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INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING Vol. 16, No. 11, pp. 2255-2264 OCTOBER 2015 / 2255
© KSPE and Springer 2015
Investigation of Lock-in Infrared Thermography for
Evaluation of Subsurface Defects Size and Depth
Shrestha Ranjit1, Kisoo Kang2, and Wontae Kim1,#
1 Department of Mechanical & Automotive Engineering, Kongju National University, 1223-24, Cheonan-daero, Seobuk-gu, Cheonan-si, Chungcheongnam-do, 31080, South Korea2 Rolling Technology Development Team, Technical Research Center, Hyundai Steel Co., 1480, Bukbusaneop-ro, Songak-eup, Dangjin-si, Chungcheongnam-do, 31719, South Korea
# Corresponding Author / E-mail: [email protected] , TEL: +82-41-521-9289, FAX: +82-41-555-9123
KEYWORDS: Amplitude image, Finite element analysis, Image processing, Lock-in thermography, Phase image, Signal to noise ratio
In this study, the investigation on lock-in infrared thermography was done for the detection and estimation of artificial subsurface
defects size and depth in stainless steel sample. The experimental and the finite element analysis were performed at several excitation
frequencies to interrogate the sample ranging from 0.182 down to 0.021 Hz. A finite element model using ‘ANSYS 14.0’ was used
to completely simulate the lock-in thermography. The four point method was used in post processing of every pixel of thermal images
using the MATLAB programming language. A signal to noise ratio analysis was performed on both phase and amplitude images in
each excitation frequency to determine the optimum frequency. The relationship of the phase value with respect to excitation frequency
and defect depths was examined. Amplitude image was quantitatively analyzed using Vision Assistant, a special tool in LABVIEW
program to acquire the defects size. The phase image was used to calculate the defects depth considering the thermal diffusivity of
the material and the excitation frequency for which the defects become visible. A finite element analysis result was found to have good
correlation with experimental result and thus demonstrated potentiality in quantification of subsurface defects.
Manuscript received: January 20, 2015 / Revised: May 26, 2015 / Accepted: August 4, 2015
1. Introduction
Stainless steel (STS) is an alloy of iron with a minimum of 10.5%
chromium. Due to its corrosion resistance and strength, STS is an
attractive material for many industrial, architectural, chemical,
consumers and a variety of applications.1 High quality of materials and
structures is an important factor in many areas of human activities.2 A
major effort to reach the high level of quality is to implement various
inspection tasks. Non-destructive testing (NDT) is one of the most
important means to detect and verify the quality of items.3 The
requirements for NDT is driven by the need for low cost methods and
instruments with great reliability, sensitivity, user friendliness, high
operational speed as well for applicability to increasingly complex
materials and structures.4 Temperature is one of the most common
indicators of the structural health of equipment and components. Faulty
machineries, corroded electrical connections and damaged material
components can cause abnormal temperature distribution.5 In this
context, Infrared Thermography (IRT) is an emerging NDT and
evaluation technique that allows the non-contact inspection and
monitoring of systems and materials through a mapping of thermal
patterns on the surface of the objects of interest.6-8 NDT using active
IRT provides information on material, structure, physical & mechanical
properties, discontinuities and defects present on the analyzed
specimen.9
Defect detection principle in IRT is based on the fact that a
difference in thermal properties exists between the sound and a defective
area, which can be used for defect detection and quantification
purposes.10-12 Lock-in thermography (LIT) facilitates better subsurface
defect detection than ordinary infrared thermography because the
thermal wave is very sensitive to interfaces between materials and less
NOMENCLATURE
IRT = Infrared Thermography
FEA=Finite Element Analysis
LIT=Lock-in Thermography
NDT=Non-destructive Testing
SNR=Signal Noise Ratio
STS=Stainless Steel
DOI: 10.1007/s12541-015-0290-z ISSN 2234-7593 (Print) / ISSN 2005-4602 (Online)
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sensitive to non-uniform emission and surrounding conditions.13 The
concept of LIT was appeared in 1980s concerning electronic device
testing and became popular in the 1990s in connection with the NDT
and evaluation of materials. One of active research by employing IRT
technology is in detecting the defect and estimating the depth of that
defect. G. Busse highlights the significance of using the phase angle as
a measure of depth and further developed a method of subsurface
imaging.14,15 G. Busse then suggested the use of a focal plane infrared
detector together with remote lamps in a thermographic technique.16
Meola et al. have investigated the effects of defect size, depth, and
thickness in composite panels using LIT.17 V.P. Vavilov and R. Taylor
developed an empirical rule; the radius of the smallest defect should be
at least one to two times larger than its depth under the surface.18 X.
Maldague and S. Marinetti developed the Pulse Phase Thermography
(PPT) by combining the advantages of both LIT and Pulse Thermography
without sharing their drawbacks.19,20 Wu and Busse demonstrated that
LIT can eliminate all disturbances such as surrounding reflections, local
variations of surface optical absorption and infrared emission coefficient,
and inhomogeneous illumination by heating sources.21 Choi evaluated
the sizes and locations of subsurface defects by using LIT and showed
that a phase difference between the defective area and the healthy area
indicates the qualitative location and size of the defect.22
In LIT, energy is delivered to the specimen’s surface in the form of
periodic thermal waves and thermograms (Thermal Images) are captured
under the periodic sinusoidal heating. The excitation frequency is chosen
based on the diffusion length of a thermal signal and the images are
extracted.23-25 The size of defects can be measured directly from the
thermal images by exactly knowing the spatial resolution of the employed
optic.17 However, detailed information about defect parameters such as
size, depth and thermal resistance can be obtained by applying post-
processing procedures to the thermograms. LIT typically use amplitude
and phase measurements for the assessment of underlying defects. The
phase and amplitude information calculated by processing of recorded
thermal images for each of the pixels are stored in the form of 2D
matrices and subsequently converted to images known as phase image
and amplitude image.26-29 The amplitude image displays total temperature
increase on the system during power cycling and phase image represents
the time delay between powering a device and subsequent heating on
the surface. Amplitude images are quantitatively analyzed to acquire
the defect shape & size and phase image for defect’s depth.
Finite Element Analysis (FEA) is used to predict the experimental
results since the experiments are difficult to implement and they are
costly. Modeling of IRT helps to obtain the physical insight of the
thermal phenomena occurring during and after thermal excitation of
structures and helps fully understand all the aspects of their thermal
behavior. FEA is widely adopted by many industries and researchers for
modeling and simulation because it is faster and cheaper than physical
testing. However, the test validation is generally compulsory.30-32
This paper presents the experimental investigation and FEA model
to simulate the thermal phenomena in IRT for evaluation of subsurface
defect size and depth. A reference STS 304 specimen with known
artificial defects of flat bottomed holes of different size and depth was
used for the analysis. Amplitude and phase images were acquired by
post processing of thermal images using LIT. Finally, the data was
processed in MATLAB and LABVIEW for the measurement of defect
size and depth.
2. Principle of Lock-in Infrared Thermography
The periodical transfer of heat at the surface of a homogeneous
semi-infinite material results in a thermal wave, which in one dimension
is given by,6,9,29
(1)
where, T0 [°C] is initial change in temperature produced by the heat
source, ω [rad/s] is the modulation frequency, A(z) is the thermal
amplitude, is the phase, f [Hz] is the frequency, λ [m] is thermal
wavelength, z [mm] is the defect depth, and µ [m] is thermal diffusion
length which determines the rate of decay of thermal wave as it
penetrates through a material and defined by,4,6,10
(2)
From the Eq. (1), we can get the phase difference (Φ), which is
related to the defect depth as,24
(3)
In lock in thermography, after externally heating the specimen
sinusoidally, the resultant temperature distribution on the surface is
observed in the stationary regime and the corresponding data is recorded
in real time. The four point method is used to determine the phase and
amplitude data. If S1, S2, S3 and S4 are four equidistant temperature data
points as shown in Fig. 1 in a complete period then the phase ( ) and
amplitude (A) are given by,3,10
(4)
(5)
Tz t,
T0
z
µ---–⎝ ⎠
⎛ ⎞ i ωtz
µ---–⎝ ⎠
⎛ ⎞expexp A z( ) i ωt ∅ z( )–[ ]exp= =
∅ z( )
µ2α
ω-------
α
π f-----= =
∅z
µ---=
∅
∅S1
S3
–
S2
S4
–--------------⎝ ⎠⎛ ⎞1–
tan=
A S1
S3
–( )2 S2
S4
–( )2+=
Fig. 1 Principle of computation of thermal, amplitude and phase
images in lock-in thermography
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3. Materials and Methods
3.1 Experimental approach
In the present investigation, a square shaped (180 m * 180 mm) STS
304 specimen with 10 mm thickness and artificial defects with circular
cutouts of varying depth and diameter at the back side was manufactured.
The idealized shape of a circular defect was chosen to illustrate the
effects of geometry on the observed thermal response. Each column of
cutouts in the STS plate represents defects of constant diameter but of
varying depth from upper row to lower row. The Fig. 2 shows the detail
of the geometry of the specimen with artificial defects and Table 1
shows the detail of the defects size and depth considered in the
investigation.
The success of LIT technique eventually depends on the quality of
the raw thermograms. Good thermograms are obtained when the test
specimen is a perfect blackbody. The sound side of the plate was
painted with KRYLON flat black paint which has an emissivity of
approximately 0.92. The specimen was painted black to increase the
surface emissivity of the specimen and provide a uniformly emissive
surface. The Fig. 3(a) shows the front side of the specimen with black
paint and the Fig. 3(b) shows the rear side with artificial defects.
Experimental tests were performed using excited LIT in the
reflection mode. A sinusoidal thermal source was used to excite the
surface of a specimen. The thermal excitation source consisted of two
halogen lamp of 1 kW each, driven by power amplifier and a function
generator. A programmable function generator (Agilent 33210A,
Malaysia) was used for the generation of sine waves. For detection of
thermal waves, infrared camera (SC645, FLIR Systems, Sweden) was
used which has a 640*480 pixel resolution and sensitivity of 7.5-13 µm.
An IR lens of 41.3 mm with spatial resolution 0.41 mrad and dynamic
range of 14 bit was used with the camera, positioned to fully utilize the
field of view encompassing the entire specimen. Images were acquired
by using FLIR R&D software. The camera frame rate was set to 50
frames per second with acquisition times for each frequency. The Fig.
4 shows the schematic of experimental LIT testing device configuration.
For a correct non-destructive evaluation, it is necessary to know the
thermal diffusivity, thickness of the object under inspection and
appropriate selection of wave frequencies. One of the main drawbacks
of LIT is that blind frequencies affect the defect detection. If a wrong
excitation frequency is chosen, a defect might be loss. To address this
shortcoming, lock-in test were performed at multiple frequencies.
Practically, any frequency in the range from 0.01 to 0.09 Hz can be
used for lock in thermography.15 For the accurate selection of excitation
frequency range, the diffusion length for the defect depth of 5, 6, 7 and
8 mm were calculated in terms of amplitude and phase image. During
the calculation, the depth range of µ and 1.8 µ were considered for the
Fig. 2 Geometry of specimen with artificial defects
Table 1 Details of defects size and depth
Hole Number Diameter(mm) Depth (mm)
A1 16 8
A2 4 8
A3 8 8
A4 12 8
B1 16 5
B2 4 5
B3 8 5
B4 12 5
C1 16 7
C2 4 7
C3 8 7
C4 12 7
D1 16 6
D2 4 6
D3 8 6
D4 12 6
Fig. 3 STS Model Specimen, (a) Front Side with black paint, and (b)
Rear Side with flat bottomed holes
Fig. 4 Schematic of LIT testing device configuration
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amplitude image and phase image respectively. The Table 2 shows the
calculated diffusion length and the range of excitation frequency for the
different defect depth in STS specimen. From the Table 2, it is known
that a thermal wave can penetrate deeper at low frequencies.
3.2 Finite Element Analysis (FEA)
To simulate the thermographic inspection, 3D heat flow simulation
model has been developed by using a commercial finite element
modeling computer package ‘ANSYS Version 14.0’. In FEA modeling,
the same geometry and the artificial defects were considered which were
used in the experiment. The Fig. 5(a) shows the front side of FEA
model and the Fig. 5(b) shows the rear side of FEA model with artificial
defects. During meshing, a tetrahedral meshing was adapted to the
various domains of the sample. Physical preference was taken as
mechanical with relevance 100, relative center was kept in fine mode,
proximity and curvature was on in advanced size function in order to
calculate temperature variations with sufficient spatial resolution. The
resultant mesh had 655,015 elements and 940,245 nodes. The finite
element model of the specimen with meshing is shown in Fig. 5(c). The
thermal analysis was considered for recording the temperature time
histories to determine the phase difference associated with the frequency
of the sinusoidal wave form. The thermal properties and geometrical
parameters considered for FEA-model are shown in the Table 3.
In this model, the influence of radiative and convective heat transfer
is neglected. The boundary condition for the heat flux can be written
in the following form,4,32
(6)
where, is the term which describes the heat flux on the irradiated
surface.
The ambient temperature Tamb
measured in the room was used both
as boundary condition and initial condition since it was assumed that
the specimen was in equilibrium with the environment at room
temperature before the experiment started. The initial condition is,
(7)
The front surface of the plate is subjected to plane harmonic heat.
The equation, which represents the heat source and generate a continuous
sinusoidal wave is given by,11,23
(8)
where, Q0 is the intensity of heat source, ω is the angular modulation
frequency and t is the time.
Once the thermal sinusoidal wave hits the material, its response also
k.∇T( ) ∅0
=
∅0
T x y z t = 0, , ,( ) Tamb
24°C= =
qQ
0
2------ 1 ω t( )cos+( )=
Table 2 Theoretically calculated diffusion length and excitation
frequency for different defects depth
Defect
Depth
(mm)
Amplitude Image Phase Image
Diffusion
length (mm)
Frequency
(Hz)
Diffusion
length (mm)
Frequency
(Hz)
8 8.07 0.021 4.39 0.071
7 6.99 0.028 3.84 0.093
6 6.00 0.038 3.30 0.126
5 4.99 0.055 2.74 0.182
Fig. 5 FEA Model, (a) Front Side, (b) Rear Side with flat bottom
holes, and (c) Meshing description
Table 3 Geometrical parameters and thermal properties of STS 304
Length (X) 0.18 m
Length (Y) 0.18 m
Length (Z) 0.01 m
Mass (m) 2.4822 kg
Volume (v) 3.142E-4 m3
Thermal Conductivity (k) 16.2 W/m/oC
Specific Heat (C) 477 J/kg/oC
Density (ρ) 7900 kg/m3
Initial Temperature 24 oC
Nodes 940,245 No.
Elements 655,015 No.
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INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING Vol. 16, No. 11 OCTOBER 2015 / 2259
becomes sinusoidal in nature with both phase and amplitude. The Fig.
6(a) and 6(b) shows the nature of excitation heat flux by a time varying
sinusoidal wave for the frequency of 0.182 Hz and 0.021 Hz respectively.
The temperature of all the nodes is computed considering the thermal
properties of the material and the thermal exchanges between the nodes
and with the external environment. The thermal data were then analyzed
by applying an image processing algorithm to these temporal series of
images representing the evolution of the temperature at the excited
surface.
4. Results and Discussion
The experimental analysis and the finite element analysis was carried
out for the 4 complete excitation cycles at the frequency ranging from
0.182 Hz (21.96 sec) down to 0.021Hz (190.48 sec). During heat
excitation thermal images represented with x, y coordinates are captured
by IR camera. The sequence of thermal images is monitored and recorded
in time. Some examples of thermal, amplitude and phase images
obtained from both the experimental and finite element analysis at
different frequencies will be discussed in this section.
In the thermal image, each pixel represents a temperature value. For
the comparison of surface temperature distribution between varying
defects diameter and depth, the measurement profile A-A’ and C-C’
were created along the defects A1, A2, A3 & A4 with defect depth of 8
mm and along the defects C1, C2, C3 & C4 with defect depth of 7 mm
as shown in Fig. 7(a). The thermal image at frequency 0.071 Hz and
time 21.13 second was considered for the analysis. From the Fig. 7(b)
and 7(c), it is observed that high heat flow value gives a greater
temperature difference in the defects surface and is favorable for the
Fig. 6 Input heat flux with time for, (a) 0.182 Hz (b) 0.021 Hz
Fig. 7 Temperature Distribution, (a) Thermal Image at frequency 0.071
Hz and time 21.13 sec (b) Temperature distribution profile along the
line A-A’ and (c) Temperature distribution profile along the line C-C’
Table 4 Time calculation for the selection of images
Frequency
(HZ)
Time (Sec) Image (with respect to time)
Cycle
time
Image
interval1st 2nd 3rd 4th
0.182 5.49 1.37 8.24 9.62 10.99 12.36
0.126 7.94 1.98 11.90 13.89 15.87 17.86
0.093 10.75 2.69 16.13 18.82 21.51 24.19
0.071 14.08 3.52 21.13 24.65 28.17 31.69
0.055 18.18 4.55 27.27 31.82 36.36 40.91
0.038 26.32 6.58 39.47 46.05 52.63 59.21
0.028 35.71 8.93 53.57 62.50 71.43 80.36
0.021 47.62 11.90 71.43 83.33 95.24 107.14
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defect detection. The thermal contrast depends on the variation of the
defect depth and increases with the defect depth. From the comparison
of experimental and FEA results, it was also found that the temperatures
obtained experimentally are higher than those obtained from FEA
although they have similar trends.
The thermal images were selected from the 2nd cycle for each
excitation frequencies and then post-processed to determine the phase
and amplitude of the periodic temperature change at the specimen
Fig. 8 Thermal, Amplitude and Phase Image at frequency 0.182 Hz,
(a) Experimental Analysis and (b) FEA
Fig. 9 Thermal, Amplitude and Phase Image at frequency 0.071 Hz,
(a) Experimental Analysis and (b) FEA
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surface. The four point method was used in post processing every pixel
of thermal images using the MATLAB programming language. The
Table 4 shows the list of selected thermal images with respect to time
at different frequencies for post processing.
The thermal, amplitude and phase images obtained by LIT from
experimental investigation and FEA at 0.182 Hz, 0.071 Hz and 0.021
Hz using the Eqs. (4) and (5) are shown in Figs. 8, 9 and 10. As per
the experimental results, it is observed that no defects were detected at
the highest frequency 0.182 Hz. As the frequency decreased to 0.126
Hz, the contrast begins to improve and when it goes down to 0.021 Hz,
the surface defects in phase and amplitude become more visible. It is
observed that information about deeper feature was available when
lower frequencies were used although testing time become quite long.
But in case of finite element analysis, the defects were visible in all the
cases of excitation frequency however as the frequency goes down the
thermal contrast increases which tend to increase the noise in the
images. It is also observed that the maximum phase information was
obtained at high frequency 0.182 Hz and the maximum amplitude
information at low frequency 0.021 Hz. Compared to experimental
results, the finite element analysis has higher capability to detect the
size of subsurface defects in an amplitude image due to the larger
temperature difference between defective regions and non-defective
one.
Signal to Noise Ratio (SNR) is the decisive quantity that determines
how small a defect or any other feature can be detectable. The SNR is
the ratio of the strength of the signal and the strength of the noise. SNR
describes the contrast between a defective area and its neighborhood.33
SNR analysis was performed on both phase and amplitude images in
each excitation frequency to determine the optimum frequency at which
the highest signal to noise ratio was recorded. For this purpose, two
Fig. 10 Thermal, Amplitude and Phase Image at frequency 0.021 Hz,
(a) Experimental Analysis and (b) FEA
Fig. 11 SNR of Phase and Amplitude Image as a function of excitation
Frequency, (a) Experimental Analysis and (b) FEA
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areas for each defect are selected; an area in the defect that will be
considered as ‘signal’ and an area around the defect defined as ‘Noise’.
From the Fig. 11, it is observed that with increment in excitation
frequency, the SNR of phase image increases while at the same time the
SNR of amplitude image goes down in both experimental investigation
and FEA. So 0.071 Hz was selected as a blind frequency where SNR
is maximum and the maximum numbers of defects are visible for both
amplitude and phase image. Although the SNR is high and maximum
number of defects is visible in the range of 0.071 Hz down to 0.055 Hz
in both FEA and experimental analysis, the information about the
deeper defects is not effective. So the optimum frequency of 0.021 Hz
was considered for the analysis where phase difference between the
sound area and defective area was found minimum.
Phase difference was evaluated by subtracting the phase value
located centrally over the defects from the phase value measured in the
sound area near the defects. Analysis of phase image was performed in
relation to excitation frequency and defect depth. The Fig. 12 shows the
plot of defect’s phase as a function of excitation frequency. The defect
A1 with larger diameter 16 mm and deeper depth 8 mm is chosen for
the analysis. It is observed that with increase in excitation frequency,
the phase difference between the sound area and the defective area
increases for the same defect size and depth. The Fig. 13 shows the
phase measured over the defects as a function of defect depth for a
thermal excitation frequency of 0.021 Hz. Again the same defect A1
with larger diameter 16 mm and varying depth of 5 mm, 6 mm, 7mm
and 8 mm is chosen for the analysis. It was found that, the phase
difference increases with the defect’s depth.
The size of defect was evaluated by considering the amplitude image
which displayed the better contrast. For this, Vision Assistant, a special
tool in LABVIEW Program was used. By default, Vision assistant returns
measurement in pixel units. For the inspection to return measurement
in the real world units, mapping of pixel units in real world units was
done through a process called spatial calibration. Phase image was used
for calculating the defect’s depth. The variation in the high and low
phase values produce by the defect was exploited to evaluate the depth
of defects. The depth of a defect was calculated by using Eq. (3) and
considering the thermal diffusivity of the material and the heating
frequency for which defects become visible. The Table 5 shows the
results obtained from experimental and FEA data quantification at the
optimum frequency of 0.021 Hz.
Finally, it is observed that, the defects A1 (Diameter Size 16 mm &
Defect Depth 8 mm), A4 (Diameter Size 12 mm & depth 8 mm), C1
(Diameter Size 16 mm & depth 7 mm) and C4 (Diameter Size 12 mm
& depth 8 mm) are detachable and measurable in both the FEA and
experimental analysis. The defects A2, B2, C2 & D2 with the minimum
diameter size 4 mm and depths 8, 5, 7 and 6 mm respectively were not
detachable in both the FEA and experimental analysis. As compared to
Fig. 12 Plot of phase difference Vs. thermal excitation frequency
Fig. 13 Phase value for 16 mm diameter as a function of defect depth
Table 5 Estimated defect size and depth
HoleActual Experimental FEA
Diameter Depth Diameter Depth Diameter Depth
A1 16 8 16.20 7.95 16.10 8.28
A2 4 8 - - - -
A3 8 8 - - 8.05 8.55
A4 12 8 11.71 6.16 12.20 8.32
B1 16 5 - - 16.59 5.55
B2 4 5 - - - -
B3 8 5 - - - -
B4 12 5 - - - -
C1 16 7 14.59 7.08 14.15 8.79
C2 4 7 - - - -
C3 8 7 - - 8.29 7.68
C4 12 7 9.95 6.06 12.44 7.26
D1 16 6 - - 16.1 6.47
D2 4 6 - - - -
D3 8 6 - - - -
D4 12 6 - - 11.71 6.70
Fig. 14 Error % as a function of defect size
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experimental results, the defects; A3 (Diameter size 8 mm and depth 8
mm); B1 (Diameter size 16 mm and depth 5 mm); C3 (Diameter size
8 mm and depth 7 mm); D1 (Diameter 16 mm and depth 6 mm) and
D4 (Diameter 12 mm and depth 6 mm) are more clearly visible and
measureable although the optimum frequency for each defect is
different measurement accuracy is low. The Figs. 14 and 15 shows the
errors present in quantification of defects which were noticeable in both
experimental investigation and FEA. From the both Figs. 14 and 15, it
is found that due to change in the defect size the error percentage varies
for the same defect depth. It is also observed that the defects with
radius to depth ratio 1 or greater than 1 are found to be detectable with
high accuracy.
5. Conclusion
This study explored the use of LIT and image processing algorithms
for quantitative assessment of sub-surface defects in STS 304 material.
The results shows, infrared thermography is a reliable non-destructive
method for detecting the defects size and depths and the detachability
improves as the defect radius to defect depth ratio approximates unity.
A finite element analysis was found to have good correlation with
experimental data and thus demonstrate potential in providing improved
estimates of defect depth.
The detachability of subsurface defects by LIT depends on material
properties, defect size and depth, geometry and surface finish of the
component, IR Camera thermal sensitivity, excitation frequency, heating
power etc.
So it is realized that the development of algorithm by considering the
defect size will help to improve the efficiency of LIT for the calculation
of the defects depth. Furthermore, comparing the experimental results
with the FEA, the visibility of defects in experiment is limited by
structural and apparatus noise. The structural noise depends on the
material characteristics and on the boundary conditions and is difficult
is to eliminate. The detector noise can be reduced by using modern
FPA cameras with high sensitivity and spatial resolution.
ACKNOWLEDGEMENT
This work was supported by the National Research Foundation of
Korea (NRF) grant funded by the Korea government (NRF-2010-0023
353) and, by the Human Resources Development program (No. 201540
30200940) of the Korea Institute of Energy Technology Evaluation and
Planning (KETEP) grant funded by the Korea government Ministry of
Trade, Industry and Energy.
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