Daftar Pustaka 1. Farid Triawan, Pengembangan Penganalisis Sinyal Dinamik Berbasis LabVIEW 7.1 Menggunakan Kartu Akuisisi Data PCI-4451, Tugas Sarjana, Departemen Teknik Mesin, FTI-ITB, 2005. 2. Andreas Alfredo Sigalingging, Pengembangan Penganalisis Sinyal Dinamik Berbasis Komputer Personal Menggunakan Kartu Akuisisi Data PCI-4451 dan Bahasa Pemrograman LabVIEW 7.1, Tugas Sarjana, Program Studi Teknik Mesin, FTI-ITB, 2006. 3. Ilham Kurniawan, Pengembangan Perangkat Lunak untuk Analisis Fungsi Respon Frekuensi Berbasis LabVIEW 6.1, Tugas Sarjana, Departemen Teknik Mesin, FTI- ITB, 2004. 4. D.J. Ewins, Modal Testing: Theory, Practice and Application, Research Studies Press Ltd., USA, 2000. 5. LabVIEW 7 Express: Measurement Manual, National Instruments, Austin, Texas, 2003. 6. M Series User Manual, National Instruments, Austin, Texas, 2004. 7. LabVIEW Analysis Concept, National Instruments, Austin, Texas, 2004. 8. LabVIEW 7 Express: User Manual, National Instruments, Austin, Texas, 2004. 9. LabVIEW Sound and Vibration Toolkit User Manual, National Instruments, Austin, Texas, 2004. 10. Furqanul Fikri, Pengembangan Metode Circle Fit untuk Curve Fitting Fungsi Respon Frekuensi Sistem Getaran MDOF, Tugas Sarjana, Program Studi Teknik Mesin, FTI- ITB, 2007. 59
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KAJI BANDING HASIL PENGUKURAN FUNGSI · PDF file7. Evaluasi data hasil pengujian yang telah dilakukan. Hasil ... - Kegiatan kaji banding hasil pengukuran FRF tidak dapat dilakukan
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Daftar Pustaka
1. Farid Triawan, Pengembangan Penganalisis Sinyal Dinamik Berbasis LabVIEW 7.1
Menggunakan Kartu Akuisisi Data PCI-4451, Tugas Sarjana, Departemen Teknik
Mesin, FTI-ITB, 2005.
2. Andreas Alfredo Sigalingging, Pengembangan Penganalisis Sinyal Dinamik Berbasis
Komputer Personal Menggunakan Kartu Akuisisi Data PCI-4451 dan Bahasa
Pemrograman LabVIEW 7.1, Tugas Sarjana, Program Studi Teknik Mesin, FTI-ITB,
2006.
3. Ilham Kurniawan, Pengembangan Perangkat Lunak untuk Analisis Fungsi Respon
Frekuensi Berbasis LabVIEW 6.1, Tugas Sarjana, Departemen Teknik Mesin, FTI-
ITB, 2004.
4. D.J. Ewins, Modal Testing: Theory, Practice and Application, Research Studies Press
Ltd., USA, 2000.
5. LabVIEW 7 Express: Measurement Manual, National Instruments, Austin, Texas,
2003.
6. M Series User Manual, National Instruments, Austin, Texas, 2004.
7. LabVIEW Analysis Concept, National Instruments, Austin, Texas, 2004.
8. LabVIEW 7 Express: User Manual, National Instruments, Austin, Texas, 2004.
9. LabVIEW Sound and Vibration Toolkit User Manual, National Instruments, Austin,
Texas, 2004.
10. Furqanul Fikri, Pengembangan Metode Circle Fit untuk Curve Fitting Fungsi Respon
Frekuensi Sistem Getaran MDOF, Tugas Sarjana, Program Studi Teknik Mesin, FTI-
ITB, 2007.
59
KAJI BANDING HASIL PENGUKURAN FUNGSI RESPON FREKUENSI
MENGGUNAKAN PERANGKAT AKUISISI DATA MULTIPLEXING PCI-6281
DAN PERANGKAT AKUISISI DATA SEREMPAK MULTI KANAL MSA
HP3566A
Oleh:
Nama: William
NIM: 13103130
Pembimbing:
Prof. Dr. Ir. Komang Bagiasna
Ringkasan
Latar Belakang
- Laboratorium Dinamika ITB telah beberapa kali mengembangkan perangkat lunak
penganalisis sinyal getaran yang mampu melakukan pengukuran Fungsi Respon
Frekuensi (FRF) menggunakan perangkat akuisisi data multiplexing dan perangkat
akuisisi data serempak multi kanal.
- FRF merupakan fungsi perbandingan suatu respon dengan gaya eksitasi yang
dinyatakan dalam domain frekuensi. Baik respon dan getaran harus diukur dalam
waktu yang bersamaan.
Perumusan Masalah
Melaksanakan kaji banding hasil pengukuran FRF menggunakan perangkat akuisisi
data multiplexing PCI-6281 dan perangkat akuisisi data serempak multi kanal MSA
HP3566A.
Metode Penyelesaian Masalah
1. Studi literatur tentang perangkat lunak yang telah dikembangkan sebelumnya di
Laboratorium Dinamika ITB.
2. Studi literatur mengenai bahasa pemrograman LabVIEW 7.1 dan NI-DAQmx 7.4
beserta teori dan teknik akuisisi data.
3. Pembuatan perangkat lunak analisis FRF dengan kartu akuisisi data PCI-6281.
4. Validasi perangkat lunak yang telah dikembangkan.
5. Pengujian FRF pada struktur pelat T.
6. Pengujian FRF pada struktur batang tumpuan sederhana
7. Evaluasi data hasil pengujian yang telah dilakukan.
Hasil
- Pengembangan perangkat lunak untuk melakukan pengukuran FRF metode eksitasi
kejut dan metode swept sine dengan menggunakan kartu akuisisi data multiplexing
PCI-6281.
- Kegiatan kaji banding hasil pengukuran FRF tidak dapat dilakukan dengan
sempurna karena fasilitas filter yang terdapat di kartu PCI-6281 tidak dapat
berfungsi sebagai anti-aliasing filter yang benar.
LAMPIRAN A
DATA SPESIFIKASI TEKNIK NI PCI-628X
NI 628x SpecificationsSpecifications listed below are typical at 25 °C unless otherwise noted. Refer to the M Series User Manual for more information about NI 628x devices.
Analog InputNumber of channels
NI 6280/NI 6281 ........................ 8 differential or 16 single ended
NI 6284/NI 6289 ........................ 16 differential or 32 single ended
DO or DI Sample Clock frequency ..............................0 to 10 MHz
DO or DI Sample Clock source2...................................Any PFI, RTSI,
AI Sample or Convert Clock, AO Sample Clock, Ctr n Internal Output, and many other signals
PFI/Port 1/Port 2 FunctionalityFunctionality ................................... Static digital input,
static digital output, timing input, timing output
Timing output sources .................... Many AI, AO, counter, DI, DO timing signals
Debounce filter settings .................. 125 ns, 6.425 μs, 2.54 ms, disable; high and low transitions; selectable per input
Recommended Operation Conditions
Electrical Characteristics
1 Stresses beyond those listed under Input voltage protection may cause permanent damage to the device.2 The digital subsystem does not have its own dedicated internal timing engine. Therefore, a sample clock must be provided
from another subsystem on the device or an external source.
NI PCI-6280/6281/6284/6289 ....10.6 cm × 15.5 cm (4.2 in. × 6.1 in.)
NI PXI-6280/6281/6284/6289 ....Standard 3U PXI
Weight
NI PCI-6280................................151 g (5.3 oz)
NI PCI-6281................................158 g (5.6 oz)
NI PCI-6284................................159 g (5.6 oz)
NI PCI-6289................................167 g (5.9 oz)
NI PXI-6280 ...............................218 g (7.7 oz)
NI PXI-6281 ...............................225 g (7.9 oz)
NI PXI-6284 ...............................229 g (8.1 oz)
NI PXI-6289 ...............................237 g (8.4 oz)
I/O connector
NI 6280/NI 6281.........................1 68-pin VHDCI
NI 6284/NI 6289.........................2 68-pin VHDCI
Maximum Working Voltage1
NI 6280/NI 6281/NI 6284/NI 6289Channel to earth ..............................11 V,
Measurement Category I
Caution Do not use for measurements within Categories II, III, or IV.
EnvironmentalOperating temperature.....................0 to 55 °C
Storage temperature.........................–20 to 70 °C
Humidity..........................................10 to 90% RH, noncondensing
Maximum altitude ...........................2,000 m
Pollution Degree(indoor use only) .............................2
Table 1. PXI and PXI Express Chassis
DevicePart
Number
SCXI Control in PXI/SCXI
Combo Chassis
PXI Express Hybrid Slot Compatible
PXI-6280 191501C-04 No Yes
PXI-6281 191501C-03 No Yes
PXI-6284 191501C-02 No Yes
PXI-6289 191501C-01 No Yes
191501C-11 Yes No
Earlier versions of PXI-628x
191501A-0x191501B-0x
Yes No
1 Maximum working voltage refers to the signal voltage plus the common-mode voltage.
NI 628x Specifications 12 ni.com
Shock and Vibration (PXI Devices Only)Operational shock............................30 g peak, half-sine,
11 ms pulse (Tested in accordance with IEC-60068-2-27. Test profile developed in accordance with MIL-PRF-28800F.)
Random vibration
Operating ....................................5 to 500 Hz, 0.3 grms
Nonoperating ..............................5 to 500 Hz, 2.4 grms (Tested in accordance with IEC-60068-2-64. Nonoperating test profile exceeds the requirements of MIL-PRF-28800F, Class 3.)
SafetyThis product is designed to meet the requirements of the following standards of safety for electrical equipment for measurement, control, and laboratory use:
• IEC 61010-1, EN 61010-1
• UL 61010-1, CSA 61010-1
Note For UL and other safety certifications, refer to the product label or visit ni.com/certification, search by model number or product line, and click the appropriate link in the Certification column.
Electromagnetic CompatibilityThis product is designed to meet the requirements of the following standards of EMC for electrical equipment for measurement, control, and laboratory use:
• EN 61326 EMC requirements; Minimum Immunity
• EN 55011 Emissions; Group 1, Class A
• CE, C-Tick, ICES, and FCC Part 15 Emissions; Class A
Note For EMC compliance, operate this device according to product documentation.
CE ComplianceThis product meets the essential requirements of applicable European Directives, as amended for CE marking, as follows:
Note Refer to the Declaration of Conformity (DoC) for this product for any additional regulatory compliance information. To obtain the DoC for this product, visit ni.com/certification, search by model number or product line, and click the appropriate link in the Certification column.
Waste Electrical and Electronic Equipment (WEEE)
EU Customers At the end of their life cycle, all products must be sent to a WEEE recycling center. For more information about WEEE recycling centers and National Instruments WEEE initiatives, visit ni.com/environment/weee.htm.
National Instruments, NI, ni.com, and LabVIEW are trademarks of National Instruments Corporation. Refer to the Terms of Use section on ni.com/legal for more information about National Instruments trademarks. Other product and company names mentioned herein are trademarks or trade names of their respective companies. For patents covering National Instruments products, refer to the appropriate location: Help»Patents in your software, the patents.txt file on your CD, or ni.com/patents.