeyasingh 1 , Scott Fong 1 , Chiyui Ahn 1 , SangBum Kim 1 , Jiale Liang 1 , Marissa Caldwell 1 Zijian Li 2 , Jaeho Lee 2 , Elah Bozorg-Grayeli 2 , Mehdi Asheghi 2 , Kenneth E. Goodson 2 , Delia Milliron 3 and H. –S. Philip Wong 1 1 Department of Electrical Engineering and 2 Department of Mechanical Engineering, Stanford University, Stanford, CA 94305 3 Molecular Foundry, Lawrence Berkeley National Labs
38
Embed
Methodologies to Study the Scalability and Reliability ......Stanford University 11.12.2013 Methodologies to Study the Scalability and Reliability Physics of Phase-Change Memory Rakesh
This document is posted to help you gain knowledge. Please leave a comment to let me know what you think about it! Share it to your friends and learn new things together.
Transcript
Stanford University
11.12.2013
Methodologies to Study the Scalability and Reliability Physics of Phase-Change Memory Rakesh Jeyasingh1, Scott Fong1, Chiyui Ahn1, SangBum Kim1, Jiale Liang1, Marissa Caldwell1 Zijian Li2, Jaeho Lee2, Elah Bozorg-Grayeli2, Mehdi Asheghi2, Kenneth E. Goodson2, Delia Milliron3 and H. –S. Philip Wong1 1Department of Electrical Engineering and 2Department of Mechanical Engineering, Stanford University, Stanford, CA 94305 3Molecular Foundry, Lawrence Berkeley National Labs
Stanford University
Department of Electrical Engineering Rakesh Jeyasingh 2
Outline
§ Phase Change Memory (PCM) Basics
§ Phase Change Material Scaling using GeTe Nanoparticles
§ 1D Thickness Scaling Studies using Additional Top Electrode (ATE) Devices
§ Programming Current (Electrode) Scaling using CNTs
§ Micro Thermal Stage (MTS) - An On-Chip Heater and Thermometer to Study PCM Reliability Physics
§ Conclusion
Stanford University
Department of Electrical Engineering Rakesh Jeyasingh 3
Outline
§ Phase Change Memory (PCM) Basics
§ Phase Change Material Scaling using GeTe Nanoparticles
§ 1D Thickness Scaling Studies using Additional Top Electrode (ATE) Devices
§ Programming Current (Electrode) Scaling using CNTs
§ Micro Thermal Stage (MTS) - An On-Chip Heater and Thermometer to Study PCM Physics
§ Conclusion
Stanford University
Department of Electrical Engineering Rakesh Jeyasingh 4
Phase Change Materials
Crystalline Amorphous High
Resistance Low
Resistance
Annealing
Melt-quenched
Phase-change materials:
§ Ge2Sb2Te5 (GST)
§ AIST (AgInSbTe)
§ GeSb, Sb2Te, GeTe…
Stanford University
Department of Electrical Engineering Rakesh Jeyasingh 5
Phase Change Materials § Sulphur (S), Selenium (Se) and Tellurium (Te) - group 16 (VIA),
are called chalcogens § Chalcogenides - group 16 + group 13-15 namely Arsenic (As),
Germanium (Ge), Antimony (Sb), Phosphorus (P) etc.
Most reports in the literature uses the Ge2Sb2Te5 alloy (GST)
Stanford University
Department of Electrical Engineering Rakesh Jeyasingh 6
Phase Change Memory
§ Amorphization (RESET): Melt and quench (T>TMelt)
§ Crystallization (SET): Anneal (T>Tcrys)
Bottom Electrode
Top Electrode
Programming regionPhase changing material
HeaterInsulator Te
mpe
ratu
re
Time
Tmelt
TcrysRead
SET pulse
RESET pulse
Troom
Stanford University
Department of Electrical Engineering Rakesh Jeyasingh 7
PCM Current-Voltage Characteristics
A. Pirovano et al., IEEE Trans. Electron Devices, vol. 51, no. 5, pp. 714–719, May 2004.
Stanford University
Department of Electrical Engineering Rakesh Jeyasingh 8
Phase Change Memory
poly c-GST poly c-GSTpoly c-GST
amorphousamorphous
SiO2 SiO2 SiO2TiN TiN TiN
TiNTiNTiNfully set state partially reset state fully reset state
§ Resistance change achieved by controlling the size of the amorphous region
§ Amorphous volume ∝ Programming power
Stanford University
Department of Electrical Engineering Rakesh Jeyasingh 9
History of Phase Change Memory
N. Carlisle, “The Ovshinsky invention,” Science & Mechanics,
Feb. 1970
R. G. Neale, D. L. Nelson and G. E. Moore,
“Nonvolatile and Reprogrammable, the Read Mostly Memory is Here,”
Electronics, Sep. 1970
M. Kanga et al., IEDM 2011
F ≈ 2mm 1 bit
F ≈ 350μm 256 bit
F ≈ 20nm 8 Gbit
Stanford University
Department of Electrical Engineering Rakesh Jeyasingh 10
Department of Electrical Engineering Rakesh Jeyasingh 27
Temperature Dependence of Reliability Issues
Spontaneous crystallization § Higher temperature
à Faster crystallization.
Drift (RRESET + Vth) § Higher temperature
à Faster drift
A. Pirovano et al., IEDM, 2003. D. Ielmini et al., Microelectronic Engineering, v.86, p.1942, 2009.
Stanford University
Department of Electrical Engineering Rakesh Jeyasingh 28
Thermal (program) Disturbance in PCM
§ PCM uses heat for programming.
à Thermal disturbance in PCM.
§ Thermal disturbance makes reliability issues worse – especially for scaled devices
Thermal Disturbance
A.Pirovano et al., IEDM, 2003.
Selected cell
Unselected cell
Stanford University
Department of Electrical Engineering Rakesh Jeyasingh 29
Micro-thermal stage (MTS)
An external heater integrated with the PCM cell
§ Lateral PCM cell + Pt heater on top
§ Thermal time constant: ~1.5 µs
Temperature calibration on the external heater
PowerTTTRR
heater
heater
∝Δ
Δ+= β)( 0
0.0 5.0m 10.0m 15.0m165
170
175
180
185
Linear fit 40 °C 35 °C
30 °C 25 °C 20 °C
Rhe
ater (Ω
)Power (W)
§ Pt bridge: Heater + thermometer S. Kim et al., IEEE Tran. Elec. Dev. Vol. 58, pp. 584, 2011
Stanford University
Department of Electrical Engineering Rakesh Jeyasingh 30
Need for a Micro – Thermal Stage (MTS)
§ Enables temperature measurements closer to real device operating conditions § MTS – allows fast measurements of drift and crystallization on real PCM devices § Measurements on technologically relevant melt-quenched amorphous phase § Study the effect of electronic and thermal effects in isolation
T0
Tcrys
TmeltPCM
(+heater) self-
heating
Mirco-thermal stage
Thermal stage
1n 1µ 1m 1 1k
Tem
pera
ture
Termal time constant (s)Thermal )me constant (s)
Stanford University
Department of Electrical Engineering Rakesh Jeyasingh 31
100µ 1m 10m 100m 1 10
0.05
0.10
0.15
0.20
Drif
t coe
ffici
ent
Time after reset (s)
25oC 35oC 45oC 55oC 65oC
TA:
RRESET Drift Measurement
§ Faster drift at higher TA.
§ 3 times larger drift coefficient between 100 µs and 1 ms at 65 °C
VoltageTemperature
ProgrammingRead
t0 t1 t2 tn
Time
From [5]
10µ 1m 100m 10 1k 100k
1M
2M
3M
4M
Res
ista
nce
(Ω)
Time after reset (s)
25oC 35oC 45oC 55oC 65oC
1M
10M
100M
50oC
Resistance (Ω
)
100oC
t0 t1 t2 t3 t4 t5
S. Kim et al., IEEE Tran. Elec. Dev. Vol. 58, pp. 584, 2011
Stanford University
Department of Electrical Engineering Rakesh Jeyasingh 32
RRESET Drift Impacted by Thermal Disturbances
§ Important features – A: ~25% variation on resistance. – B: Drift is faster – C: Drift is slower – D: No change (>100ms)
10µ 100µ 1m 10m100m 1 10 100
1M
1.5M
2M
2.5M
RR
ES
ET (Ω
)
Delay for read (s)
Delay for annealing 300µs 1.2ms 11ms 110ms
A
)/log()/log(
12
12
ttRR
=γ
100µ 1m 10m 100m 1 100.00
0.05
0.10
0.15
0.20
Drif
t coe
ffici
ent
Delay for read (s)
Delay for annealing 300µs 1.2ms 11ms 110ms no annealing
B
B
CCHeat pulse :
60 °C for 600 µs
D
Voltage
Temperature
Programming Delayed read
TimedA
dA: Delay for annealing (TD)
Stanford University
Department of Electrical Engineering Rakesh Jeyasingh 33
Crystallization Time (tcrys) Vs Temperature (T)
§ Current MTS enables tcrys measurement down to ~100µs.
§ Arrhenius behavior with constant activation energy (EA)
RESET
PCM
MTSheater
AB
A : Delay for readB : Delay for annealing
read
IPCMτthermal
tcrys
6 orders in time
Stanford University
Department of Electrical Engineering Rakesh Jeyasingh 34
Crystallization Time (tcrys) with Thermal Disturbance
§ Constant shift in log(tcrys) à The tcrys ratio is constant.
10µ
100µ
1m
10m
100m
1
10
100250 200 150
crys
talli
zatio
n tim
e (s
) With thermal disturbance (TD) Without TD
(°C)
22 24 26 281/kBT (eV-1)
∫=
=
dttTvr
TtTv
cryscrys
cryscrys
))((
)(1)(
crys
TD : 243 °C for 75 µs
vcrys: Crystallization speed rcrys: degree of crystallization
S. Kim et al., IRPS 2010
Stanford University
Department of Electrical Engineering Rakesh Jeyasingh 35
Effects of Temperature on PCM Reliability - Summary
§ Spontaneous crystallization and Resistance drift – major reliability issues of PCM
§ Significantly impacted by short thermal disturbances – variability in the retention and drift behavior
§ Use of Micro Thermal Stage – fast heater and thermometer to study the reliability physics in short time scales
Stanford University
Department of Electrical Engineering Rakesh Jeyasingh 36
Non-Volatile Memory Technology Research Initiative (NMTRI) at Stanford University
Stanford University
Department of Electrical Engineering Rakesh Jeyasingh 37
Technical Collaborators on Memory
Stanford University
Department of Electrical Engineering Rakesh Jeyasingh 38
Bottom Electrode
HT Oxide
GST
Top Electrode
Understanding Physics & Reliability
Material Scaling
Device Scaling
Methodologies to Study Scalability and Physics of PCM