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AUTOMOTIVE GRADE
PD - 97550
Features
Advanced Process Technology Ultra Low On-Resistance 175C Operating Temperature Fast Switching Repetitive Avalanche Allowed up to Tjmax Lead-Free, RoHS Compliant Automotive Qualified *
DescriptionSpecifically designed for Automotive applications,this HEXFETPower MOSFET utilizes the latest pro-
cessing techniques to achieve extremely low on-resistance per silicon area. Additional features of this
design are a 175C junction operating temperature,
fast switching speed and improved repetitive ava-lanche rating . These features combine to make this
design an extremely efficient and reliable device foruse in Automotive applications and a wide variety of
other applications.
HEXFET Power MOSFET
TO-247AC
SD
G
D
G D S
Gate Drain Source
HEXFET is a registered trademark of International Rectifier.
*Qualification standards can be found at http://www.irf.com/
Absolute Maximum RatingsStresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. Theseare stress ratings only; and functional operation of the device at these or any other condition beyond those indicated inthe specifications is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect devicereliability. The thermal resistance and power dissipation ratings are measured under board mounted and still air conditions.Ambient temperature (TA) is 25C, unless otherwise specified.
Parameter Units
ID
@ TC
= 25CContinuous Drain Current, VGS @ 10V A
ID @ TC = 100C Continuous Drain Current, VGS @ 10V
IDM Pulsed Drain Current c
PD @TC = 25C Maximum Power Dissipation W
Linear Derating Factor W/C
VGS Gate-to-Source Voltage V
EAS Single Pulse Avalanche Energy (Thermally Limited) d mJ
EAS (tested) Single Pulse Avalanche Energy Tested Value i
IAR Avalanche Current c A
EAR Repetitive Avalanche Energy h mJ
TJ Operating Junction and C
TSTG Storage Temperature Range
Soldering Temperature, for 10 seconds (1.6mm from case )
Mounting torque, 6-32 or M3 screw
Thermal Resistance
Parameter Typ. Max. Units
RJC Junction-to-Case j 0.49 C/W
RCS Case-to-Sink, Flat, Greased Surface 0.24
RJA Junction-to-Ambient 40
10 lbfin (1.1Nm)
310
2.0
20
520
690
See Fig.12a,12b,15,16
300
-55 to + 175
Max.
170120
680
V(BR)DSS
75V
RDS(on) max. 4.5m
ID 170AS
D
G
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Notes:
Repetitive rating; pulse width limited bymax. junction temperature. (See fig. 11).
Limited by TJmax, starting TJ = 25C,
L=0.13mH, RG = 25, IAS = 90A, VGS =10V.
Part not recommended for use above this value.
ISD 90A, di/dt 340A/s, VDD V(BR)DSS,
TJ 175C.
Pulse width 1.0ms; duty cycle 2%.
Coss eff. is a fixed capacitance that gives the samecharging time as Coss while VDS is rising from 0 to 80% VDSS.
Limited by TJmax , see Fig.12a, 12b, 15, 16 for typical repetitive
avalanche performance.
This value determined from sample failure population,
starting TJ = 25C, L=0.13mH, RG = 25, IAS = 90A, VGS =10V.
R is measured at TJ of approximately 90C.
S
D
G
Static Electrical Characteristics @ TJ = 25C (unless otherwise specified)
Parameter Min. Typ. Max. UnitsV(BR)DSS Drain-to-Source Breakdown Voltage 75 V
VDSS/TJ Breakdown Voltage Temp. Coefficient 0.069 V/CRDS(on) Static Drain-to-Source On-Resistance 3.5 4.5 mVGS(th) Gate Threshold Voltage 2.0 4.0 V
gfs Forward Transconductance 180 S
IDSS Drain-to-Source Leakage Current 20 A
250
IGSS Gate-to-Source Forward Leakage 200 nA
Gate-to-Source Reverse Leakage -200
Dynamic Electrical Characteristics @ TJ = 25C (unless otherwise specified)
Parameter Min. Typ. Max. UnitsQg Total Gate Charge 180 270
Qgs Gate-to-Source Charge 46 nC
Qgd Gate-to-Drain ("Miller") Charge 65
td(on) Turn-On Delay Time 19 nstr Rise Time 140
td(off) Turn-Off Delay Time 97
tf Fall Time 100
LD Internal Drain Inductance 5.0 nH Between lead,
6mm (0.25in.)LS Internal Source Inductance 13 from package
and center of die contactCiss Input Capacitance 7500 pF
Coss Output Capacitance 970
Crss Reverse Transfer Capacitance 510
Coss Output Capacitance 3640
Coss Output Capacitance 650
Coss eff. Effective Output Capacitance 1020
Diode CharacteristicsParameter Min. Typ. Max. Units
IS Continuous Source Current 90
(Body Diode) AISM Pulsed Source Current 680
(Body Diode)
VSD Diode Forward Voltage 1.3 V
trr Reverse Recovery Time 41 61 nsQrr Reverse Recovery Charge 59 89 nC
ton Forward Turn-On Time Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)
VDS = VGS, ID = 250A
VDS = 75V, VGS = 0V
VDS = 75V, VGS = 0V, TJ = 125C
Conditions
Conditions
VGS = 0V, ID = 250A
Reference to 25C, ID = 1mAVGS = 10V, ID = 90A f
TJ = 25C, IF = 90A, VDD = 38V
di/dt = 100A/s f
TJ = 25C, IS = 90A, VGS = 0V f
showing the
integral reverse
p-n junction diode.
VGS = 0V, VDS = 1.0V, = 1.0MHz
VGS = 10V f
MOSFET symbol
VGS = 0V
VDS = 25V
VGS = 0V, VDS = 60V, = 1.0MHz
Conditions
VGS = 0V, VDS = 0V to 60V
= 1.0MHz, See Fig. 5
RG = 2.5
ID = 90A
VDS = 25V, ID = 90A
VDD = 38VID = 90A
VGS = 20V
VGS = -20V
VDS = 60V
VGS = 10V f
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Qualification standards can be found at International Rectifiers web site: http//www.irf.com/
Exceptions to AEC-Q101 requirements are noted in the qualification report.
Qualification Information
TO-247 MSL1
RoHS Compliant Yes
ESD
Machine Model Class M4 (425V)
AEC-Q101-002
Human Body Model Class H2 (4000V)
AEC-Q101-001
Charged Device
Model
Class C5 (1125V)
AEC-Q101-005
Moisture Sensitivity Level
Qualification Level
Automotive
(per AEC-Q101)
Comments: This part number(s) passed Automotive
qualification. IRs Industrial and Consumer qualification level
is granted by extension of the higher Automotive level.
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Fig 2. Typical Output CharacteristicsFig 1. Typical Output Characteristics
Fig 3. Typical Transfer Characteristics Fig 4. Typical Forward Transconductance
vs. Drain Current
0.1 1 10 100
VDS, Drain-to-Source Voltage (V)
1
10
100
1000
10000
ID,Drain-to-SourceCurrent(A)
VGS
TOP 15V10V8.0V7.0V6.0V5.5V5.0V
BOTTOM 4.5V
60s PULSE WIDTH
Tj = 25C
4.5V
0.1 1 10 100
VDS, Drain-to-Source Voltage (V)
10
100
1000
ID,Drain-to-SourceCurrent(A)
4.5V
60s PULSE WIDTH
Tj = 175C
VGS
TOP 15V10V8.0V7.0V6.0V5.5V5.0V
BOTTOM 4.5V
2 4 6 8 10
VGS, Gate-to-Source Voltage (V)
0.1
1
10
100
1000
ID,Drain-to-SourceCurrent()
TJ = 25C
TJ = 175C
VDS = 25V
60s PULSE WIDTH
0 25 50 75 100 125 150
ID,Drain-to-Source Current (A)
0
50
100
150
200
Gfs,ForwardTransconductance(S) TJ = 25C
TJ = 175C
VDS = 10V
380s PULSE WIDTH
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Fig 8. Maximum Safe Operating Area
Fig 6. Typical Gate Charge vs.Gate-to-Source Voltage
Fig 5. Typical Capacitance vs.Drain-to-Source Voltage
Fig 7. Typical Source-Drain DiodeForward Voltage
1 10 100
VDS, Drain-to-Source Voltage (V)
100
1000
10000
100000
C,Capacitance(pF)
VGS = 0V, f = 1 MHZ
Ciss = Cgs + Cgd, C ds SHORTED
Crss = CgdCoss = Cds + Cgd
Coss
Crss
Ciss
0 50 100 150 200
QG Total Gate Charge (nC)
0.0
2.0
4.0
6.0
8.0
10.0
12.0
VGS,Gate-to-SourceVoltage(V) VDS= 60V
VDS= 38V
VDS= 15V
ID= 90A
0.0 0.5 1.0 1.5 2.0 2.5
VSD, Source-to-Drain Voltage (V)
1
10
100
1000
ISD,ReverseDrainCurrent(A)
TJ = 25C
TJ = 175C
VGS = 0V
1 10 100 1000
VDS, Drain-to-Source Voltage (V)
0.1
1
10
100
1000
10000
ID,Drain-to-SourceCurrent(A)
1msec
10msec
OPERATION IN THIS AREALIMITED BY R DS(on)
100sec
Tc = 25CTj = 175C
Single Pulse
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Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
Fig 9. Maximum Drain Current vs.Case Temperature
Fig 10. Normalized On-Resistancevs. Temperature
-60 -40 -20 0 20 40 60 80 100 120 140 160 180
TJ , Junction Temperature (C)
0.5
1.0
1.5
2.0
2.5
RDS(on),Drain-to-SourceOnResistanc
e
(Normalized)
ID = 90AVGS = 10V
1E-006 1E-005 0.0001 0.001 0.01 0.1 1
t1 , Rectangular Pulse Duration (sec)
0.0001
0.001
0.01
0.1
1
ThermalResponse(Z
thJC
)
0.20
0.10
D = 0.50
0.02
0.01
0.05
SINGLE PULSE( THERMAL RESPONSE ) Notes:
1. Duty Factor D = t1/t2
2. Peak Tj = P dm x Zthjc + Tc
Ri (C/W) i (sec)
0.1224 0.000360
0.1238 0.001463
0.2433 0.021388
J
J
1
1
2
2
3
3
R1
R1
R2
R2
R3
R3
C
Ci= i/Ri
25 50 75 100 125 150 175
TC , Case Temperature (C)
0
25
50
75
100
125
150
175
ID,
DrainCurrent(A)
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QG
QGS
QGD
VG
Charge
10 V
Fig 13b. Gate Charge Test Circuit
Fig 13a. Basic Gate Charge Waveform
Fig 12c. Maximum Avalanche Energy
vs. Drain CurrentFig 12b. Unclamped Inductive Waveforms
Fig 12a. Unclamped Inductive Test Circuit
tp
V(BR)DSS
IAS
Fig 14. Threshold Voltage vs. Temperature
RG
IAS
0.01tp
D.U.T
LVDS
+
-VDD
DRIVER
A
15V
20VVGS
1K
VCCDUT
0
L
25 50 75 100 125 150 175
Starting TJ , Junction Temperature (C)
0
500
1000
1500
2000
2500
EAS,SinglePulseAvalancheEnergy(m
J)
IDTOP 16A
25A
BOTTOM90A
-75 -50 -25 0 25 50 75 100 125 150 175 200
TJ , Temperature ( C )
1.0
1.5
2.0
2.5
3.0
3.5
4.0
VGS(th)GatethresholdVoltage(V)
ID = 250A
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Fig 15. Typical Avalanche Current Vs.Pulsewidth
Fig 16. Maximum Avalanche Energyvs. Temperature
Notes on Repetitive Avalanche Curves , Figures 15, 16:(For further info, see AN-1005 at www.irf.com)1. Avalanche failures assumption:
Purely a thermal phenomenon and failure occurs at atemperature far in excess of Tjmax. This is validated forevery part type.
2. Safe operation in Avalanche is allowed as long asTjmax isnot exceeded.
3. Equation below based on circuit and waveforms shown inFigures 12a, 12b.
4. PD (ave) = Average power dissipation per singleavalanche pulse.
5. BV = Rated breakdown voltage (1.3 factor accounts forvoltage increase during avalanche).
6. Iav = Allowable avalanche current.
7. T = Allowable rise in junction temperature, not to exceedTjmax (assumed as 25C in Figure 15, 16).tav = Average time in avalanche.D = Duty cycle in avalanche = tav f
ZthJC(D, tav) = Transient thermal resistance, see figure 11)
PD (ave) = 1/2 ( 1.3BVIav) =DT/ ZthJC
Iav =2DT/ [1.3BVZth]
EAS (AR) = PD (ave)tav
1.0E-05 1.0E-04 1.0E-03 1.0E-02 1.0E-01
tav (sec)
1
10
100
1000
AvalancheCurrent(A)
0.05
Duty Cycle = Single Pulse
0.10
Allowed avalanche Current vsavalanche pulsewidth, tav
assuming Tj = 25C due toavalanche losses0.01
25 50 75 100 125 150 175
Starting TJ , Junction Temperature (C)
0
100
200
300
400
500
600
EAR
,AvalancheEnergy(mJ)
TOP Single Pulse
BOTTOM 1% Duty Cycle
ID = 90A
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Fig 17. Peak Diode Recovery dv/dt Test Circuit for N-ChannelHEXFETPower MOSFETs
Circuit Layout Considerations
Low Stray Inductance
Ground Plane
Low Leakage Inductance
Current Transformer
P.W.Period
di/dt
Diode Recoverydv/dt
Ripple 5%
Body Diode Forward Drop
Re-AppliedVoltage
ReverseRecoveryCurrent
Body Diode ForwardCurrent
VGS=10V
VDD
ISD
Driver Gate Drive
D.U.T. ISD Waveform
D.U.T. VDS Waveform
Inductor Curent
D =P.W.
Period
* VGS = 5V for Logic Level Devices
*
+
-
+
+
+-
-
-
RGVDD dv/dt controlled by RG
Driver same type as D.U.T.
ISDcontrolled by Duty Factor "D" D.U.T. - Device Under Test
D.U.T
VDS
90%
10%
VGS
td(on) tr td(off) tf
VDS
Pulse Width 1sDuty Factor 0.1 %
RD
VGS
RGD.U.T.
10V
+
-VDD
Fig 18a. Switching Time Test Circuit
Fig 18b. Switching Time Waveforms
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TO-247AC package is not recommended for Surface Mount Application.
TO-247AC Package OutlineDimensions are shown in millimeters (inches)
Note: For the most current drawing please refer to IR website at http://www.irf.com/package/
AUFP2907Z
YWWA
XX or XX
Date Code
Y= Year
WW= Work Week
A= Automotive, LeadFree
Part Number
IR Logo
Lot Code
TO-247AC Part Marking Information
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Ordering InformationBase part Package Type Standard Pack Complete Part Number
Form QuantityAUIRFP2907Z TO-247 Tube 25 AUIRFP2907Z
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