Oxidant K edge x-ray emission spectroscopy of UF 4 and UO 2 J. G. Tobin, S.-W. Yu, R. Qiao, W. L. Yang, and D. K. Shuh Citation: Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 36, 03E101 (2018); View online: https://doi.org/10.1116/1.5016393 View Table of Contents: http://avs.scitation.org/toc/jva/36/3 Published by the American Vacuum Society
6
Embed
J. G. Tobin, S.-W. Yu, R. Qiao, W. L. Yang, and D. K. Shuh ...
This document is posted to help you gain knowledge. Please leave a comment to let me know what you think about it! Share it to your friends and learn new things together.
Transcript
Oxidant K edge x-ray emission spectroscopy of UF4 and UO2J. G. Tobin, S.-W. Yu, R. Qiao, W. L. Yang, and D. K. Shuh
Citation: Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 36, 03E101 (2018);View online: https://doi.org/10.1116/1.5016393View Table of Contents: http://avs.scitation.org/toc/jva/36/3Published by the American Vacuum Society
spectrum which is consistent with each XES measurement?
This issue will be addressed next.
IV. CONCEPTUALIZATION OF XES SPECTRUM
The K (1s) edge XES spectrum is the result of a transition
of an electron from an occupied 2p state into a 1s core–hole,
as shown schematically in Fig. 3. These transitions are elec-
tric dipole in nature, with Dl¼61. Generally speaking, for
each state in the manifold with 2p character, there should be
a corresponding peak in the XES spectrum, with a finite
width caused by a variety of factors, including lifetime
broadening and instrumental resolution limitations. This is
also shown schematically in Fig. 3. Our approach is to take
each occupied state in the Ryzhkov cluster calculation with
nonzero 2p character and generate an XES component peak
for it, scaling the intensity to the 2p percentage, and then
sum all of the component peaks to get an overall spectrum.
For the sake of simplicity and transparency, we will begin
by utilizing the ubiquitous Gaussian function for our compo-
nent line-shape.
V. RESULTS AND DISCUSSION: SPECTRALSIMULATION BASED UPON THE HISTOGRAMODOS
The approach here is minimalist: the goal is to find the
least complicated set of conditions that can explain the
spectral observations. In this analysis, we have made a pair
of simplifying assumptions. (1) The component peak cross
sections are all equal. (2) The component peak widths and
shapes are all the same. To begin, a Gaussian lineshape was
utilized and the full width at half maximum (FWHM) was
varied systematically, as shown in Fig. 4, for the F2p ODOS,
FIG. 1. (Color online) Comparison of the XES results for UF4 with the XPS
of UF4 from Thibaut et al. (Ref. 16) and the ODOS derived from the calcu-
lations of Ryzhkov and coworkers (Ref. 6), for a (UF8)4� cluster. The XES
peak is at hv¼ 675 eV. The XPS measurements of Teterin et al. (Ref. 6)
confirm the Thibaut result. BE (eV) is the binding energy in electron volts,
used in the XPS experiment. The photon energy in the XES experiment is
denoted with hv (eV). ODOS En (eV) is the occupied density of states
energy in electron volts for cluster calculations. This figure is similar to the
one in Ref. 10.
FIG. 2. (Color online) Following Fig. 1, this is a comparison of the XES,
XPS (Ref. 5), and cluster results for UO2. The calculations of Ryzhkov and
coworkers (Ref. 7) are based upon a (UO8)12� cluster. The XPS spectrum
was taken from Ref. 5.
FIG. 3. (Color online) XES process and resultant spectrum. See text for details.
The photon is denoted as hv.
03E101-2 Tobin et al.: Oxidant K edge XES of UF4 and UO2 03E101-2
J. Vac. Sci. Technol. A, Vol. 36, No. 3, May/Jun 2018
with the intensity scaling from the histograms in Fig. 1. The
plots in Fig. 4 show the summation of the contributions from
each component. As can be seen in Fig. 5, the best match
corresponds to FWHM near 1 eV.
Even with this very simple spectral simulation, it is possi-
ble to achieve a fairly good match, as shown in Fig. 5. One
viewpoint would be to note that the three features are
obtained in the simulated spectrum, although the shoulder on
the right side (higher XES energy) is much stronger than that
observed experimentally. There are also two winglike,
weaker shoulders, one on each side, that are not resolved
experimentally, but are consistent with the overall peak
width near the base of the 2p envelope peak. Despite the
appeal of the three feature viewpoint, a superior viewpoint
would be to concede that, experimentally, the smaller and
weaker features are being lost and only the two main strong
features, the central peak and the lower photon energy shoul-
der are resolvable. Thus, the simple theory gives us the two
main spectral features, which are resolved experimentally, as
well as the smaller winglike shoulders and the fine structure
near the peak maximum, which are not resolved experimen-
tally. In some respects, this result is not surprising, for two
reasons: (1) theory almost always resolves more fine struc-
ture than experiment; and (2) the real UF4 sample has two U
sites in its unit cell, which may have slightly different indi-
vidual spectra, which are not separable here.1–3
A similar analysis has been carried out for the O2p mani-
fold in UO2, as shown in Figs. 6 and 7. Once again, the best
visual match is near FWHM¼ 1 eV and a simulated spec-
trum is obtained, with parallel limitations as those described
above for UF4.
FIG. 4. (Color online) Simulated XES spectra from the F2p ODOS histo-
grams, utilizing a Gaussian lineshape and specified FWHM for each compo-
nent, For a Gaussian function, FWHM¼ 2(2ln2)1/2 Sigma¼ 2.355 Sigma.
FIG. 5. (Color online) Comparison of the XES spectrum of UF4 and the sim-
ulated spectrum with the component FWHM¼ 0.94 eV.
FIG. 6. (Color online) Simulated XES Spectra from the F2p ODOS histo-
grams, utilizing a Gaussian lineshape and specified FWHM for each
component.
03E101-3 Tobin et al.: Oxidant K edge XES of UF4 and UO2 03E101-3
JVST A - Vacuum, Surfaces, and Films
Once again, the best analysis may be to accept that some
of the fine structure in the simulation is lost in the experi-
ment. Then, the overall, plateaulike appearance of the simu-
lated spectrum can be explained as being consistent with the
two main features, the central peak and the lower photon
energy shoulder, which are both observed experimentally,
albeit with an overemphasis of the shoulder relative to the
central peak. However, this leaves the problem at the peak
base.
Here, the Gaussian line-shape fails to give the proper
width and tailing. This problem can be fixed, by substituting
a Lorentzian line-shape, as shown in Fig. 8. Although there
is a slight sharpening of peak tops with the Lorentzian, to a
large extent, the central part of the line-shape remains much
the same for the Gaussian and Lorentzian cases: only the
tailing at the base, with its concomitant broadening, is
strongly affected. This result suggests that lifetime broaden-
ing is the dominant effect here and the possible high energy
shoulder is merely lifetime broadening.
VI. SUMMARY AND CONCLUSIONS
It has been shown that, even with the simplifying assump-
tions of constant cross sections and component line-widths
and shapes, it is possible to construct simulated spectra from
the histogram ODOS of the Ryzhkov clusters that agree
fairly well with the experimental oxidant K Edge spectra of
UO2 and UF4. These simulations reconstruct the two main
features in all of the XES and XPS spectra: the central peak
and the lower photon energy shoulder. However, much of
the additional simulated spectral fine structure is lost, includ-
ing the details near the peak maximum. Because of the pres-
ence of smaller features on the wings in the UF4, it is not
necessary to utilize a Lorentzian lineshape, so long as the
premise of the loss of simulated fine structure is accepted.
However, for the UO2, a Lorentzian lineshape is required to
explain the tailings on either side of the peak. To improve
the quality of the match, it will be necessary to properly
include state specific matrix elements for each transition.17
ACKNOWLEDGMENTS
Lawrence Livermore National Laboratory (LLNL) is
operated by the Lawrence Livermore National Security, LLC,
for the U.S. Department of Energy, National Nuclear Security
Administration, under Contract No. DE-AC52-07NA27344.
Work at Lawrence Berkeley National Laboratory (LBNL)
(D.K.S.) was supported by the Director of the Office of
Science, Office of Basic Energy Sciences (OBES), Division
of Chemical Sciences, Geosciences, and Biosciences (CSGB),
Heavy Element Chemistry (HEC) Program of the U.S.
Department of Energy under Contract No. DE-AC02-
05CH11231. The ALS is supported by the Director of the
Office of Science, OBES of the U.S. Department of Energy at
LBNL under Contract No. DE-AC02-05CH11231. The UF4
sample was originally prepared at Oak Ridge National
Laboratory and provided to LLNL by J. S. Morrell of Y12.
1J. G. Tobin et al., Phys. Rev. B 92, 035111 (2015).2J. G. Tobin et al., Phys. Rev. B 92, 045130 (2015).3J. G. Tobin, W. Siekhaus, C. H. Booth, and D. K. Shuh, J. Vac. Sci.
Technol., A 33, 033001 (2015).4J. G. Tobin and S.-W. Yu, Phys. Rev. Lett. 107, 167406 (2011).
FIG. 7. (Color online) Comparison of the XES spectra of UO2 and the simu-
lated spectrum with component FWHM¼ 0.94 eV.FIG. 8. (Color online) Comparison of the O1s XES spectra with a composite
spectrum utilizing a Lorentzian line-shape for the component peaks, with a
component FWHM of 1 eV. The inset shows a direct comparison of
Gaussian and Lorentzian line-shapes for equivalent FWHM values. The
overall FWHM of the O1s peak was about 2 eV, and the projected instru-
mental broadening was 1.2 eV (Ref. 8).
03E101-4 Tobin et al.: Oxidant K edge XES of UF4 and UO2 03E101-4
J. Vac. Sci. Technol. A, Vol. 36, No. 3, May/Jun 2018
5S.-W. Yu, J. G. Tobin, J. C. Crowhurst, S. Sharma, J. K. Dewhurst, P.
Olalde-Velasco, W. L. Yang, and W. J. Siekhaus, Phys. Rev. B 83,
165102 (2011).6A. Yu. Teterin, Yu. A. Teterin, K. I. Maslakov, A. D. Panov, M. V.
Ryzhkov, and L. Vukcevic, Phys. Rev. B 74, 045101 (2006).7Yu. A. Teterin, K. I. Maslakov, M. V. Ryzhkov, O. P. Traparic, L.
Vukcevic, A. Yu. Teterin, and A. D. Panov, Radiochemistry 47, 215 (2005).8S.-W. Yu and J. G. Tobin, J. Electron Spectrosc. Relat. Phenom. 187, 15
(2013).9S.-W. Yu, J. G. Tobin, and B. W. Chung, Rev. Sci. Instrum. 82, 093903
(2011).10J. G. Tobin, S.-W. Yu, R. Qiao, W. L. Yang, and D. K. Shuh, “F1s x-ray
emission spectroscopy of UF4,” Prog. Nucl. Sci. Technol. (submitted).
11J. J. Jia et al., Rev. Sci. Instrum. 66, 1394 (1995).12S.-W. Yu and J. G. Tobin, J. Vac Sci. Technol., A 29, 021008 (2011).13J. G. Tobin, A. M. Duffin, S.-W. Yu, R. Qiao, W. L. Yang, C. H. Booth,
and D. K. Shuh, J. Vac. Sci. Technol., A 35, 03E108 (2017).14S.-W. Yu, J. G. Tobin, P. Olalde-Velasco, W. L. Yang, and W. J.
Siekhaus, J. Vac. Sci. Technol., A 30, 011402 (2012).15J. G. Tobin, S. W. Yu, B. W. Chung, G. D. Waddill, E. Damian, L. Duda,
and J. Nordgren, Phys. Rev. B 83, 085104 (2011).16E. Thibaut, J.-P. Boutique, J. J. Verbist, J.-C. Levet, and H. Noel, J. Am.
Chem. Soc. 104, 5266 (1982).17J. D. Ward, M. Bowden, C. T. Resch, G. C. Eiden, C. D. Pemmaraju,
D. Prendergast, and A. M. Duffin, Spectrochim. Acta, B 127, 20
(2017).
03E101-5 Tobin et al.: Oxidant K edge XES of UF4 and UO2 03E101-5