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IRFP2907z 170A

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    AUIRFP2907Z

    08/13/2010

    www.irf.com 1

    AUTOMOTIVE GRADE

    PD - 97550

    Features

    Advanced Process Technology Ultra Low On-Resistance 175C Operating Temperature Fast Switching Repetitive Avalanche Allowed up to Tjmax Lead-Free, RoHS Compliant Automotive Qualified *

    DescriptionSpecifically designed for Automotive applications,this HEXFETPower MOSFET utilizes the latest pro-

    cessing techniques to achieve extremely low on-resistance per silicon area. Additional features of this

    design are a 175C junction operating temperature,

    fast switching speed and improved repetitive ava-lanche rating . These features combine to make this

    design an extremely efficient and reliable device foruse in Automotive applications and a wide variety of

    other applications.

    HEXFET Power MOSFET

    TO-247AC

    SD

    G

    D

    G D S

    Gate Drain Source

    HEXFET is a registered trademark of International Rectifier.

    *Qualification standards can be found at http://www.irf.com/

    Absolute Maximum RatingsStresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. Theseare stress ratings only; and functional operation of the device at these or any other condition beyond those indicated inthe specifications is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect devicereliability. The thermal resistance and power dissipation ratings are measured under board mounted and still air conditions.Ambient temperature (TA) is 25C, unless otherwise specified.

    Parameter Units

    ID

    @ TC

    = 25CContinuous Drain Current, VGS @ 10V A

    ID @ TC = 100C Continuous Drain Current, VGS @ 10V

    IDM Pulsed Drain Current c

    PD @TC = 25C Maximum Power Dissipation W

    Linear Derating Factor W/C

    VGS Gate-to-Source Voltage V

    EAS Single Pulse Avalanche Energy (Thermally Limited) d mJ

    EAS (tested) Single Pulse Avalanche Energy Tested Value i

    IAR Avalanche Current c A

    EAR Repetitive Avalanche Energy h mJ

    TJ Operating Junction and C

    TSTG Storage Temperature Range

    Soldering Temperature, for 10 seconds (1.6mm from case )

    Mounting torque, 6-32 or M3 screw

    Thermal Resistance

    Parameter Typ. Max. Units

    RJC Junction-to-Case j 0.49 C/W

    RCS Case-to-Sink, Flat, Greased Surface 0.24

    RJA Junction-to-Ambient 40

    10 lbfin (1.1Nm)

    310

    2.0

    20

    520

    690

    See Fig.12a,12b,15,16

    300

    -55 to + 175

    Max.

    170120

    680

    V(BR)DSS

    75V

    RDS(on) max. 4.5m

    ID 170AS

    D

    G

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    Notes:

    Repetitive rating; pulse width limited bymax. junction temperature. (See fig. 11).

    Limited by TJmax, starting TJ = 25C,

    L=0.13mH, RG = 25, IAS = 90A, VGS =10V.

    Part not recommended for use above this value.

    ISD 90A, di/dt 340A/s, VDD V(BR)DSS,

    TJ 175C.

    Pulse width 1.0ms; duty cycle 2%.

    Coss eff. is a fixed capacitance that gives the samecharging time as Coss while VDS is rising from 0 to 80% VDSS.

    Limited by TJmax , see Fig.12a, 12b, 15, 16 for typical repetitive

    avalanche performance.

    This value determined from sample failure population,

    starting TJ = 25C, L=0.13mH, RG = 25, IAS = 90A, VGS =10V.

    R is measured at TJ of approximately 90C.

    S

    D

    G

    Static Electrical Characteristics @ TJ = 25C (unless otherwise specified)

    Parameter Min. Typ. Max. UnitsV(BR)DSS Drain-to-Source Breakdown Voltage 75 V

    VDSS/TJ Breakdown Voltage Temp. Coefficient 0.069 V/CRDS(on) Static Drain-to-Source On-Resistance 3.5 4.5 mVGS(th) Gate Threshold Voltage 2.0 4.0 V

    gfs Forward Transconductance 180 S

    IDSS Drain-to-Source Leakage Current 20 A

    250

    IGSS Gate-to-Source Forward Leakage 200 nA

    Gate-to-Source Reverse Leakage -200

    Dynamic Electrical Characteristics @ TJ = 25C (unless otherwise specified)

    Parameter Min. Typ. Max. UnitsQg Total Gate Charge 180 270

    Qgs Gate-to-Source Charge 46 nC

    Qgd Gate-to-Drain ("Miller") Charge 65

    td(on) Turn-On Delay Time 19 nstr Rise Time 140

    td(off) Turn-Off Delay Time 97

    tf Fall Time 100

    LD Internal Drain Inductance 5.0 nH Between lead,

    6mm (0.25in.)LS Internal Source Inductance 13 from package

    and center of die contactCiss Input Capacitance 7500 pF

    Coss Output Capacitance 970

    Crss Reverse Transfer Capacitance 510

    Coss Output Capacitance 3640

    Coss Output Capacitance 650

    Coss eff. Effective Output Capacitance 1020

    Diode CharacteristicsParameter Min. Typ. Max. Units

    IS Continuous Source Current 90

    (Body Diode) AISM Pulsed Source Current 680

    (Body Diode)

    VSD Diode Forward Voltage 1.3 V

    trr Reverse Recovery Time 41 61 nsQrr Reverse Recovery Charge 59 89 nC

    ton Forward Turn-On Time Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)

    VDS = VGS, ID = 250A

    VDS = 75V, VGS = 0V

    VDS = 75V, VGS = 0V, TJ = 125C

    Conditions

    Conditions

    VGS = 0V, ID = 250A

    Reference to 25C, ID = 1mAVGS = 10V, ID = 90A f

    TJ = 25C, IF = 90A, VDD = 38V

    di/dt = 100A/s f

    TJ = 25C, IS = 90A, VGS = 0V f

    showing the

    integral reverse

    p-n junction diode.

    VGS = 0V, VDS = 1.0V, = 1.0MHz

    VGS = 10V f

    MOSFET symbol

    VGS = 0V

    VDS = 25V

    VGS = 0V, VDS = 60V, = 1.0MHz

    Conditions

    VGS = 0V, VDS = 0V to 60V

    = 1.0MHz, See Fig. 5

    RG = 2.5

    ID = 90A

    VDS = 25V, ID = 90A

    VDD = 38VID = 90A

    VGS = 20V

    VGS = -20V

    VDS = 60V

    VGS = 10V f

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    Qualification standards can be found at International Rectifiers web site: http//www.irf.com/

    Exceptions to AEC-Q101 requirements are noted in the qualification report.

    Qualification Information

    TO-247 MSL1

    RoHS Compliant Yes

    ESD

    Machine Model Class M4 (425V)

    AEC-Q101-002

    Human Body Model Class H2 (4000V)

    AEC-Q101-001

    Charged Device

    Model

    Class C5 (1125V)

    AEC-Q101-005

    Moisture Sensitivity Level

    Qualification Level

    Automotive

    (per AEC-Q101)

    Comments: This part number(s) passed Automotive

    qualification. IRs Industrial and Consumer qualification level

    is granted by extension of the higher Automotive level.

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    Fig 2. Typical Output CharacteristicsFig 1. Typical Output Characteristics

    Fig 3. Typical Transfer Characteristics Fig 4. Typical Forward Transconductance

    vs. Drain Current

    0.1 1 10 100

    VDS, Drain-to-Source Voltage (V)

    1

    10

    100

    1000

    10000

    ID,Drain-to-SourceCurrent(A)

    VGS

    TOP 15V10V8.0V7.0V6.0V5.5V5.0V

    BOTTOM 4.5V

    60s PULSE WIDTH

    Tj = 25C

    4.5V

    0.1 1 10 100

    VDS, Drain-to-Source Voltage (V)

    10

    100

    1000

    ID,Drain-to-SourceCurrent(A)

    4.5V

    60s PULSE WIDTH

    Tj = 175C

    VGS

    TOP 15V10V8.0V7.0V6.0V5.5V5.0V

    BOTTOM 4.5V

    2 4 6 8 10

    VGS, Gate-to-Source Voltage (V)

    0.1

    1

    10

    100

    1000

    ID,Drain-to-SourceCurrent()

    TJ = 25C

    TJ = 175C

    VDS = 25V

    60s PULSE WIDTH

    0 25 50 75 100 125 150

    ID,Drain-to-Source Current (A)

    0

    50

    100

    150

    200

    Gfs,ForwardTransconductance(S) TJ = 25C

    TJ = 175C

    VDS = 10V

    380s PULSE WIDTH

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    Fig 8. Maximum Safe Operating Area

    Fig 6. Typical Gate Charge vs.Gate-to-Source Voltage

    Fig 5. Typical Capacitance vs.Drain-to-Source Voltage

    Fig 7. Typical Source-Drain DiodeForward Voltage

    1 10 100

    VDS, Drain-to-Source Voltage (V)

    100

    1000

    10000

    100000

    C,Capacitance(pF)

    VGS = 0V, f = 1 MHZ

    Ciss = Cgs + Cgd, C ds SHORTED

    Crss = CgdCoss = Cds + Cgd

    Coss

    Crss

    Ciss

    0 50 100 150 200

    QG Total Gate Charge (nC)

    0.0

    2.0

    4.0

    6.0

    8.0

    10.0

    12.0

    VGS,Gate-to-SourceVoltage(V) VDS= 60V

    VDS= 38V

    VDS= 15V

    ID= 90A

    0.0 0.5 1.0 1.5 2.0 2.5

    VSD, Source-to-Drain Voltage (V)

    1

    10

    100

    1000

    ISD,ReverseDrainCurrent(A)

    TJ = 25C

    TJ = 175C

    VGS = 0V

    1 10 100 1000

    VDS, Drain-to-Source Voltage (V)

    0.1

    1

    10

    100

    1000

    10000

    ID,Drain-to-SourceCurrent(A)

    1msec

    10msec

    OPERATION IN THIS AREALIMITED BY R DS(on)

    100sec

    Tc = 25CTj = 175C

    Single Pulse

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    Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case

    Fig 9. Maximum Drain Current vs.Case Temperature

    Fig 10. Normalized On-Resistancevs. Temperature

    -60 -40 -20 0 20 40 60 80 100 120 140 160 180

    TJ , Junction Temperature (C)

    0.5

    1.0

    1.5

    2.0

    2.5

    RDS(on),Drain-to-SourceOnResistanc

    e

    (Normalized)

    ID = 90AVGS = 10V

    1E-006 1E-005 0.0001 0.001 0.01 0.1 1

    t1 , Rectangular Pulse Duration (sec)

    0.0001

    0.001

    0.01

    0.1

    1

    ThermalResponse(Z

    thJC

    )

    0.20

    0.10

    D = 0.50

    0.02

    0.01

    0.05

    SINGLE PULSE( THERMAL RESPONSE ) Notes:

    1. Duty Factor D = t1/t2

    2. Peak Tj = P dm x Zthjc + Tc

    Ri (C/W) i (sec)

    0.1224 0.000360

    0.1238 0.001463

    0.2433 0.021388

    J

    J

    1

    1

    2

    2

    3

    3

    R1

    R1

    R2

    R2

    R3

    R3

    C

    Ci= i/Ri

    25 50 75 100 125 150 175

    TC , Case Temperature (C)

    0

    25

    50

    75

    100

    125

    150

    175

    ID,

    DrainCurrent(A)

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    QG

    QGS

    QGD

    VG

    Charge

    10 V

    Fig 13b. Gate Charge Test Circuit

    Fig 13a. Basic Gate Charge Waveform

    Fig 12c. Maximum Avalanche Energy

    vs. Drain CurrentFig 12b. Unclamped Inductive Waveforms

    Fig 12a. Unclamped Inductive Test Circuit

    tp

    V(BR)DSS

    IAS

    Fig 14. Threshold Voltage vs. Temperature

    RG

    IAS

    0.01tp

    D.U.T

    LVDS

    +

    -VDD

    DRIVER

    A

    15V

    20VVGS

    1K

    VCCDUT

    0

    L

    25 50 75 100 125 150 175

    Starting TJ , Junction Temperature (C)

    0

    500

    1000

    1500

    2000

    2500

    EAS,SinglePulseAvalancheEnergy(m

    J)

    IDTOP 16A

    25A

    BOTTOM90A

    -75 -50 -25 0 25 50 75 100 125 150 175 200

    TJ , Temperature ( C )

    1.0

    1.5

    2.0

    2.5

    3.0

    3.5

    4.0

    VGS(th)GatethresholdVoltage(V)

    ID = 250A

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    Fig 15. Typical Avalanche Current Vs.Pulsewidth

    Fig 16. Maximum Avalanche Energyvs. Temperature

    Notes on Repetitive Avalanche Curves , Figures 15, 16:(For further info, see AN-1005 at www.irf.com)1. Avalanche failures assumption:

    Purely a thermal phenomenon and failure occurs at atemperature far in excess of Tjmax. This is validated forevery part type.

    2. Safe operation in Avalanche is allowed as long asTjmax isnot exceeded.

    3. Equation below based on circuit and waveforms shown inFigures 12a, 12b.

    4. PD (ave) = Average power dissipation per singleavalanche pulse.

    5. BV = Rated breakdown voltage (1.3 factor accounts forvoltage increase during avalanche).

    6. Iav = Allowable avalanche current.

    7. T = Allowable rise in junction temperature, not to exceedTjmax (assumed as 25C in Figure 15, 16).tav = Average time in avalanche.D = Duty cycle in avalanche = tav f

    ZthJC(D, tav) = Transient thermal resistance, see figure 11)

    PD (ave) = 1/2 ( 1.3BVIav) =DT/ ZthJC

    Iav =2DT/ [1.3BVZth]

    EAS (AR) = PD (ave)tav

    1.0E-05 1.0E-04 1.0E-03 1.0E-02 1.0E-01

    tav (sec)

    1

    10

    100

    1000

    AvalancheCurrent(A)

    0.05

    Duty Cycle = Single Pulse

    0.10

    Allowed avalanche Current vsavalanche pulsewidth, tav

    assuming Tj = 25C due toavalanche losses0.01

    25 50 75 100 125 150 175

    Starting TJ , Junction Temperature (C)

    0

    100

    200

    300

    400

    500

    600

    EAR

    ,AvalancheEnergy(mJ)

    TOP Single Pulse

    BOTTOM 1% Duty Cycle

    ID = 90A

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    Fig 17. Peak Diode Recovery dv/dt Test Circuit for N-ChannelHEXFETPower MOSFETs

    Circuit Layout Considerations

    Low Stray Inductance

    Ground Plane

    Low Leakage Inductance

    Current Transformer

    P.W.Period

    di/dt

    Diode Recoverydv/dt

    Ripple 5%

    Body Diode Forward Drop

    Re-AppliedVoltage

    ReverseRecoveryCurrent

    Body Diode ForwardCurrent

    VGS=10V

    VDD

    ISD

    Driver Gate Drive

    D.U.T. ISD Waveform

    D.U.T. VDS Waveform

    Inductor Curent

    D =P.W.

    Period

    * VGS = 5V for Logic Level Devices

    *

    +

    -

    +

    +

    +-

    -

    -

    RGVDD dv/dt controlled by RG

    Driver same type as D.U.T.

    ISDcontrolled by Duty Factor "D" D.U.T. - Device Under Test

    D.U.T

    VDS

    90%

    10%

    VGS

    td(on) tr td(off) tf

    VDS

    Pulse Width 1sDuty Factor 0.1 %

    RD

    VGS

    RGD.U.T.

    10V

    +

    -VDD

    Fig 18a. Switching Time Test Circuit

    Fig 18b. Switching Time Waveforms

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    TO-247AC package is not recommended for Surface Mount Application.

    TO-247AC Package OutlineDimensions are shown in millimeters (inches)

    Note: For the most current drawing please refer to IR website at http://www.irf.com/package/

    AUFP2907Z

    YWWA

    XX or XX

    Date Code

    Y= Year

    WW= Work Week

    A= Automotive, LeadFree

    Part Number

    IR Logo

    Lot Code

    TO-247AC Part Marking Information

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    Ordering InformationBase part Package Type Standard Pack Complete Part Number

    Form QuantityAUIRFP2907Z TO-247 Tube 25 AUIRFP2907Z

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    IMPORTANT NOTICE

    Unless specifically designated for the automotive market, International Rectifier Corporation and its

    subsidiaries (IR) reserve the right to make corrections, modifications, enhancements, improvements, andother changes to its products and services at any time and to discontinue any product or services without

    notice. Part numbers designated with the AU prefix follow automotive industry and / or customer specificrequirements with regards to product discontinuance and process change notification. All products are soldsubject to IRs terms and conditions of sale supplied at the time of order acknowledgment.

    IR warrants performance of its hardware products to the specifications applicable at the time of sale inaccordance with IRs standard warranty. Testing and other quality control techniques are used to the extent

    IR deems necessary to support this warranty. Except where mandated by government requirements, testingof all parameters of each product is not necessarily performed.

    IR assumes no liability for applications assistance or customer product design. Customers are responsiblefor their products and applications using IR components. To minimize the risks with customer products andapplications, customers should provide adequate design and operating safeguards.

    Reproduction of IR information in IR data books or data sheets is permissible only if reproduction is withoutalteration and is accompanied by all associated warranties, conditions, limitations, and notices. Reproduc-tion of this information with alterations is an unfair and deceptive business practice. IR is not responsibleor liable for such altered documentation. Information of third parties may be subject to additional restrictions.Resale of IR products or serviced with statements different from or beyond the parameters stated by IR for

    that product or service voids all express and any implied warranties for the associated IR product or serviceand is an unfair and deceptive business practice. IR is not responsible or liable for any such statements.

    IR products are not designed, intended, or authorized for use as components in systems intended for surgicalimplant into the body, or in other applications intended to support or sustain life, or in any other applicationin which the failure of the IR product could create a situation where personal injury or death may occur. Should

    Buyer purchase or use IR products for any such unintended or unauthorized application, Buyer shallindemnify and hold International Rectifier and its officers, employees, subsidiaries, affiliates, and distributorsharmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of,

    directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorizeduse, even if such claim alleges that IR was negligent regarding the design or manufacture of the product.

    IR products are neither designed nor intended for use in military/aerospace applications or environmentsunless the IR products are specifically designated by IR as military-grade or enhanced plastic. Onlyproducts designated by IR as military-grade meet military specifications. Buyers acknowledge and agreethat any such use of IR products which IR has not designated as military-grade is solely at the Buyers risk,and that they are solely responsible for compliance with all legal and regulatory requirements in connectionwith such use.

    IR products are neither designed nor intended for use in automotive applications or environments unlessthe specific IR products are designated by IR as compliant with ISO/TS 16949 requirements and bear a partnumber including the designation AU. Buyers acknowledge and agree that, if they use any non-designated

    products in automotive applications, IR will not be responsible for any failure to meet such requirements.

    For technical support, please contact IRs Technical Assistance Centerhttp://www.irf.com/technical-info/

    WORLD HEADQUARTERS:233 Kansas St., El Segundo, California 90245

    Tel: (310) 252-7105