Materials and Manufacturing in Electronics Prof. Dr.-Ing. Jürgen Villain University of Applied Sciences Augsburg, Germany Department of Electrical Engineering COST 531 Meeting 14.1.2003 Berlin
Jan 15, 2016
Materials and Manufacturing in Electronics
Prof. Dr.-Ing. Jürgen Villain
University of Applied Sciences Augsburg, Germany
Department of Electrical Engineering
COST 531 Meeting
14.1.2003
Berlin
Lectures and Team
Lectures• Materials Science for Engineers• Manufacturing in Electronics• Packaging• Design and Strength of Materials
Team in the Lab• Dipl.-Ing. T. Qasim (material science)• Dipl.-Ing. Ch. Weippert (crystallography)• Dipl.-Ing. (FH) A. Svetly (mechanical engineering)• J. Pahl (material test)• E. Hundt (measuring technique)• Students, candidate for a doctor`s degree
Topics of Research
• Influence of structure on the mechanical behaviour of metals• Determination of mechanical properties of small specimens depending on temperature and strain rate• Size effect on mechanical properties of metals in electronics • Vapour-phase soldering of lead-free solder materials• Creep behaviour of solder materials• Formation of intermediate phases in small solder volumes
Equipment of the Lab
Macro and micro tension test machines (0.5 N – 500 N, -55 °C/250 °C)Pull- and Shear-TestCreep Test (RT/200 °C)Laser extensometerSpecial clamping jaws for small specimensMicro-hardness testerSEM with EDX (tension and creep tests inside possible)X-ray fluorescent analysisThermal shockVapour-Phase solderingWetting testerOvens
Special clampingjaws for
small Cu-Foils (10 µm - 250 µm)
Tensile module for small specimens(part of SEM)
Tools for small specimens
0
10
20
30
40
50
60
70
80
90
23 °C 50 °C 70 °C 100 °C
Ten
sile
Str
engt
h [N
/mm
2]
0,003 1/s
0,01 1/s
0,03 1/s
0,05 1/s
0
200
400
600
800
1000
1200
1400
1600
23 50 70 100Temperature [°C]
Elo
ngat
ion
[%]
0,003 1/s
0,01 1/s
0,03 1/s
0,05 1/s
Material parameters describing exactly the material behaviour of electronic devices under working conditions are necessary for thermo-mechanical
simulations.
Elongation at rupture of Sn43Bi57for different temperatures and strain rates
Tensile strength of Sn43Bi57for different temperatures and strain rates
Determination of mechanical properties of small specimens depending on temperature and strain rate
0
2
4
6
8
10
12
14
16
18
20
Elongation at rupture [%]
10 20 25 100 250
Cu Thickness [µm]
0
50
100
150
200
250
300
350
Ultimate tensile strength [N/mm2]
10 20 25 100 250
Cu Thickness [µm]
Size Effect on Mechanical Properties of Copper Foils
The smaller the tested volume the lower the ductility !
Manufacturing and Reliability of Lead-Free-Solders
Topics: Manufacturing parameters, shear and tensile strength, creep-behaviour, migration, intermediate compounds
Solder materials: Sn91Zn9, Sn43Bi57, Sn96.5Ag3.5, Sn93.5Ag3.8Cu0.7Bi2(4)
Phase Formation in Small Solder Volumes (intermediate phases)
Sn43Bi57, device Sn,Pad: Cu/Ni/Au
Sn91Zn9, device Sn,Pad: Cu/Ni/Au
Small solder volumes are out of thermodynamic equilibrium and consist mainly of intermediate phases (3 – 5 elements) with almost completely unknown material properties.
0
5
10
15
20
25
0,01 0,1 1 10 100 1000 10000
Time [h]
Stra
in e
[%]
0
5
10
15
20
0,01 0,1 1 10 100 1000 10000
Time [h]
Str
ain
[%
]
60Sn40Pb, Qm = 0.73 eV
43Sn57Bi, Qm = 0.76 eV
0
5
10
15
20
0,01 0,1 1 10 100 1000 10000Time [h]
Str
ain
[%
]
91Sn9Zn, Qm = 1.01 eV
0
10
20
30
40
50
0,001 0,01 0,1 1 10 100 1000 10000Time [h]
Str
ain
[%
]
96.5Sn3.5Ag, Qm = 0.87 eV
Lowest homologoues temperature, highest homologoues stress
Creep behaviour of solder materials
The creep behaviour ofsolder materials at highhomologous temperaturescan be described using a viscoplastic equation.
(t,T,)=o J(t) a a
Comparison of Activation Energies and Time-Temperature Shift-Factor
0
2000
4000
6000
8000
10000
12000
14000
16000
18000
20000
0,6 0,65 0,7 0,75 0,8 0,85 0,9 0,95 1 1,05
Activation energy [eV]
Tim
e-te
mpe
ratu
re s
hift
fact
or m
ax a
T
42Sn58Bi
60Sn40Pb
91Sn9Zn9
96.5Sn3.5Ag
Round phases
Dendritic or scorched phases
0
1
2
3
4
5
6
7
8
0,1 1 10 100 1000
Time [h]
Elo
ngat
ion
[%]
5 mm-Probe 1 mm-Probe2
1.78 mm3
785 mm3
Sn60Pb40, stress 5 N/mm2, same structure, same strain rate.
The smaller the tested volume the lower the creep resistance.
Size Effect on Creep Behaviour of a Solder Material
Further investigations
Analysis of metallic and intermediate phases of small solder volumes
Determination of the mechanical behaviour of eutectic and non eutectic solder materials with regard to
structure and tested volume under experimental and numerical view