Introduction to GR228X Test Systems

Symbol on equipment signifies that the manual containsinformation to prevent injury or equipment damage. Refer topage vi and to other manuals in set.

IEC417!

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NT Version

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ii

Copyright GenRad, Inc. 1999. All rights reserved under copyright laws of the United States and other countries. The technical dataincluded herein, excluding computer software documentation, is subject to the LIMITED RIGHTS as set forth in FAR 52.227-15 (JUN1987) and DFARS 252.227-7015 (JUN 1995). All technical data and computer software documentation contained herein isproprietary and confidential to GenRad, Inc. or its licensor. All computer software documentation contained herein is CommercialComputer Software Documentation, proprietary to GenRad, Inc. or its licensor and furnished under limited license only. Forsolicitations issued by the United States, its agencies or instrumentalities (the “Government”) on or after December 1, 1995 and theDepartment of Defense (“DoD”) on or after September 29, 1995, the only rights provided in the Commercial Computer SoftwareDocumentation shall be those specified in a license customarily provided to the public by GenRad, Inc. in accordance with FAR12.212 (a) and (b) (OCT 1995) or DFARS 227.7202-3 (a) (JUN 1995). For solicitations issued before December 1, 1995 by theGovernment (other than DoD) use, duplication or disclosure of the documentation shall be subject to the RESTRICTED RIGHTS asset forth in subparagraph (c) (1) and (2) of the commercial computer software – restricted rights clause at FAR 52.227-19 (JUN1987). For solicitations issued before September 29, 1995 by DoD: RESTRICTED RIGHTS LEGEND – The use, duplication, ordisclosure by the Government is subject to restrictions as set forth in subparagraph (c) (1) (ii) of the Rights in Technical Data andComputer Software clause at DFARS 252.227-7013 (OCT 1988).

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Product names listed are trademarks of their respective manufacturers. Company names listed are trademarks or trade names oftheir respective companies.

The material in this manual is for informational purposes only and is subject to change, without notice. GenRad assumes noresponsibility for any error or for consequential damages that may result from the use or misinterpretation of any of the proceduresin this publication.

iii

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We at GenRad strive to achieve the highest possible customer satisfaction through innovative products and services,and continuous improvement of our product quality and support.

To help us achieve our goal, we ask that you:

� Please fill out and return the Reader Comments card, located at the back of this manual, if you have anysuggestions for structure or content improvements.

� Please document any product problems or enhancement requests on the GenRad System PerformanceReport forms, supplied with the equipment documentation, and return them to the GenRad CustomerCare Center (CCC). The contact addresses are in the Preface of this manual.

Thank you for choosing GenRad as your integrated diagnostic solutions provider.

v

December, 1999

Total number of pages in this publication is 114.

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Manual and Binder Reorder No.DateIssueOriginal

Page No. Issue

Title Original. . . . . . . . . . . . . . . . . . . . .

ii through xvii Original. . . . . . . . . . . .

1–1 through 1–15 Original. . . . . . . . .




A–1 through A–3 Original. . . . . . . . . .

Index–1 through Index–5 Original. . .

N/AManual Reorder No.9007–4008–03

vi

WARNINGS

� Do not remove covers. Potentially lethal voltages are present inside the system. Observe all WARNING markings on the equip-ment and WARNING notices in the manual. If servicing is necessary, it should be performed only by a qualified person familiarwith the electrical shock hazards present inside the system.

� Grounding circuit continuity is vital for safe operation of the equipment. Never operate equipment with grounding conduc-tor disconnected.

� Safeguard your hands and fingers while handling any fixture or other accessory. Be sure it is securely supported if youreach under it. If it is heavy, you must have another person help to move it.

� The symbol !IEC417 on equipment signifies that the manual contains information to prevent injury or equipment damage.

Observe and heed all WARNING notices in the manuals and the equipment. WARNINGS call attention to personnel safe-ty information.

� Replace any fuse only with the same type and ratings as labeled on the equipment and/or listed in the manual.

MISES EN GARDE

� Ne pas enlever les couvercles. Les niveaux de tension se trouvant dans le système sont extrêmement dangereux.Respectez toutes les consignes de sécurité figurant sur l’équipement et les MISES EN GARDE données dan cemanuel. Seule une personne qualifée, connaisant les risques de décharge électrique du système, est autorisée àeffecteur les opérations de nettoyage ou de réparation du système.

� Le circuit doit être mis à la terre sans discontinuation pour garantir un fonctionnement sans danger de l’équipement. Nejamais faire fonctionner l’équipement pendant que le raccord à la terre est déconnecté.

� Protégez–vous les mains et les doigts pendant le maniement de tout dispositif de serrage ou autre accessoire.Assurez–vous que ceux–ci soient bien solidement fixés en place, avant de vous pencher sous eux. Si l’accessoire enquestion est trop lourd, faites–vous aider pour le déplacer.

� Le symbole !IEC417 figurant sur l’équipement signifie que le manuel contient des informations permettant d’empêcher

les accidents ou l’endommagement de l’équipement. Respectez toutes les consignes de MISES EN GARDE donnéesdans le manuel et figurant sur l’équipement. Les MISES EN GARDE attirent l’attention sur la nécessité de se protéger.

� Ne remplacez les fusibles qu’avec des fusibles du même type et de la même valuer que ceux mentionnés sur l’équipe-ment et figurant dans le manuel.

WARNHINWEISE

� Abdeckungen nicht entfernen. Potentiell lebensgefährliche Spannungsbedingungen innerhalb des Systems vorhanden. Alleauf der Einrichtung befindlichen WARNMARKIERUNGEN und im Handbuch enthaltenen WARNHINWEISE beachten.Wartungsarbeiten dem qualifizierten Personal überlassen, das mit den innerhalb des Systems vorhandenen Gefahren eineselektrischen Schlags vertraut ist.

� Die Erdung des Schaltungsdurchgangs ist eine Grundvoraussetzung für den sicheren Betrieb der Einrichtung.Einrichtung niemals ohne Erdleiter betreiben.

� Hände und Finger bei der Handhabung einer Spannvorrichtung oder eines anderen Zubehörteils schützen. Sich vor derPlazierung der Hände unterhalb der Einrichtung vergewissern, daß die Einrichtung über ausreichenden Halt verfügt. Falls dieEinrichtung schwer ist, sich von einer anderen Person beim Tragen helfen lassen.

� Das auf der Einrichtung befindliche Symbol !IEC417 bedeutet, daß das Handbuch Informationen zur Verhinderung von

Körperverletzungen oder Sachschäden enthält. Alle in den Handbüchern enthaltenen und auf der Einrichtung befindlichenWARNHINWEISE beachten und befolgen. WARNHINWEISE sollen auf Informationen zur persönlichen Sicherheit aufmerksammachen.

� Sicherungen nur durch Sicherungen des gleichen Typs und der gleichen Nennleistung ersetzen. Auf der Einrichtung befindlicheEtiketten und im Handbuch enthaltene Informationen zu Rate ziehen.

vii

AVISOS

� Não remova as tampas. Há voltagens potencialmente fatais presentes na parte interna do sistema. Observe todas asmarcações de AVISOS no equipamento e discrições de AVISOS no manual. Se for necessário fazer manutenção, estadeve ser feita somente por uma pessoa qualificada familiarizada com os perigos de choques elétricos presentes na parteinterna do sistema.

� A continuidade do circuito de aterramento é vital para a operação segura do equipamento. Nunca opere o equipamentocom o cabo de aterramento desligado.

� Proteja as suas mãos e dedos ao operar qualquer dispositivo ou outro acessório. Certifique–se que ele esteja suportadocom segurança se você tiver que alcançar algo debaixo dele. Se for pesado, você deve ter a ajuda de uma outra pessoapara movê–lo.

� O simbolo !IEC417 no equipamento significa que o manual contém informações para prevenir ferimentos ou danos ao

equipamento. Observe e preste atenção a todos os AVISOS nos manuais e no equipamento. Os AVISOS chamam a atenção a informações sobre a segurança pessoal.

� Substitua qualquer fusivel somente com um do mesmo tipo e da mesma capacidade nominal como marcado no equipamen-to e listado no manual.

ADVERTENCIAS

� No quitar las tapas. En el interno del sistema hay voltajes potencialmente mortales. Obsérvense todos los rótulos deADVERTENCIA presentes en el equipo, así como la descripción de las notas de ADVERTENCIA presentadas en el man-ual. De ser necesario, el servicio de mantenimiento deberá ser efectuado únicamente por personal calificado que estéfamiliarizado con los peligros de choque eléctrico presentes en el sistema.

� La continuidad del circuito de puesta a tierra es de vital importancia para el functionamiento seguro del equipo. Nuncase debe usar el equipo con el conductor de puesta a tierra desconectado.

� Protéjanse las manos y los dedos toda vez que sea necesario manipular un dispositivo u accesorio. Cerciorarse de queel mismo esté firmemente sujetado antes de proceder a trabajar debajo de él. Si el aparato u accesorio fuera pesado,pedir la ayuda de otra persona para moverlo.

� El simbolo !IEC417 que aparece en el equipo significa que el manual contiene informaciones para evitar lesiones per-

sonales o daños al equipo. Obsérvense y préstese atención a toda las notas de ADVERTENCIA presentes en los manu-ales y en el equipo. Las ADVERTENCIAS sirven para llamar la atención sobre informaciones de seguridad para el per-sonal.

� Reemplazar los fusibles únicamente con otros del mismo tipo y capacidad, según lo indique el rótulo en el equipo y ladescripción en el manual.

viii

CAUTIONS

� Observe and heed all CAUTION notices in the manuals and on the equipment. CAUTIONS call attention to informationabout safeguarding equipment from damage.

HANDLING PRECAUTIONS FOR ELECTRONIC DEVICES SUBJECT TO DAMAGE BY STATIC ELECTRICITY

Place instrument or module to be serviced, spare parts inconductive (anti–static) envelopes or carriers, hand toolsetc. on a work surface defined as follows. The work surfacemust be conductive and reliably connected to earth groundthrough a safety resistance of approximately 250 kilohms.The surface must NOT be metal. (A resistivity of 30 to 300kilohms per square is suggested.) Avoid placing tools orelectrical parts on insulators.

Ground the frame of any line–powered equipment, test in-struments, lamps, soldering irons, etc., directly to earthground. To avoid shorting out the safety resistance, be surethat grounded equipment has rubber feet or other means ofinsulation from the work surface. The module being serv-iced should be insulated while grounded through the pow-er–cord ground wire, but must be connected to the worksurface before, during and after any disassembly or otherprocedure in which the line cord is disconnected.

Exclude any hand tools (such as non–conductive plunger–type solder suckers) that can generate a static charge.

Ground yourself reliably, through a resistance, to the worksurface; use, for example, a conductive strap or cable witha wrist cuff. The cuff must make electrical contact directlywith your skin; do NOT wear it over clothing. (Resistancebetween skin contact and work surface through a commer-cially available personnel grounding device is typically 250kilohms to 1 megohm.)

If any circuit or IC packages are to be stored or transported,enclose them in conductive envelopes or carriers. Removethem only with the above precautions; handle IC packageswithout touching the contact pins.

Avoid circumstances that are likely to produce static charges,such as wearing clothes of synthetic material, sitting on aplastic–covered stool (particularly while wearing wool), comb-ing your hair, or making extensive erasures. These circum-stances are most significant when the air is dry.

When testing static sensitive devices, be sure dc power ison before, during, and after application of test signals. Besure all pertinent voltages have been switched off whileboards or components are removed or inserted.

ixIntroduction to GR228X Test Systems

Contents

PrefaceOverview xiii. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Audience xiii. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

About this Manual xiv. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Related GenRad Documentation xv. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Document Conventions xvi. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

GenRad Customer Care Center xvii. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

OverviewGR228X System Architecture 1-2. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Basic System Components 1-3. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

System Activities 1-4. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Testing Methods 1-4. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

In-Circuit Testing 1-6. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Functional Testing 1-7. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

System Test Devices 1-8. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Testing Board Continuity 1-11. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Testing Analog Components 1-11. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Testing Digital Components 1-12. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Testing Hybrid Components 1-13. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Testing Boundary Scan Components 1-14. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Test Fixtures 1-15. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

In-Circuit Test Fixture 1-15. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Functional Test Fixture 1-15. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

x Contents

GR228X Test SystemsGR228X System Configurations 2-1. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

GR2280 and GR2281 Production Test Systems 2-3. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Standard System Hardware 2-4. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Optional Hardware 2-4. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

GR2281A and GR2287A Production Test Systems 2-5. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .



GR228X i-Series Test Systems 2-7. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Standard Hardware 2-8. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .


GR228X e-Series Test Systems 2-10. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .



GR2283 and GR2284 Test Systems 2-13. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .



GR228X Test Systems with Windows NT PC Retrofit 2-15. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .



UUT Power Supplies 2-18. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Available UUT Power Supplies 2-19. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Optional Programmable Voltage UUT Power Supplies 2-20. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Optional Fixed Voltage Power Supplies 2-20. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

GR228X Test SoftwareTest Development Process 3-2. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Test Preparation Tools 3-3. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

CB/Test 3-3. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Circuit Description Generator 3-4. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

System Device Libraries 3-4. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Model Generation 3-9. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Power Supply Editor 3-15. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Test Generation Tools 3-16. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Automatic Test Generator 3-16. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Preprocessor 3-17. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Scan Pathfinder 3-17. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Nail Assignment 3-19. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Translator 3-19. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Test Debug Tools 3-20. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Program Xplorer 3-20. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Autodebug 3-21. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Digital Waveform Display 3-22. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Measuring Fault Coverage (ALLFAULT) 3-24. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Floating Point Array Display 3-25. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

xiIntroduction to GR228X Test Systems

Generating a Plot 3-27. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Test Execution Tools 3-27. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Standard Test Software 3-27. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

PinPoint Guided Probe 3-29. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

TEST XPRESS 3-29. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Panel Test, Split Fixturing, and Serial Numbering 3-31. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Test Analysis Tools 3-31. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Real Time Data Collection 3-31. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Data Display 3-34. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Off-line Programming 3-35. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

ATG Xpress 3-35. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

TRACS III 3-35. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

GRXpert 3-35. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Migrating from One Test System to Another 3-36. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Windows NT System EnvironmentEditors 4-1. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

PFE Editor 4-2. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

emacs 4-3. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

vim 4-3. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Choosing a User Interface 4-4. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

TestFlo Program Preparation Manager (PPM) 4-4. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

GR228X Monitor 4-5. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Online Help 4-6. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Monitor Page Help 4-6. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Online Help Topics 4-6. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Online Manuals 4-10. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Documentation Quick ReferenceHardware Documentation A-1. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Software Documentation A-2. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Third Party Documentation A-3. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Index

xiiiIntroduction to GR228X Test Systems

Preface

Overview

This manual introduces you to the GR228X Test Systems by providing you with a brief descriptionof the:

� GR228X Test System architecture.

� Standard and optional hardware available for each GR228X Test System.

� Software that is available to help you develop test programs, and which manual in theGR228X Documentation Set provides detailed information.

� Windows NT-based system environment.

Audience

This manual will benefit:

� Network Manager or Administrator

� System Manager or Administrator

� Test Engineer

� Field Service Personnel

� Site Manager

� Test Programmer

� Operator

xiv Preface

About this Manual

This section identifies the knowledge or tasks described in the chapters or appendices of this manual.

For information about Read this Chapter or Appendix

The general GR228X System’s architecture,testing strategies, devices tested, and testfixtures

Overview

The standard and optional hardware that isavailable on your GR228X System and somebasic information about power supplies

GR228X Test Systems

The test development process and thesoftware tools available for the GR228XSystems

GR228X Test Software

The Windows NT system environment, testeditors, user interfaces, and how to get help

Windows NT System Environment

Where to find information about a task in thedocumentation set; where to find 3rd Party(non–GenRad) documentation information

Documentation Quick Reference

xvIntroduction to GR228X Test Systems

Related GenRad Documentation

This section lists other GenRad manuals that may provide supporting or related information.

Manual Title How it relates or supports this manual

GR228X Test Program Generation Manual Provides detailed information about the testprogram development process

PinPoint Guided Probe User’s Guide Provides detailed information about usingPinPoint Guided Probe

Meeting the Challenge of Boundary Scan Provides an informal introduction to boundaryscan

GR228X Test Fixture Manual Provides detailed information about creatingtest fixtures

GR228X Production Test User’s Guide Provides information that is necessary toperform production testing on UUTs

GR228X Test Language Reference Manual Provides detailed information on creating testsusing the test language statements

GR228X Test Library Programming Manual Provides detailed information on creatinganalog, digital and hybrid models

GR228X Master Index Provides a method for locating specificinformation within the documentation set

BasicSCAN Boundary Scan User’s Guide Provides detailed information about usingBasicSCAN to test boundary scan components

Xpress Model User’s Guide Provides detailed information on generatingmodels using the Xpress Model option

GR228X Scan Pathfinder User’s Guide Provides detailed information on generatingtests for boundary scan components

GR228X Test Program Debug Manual Provides detailed information on debuggingtest programs

Test Xpress User’s Guide Provides detailed information on generatingopen pin tests

GR228X Panel Test, Serial Numbering, andSplit Fixturing Manual

Provides detailed information on testing apanel of boards, using serial numbering, andtesting UUTs using a split fixture

GR228X Migration User’s Guide Provides detailed information on migratingfrom one test system to another

GR228X System Administration User’s Guide Provides information on using the Windows NTsystem environment administration andoperation

GR228X Advanced Applications Provides application programs illustrating testmethods that will help you to develop similarapplications.

ATG Xpress User’s Guide Provides information to develop a test programoff-line on a PC.

xvi Preface

Document Conventions

The following document conventions are used throughout the documentation set.

Convention Indicates

Bold monospacetext

command text that you enter

Bold text commands, keys, buttons, prompts, menu options, icons, andliterals within text

Courier text command, syntax, or error message

Italic monospacetext

replace the term with a valid entry

Italic text manual title, chapter title, or section title

P/N or PN part number

[text, text] field within the brackets is optional

{text, text} select one or more choices within the braces

CAUTION potential harm to the system or equipment as a result of thisaction

Example

End Example

the beginning of an example

the end of an example

NOTE specialized information that may benefit you

NEXT informational options that direct you to the next chapter or step

WARNING� potential harm to you as a result of this action

xviiIntroduction to GR228X Test Systems

GenRad Customer Care Center

GenRad offers customer support through the GenRad Customer Care Center (CCC). You cancontact the Customer Care Center for assistance at any time if you are unable to solve a problemthrough the use of on-line help or product documentation. If the Customer Care Center is closedwhen you call, you can leave a voice mail message by phone.

Before contacting the Customer Care Center, please have the following information available:

� Your site number

� Hardware system type

� System serial number

� Software version number

You can contact the Customer Care Center by:

Phone (978) 589-7000USA only: 1–800–4–GENRAD

(1-800-443-6723)Select the number 1 to connect to the CustomerCare Center.

Fax (978) 589-2080 (Customer Care Center)(978) 589-7007 (GenRad Main)

E–mail [email protected]

Mail GenRad, Inc.7 Technology Park Drive, MS 6Westford, MA 01886-0033

World Wide Web http://www.genrad.com

FTP ftp.genrad.comlogin: anonymouspassword: your e-mail addresscd pub/pub (public, for directory use ls) orcd pub/incoming (public, directory cannot be seen)

1-1Introduction to GR228X Test Systems

Overview

The GR228X Test Systems, hereafter referred to as the GR228X systems, are a family ofPC-controlled combinational test systems. The systems are designed to perform rapid electricaltesting of printed circuit boards with high diagnostic accuracy. The GR228X systems run on aWindows NT-based software platform and are configurable to meet the hardware and softwarerequirements of the target application.

Your GR228X system’s primary purpose is to execute in-circuit tests on electrically-isolatedcomponents of a unit–under–test (UUT). Such components include analog IC, digital IC, hybrid IC, andmemory components.

NOTE The GR2281A and GR2287A Test Systems do not have digital test vectorcapabilities, but can detect opens on digital components using the TESTXPRESS software.

A GR228X system is particularly effective at detecting manufacturing faults, such as:

� Shorts and opens within components or on board etches

� Missing, wrong, damaged, or improperly inserted components

� Out of tolerance and faulty components

� Incorrectly programmed components and faulty memory devices

� Functional faults on complete circuits

This chapter provides an introduction to all Windows NT-based GR228X Test Systems, whichinclude any VMS-based GR228X Test Systems that have been retrofitted with a WindowsNT-based PC.

1

1-2 Overview

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All Windows NT-based GR228X systems are PC-controlled and have similar standard andoptional hardware components. Table 1–1 describes each of the GR228X system’s majorcomponents that are shown in Figure 1–1.

KEYBOARD

HARDWARE

VIDEODISPLAY

PRINTER

DISK DRIVE

1/4–INCHTAPE DRIVE

REPAIR TICKET

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DISKETTEDRIVE

KEYPAD(Optional)

HARD

MOUSE

PROCESSOR TESTINSTRUMENTS

TEST FIXTURE RECEIVER

MODEM

CD–ROM DRIVE

PRINTERLINE

Figure 1–1 System Components

Table 1–1GR228X System Components

Component Description

Mouse Used to select options and enter input.

Keyboard Used to enter commands to the PC or to respond to system prompts and test boards.

Hardware Keypad This option enables you to test UUTs easily without constantly using the keyboard.

Video Display Used during program preparation and during the testing sequence to displaymeasurements, waveforms, error messages, and other operator information.

Repair TicketPrinter

Prints diagnostic messages and results from the PC. Used by the test system todocument test results and error messages, which can be attached to the failingboards.

Line Printer This option is available for hard-copy output of program listings and log listings.

CD-ROM Used to load CD-ROM formatted software.

Hard Disk Drive Stores system software, test programs and data, and any other information that the PCneeds to quickly access. Optional disk drives may be added to provide additionalstorage.

3.5-inch DisketteDrive

This 1.44 Mb diskette drive is used for system backup and data transfer.

1/4-inch Tape Drive This 525Mb tape drive is used for loading system software and for systembackup.

Modem An internal modem for remote accessing.

Processor Executes the test programs.


Component Description

Test Instruments The source and measure instruments perform a variety of device tests. For example,by forcing a known voltage from the dc source and measuring the current, thesoftware computes the value of dc resistance under test using Ohm’s Law (R=E/I).

Test FixtureReceiver andSupport Circuitry

Provides an interface between the test instruments and the variety of boards thatundergo tests. Fixtures, which are uniquely fabricated for each board design to betested, are mounted to the test system’s receiver. Through the fixture, the testsystem establishes electrical connections between the test instruments andindividual components on the UUT.

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The GR228X systems include a variety of specially designed interconnected modules andcomponents that provide easy access at the front for UUT testing and at the rear for equipmentservicing. Internal ventilation is provided by positive pressure air circulation from air intakes oneach cabinet. Figure 1–2 shows the system as a block diagram. The basic system contains a PC,analog and digital subsystems, a receiver, and UUT power supplies.

NOTE The GR2281A and GR2287A Test Systems do not contain a digital subsystem.

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Figure 1–2 Basic System Block Diagram

1-4 Overview

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Figure 1–3 identifies activities that are needed to use the system effectively. The activities aregrouped under four major functions.

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GR228X Test System

Set Up SystemDevelop Test Programs

Production Testing

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Figure 1–3 GR228X Test System Activities

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There are two testing methods available for the GR228X systems; in-circuit and functional. Bothmethods can produce tests that identify a high percentage of all possible defects. Depending on theassembly stage, either the in-circuit or the functional testing method is easier to implement andprovides the most useful information.

In-circuit tests are usually performed at earlier and intermediate stages of assembly when it is mostimportant to identify and correct component faults. While the in-circuit test does not provide directinformation about how well a board functions, experience shows that most boards that pass anin-circuit test can also pass a thorough functional test. Therefore, even though the in-circuit testdoes not determine whether the whole board works correctly, it can indicate whether a boardshould continue through assembly or whether it has faults that need repair.

Once it is established that all components are correctly inserted and are operational, board–levelfunctional tests or quality control tests can be useful for verifying a board’s overall performance.Functional tests are usually performed in the later stages of assembly when access is only availableat the board edge.


A dedicated functional test system is often used for functional testing. Alternatively, you can movemany of the functional tests to the GR228X Test System which has many of the necessary hybridtest capabilities built-in. The ICA systems contain instruments for testing groups of analogcomponents, groups of ICs using the system’s parallel Driver/Sensors, and groups of hybridcomponents using the AWG, DMM, and ACM in addition to the other instruments. Functional testingmay require the addition of optional power supplies. The Hybrid Test Library (HTL) enables you todevelop a library of functional tests that can be automatically generated. Functional testing enablesyou to collect additional test statistics using the system’s data logging feature.

In-circuit testing individually checks the performance of each component on the board with little orno operator probing. Occasionally a fault such as an open connection needs to be localized further.The GR228X systems offer a scratchprobing technique that can discriminate between a poor testprobe contact, a bent IC pin that was not inserted correctly, or a broken track.

Performing a combination of in-circuit and functional tests provides the most thorough faultcoverage. The GR228X software and hardware are optimized for in-circuit component testing,therefore, the test development process focuses on in-circuit testing. GR228X systems can alsoperform “clusters” of functional tests using the same test fixture. By grouping the UUT intofunctional clusters, you can simplify test development and improve the diagnostic accuracy offailing cluster tests.

Table 1–2 identifies and contrasts the major characteristics of functional and in-circuit testing.

Table 1–2Functional and In-Circuit Test Characteristics

Characteristic Functional (Board-Edge) Test In-Circuit Test

What is tested Component inputs and outputs. Component connections, values,and functions.

How is it tested Power is applied to the board. Component-by-component;power is applied to UUT for digitaland hybrid tests.

Fixturerequirements

Board edge connector that may acceptmany boards.

Bed-of-nails fixture for eachboard design.

Softwarerequirements

Can use an optional circuit simulator as adiagnostic aid to predict outputs and faultcoverage. Test development requires asimulator library, and a programmer towrite part of the test. It requires a longertest development cycle.

Automatic Test Generator (ATG)writes the test using test libraries.The hybrid library can generatefunctional tests.

Componentlibrary

Must contain complete transfer function ortruth table for each digital device.

Contains analog, digital, andhybrid model tests, written for avariety of circuit environments.

Fault diagnosis Provided by guided operator probing; faultidentification depends on adequatesimulation.

Probing is not required to obtaingood fault identification.

Fault coverage Excellent fault coverage, although boththe test development and debug time arelengthy. Also, manufacturing faults maynot be detected.

Excellent fault coverage with fasttest development and debugtime.

1-6 Overview

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In-circuit testing methods are used to check for manufacturing faults. Manufacturing faults aredefects in individual components and inter-connections on the board. To test componentsindividually, connections from the test system to all functioning component pins is required.This is accomplished using a test fixture that mates with each of the board’s circuit nodes andtest methods that can effectively isolate a single component from the parts surrounding it. Anin-circuit component test is often performed as the first or second test after a board has beenassembled and soldered. It may be preceded by a separate bare board test to check for opensand shorts in the conductive tracks before parts are inserted.

In-circuit tests generally fall into four test categories:

� Connectivity tests that check for shorts and open connections on the board.

� Analog tests that measure component values.

� Digital tests that check the operation of digital integrated circuits.

� Hybrid tests that check components that are a combination of analog and digital components.

The System contains test hardware appropriate for each kind of test, but it must be connected toeach part on the board individually before you can perform a test. Since components are testedindividually, the system can usually localize a fault immediately and issue a report telling theoperator or technician which part needs repair. Interactive faults that can cause the board tomalfunction are generally overlooked, but such faults are rare on a well–designed board.

The in-circuit tests are generated by the Automatic Test Generation (ATG) software. Programmers whoneed to modify tests created by ATG or who need to write tests of their own should thoroughlyunderstand these techniques and the criteria ATG uses in selecting various test methods.

The most troublesome aspect of the in-circuit test is the assumption that you can test eachcomponent as if it were the only part on the board. Fairly complex test strategies are often requiredto analyze the component’s circuit environment and to isolate the component from the surroundingcircuits. Since these test strategies involve only individual components and their immediate circuitconnections, you can assemble libraries of standard test procedures and adapt them to the limitedrange of environments in which the components are found. Given an appropriately codeddescription of the circuit, the system software can write the entire board test by drawing tests forindividual components from test libraries. VLSI devices are tested in a way that is, in principle, nomore complex than the method used for simple components.

The system does not need to know the entire truth table or transfer function of a digital device, since itdoes not analyze how signals move through the circuit. Instead, it only requires that the library containa set of typical input and output patterns for each device that is used to test the device. For a simplerdigital IC, these patterns are usually based on the device’s truth tables, but for a larger device, theymay consist of no more than a carefully chosen sample of the possible inputs and outputs.

Bused ICs present a special class of challenges. Before full tests are performed on bused devices,all the devices on the bus are tri–stated, that is, put in a low current state to verify that the bus isfree. If the bus test fails, the BUSBUST diagnostic technique can automatically identify the IC(s)causing the bus failure. Once the bus test passes, you can individually test the performance ofeach IC on the bus. All other devices on the bus are disabled or disconnected from the bus and theIC is tested as if it were the only device on the board.

For an in-depth explanation of in-circuit testing strategies, refer to the GR228X Test ProgramGeneration Manual.


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Functional circuit testing is often used to identify any faults that went undetected by in-circuittesting. A functional test is most important to the end user of a circuit board because it certifiesthat the board meets its performance specifications.

To connect the unit–under–test (UUT) to the test instruments, you must construct a fixture thatmates easily with the board and provides reliable electrical connections. Usually, you only need totest the board’s inputs and outputs, and the fixture needs to provide little more than the board’snormal interface connectors. Therefore, the test fixture can be relatively simple and inexpensiveto construct, which is especially attractive for low–volume testing. Using a functional tester, it isoften possible to test a variety of bus–oriented boards from an edge connector in a single fixture.

With power applied to the board, a functional test checks that the board, or chosen sections of theboard, produces the desired output response when various input stimuli are applied. Functionaltesting can also check that further stages of assembly have not damaged the board.

When a board fails a functional test, the test cannot always identify the cause of the faultimmediately since there can be any number of paths from the inputs to the outputs along whichthe fault might lie. As boards become more complex, the possible signal paths become muchlonger, and the simple information that a particular board output has failed becomes less useful inidentifying the cause of the failure. After a board fails a functional test, a technician usually has totrace the fault from the output back to its origin.

Since ATG does not generate functional test programs, you must write a test in the system’s testlanguage. The test you develop needs to apply an appropriate stimulus, a waveform or a bit pattern,at the board’s inputs and measure the outputs to determine if the board or a group of components,such as a filter section, are functioning properly.

When a sophisticated functional test is required, or if diagnostic information can be gained from thefunctional test, some proficiency in manual programming in the test language may be required.For functional testing, you can use software to adapt the output of simulator models to the GR228Xtest language to form digital models of function units. You can then use the PinPoint Guided Probefor testing a function unit. The guided probe provides an important capability for diagnosing functionalfaults. Refer to the PinPoint Guided Probe User’s Guide for more information.

The PinPoint Guided Probe is ideally suited for tracking digital functions. Using a probe connectedto a signal tracer or logic analyzer, is not as efficient as using PinPoint Guided Probe. If thePinPoint Guided Probe capability is to aid in locating the fault, it must have a software model of theboard’s circuits available so that it can compute the possible signal paths and guide the operator toprobable sources of the error. However, when you perform a functional test in conjunction with anin-circuit test, the in-circuit test is often sufficient to identify component faults that cause functionalfailures.

To model a circuit, the simulator must be able to predict the state of each pin as a signal propagatesfrom the inputs to the outputs. A complete truth table for each digital device on the board must beavailable so that for each input pattern that appears at an IC’s inputs, it can find the resulting outputsand advance to the next devices. This has important consequences for functional testing of boardscontaining VLSI devices. For SSI and most MSI devices you can record the truth tables withoutdifficulty; however, for some VLSI devices such as microprocessors, the truth tables comprise from10,000 to several million test vectors. For these devices you must find other less thorough methods forsimulation. In general, adequate software modeling of boards containing VLSI devices is a formidableand expensive task.

For an explanation of functional testing strategies, refer to the GR228X Test Program GenerationManual.

1-8 Overview

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The GR228X test language controls the system test hardware and software devices,which enableyou to test and measure the components on the UUT. Figure 1–4 provides a global view of thesystem test devices. Table 1–3 describes the function of the hardware and software devices.

SVS

UPS

PVS/HCS

PS

[3]

[3]

[3]

ACZ

DCS

DCM

RM

SHORTS, LGC[2]

I488(BUS OPT)

ARITH[1] PIO

STM

MUX SCAN

UUT

NOTE:

PEX

OPENS, ANDCONTACT

LGC may include standard digital test nails and/or special nails[2]

AFTM

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[1]

[1]

[1] Not actual instruments, they are software drivers

Power supplies for UNIX PC Retrofitted Systems[3]

ICA

ACM

DMM

AWG

DSM

TESTPINOPENS

[1]

Figure 1–4 System Test Devices


Table 1–3System Test Device Functions

Acronym Device Name Function

ACM Digital ACVoltmeter/Ammeter

Measures a signal’s positive peak, negativepeak, RMS, or dc offset (Voltages up to 200 Vand currents up to 160 mA for signals between 1Hz and 40 kHz.).

ACZ AC Impedance Measure Measures impedance or admittance by applyingthe ac source voltage and measuring the result.

AFTM Analog Functional TestModule

The AFTM option contains these analoginstruments:

DC Voltmeter, AC Voltmeter, AC Source, TTLSync Signal Output, Frequency/Time-IntervalMeter.

ARITH Arithmetic Test Module Tests arithmetic quantities not directly measuredby an instrument, such as the gain of atransistor. This utility device is considered asystem device because the action requiredwhen it fails is the same as other instrumentstatements.

AWG Arbitrary WaveformGenerator

Sources voltage or current waveforms.Programmed waveforms can be sine, square,and triangle. You can also define arbitrarywaveforms.

DCM DC Measure Uses a differential voltmeter and an ammeter tomeasure dc voltage. The DCM module on anICA-configured system has a wider range thanon a non-ICA configured system.

DCS DC Source Serves as voltage source (DCV) or currentsource (DCI). The DCS module on anICA-configured system has a wider range thanon a non-ICA configured system. Triggercommand available for ICA systems only.

DMM Digital Multimeter Measures voltage and current. Permitsimmediate or triggered voltage and currentsequence measurements which are then storedin the DMM’s memory.

DSM Deep Serial Memory Extends test system memory by supplying statedata to the Driver/Sensors through the digitalinstrument bus.

I488(BUS OPT)

IEEE Standard 488–1978 Permits up to nine external devices that conformto IEEE Standard 488–1978. These externaldevices can be attached to the system, thenoperated remotely by test language statements.

LGC Logic Driver/Sensors Digitally controls the D/S subsystem for standarddigital testing.

1-10 Overview

Table 1–3System Test Device Functions

Acronym FunctionDevice Name

MUX Instrument Multiplexer Relay matrices used to connect selectedinstruments to any of four (A, B, C, D) or eight(A, B, C, D, E, F, G, H) output channels.

PEX Pin Expander Connects Driver/Sensor or analog BUS lines toa larger number of pins.

PINOPEN Open Pins This software driver tests for open pins onselected components and connectors. It usesvarious tester instruments depending on yourtester configuration and selected PINOPENoptions.

PIO Parallel I/O Reads driver outputs and monitors TTL inputs.This utility device consists of program controlleddriver circuits that activate relays, TTL circuits,LED indicators, and sensor circuits.

PS Programmable Supply Power supply option used on theWindows NT-based GR228X Systems to powerthe UUT.

RM Resistance Measure Uses an ohmmeter to measure resistance.

SCAN Analog Pin Scanner Uses relay matrices to connect the MUXchannels to designated UUT nails.

SHORTSOPENSCONTACT

ShortsOpensContinuity

Connects the DCS and DCM to perform analogcontinuity tests. The DCS and DCM go throughthe MUX and SCAN, to connect source andmeasure units to the UUT.

STM Self–Test Module This utility device contains circuits andcomponents of known values that check how thevarious system test devices operate.

SVSUPSPVS/HCS

Selectable VoltageSupply; Universal PowerSupply; High CurrentSupplies

Power supply options used on theWindows NT-PC Retrofitted GR228X Systems topower the UUT.

UUT Unit Under Test Printed circuit board that you are testing.


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Continuity tests are the first set of in-circuit tests that ATG generates. Continuity tests identifyshorts and opens in the circuit board connections by:

� Measuring the resistances between all possible node pairs.

� Checking unconnected nodes for very high resistance.

� Checking connected nodes for very low resistance.

Optionally, you can select a test that verifies the integrity of the connections between the receiver,fixture, and UUT. This test checks for a leakage path between source nodes and sense nodes on theUUT. If a leakage path does not exist, it usually means that the receiver, fixture, or UUT is not makingelectrical contact.

The scratchprobing diagnostic technique is another form of connectivity testing that you can useto determine if a component failed because of a bad connection on the UUT. You use a probe forthis test. When a component fails, the operator can be instructed to probe the pins of the failedcomponent. This tests the connection from each IC pin to the test probe. It verifies that theconnection from the test probe to the IC pin is intact and whether the IC or the board connectionneeds repair.

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Analog testing is usually performed with no power supplies or ground reference applied to theUUT. Passive analog components are tested by applying an external stimulus to the component,either voltage or current, and measuring the results. Tests of more complex devices, such asactive filters, usually require power. In either case, appropriate source and measure instrumentsare connected to component pins on the board. The source instruments force a voltage or currentinput. The Measure instruments measure the voltage or current output.

ATG automatically analyzes the circuitry surrounding each analog component and then searches theAnalog Test Library (ATL) for an appropriate measurement configuration.

ATG uses the library procedure as a template for the test to:

� Select source, measure, and guard terminals.

� Calculate the unknown component value.

� Check for error conditions.

The ATG test selection process can generate these basic impedance test configurations:

� 2-terminal unguarded measurement and 4–terminal Kelvin measurement

� 4- and 6-terminal guarded measurement

� 6-terminal guarded Kelvin measurement

1-12 Overview

ATG can also determine if a test system has an 8–wire mode, and, when appropriate, writes accurate8–wire resistor tests for low value components.

Each in-circuit analog test that ATG generates:

� Defines relevant measurement parameters, such as resistance, capacitance, or gain, andselects a stimulus current or voltage for measuring it.

� Determines how the device can be isolated from its circuit environment so that interactionsfrom other components do not affect the measurement.

� Connects the appropriate circuit nodes to the tester’s measurement instruments so that it canissue relay commands. In some cases, both analog and digital test strategies are used toaccomplish these ends. Fortunately, most testing problems are solved by the ATG software,using programmed circuit analysis and libraries of test procedures for circuit components todevelop tests for the board.

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NOTE The GR2281A and GR2287A Test Systems do not have digital test vectorcapabilities, but can detect opens on digital components using the TESTXPRESS software.

Digital component testing requires a method of testing the device and a method of isolating itfrom the surrounding devices or from adjacent buses. The device test requires a set of knownlogic states applied to the device’s inputs, and a set of expected output states that the deviceshould produce. These input and output bit patterns, called test vectors, usually reflect the truthtable associated with the device. To allow the device to function, power and ground are applied tothe device during the test.

Digital component testing is actually several tests that are performed in this order:

� Non–bused IC tests are performed before full tests on the bused devices.

� Bus connections are tested by attempting to free the bus from all the devices connected to it.

A digital circuit component test usually requires a large number of simultaneous input and outputtest vectors. Accordingly, the test hardware for digital testing consists of a relatively large numberof Driver/Sensor circuits. Test programs are written as if a separate Driver/Sensor were availableat each test probe. The actual number of Driver/Sensors is, however, much smaller than thenumber of available probes. The system software arranges connections from the Driver/Sensorsthrough a relay–based multiplexing system, so you can connect all probes to the Driver/Sensors.This means that a program cannot actually use all of the test probes at once; but test programsrarely need to use more than 250 probes at any one time.

Each Driver/Sensor contains built–in, programmable pull–up and pull–down resistors that connectto the logic high and low drive voltages. These resistors are commonly used to simplify thesensing of open–emitter and open–collector outputs.

In bus testing, the pull–down resistors are first used to pull the bus lines low. If the pull–downresistors can bring the bus lines to a low voltage level, you can assume that the bus is in a highimpedance state, at least in the high voltage range. The programmable pull–up resistors areconnected to the logic high voltage, and the bus lines are checked for logic highs. These two testsverify that no device is driving the bus at the low logic level.


The output of each driver normally functions as a programmable voltage source, generating highsand lows at voltages the test program determines. To test open–collector, open–emitter, andtri–state devices, the Driver/Sensor can switch in a pair of pull–up and pull–down resistors. A sensoris simply a voltage comparator that returns a logic 1 for all voltages above a certain programmedthreshold, and a logic 0 for voltages below a second programmed threshold. Values falling between thetwo thresholds fail tests for both high and low.

A digital test is conducted by applying as many input combinations to the device’s inputs as thecircuit connections allow. Inputs tied high or low cannot be tested and inputs tied together cannotbe tested separately. Using the truth table or an appropriate set of test vectors, the test systemchecks the outputs for the expected high and low states. Within certain limits, you can specify thedevice’s current and voltage parameters, as well as signal delays, in the test. In-circuit digital testsgenerally, however, are meant to verify the device’s logical functions rather than its electricalparameters.

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A hybrid test is a test that usually includes both analog and digital test statements. Hybrid testsare effective at generating tests for multiple components that are tested as a function (such asfilters, pulse width modules). Examples of other hybrid devices include: programmable gainamplifiers and analog–to–digital converters. Hybrid tests can be generated on GR228X testsystems. Hybrid tests can use any of the system’s test instruments to construct the test tomeasure a component or group of components.

The Hybrid Test Generator (HTG) uses hybrid library models that effectively take advantage ofthese GR228X test software features:

� TRIGGER statement that synchronizes the source and measurement instrument timing. Bothsingle–step and continuous triggering are permitted.

� Floating–point arrays and system subroutines that simplify the handling of large amounts ofdata. The test language includes routines to process and display array data. A test programcan use arrays with up to 32K elements.

The subroutines can perform:

Simple mathematical calculations on arrays of real numbers

Mathematical calculations on complex vectors

Discreet Fourier Transforms, Fast Fourier Transforms, and Inverse FastFourier Transforms

� Arbitrary Waveform Generator (AWG) that provides various input stimulus to test a circuit’sresponse. You can create a multi–tone signal that increases testing efficiency. By combiningmultiple tones into a single waveform, tests can be performed in parallel.

� Digital Multimeter (DMM) that performs voltage and current sampling on digitized analogsignals for applications requiring tests like signal/noise ratio calculations, spectral analysis,and slew rate calculations. Sampling a waveform enables you to compare the frequencyresponse of a device output to the input signal generated by the test system.

� AC voltage and current meter (ACM) that performs RMS, peak, and DC–offsetmeasurements on analog signals.

1-14 Overview

A hybrid test is generated from a hybrid model. The hybrid model can contain both unpoweredand powered sections that define how the hybrid device is tested.

Unpowered section tests are performed on the passive section of a component or group ofcomponents. The unpowered hybrid test is inserted in the test program after the analog in-circuittests and before the power up routine.

Powered section tests are performed on the key operating parameters of a device or group ofdevices. The powered hybrid test is inserted in the test program after the power up routine andbefore the digital tests. These tests can contain a digital burst.

When both unpowered and powered tests are within the same model, ATG splits the test andplaces the sections in the appropriate place within the program.

For examples of these advanced test techniques, refer to the GR228X Advanced Applications.

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Boundary scan is a structured design-for-testability method applicable to digital devices. Thephrase “design-for-testability” refers to the on-going effort by both component and boarddesigners to improve the observation and control of their designs during test.

NOTE The GR2281A and GR2287A Test Systems do not support boundary scancomponent testing.

Some circuit board assemblies contain boundary scan components. These components offer testingadvantages by exercising the components’ internal circuitry to overcome probing limitations.In addition, you can further test the board by exercising boundary scan components to performself-tests.

To improve UUT fault coverage and diagnostics, GenRad combines traditional in-circuit testtechniques with boundary scan test techniques. GenRad offers two optional software productsthat perform in-circuit testing of boundary scan components:

� BasicSCAN is very effective for testing UUTs that contain a few boundary scan componentswith full access.

� Scan Pathfinder is very effective for testing UUTs that contain many boundary scancomponents with limited access.

For further information, refer to Meeting the Challenge of Boundary Scan. This GenRadhandbook provides an informal introduction to Boundary Scan. You can obtain this handbookfrom your sales representative.


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A test fixture is a custom built interface that provides reliable electrical paths to the UUT from thesystem’s analog source and measure instruments, digital driver/sensor circuits, and UUT powersupplies.

There are many test fixture types. The most common are:

� In-circuit (bed-of-nails)

� Functional (edge)

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The in-circuit test fixture connects rows of contact nails on the receiver to a bed-of-nails on thetop side of the fixture. The nails on the fixture are called test nails, and the nails on the receiverare called receiver nails. Since each UUT is unique, it requires its own in-circuit test fixture.

Fixture manufacturers usually provide test fixtures that are completely assembled and wired ortest fixture kits that you assemble and wire. No matter who assembles the test fixture, you needto provide UUT and test program information that includes:

� Nail Fixture Report (.NFR) file, and optionally, the Nail Wire List (.NWL) file, which is used forshort–wire length fixtures, and the CAD design data that contains the X, Y coordinateinformation for all pins on the UUT.

� Your test system’s configuration.

� Test program requirements such as special Opens Xpress, Cap Xpress, and Orient Xpressfixture wiring data (.DPR) file.

� Fixture Wiring Instructions (.FWI) file, that contains informational messages and instructionsto the fixture assembler on how to wire the power supply connections to the test fixture.

The Fixture design and construction is coordinated with the test program development objectives.Refer to your test system’s Test Fixture Manual for the reasons and procedures for the variousfixture design strategies.

Refer to the GR228X Test Program Generation Manual for information on generating reportsrequired for building a test fixture. For information on installing and using a test fixture, refer to theGR228X Production Test User’s Guide.

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The Functional test fixture connects the UUT to the system’s test instruments. In functionaltesting, you only test the inputs and outputs that are at the UUT edge connectors. Therefore, thetest fixture need only be a little more than the UUT’s normal interface connectors. The test fixturecan be relatively simple and inexpensive to construct, which is especially attractive forlow–volume testing. Using a functional tester, it is often possible to test a variety of bus–orientedboards from an edge connector in a single fixture.


GR228X Test Systems

GenRad’s GR228X Test Systems are a family of Windows NT-based PC–controlled,combinational test systems. Providing a variety of GR228X systems enables you to choose theconfiguration that best suits your board testing needs. This section describes the hardware thatcomprises the Windows NT-based GR228X Test System.

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Each Windows NT-based GR228X Test System is configured differently. A description of the fieldsused in the GR228X System Configurations appears before Table 2–1.

A description of the fields used in Table 2–1 follow.

Field Name Identifies the

System Type Type of GR228X System.

Pin Board (Type) System’s performance class.

Pin Board (Max) Maximum number of pin boards allowed for that system type.

Driver/Sensors per board Maximum number of driver/sensor (D/S) connections per pinboard.

Avail. Nails (Max) Maximum number of test nails available for that system type.

Mux Ratio Multiplexing system ratio (i.e. 2 D/S per 16 nails).

Data Rate Maximum digital subsystem vector speed rate.

2

2-2 GR228X Test Systems

Table 2–1GR228X System Configurations

System TypePin Board

(Type)

PinBoards(Max)

Driver/Sensors

per board

Avail.Nails(Max)

MuxRatio

Data Rate

GR2280 Combo I 10 � 16 1280 � 2:16 5 MHz

GR2281 Combo II 10 � 32 1280 � 2:8 5 MHz

GR2281A ASM � 11 0 1408 2:8 Not Applicable

GR2282 � Combo I 30 16 3840 2:16 5 MHz

GR2283 � Combo I 15 16 1920 2:16 5 MHz

GR2284 � Combo II 15 32 1920 2:8 5 MHz

GR2285e XP � 15 32 1920 2:8 10 MHz

GR2286 � Combo I 30 16 3840 2:16 5 MHz

GR2286 � Combo I 30 16 3840 2:16 5 MHz

GR2287 � Combo II 30 32 3840 2:8 5 MHz

GR2287 � Combo II 30 32 3840 2:8 5 MHz

GR2287L HDC1 30 32 7680 2:16 5 MHz

GR2287LX HDC2 30 64 7680 2:8 5 MHz

GR2287A ASM � 30 0 3840 2:8 Not Applicable

GR2288 � Combo II 9 32 1152 2:8 5 MHz

GR2289e XP � 30 32 3840 2:8 10 MHz

� System allows 11 pin boards if the AFTM is not installed.

� 1408 if 11 pin boards are present

� Analog Scanner Modules

� Windows NT PC Retrofitted system

� e-Series system or i-Series system

� Xtended Performance

High Density Card 1. You must have a minimum of two HDC1s. Optionally, you can populate the GR2287L with up to 28 Combo II pin boards.

High Density Card 2. You can only populate the GR2287LX with HDC2 pin boards.


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The GR2280 and GR2281 Production Test Systems are designed to provide comprehensivetesting for small to large scale Printed Circuit Boards (PCB) and assemblies. Each ProductionTest System provides full analog and digital measurement capabilities for testing.

In addition, some functional tests can be performed with the standard system measurementmodules. External measurement or source devices, controlled via an IEEE bus interface option,can be added to expand the functional test capabilities. These external instruments can beconnected to the system’s scanner subsystem through external multiplexer ports.

Figure 2–1 shows the GR2280 and GR2281 Production Test Systems.

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Figure 2–1 GR2280 and GR2281 Production Test System


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The standard system hardware configurations include:

Hardware GR2280 GR2281

Pin board type Combo I Combo II

Pin board (max) 10 10

Driver/Sensors per board 16 32

Available nail (max) 1280 1280

Mux Ratio 2:16 2:8

Data Rate 5 MHz 5 MHz

Analog Functional Test Module (AFTM) Yes Yes

Analog testing & measurement Yes Yes

Digital testing & measurement Yes Yes

Clock/Sync/Trigger board Yes Yes

High Speed Controller Yes Yes

NOTE If an AFTM is not used in these systems, they can accommodate 11 pin boardsand has 1408 available nails.

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The hardware options that can be added to the standard system configurations include:�

� Increasing the number of pin boards from minimum configurations

GR2280 and GR2281 systems can contain up to 10 pin boards, 11 if AFTM is not present.The standard system comes with 2 pin boards.

� UUT power supplies in any combination of these voltages:

Programmable Voltage (PS)(up to 7 PS in alliance rack)

Fixed Voltage (Fixed) (set of 3 )

0 - 7V @ 15A +5V @ 6A +5V @ 6A

0 - 20V @ 8A �+15V @ 1.0A or �+12V @ 1.3A

0 - 60V @ 2.5A

� High Voltage DC Voltage Source (+120V). DC Current Measure (+60mA).

� IEEE-488 Interface Controller and Instrument Multiplexer

� Deep Serial Memory Module (DSM)

� Custom Function Board (CFB) with Vehicle Control Interface (VCI) or Frequency TimeInterval Instrument (FTI) modules

� Bar Code Scanner

� Repair ticket printer or line printer


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The GR2281A and GR2287A Production Test Systems perform analog testing. They do not havea digital subsystem. These systems are designed to quickly identify component faults early in themanufacturing process.

Figure 2–2 shows the GR2281A and GR2287A Test Systems.

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Figure 2–2 GR2281A and GR2287A Production Test System


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Hardware GR2281A GR2287A

Pin board type ASM ASM



Mux Ratio 2:8 2:8


Digital testing & measurement No No

Clock/Sync/Trigger board No No

High Speed Controller No No

NOTE Data rates are used to describe digital test vector speeds. Since theGR2281A and GR2287A Production Test Systems do not have adigital subsystem, data rates are not available.

ASM refers to Analog Scanner Modules

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The hardware options that can be added to the standard system configurations include:


GR2281A systems can contain up to 11 pin boards. The standard system comes with 4 pinboards.

GR2287A systems can contain up to 30 pin boards. The standard system comes with 4 pinboards.


Programmable Voltage (PS)(up to 5 PS in alliance rack)


0 - 7V @ 15A +5V @ 6A +5V @ 6A

0 - 20V @ 8A �+15V @ 1.0A or �+12V @ 1.3A

0 - 60V @ 2.5A

� High Voltage DC Voltage Source (+120V)

� Additional vacuum port (2281A only)


� IEEE interface

� Custom Function Board (CFB) with Frequency Time Interval Instrument (FTI)

� Repair ticket printer or line printer


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The Production Test Systems are designed to provide comprehensive testing for small to largescale Printed Circuit Boards (PCB) and assemblies. Each Production Test System provides fullanalog and digital measurement capabilities for testing.

Figure 2–3 shows a GR228X i–Series Test System. The GR228X i–Series Test Systems includethe GR2283, GR2284, GR2286, GR2287, and GR2287L.

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Figure 2–3 GR228X i–Series Test System


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The standard test system hardware configurations include:

Hardware GR2283 GR2284 GR2286 GR2287 GR2287L GR2287LX

Pin board type Combo I Combo II Combo I Combo II HDC1 orCombo II

HDC2

Pin board (max) 15 15 30 30 30 30

Driver/Sensors perboard

16 32 16 32 32 64

Available nails(max)

1920 1920 3840 3840 7680 7680

Mux Ratio 2:16 2:8 2:16 2:8 2:16 2:8

Data Rate 5 MHz 5 MHz 5 MHz 5 MHz 5 MHz 5 MHz

Analog testing andmeasurement

YES YES YES YES YES YES

Digital testing andmeasurement


Clock/Sync/Triggerboard


High SpeedController


NOTE HDC refers to the High Density Card.


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� Increasing the number of pin boards from the 2 pin board minimum configuration.

GR2283 and GR2284 systems can contain up to 15 pin boards. In addition, there are 7accessory slots available which can contain optional hardware modules such as DSM boardsand the AFTM board.

GR2286 and GR2287 systems can contain up to 30 boards including more pin boards andthe optional DSM and/or the AFTM. Accessory slots are not available for these systems. TheGR2287L must have a minimum of two High Density Cards (HDC1). Optionally, you canpopulate the GR2287L with up to 28 Combo II boards. The GR2287LX can only beconfigured with HDC2 pin boards.


Programmable Voltage (PS)(up to 2 cages of 7 PS)


0 - 7V @ 15A +5V @ 6A +5V @ 6A

0 - 20V @ 8A �+15V @ 1.0A or �+12V @ 1.3A

0 - 60V @ 2.5A






� Repair ticket printer, line printer

� AFTM


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The GR228X e-Series Test Systems are designed to provide comprehensive testing for small tolarge scale Printed Circuit Boards (PCB) and assemblies. Each GR228X e-Series Test Systemprovides full analog and digital measurement capabilities for testing:

� Analog, digital, and mixed signal components.

� Functional blocks of components.

� All types of components (including SMT) without using device libraries, if you purchase theTEST XPRESS option.

Each e-Series system is compatible with all other e-Series systems that contain the same muxratio. Test programs and fixtures developed on one system are easily migrated to anothere-Series system.

Figure 2–4 shows the GR228X e-Series Test System.

CPU ON

OFF SYS

POWER

ON

DVR/STROBE 1

SNR/STROBE 2

TRIGGER

CLOCK

STROBE 3

STROBE 4

TEST STEP

DIG INSTR

PROBE PROBE

L

RAUTOONOFF

UUT VACUUM CONTROLFIXTURERAISE

AUTOMODE

LOWER

AUTO MODEENABL

SINGLEDUAL

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Figure 2–4 GR228X e–Series Test System


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The six standard e-Series system configurations are described in the following table. Thee-Series systems use one of two receivers:

� GR2283e, GR2284e, and GR2285e systems use receiver connector positions 0 through 18.

� GR2286e, GR2287e, and GR2289e systems use receiver connector positions 0 through 33.

Hardware GR2283e GR2284e GR2285e GR2286e GR2287e GR2289e

Pin board type Combo I Combo II XP Combo I Combo II XP

Pin board (max) 15 15 15 30 30 30

Driver/Sensors per board 16 32 32 16 32 32

Available nails (max) 1920 1920 1920 3840 3840 3840

Mux Ratio 2:16 2:8 2:8 2:16 2:8 2:8

Data Rate 5 MHz 5 MHz 10 MHz 5 MHz 5 MHz 10 MHz

Analog testing andmeasurement

Yes Yes Yes Yes Yes Yes

Digital testing andmeasurement

Yes Yes Yes Yes Yes Yes

Clock/Sync/Trigger board Yes Yes Yes Yes Yes Yes

High Speed Controller Yes Yes Yes Yes Yes Yes

NOTE XP means Xtended Performance.


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The hardware options that may be added to the standard system configurations include:


GR2283, GR2284, and GR2285 systems can contain up to 15 pin boards. The standardsystem comes with 2 pin boards.

GR2286, GR2287, and GR2289 systems can contain up to 30 pin boards. The standardsystem comes with 5 pin boards.


Programmable Voltage (PS)(up to 14 PS in two alliance racks)

Fixed Voltage (Fixed)(set of 3 for ICA systems only)

0 - 7V @ 15A0 - 20V @ 8A0 - 60V @ 2.5A

+5V @ 6A+15V @ .75A





� Analog Functional Test Module (AFTM)

� Additional Relay Driver Board


� Footswitch


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The GR2283 and GR2284 Test Systems, which have evolved since their introduction in 1992have one of these configurations.

� a control arm and no shelf.

� a control arm and shelf.

� a monitor/control arm and shelf. Refer to Figure 2–5.

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Figure 2–5 GR2283/GR2284 Test System with a Monitor/Control Arm and Shelf


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Hardware GR2283 GR2284

Pin board type Combo I Combo II


Driver/Sensors per board 16 32


Mux Ratio 2:16 2:8

Data Rate 5 MHz 5 MHz


Digital testing & measurement Yes Yes

Clock/Sync/Trigger board Yes Yes

High Speed Controller Yes Yes

2'��+�-��1��



GR2283 and GR2284 systems can contain up to 15 pin boards. The standard system comeswith 2 pin boards.

� UUT power supplies. The Programmable Voltage (PS) supplies are:

0 - 7V @ 15A

0 - 20V @ 8A

0 - 60V @ 2.5A




� Additional Instrument Multiplexer Board




� Footswitch

� Repair ticket printer

� Line printer

� Load box (for operational verification)


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Your VMS-based GR228X Test Systems can be upgraded using the Windows NT PC Retrofitoption. GenRad no longer builds or develops new software features for the VMS-based testsystems. The Windows NT PC Retrofit option enables you to run the latest release of theGR228X software and improves the throughput of your system.

Figure 2–6, Figure 2–7, and Figure 2–8 shows the GR228X Test Systems with the Windows NTPC Retrofit installed.

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Figure 2–6 PC Retrofitted GR2282 Test System

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Figure 2–7 PC Retrofitted GR2286 and GR2287 Test Systems


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Figure 2–8 PC Retrofitted GR2288 Test System

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Hardware GR2282 GR2286 GR2287 GR2288

Pin board type Combo I Combo I Combo II Combo II

Pin board (max) 30 30 30 9

Driver/Sensors per board 16 16 32 32

Available nail (max) 3840 3840 3840 1152

Mux Ratio 2:16 2:16 2:8 2:8

Data Rate 5 MHz 5 MHz 5 MHz 5 MHz

Analog testing and measurement Yes Yes Yes Yes

Digital testing and measurement Yes Yes Yes Yes

Clock/Sync/Trigger board Yes Yes Yes Yes

High Speed Controller Yes Yes Yes Yes

NOTE The GR2282 is the only 4-wire system, the other systems are 8-wire.


2'��+�-��1��



GR2282 systems can contain up to 30 pin boards. The standard system contains 5 pinboards.

GR2286 and GR2287 systems can contain up to 30 pin boards. The standard systemcontains 5 pin boards.

GR2288 systems can contain up to 9 pin boards. The standard system contains 2 pin boards.

� UUT power supplies

Universal PowerSupply (UPS)

Programmable VoltageSupply (PVS)

Selectable VoltageSupply (SVS)

10V 0 - 5.5V @ 50A 7 - 20 - 20

20V 0 - 7V @ 35A 20 - 20 - 20

40V 0 - 30V @ 8A

50V

� Load box (for UPS/SVS current verification tests on GR2288)

� Additional Instrument Multiplexer Boards

� Additional DC Voltage and Current Source Boards



� IEEE interface

� Line printer

� Analog Instrument Option (AIO)


� Deep Serial Memory (DSM)


� Expansion bay (GR2286 and GR2287)

� Footswitch


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The GR228X Test Systems can include optional UUT power supplies that provide power to theUUT. There are two types of UUT power supplies:

� Programmable voltage power supplies (PS)

� Fixed voltage power supplies (Fixed)

The Windows NT-based GR228X system can support up to seven individual power supply modules ina controller box. The system’s configuration is established by both the number and types of powersupply modules in the system and the wiring between receiver connections and the power supplymodules.

Virtual power supplies are created by wiring power supply modules in parallel, in series, or acombination of parallel and series. You designate the virtual power supplies as PS(n); thus, a PSpower supply can be composed of any possible combination of power supply modules. A virtualsupply is mainly used to stack power supplies to obtain higher voltages or currents than areavailable from individual power supply modules.

Power supply modules and their connections must be described in the UUT power supplyconfiguration file. This file maps the virtual unit numbers, such as PS(3), to the actual powersupply modules.

You need to know your system configuration in order to program the test statements that control theavailable UUT power supplies. Your system’s UUT power supply configuration also affects test fixturewiring. Use the SETUP monitor page to determine your system’s UUT power supply configuration. Formore information about using the SETUP monitor page, refer to Chapter 8 of the GR228X TestProgram Generation Manual.

PC Retrofitted test systems have different power supplies than the Windows NT-based systems.For more information about your power supply options, refer to Chapter 10 of the GR228X TestProgram Generation Manual.


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Choosing optional UUT power supplies depends on your GR228X system type and its configuration.Table 2–2 identifies which UUT power supplies are available for your Windows NT-based GR228Xsystem.

Table 2–2Available Power Supplies for GR228X Systems

System TypeFixed Power

Supply (Fixed)Programmable Power

Supply (PS)

GR2280 YES YES

GR2281 YES YES

GR2281A YES YES

GR2282 YES NO �

GR2283 YES � YES

GR2284 YES � YES

GR2285 YES � YES

GR2286 YES � YES ��NO �

GR2287 YES � YES ��NO �

GR2287L YES YES

GR2287LX YES YES

GR2287A YES YES

GR2288 YES NO �

GR2289 YES � YES

� e–Series ICA systems permit the use of a User (Fixed) power supply.

� Non-ICA GR2286e and GR2287 e–Series systems can only use PS power supplies.

� Windows NT PC Retrofit systems cannot contain Programmable power supplies (PS).


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The programmable voltage UUT power supplies are optional on the UNIX-based systems. Threetypes of PS supplies are available:

� 0 - 7 V, 15 A

� 0 - 20 V, 8 A

� 0 - 60 V, 2.5 A

NOTE These power supplies can be connected in series or parallel toincrease the voltage and current.

Each Windows NT-based GR228X UUT power supply complement is configured at GenRadaccording to the test system’s needs. Often, the configuration is based on existing GR227X andGR228X systems at your facility, so that you can easily move test sets and associated fixtures tothe other GR228X systems.

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User (Fixed) power supplies are available on e–Series systems configured with the ICA module.UNIX–based GR228X systems that do not include an ICA module, use PS 11, PS 12, and PS 13 toemulate the User (Fixed) power supplies. Two types of fixed power supplies are available:

� +5 V, 6 A

� +15 V, 0.75 A

For i–Series systems, two types of fixed power supplies are available:

� +5 V, 6 A

� +12 V, 1.3 A


GR228X Test Software

The GR228X Test System family is designed primarily to execute in–circuit tests on electricallyisolated components of a unit–under–test (UUT). Such components include analog, digital, andhybrid ICs. The GR228X Test System can

� Detect manufacturing faults, such as wrong , missing, damaged, and incorrectly insertedcomponents, and damaged etches.

� Detect connectivity faults on bare boards.

� Run functional tests on complete circuits on the systems that contain the instruments neededto perform the test.

The GR228X test program preparation and Run-Time System (RTS) software comprise theGR228X software, which is an application layered on Windows NT.

The GR228X monitor and Software Control area form the interface to the GR228X UNIX softwarewhich enables you to develop test programs, manipulate files, and test boards. You cansimultaneously perform more than one task by running multiple GR228X sessions from differentdirectories. For example, you can run two program preparation sessions at the same time.

NOTE The Automatic Test Generator (ATG) features that provide testing for digitalcomponents are not available on the GR2281A and GR2287A Test Systems.

This chapter briefly describes the test development process and the numerous software tools thatassist you in developing tests for isolating faults on the UUT. The tools are grouped into thesecategories:

� Test Preparation

� Test Generation

� Test Debug

� Test Execution

� Test Analysis

� Off-line Programming

This chapter also describes migrating from one test system to another.

3

3-2 GR228X Test Software

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A unique test program and test fixture, called a test set, must be developed for each type of boardto be tested. The test program contains many individual in-circuit component tests. These testsare usually created by the system’s Automatic Test Generator (ATG) software, which is part of thetest system’s program preparation software.

The information required to develop a test set is presented in several manuals included in theGR228X Documentation Set. Figure 3–1 identifies the manuals that provide information on aparticular phase of the test set development process. The GR228X Test Language ReferenceManual and the GR228X Test Library Programming Manual are reference manuals forcustomizing or developing tests not generated by ATG. For a complete list of the documentationavailable for your GR228X Test System, refer to the GR228X Master Index.

Gather Information, thenAnalyze Testing Requirements

Manually Create

Compile Fixture Dataand Send to Fixture Manufacturer

Use Nail Assignment to Assign Nails;Generate Fixture Reports

Generate Test Program (ATG)

Receive Test Fixtureand Verify

Translate Test Program

Release to Production

Debug Test Program

Update Test Program

Document Test Program

GR228X Test Program Generation Manual

Test Fixture Manual


GR228X Test Program Debug Manual

GR228X Test ProgramDebug Manual

GR228X Production Test User’s Guide

Test Development Phase Manual Used

Process CAD Data Circuit Description(CKT)Using CB/Test

Manual Used

CB/Test Documentation

Figure 3–1 Test Development Process and Associated Manuals


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The test preparation tools enable you to provide detailed data about the UUT devices and powerrequirements. These tools include the:

� CBTest

� Circuit Description Generator

� System Device Libraries

� Model Generation

� Power Supply Editor

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CB/Test is part of the GR228X software running on Windows NT. It converts a GenCAD (generalCAD output) file into a printed circuit board (PCB) database. The GenCAD file contains the majorphysical attributes of the board, such as the component shapes and position, pin X-Y locations,electrical net list, component types and electrical attributes, pad and via styles, board outline, andplacement side of the device. It is created from a raw CAD data file using an input processor.There are a number of input processors available for different types of CAD systems.

When the PCB database is created, you can:

� View and interrogate the database using an interactive graphics editor

� Compare the database against a system-level parts library verify if part attributes in thedatabase are correct

� Add missing parts to the parts library

� Change pin names in the PCB database

� Select the type of nodes to use in your circuit description file

� View the board placed over the receiver shelf so that you can manually edit the probeplacements


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The Circuit Description Generator (CKTGEN) enables the test engineer to create and maintain acircuit description file (.ckt). CKTGEN prompts you for information about the board you want totest and the circuit device interconnections and characteristics. For each device type specified,such as a resistor, a template displays to prompt you for the device data.

For detailed information on using CKTGEN, refer to the GR228X Test Program GenerationManual.

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Your GR228X system software includes a library toolset that has an object oriented graphicaluser interface. Use it to select and create digital, analog, hybrid component, and Boundary Scan(BSDL) models. You access the Library Toolset from the Start menu or by clicking its icon fromthe GR228X Program Launcher or the Start menu. You can use the library to:

� Show all the existing primes in a library, as well as all aliases and packages associated with aprime.

� Perform direct actions on this information, such as create, edit, view, move, rename, copy,export, add alias, add package, and delete.

The device test libraries provide storage and access to generalized test procedures, also knownas models, for individual devices. The device libraries available for your system include:

� Digital Test Library (DTL)

� Analog Component Library (ACL)

� Hybrid Test Library (HTL)

� Boundary Scan Library (BSL)

� Analog Test Library (ATL)


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The digital test library (DTL) provides storage and access to generalized test procedures, alsoknown as models, for individual digital devices. Figure 3–2 shows the Digital Test Library window.

Figure 3–2 Digital Test Library Window

The Digital Test Generation (DTG) software uses entries from Digital Test Library (DTL) files toproduce tests for digital components on a given UUT. The Digital Test Library contains individualcomponent models written in the Digital Test Source Language (DTSL).

The Digital Test Generator (DTG) uses the circuit description file and DTL models to identify andextract a generalized device test that is tailored to the specific digital device circuit configuration.The specific digital device model provides DTG with routines to:

� Test the device in most wiring configurations

� Inhibit and disable the device while testing other components

� Test any bused outputs, functional blocks, and banks

Refer to the GR228X Test Library Programming Manual for more detailed information.


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The Hybrid Test Library (HTL) provides storage and access to generalized test procedures, alsoknown as models, for individual hybrid devices. Examples of complex mixed signal parts that thehybrid test library can include; Analog to Digital Converters, Digital to Analog Converters, andoperational amplifiers.

Figure 3–3 shows the Hybrid Test Library window.

Figure 3–3 Hybrid Test Library Window



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Analog Component Library (ACL) contains a description of complex analog parts so that ATG knowsthe characteristics of each analog component inside the complex analog part and can write a simpletest for each one. Examples of complex analog parts that the analog component library can describeinclude Resistor packs and Op Amps. The library toolset can automatically create ACL models forcommon analog parts, such as resistor packs.

Figure 3–4 shows the Analog Component Library window.

Figure 3–4 Analog Component Library Window



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A Boundary Scan Library (BSL) enables you to create and manage libraries of Boundary ScanDescription Language (BSDL) models. Figure 3–5 shows the Boundary Scan library window.

The BSDL library utilities enable you to:

� Create Boundary Scan Libraries

� Verify the syntax of the BSDL models

� Add, move, and modify BSDL models

� Add and remove alias or package, or prime BSDL models

Figure 3–5 Boundary Scan Library Window

Refer to the GR228X Test Program Generation Manual for detailed information.


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The model generation tools enable you to develop models for devices on the UUT that do nothave models available in the device libraries. The available model generation tools include:

� Hybrid Model Editor

� BasicSCAN (Bscan)

� Xpress Model

� Onboard Programming Tools

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Hybrid Model Editor is an interactive graphical tool that you can use to create a model for a hybriddevice. You can use any of the system’s test instrumentation to construct the test you require.Similar to analog and digital test models, hybrid models can use .CKT file flagspecs. A model hasthe facilities to use information in the .CKT file and .ATO file in generating a test.

You access the Hybrid Model Editor from the Start menu or by clicking its icon from the GR228XProgram Launcher. The Hybrid Model Editor is designed to facilitate data entry by providing awindow that contains data entry fields. Figure 3–6 shows the Hybrid Model Editor main window.

Figure 3–6 Hybrid Model Editor Main Window


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BasicSCAN is a separately licensed software product that is designed to solve the test generationproblem for both Application-Specific ICs (ASICs) and complex commercial boundary scancomponents. You access BasicSCAN from the Start menu or by clicking its icon from the GR228XProgram Launcher.

BasicSCAN eliminates the need to develop test vectors for BasicSCAN components and has thesebenefits:

� Simplifies the program preparation and debug processes.

� Improves open pin fault coverage.

� Reduces test development time.

� Simplifies test complexity and reduces the number of test vectors.

Figure 3–7 shows the BasicSCAN main window.

Figure 3–7 BasicSCAN Main Window

Once BasicSCAN knows the boundary scan capabilities of a component, it can automaticallygenerate a Digital Test Source (.DTS) model that can be used by the test generation software.

All BasicSCAN generated models use the same test structure. They are capable of generatingdisable and inhibit sections that describe how to prevent the device from interfering with otherUUT component tests, and can also handle various component wiring configurations. Whenselected, BasicSCAN can also generate a test to run a component’s built–in self test.


The BasicSCAN test checks:

� Component’s instruction register capture value. An incorrect capture value can indicate afaulty or wrong component.

� Correct length of the Instruction Register and Boundary Scan Register.

� IDCODE and USERCODE expect values are correct.

� Opens between the system Driver/Sensor nails and the component’s input/output cells. Thistype of failure can indicate a mis–inserted or poorly attached component.

� Component pins can either capture or drive both a logic 0 and a logic 1. This detects anystuck–at failures at the component’s input/output buffers.

For more information about BasicSCAN, refer to the BasicSCAN Boundary Scan User’s Guide.

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Xpress Model is an interactive graphical tool that you can use to create a model for a digitaldevice that is not in the Digital Test Library. Xpress Model is often used to create models forcustom digital components that do not support boundary scan components, such asprogrammable array logic devices (PALs).

You access Xpress Model from the Start menu or by clicking its icon from the GR228X ProgramLauncher. Xpress Model is designed to facilitate data entry by providing a window that containsdata entry fields. Figure 3–8 shows the Xpress Model main window.

There are several 3rd-party software products that you can use to create DTL models.FS-ATG and AccuGEN are two products that can automatically generate models for PALs.

For more detailed information on generating digital models, refer to the Xpress Model User’s Guide.

Figure 3–8 Xpress Model Main Window


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Onboard programming provides a cost–effective method for testing board assemblies. It enablesyou to program memory and in-system programmable (ISP) devices after they are assembled ona printed circuit board. This reduces manufacturing costs and improves product quality. Onlyunprogrammed devices need be in stock, reducing inventory.

Programming Flash and ISP devices after board assembly reduces manufacturing time andcosts. Because using onboard programming means the devices are handled less, fewer defectsare introduced and product quality is improved. Programming the devices at board assembly timeensures the devices are programmed with the latest firmware. Onboard programming doesrequire a longer test time in the manufacturing process; throughput is lower during theprogramming process.

Flash memory is programmed using all device pins and requires full access. These devices useunique models that are created using published algorithm information produced by the vendor.

ISP logic has dedicated pins for programming a fuse matrix; this requires access to 5–6 devicepins. Programming models for these devices are automatically created using input from devicevendor-supplied tools.

Assemblies using these devices must be designed for testability because of the increased testtime. Your design must isolate pins from other components that could adversely affect theprogramming.

Onboard programming supports several vendor formats. For Flash devices, programming data isgeneric and is usually specified in one of the following file formats:

� Intel Hex–32 bit

� Motorola S–Record 32–bit

� Absolute Binary

� ASCII–Hex

For ISP devices, the supported vendors and tools are:

Vendors Vendor URL Tool

Altera www.altera.com MAX+PLUS II

AMD www.amd.com MACHPRO

Lattice www.latticesemi.com ispDCD

Xilinx www.xilinx.com EZTag

To obtain ISP vendor tools, you can contact your vendor sales representative or access thevendor home page at the specified URL.

NOTE Vendor tool names may change. There may be a vendor charge associated withthese tools.

Deep Serial Memory (DSM) is specifically designed for onboard programming test applications.DSM reduces testing and programming preparation time, and required disk space. ProgrammingFlash devices requires DSM. ISP devices can be programmed with or without DSM.


When you use DSM, data is loaded into memory once, independently of the driver/sensormemory, and is separated from the test preparation process. If the data changes from device todevice but the device configuration remains the same, the test preparation process does not needto be rerun.

The data representation is more compact than what is used in the programming language, whichreduces the required disk space. However, the bursts that result when you use DSM are very large.If the configuration changes when you use DSM, the preparation process must begin again.

The Onboard Programming Solutions tools implement onboard programming of Flash and ISPdevices using a graphical interface.

Flash memory devices are non–volatile storage devices that allow memory writes and reads whilethe devices are assembled on the board. The Flash tool, which is shown in Figure 3–9, simplifiesprogramming your Flash devices.

Figure 3–9 Flash Tool Main Window


In–system programmable (ISP) devices are logic devices that can be electronically erased andreprogrammed after they are installed on a board. Because programming these devices requiresthat power be applied to the board, the board should be checked for shorts and other defects thatcould cause damage when power is applied. The ISP tool shown in Figure 3–10, in conjunctionwith a vendor tool, simplifies the process of programming ISP devices.

Figure 3–10 ISP Tool Main Window


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You use the Power Supply Editor to describe UUT power supply requirements for testing the UUT.You access the Power Supply Editor from the Start menu or by clicking its icon from the GR228XProgram Launcher. Figure 3–11 shows the Power Supply Editor main window.

You can also access the Power Supply Editor from the TestFlo interface or from the GR228XPOWER monitor page interface.

The Power Supply Editor can generate the:

� GR228X test programming statements to power up, power down, and discharge the UUTpower nodes.

� Fixture Wiring Instructions (.fwi) file, which contains informational messages and instructionsto the fixture assembler on how to wire the power supplies in the test fixture.

� Power Test Program (.ptp), which is a stand–alone program that can be translated and run toverify that the fixture has been wired correctly and that the proper voltages are being appliedto the UUT. You can also choose to automatically merge the .ptp file with the output of the testgenerators to produce a stand-alone test program.

� Automatic Test Options (.ato or .atx) file which is input to the Automatic Test Generator (ATG).It can also contain power supply statements that are automatically included in the TestProgram file (.tpg or .tpx).

For a detailed discussion of the Power Supply Editor, refer to the online help topics.

Figure 3–11 Power Supply Editor Main Window


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The test generation tools enable you to generate the test program that identifies UUT devicefaults. These tools include the:

� Automatic Test Generator

� Preprocessor

� Scan Pathfinder

� Nail Assignment

� Translator

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The Automatic Test Generator (ATG) uses the circuit description file (.ckt) and the library files (.atl, .acl, .dtl, .htl, and .bsl) to generate the test program automatically for each device on theprinted–circuit board (PCB), otherwise called the Unit-Under-Test (UUT).

Generating a test program is a multiple step process that you control using the ATG optionsshown in Figure 3–12. For detailed information on using ATG to generate your test program, referto the GR228X Test Program Generation Manual.

Figure 3–12 ATG Monitor Page

ATG may not be able to generate tests for certain component types or device configurations notcontained in the library. There may also be configurations in which ATG detects a potential forcomponent damage or excessive error if an attempt is made to test a particular component. Inthese circumstances, ATG will not generate a test. You can however develop a test for thatcomponent using the test language. For detailed information about the test language refer to theGR228X Test Language Reference Manual.


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The preprocessor is a general purpose interpreter program that converts flagged statements in afile to GR228X test programming statements that the translator understands. The preprocessorsimplifies complex programming sequences, eliminating the need for creating tests for specificcomponents.

The preprocessor contains three interpreter programs (.IEE) files: system, update, and user.

For more information on using the Preprocessor, refer to the GR228X Test Program GenerationManual.

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The Scan Pathfinder software is a separately licensed option that can generate boundary scantest programs for UUT scan chains that are IEEE 1149.1–1990 boundary scan compliant. Thisoption comes integrated with the GR228X software

You access Scan Pathfinder from the Start menu or by clicking its icon from the GR228X ProgramLauncher. Figure 3–13 shows the Scan Pathfinder main window.

Figure 3–13 Scan Pathfinder Main Window


The Scan Pathfinder software:

� Performs full–access opens testing of individual ICs as well as more complex interactionand interconnect testing of limited–access, mixed boundary scan boards.

� Verifies the syntax and structure of Boundary Scan Description Language (BSDL) models. Italso verifies the IDCODE, USERCODE, and RUNBIST instructions.

� Integrates the boundary scan test generator with the Automatic Test Generator (ATG), andprovides a separate boundary scan diagnostic generator that communicates with theRun–Time System (RTS) software.

� Contains a graphical user interface that you use to select boundary scan tests and options.

� Generates boundary scan reports that provide details about the UUT boundary scanconfiguration, generated tests, fault coverage, and nodes where access is not required.

� Contains automatic adaptive pattern test generation to resolve ambiguous short faults and toproduce accurate pin–level diagnostics.

� Contains a boundary scan debug mode to help identify test problems.

� Contains a boundary scan library with BSDL models for a number of commercially availableBoundary Scan parts.

Scan Pathfinder generates boundary scan test programs that can detect these UUT interconnectfaults:

� Test Access Port (TAP) pin stuck–at failures.

� Faulty scan paths through the UUT’s Instruction, Bypass, or Boundary Scan Registers.

� Incorrect IDCODE or USERCODE values in Boundary Scan parts.

� Opens at nailed UUT Boundary Scan pins.

� Boundary Scan parts that fail their built-in self-test.

� Shorts between nailed conventional nodes and un–nailed Boundary Scan nodes.

� Shorts and opens between un–nailed Boundary Scan nodes.

For more information regarding modeling and testing of boundary scan components, refer to theGR228X Scan Pathfinder User’s Guide.


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The nail assignment tool automatically assigns all test nails and produces fixture wiring reports. Itsupports SHORT_WIRE nail assignment, which is used to build short–wire fixtures. It alsosupports new fixture development as well as modifications to an existing fixture resulting from anECO.

The NAIL_ASSIGNMENT monitor page produces the report files used to build a fixture. UseNAIL_ASSIGNMENT to:

� Obtain an accurate fixture wiring list.

� Obtain a cross-reference of the assigned nail, node name, and nail interconnection. This datais useful during fixture debug and test program debug.

� Modify diagnostic files to improve the failure report data.

� Modify a test set to reflect changes as the result of an ECO.

NAIL_ASSIGNMENT also offers panel test and Opens Xpress capabilities. For more detailedinformation, refer to the GR228X Test Program Generation Manual.

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The Translator uses a source test program (.tpg) file as its input and produces an object file(.obc ) file as its output. The .OBC file is a compact binary file that the tester uses to test UUTs.

The Translator:

� Locates and reports program format and syntax errors.

� Creates an error list (.lis) file.

� Checks the language structure, syntax, and nail multiplexing for conflicts as the statements aretranslated.

� Reports error messages which include the statement where the error was recognized. A caretis inserted under the point of error recognition. The location and type of error are also listed belowthe statement.

NOTE Each .tpg must be translated for the target tester on which it will run. Therefore,if you have more that one GR228X Test System, you must have an .obc file foreach test system that will run the test program.

For more detailed information, refer to the GR228X Test Program Generation Manual.


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The GR228X system has easy to use debugging tools that can decrease the time you spenddebugging your test programs. These tools include:

� Program Xplorer

� Autodebug

� Digital Waveform Display

� Measuring Fault Coverage (ALLFAULT)

� Floating Point Array Display

All the debugging tools are described in detail in the GR228X Test Program Debug Manual.

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The Program Xplorer is a graphical debugging tool for analog tests within the GR228X testprogram.

Before using the Program Xplorer, you should:

� Run ATG and nail assignment

� Build and debug the test fixture

� Obtain one or more UUTs that you can use for debugging the test program and fixture

The Program Xplorer display, shown in Figure 3–14, provides a window environment that enablesyou to:

� Modify GR228X instrument statements

� Determine which nodes surround the Device Under Test (DUT)

� Plot measurement readings

� View graphical views of mux connections

The Program Xplorer relies on information stored in the .idd and the .wor files, both of which arecreated from the .ckt file. For detailed information on debugging with Program Xplorer, refer to theGR228X Test Program Debug Manual.


Figure 3–14 Program Xplorer

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Autodebug is a debugging tool that uses the Run-Time System (RTS) to debug your test programwithout programmer interaction. Autodebug performs the actions that you would interactively performusing RTS’s Debug mode. Autodebug assumes that the test program, not the UUT or fixture, is thecause for a test that does not pass.

You can edit the Autodebug command file (.ADC) to control which debug changes are performed.When you debug a test program using Autodebug, it recognizes the type of test and applies asequence of debug commands that attempt to pass the test.

The tasks Autodebug can perform on analog tests include:

� Changing the values of analog test parameters

� Swapping source and measure

� Adding a small delay to adjust the guard set

� Modifying instrument parameters

For digital tests that fail or have unknown output states, Autodebug can:

� Initiate the learning of output states

� Insert faults using the Digital Fault Insertion (DFI) feature

Most of the debug actions that Autodebug initiates require data contained in the in-circuitdiagnostic data file (.idd). Although an Autodebug session can be performed without an .idd,useful results generally occur only when an .idd file is supplied.

For detailed information on debugging analog tests with Autodebug, refer to the GR228X TestProgram Debug Manual.


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When you test a digital component using the DIAGNOSE monitor page set to Debug mode, awaveform display of the driven and sensed logic states displays as shown in Figure 3–15. Youcan view digital debug information by using:

� Test statement

� Digital waveform

The test system also offers unique debugging features for bursts that contain CRC collection andindirect addressing statements.

Figure 3–15 UNTRANSLATE Display and Waveform Display


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Interpreting data in an array often depends on the ability to display a waveform or part of awaveform and to quickly find what you are looking for. These are the system’s waveform plottingcapabilities.

Capability Description

Multiple windows Enables you to display up to 20 plot windows at a time. Eachwindow has a unique title.

X–Y Coordinates Uses crosshairs to read X–Y coordinates.

Multiple waveforms in asingle window

Enables you to add waveforms to an existing window, deletewaveforms, lock waveforms, and hide waveforms.

Window size Enables you to change the Plot window size.

Waveform attributes Enables you to select a waveform, change its color, point sizeand shape, and the type of lines it uses to connect points.

Selecting the amount ofdata to plot

Enables you to plot an entire array or a portion of an array(subarray).

Saving, loading, andprinting

Enables you to save data from a plot window for a futuredisplay. You can load previously saved plot data or print a plot.

Magnification Enables you to focus (zoom) on a particular portion of thewindow.

Log10 mode Enables you to convert the display to log10 mode.

Scrolling Enables you to scroll (shift) the waveform display left, right, up,and down.

Help Provides on–line help for the plot window.

The PLOT system subroutine and the debug PLOT command only display the values at the timethe plot was made.


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The GR228X software provides test techniques to handle the many types of components usedon printed–circuit boards. ALLFAULT is a Run-Time Debug command that analyzes your testprogram and generates a report indicating how effective the test is at detecting potential faults.The ALLFAULT generated report can provide:

� Digital Fault Insertion results for all digital components that are tested within a burst. It alsoflags device pins that can not detect open and stuck pin faults.

� Results for all test program BUSTEST and FORCE sections. It flags BUSTESTS that fail andidentifies disable and FORCE sections that have incorrect current measurements.

� A test summary for each component tested using analog instruments.

This data is derived from running the analog component tests many times, then reporting themin, max, and standard deviation of the collected measurements. The flags for this test canindicate when a test failed, is measuring too close to a measurement limit, or is unstable fromtest to test.

� UUT Fault Coverage Summary section that identifies:

Board summary of digital fault insertion results

Digital Bursts that failed and had no fault inserted

Digital Bursts that had faults inserted, but failed during reruns

UUT components tested using the Opens Xpress technique

Bustest statistics information

Analog tests that contain problems which should be debugged

UUT components that are not tested using any technique

Nodes that are missing from the shorts and contact tests

The ALLFAULT Test Coverage Report can be used by several different departments to improveproduction and product quality.

� The Test Engineer can use the report to identify tests that may need more debugging, oridentify components that are missing tests, and can be used to document the test programfor other departments.

� The Manufacturer or Customer receiving the test program can use the ALLFAULT GeneralSummary section at the end of the report to determine the fault coverage provided by thein–circuit test program. The report identifies components that may require additional testingafter in–circuit test. Functional tests or system self tests can be created for areas of the boardthat are not fully tested during in–circuit testing.

� The Repair Technician can use the ALLFAULT General Summary to help troubleshootdifficult–to–repair boards. The report lists the type of test used, any problems with the test,and any untested components.

NOTE The ALLFAULT command uses the ATG internal work (.wor) and the in-circuitdiagnostic data (.idd) files to obtain circuit connection and componentinformation.

The test information for each component will vary depending on the test technique used. For detailedinformation on using ALLFAULT, refer to the GR228X Test Program Debug Manual.


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There are two ways to plot an array or a subarray. You can use the PLOT system subroutinewithin a test program to automatically plot waveforms, or you can use the PLOT debug commandwhile stepping through a test program.

Test programs can use arrays of data that can contain up to 65535 floating–point numbers. A testprogram can use arrays, for example, as a multi–tone signal input to the Arbitrary WaveformGenerator (AWG). The output of a DUT can be sampled with the Digital Multimeter (DMM) andsaved into an array for examination; this is called digital signal processing (DSP). Commonapplications using waveforms include measuring gain, frequency response, and settling time.

One way of examining an array’s data is to plot its contents. The plot provides a visualrepresentation that confirms the data and displays trends.

You typically plot arrays during the debug phase of test program development.

In both cases, the plot displays in a plot window. There can be more than one array plot windowduring a session, and each window’s graph can include multiple array plots. The GR228Xsoftware permits you to manipulate the views.

You can issue a PLOT command from the debug prompt to send a plot to a plot window createdby a CALL PLOT system subroutine. Similarly, by specifying a particular plot window name in aCALL PLOT system subroutine, you can send a plot to a plot window that you created in debugmode.

Refer to GR228X Advanced Applications for information about the use of arrays when convertingbetween the time and frequency domains.


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Figure 3–16 shows the main parts of a plot window.

Figure 3–16 Plot Window

The plot window has a menu bar that permits you to perform activities such as saving and printinga waveform, altering the view of a waveform, and obtaining online help.

You can operate on the entire display, for example, using features such as scrolling and resizing.You can select an individual waveform within a plot by changing its attributes (color, dot size andshape, line thickness) or hide it from view.

You can customize the plot window to include multiple waveforms. You can select an individualwaveform and alter its attributes to distinguish it from other waveforms.

To focus on particular data, you can change the view by zooming and scrolling the plot. You canupdate the display, while keeping portions and removing other portions. The plots provide you thecapability to manipulate the display to help you interpret the data.


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You can generate a plot during test program debug using either a system subroutine call fromwithin the test program or by stepping through the test program and running the PLOT debugcommand. The two methods are interchangeable and yield the same display. The result is agraph of an array in a window.

Both methods permit you to select the amount of data, the plot window to which it is displayed,and whether to retain previously generated plots in a selected window.

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The GR228X system test execution software includes:

� Standard test software

� PinPoint Guided Probe

� Panel Test, Split Fixturing, and Serial Numbering

� TEST XPRESS

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Production testing is performed using the DIAGNOSE Monitor page in Test mode. Test modeexecutes the test program and provides comprehensive diagnostic messages to the operator,identifying failing components. The diagnostic data can be tailored to the application

The standard test software includes these diagnostic techniques:

� Limited or unlimited access mode

� BUSTEST

� Softprobe

� Scratchprobe

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A privileged user can set the access mode. Automated testing can be set up using a batchprocess that allows options to be set without operator intervention.

Limited access mode allows you to limit operator access to testing. This means the operator canonly test the UUT, use Scratchprobe, obtain test diagnostics, and log test data.

Unlimited access mode allows full use of the DIAGNOSE page which includes access to all thedebugging options and all the other monitor pages.

Refer to the GR228X Test Program Generation Manual for more information about accessmodes.


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The BUSBUST test technique is used to detect and diagnose device defects on bus nodes. TheBUSBUST Diagnostic Routine can isolate a BUS node defect to the device output pin that iscausing the GO/NOGO test to fail.

A test program can contain many BUSTEST sections which include two tests that are performedin this order.

� The GO/NOGO test verifies that the bus nodes can be disabled by placing all the deviceoutputs connected to the bus nodes in a high–Z state. The bus nodes are pulled high andthen pulled low to verify that all the devices can be disabled from the bus. If the GO/NOGOtest:

Passes, the devices can be BURST tested later in the program.

Fails, the devices are marked as UNTESTABLE.

� Measure the device output driver currents using a force high and force low test for eachdevice output connected to the bus. The forces must be properly written to allow accuratediagnosis, should the GO/NOGO test fail.

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SoftProbe is a diagnostic technique that can identify multiple open or stuck input and output pinson a wide variety of digital ICs using normal in–circuit test vectors. SoftProbe test procedures useDigital Fault Insertion to verify the fault coverage and build a knowledge database. The mostaccurate diagnostic messages are the result of high fault coverage of the test vectors.

SoftProbe detects open pins by first recording the failing component signature, then successivelyrerunning the component test while simulating open input failures. After each run of the test, thenew failing output signature is compared to the original signature. If a difference exists betweenthe two signatures, the pin is not open. If there is no difference between the two signatures, thepin is open.

While the diagnostic data is being collected, it is constantly compared to the digital componentknowledge database to eliminate false diagnostics.

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ScratchProbe is a diagnostic technique used after all the digital ICs are individually tested. Thissecond level digital diagnostic tests each IC that failed. This technique uses a hand-held probe toassist in determining whether a fault is caused by a bad IC, open connecting circuitry, or a ‘badnail.’ Scratchprobe can be invoked by the user, the diagnostics, or the test program.

To verify connectivity between a suspect IC pin and a system driver, you lightly scratch the probecontinuously along the length of the side of the IC. If continuity is found, the IC is bad. If nocontinuity is found, you can choose to probe other pins on the node.

When you select the full monitor option, continuity is tested between the suspect device and thesuspect nail on the node. If continuity to some of the devices on the node is discovered, an opentrack exists. If no continuity is found, the nail contact is bad or the IC pin is bent.


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The PinPoint Guided Probe enables you to develop test programs that execute an arbitrarynumber of functional block tests (bursts) on functionally or topologically partitioned UUTs.

The PinPoint Guided Probe feature consists of various software modules within the GR228XProgram Preparation and Run–Time software.

The feature prompts the test operator to probe the nodes that logically influence the faulty node.Once the source of the failure is determined, the operator can print a report detailing the problem,place it with the PCB, then test the next PCB.

A mechanism is required to develop source files for functional block tests for use by the GR228XProgram Preparation software. While these files can be developed manually, it is often necessaryto use a simulator to model the functions they are based upon.

Probing is an interactive process between the operator and the system that aids in the diagnosis ofa failing UUT. Guided probe operation requires that the system have a database that contains thecircuit description of the UUT and fault free probe values for every node. The guided probe processuses this information to find the failing node.

Refer to the PinPoint Guided Probe User’s Guide for detailed information.

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TEST XPRESS is a suite of tests that identify open circuits (such as solder opens) and/orimproperly oriented components. These options are separately licensed:

� Junction Xpress

� Opens Xpress

� Cap Xpress

� Orient Xpress

NOTE TEST XPRESS is not available for GR2288 test systems.

The TEST XPRESS options require these elements:

� Test Instruments

You need a stable ac source and flexible sensitive sampling ac voltmeter which is supplied bysystems containing an ICA module, an AFTM module, or ATM, AMM, and APM modules. TheACZ device used by systems with a measure cage is not sensitive enough to use with theTEST XPRESS options.

� A path connecting the DUT to the test instruments

The TEST XPRESS options used for establishing the path depend on the option selected.

Option How connected

Junction Xpress Applies an AC voltage with DC bias to pins on IC that have adiode path to ground. Does not require special fixturinghardware.

Opens Xpress,Cap Xpress, andOrient Xpress

Places an opens probe above the DUT to capacitively couplepins on the DUT to the sampling voltmeter. Requires a specialoverclamp fixture.


� Access to the pins of the DUT

The UUT in-circuit test fixture provides the required access to the pins of the DUT. You willneed to create a Device Probe Information (.dpi) file along with the .ckt file when generatingthe Device Probe Report (.dpr) for the fixture vendor.

For detailed information on using the TEST XPRESS options, refer to the TEST XPRESSUser’s Guide.

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This option is a licensed feature that generates tests that identify open pins on ICs. No specialfixture wiring is required to use Junction Xpress.

Junction Xpress testing is recommended for testing:

� Ceramic or shielded device packages, or devices with heat sinks.

� Devices that have a high pin count.

� Marginal solder joints.

� Devices that do not have device models available.

� Devices that would add considerable cost because they require special fixture hardware.

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This tool helps the test programmer decide whether to test a particular component using JunctionXpress or Opens Xpress. The tool examines the circuit description contained in the .idd file andmakes a prediction regarding the testability of each pin on a component. The accuracy of theprediction for each pin is limited because it is based on an analysis of the circuit description andnot on actual electrical measurements, as is done by the TEST XPRESS POLEARN command.However, the assessment of the testability of the component itself will usually be accurate.

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This is a licensed option that generates tests that identify opens on connectors, sockets, and ICs.To use Opens Xpress, special hardware must be added to the test fixture.

Opens Xpress testing is recommended for testing:

� Non–semiconductor devices.

� Analog and mixed–signal devices.

� Whether the fixture is properly contacting the UUT.

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This option generates tests that identify misoriented polarized capacitors. Cap Xpress uses theOpens Xpress modified test fixture.

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This option generates tests that identify misoriented integrated circuits (ICs) that contain multipleasymmetric power and ground pins. Orient Xpress uses the Opens Xpress modified test fixture.


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The Panel Test and Split Fixturing features enable you to speed up your production testing time.The Serial Numbering feature enables you to track a board through your production process.

Refer to the GR228X Panel Test, Serial Numbering, and Split Fixturing Manual for moreinformation about these features.

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The Panel Test software enables you to test a homogeneous panel of boards. Testing boardswhile still on the panel decreases the handling and throughput time. The Panel Test softwaresupports:

� Prepending and/or appending a user-specified prefix or suffix to each board in the panel.

� Passing and failing data collection.

� Fixture reports that encompass all boards on the panel.

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Split fixturing combines two smaller, identical, independent board test fixtures with a standard testfixturing casing. Using a split fixture enables you to increase board test throughput.

The split fixture operates by alternating between the right-hand and left-hand side of the fixturewhen testing. This approach eliminates waiting for one test to complete before you setup and testanother UUT. You can alternate between the right and left sides for testing the UUTs.

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In typical testing, serial numbers are used with some form of data collection. You can use serialnumbering to electronically collect data and print the serial number on the repair ticket.

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The test analysis tools enable you to collect data during testing, then generate reports based onthe information you select. The tools that enable you to analyze the collected data include:

� Real time data collection

� Data Display

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The GR228X system software can record test data and generate reports to help you analyze thetested component data. Analyzing the collected component data can assist in test developmentand manufacturing by producing reports that let you view board failure and pass ratios.


Table 3–1 provides you with a brief description of the data logging options that are selected from theDIAGNOSE monitor page as shown in Figure 3–17. Each option produces a .log file with a varyingdegree of information.

Table 3–1Logging Options

Logging Option Description

Standard Collects data for all components on the UUT. The amount of test datacollected for the components determined by the Logging options. TheStandard Logging combination of +PASSES option and LOG page PLOTSgeneration is commonly used as a debug tool and is sometimes used asacceptance criteria for Analog tests.

The ALLFAULT command on the lower–level DIAGNOSE monitor page canalso be used to characterize test program measurements and produce faultcoverage reports. Refer to the GR228X Test Program Debug Manual.

Selective Data (SEL)

Enables you to select the components you want logged and the amount ofdata logged. Selective logging requires a Selective Options file (.sel) as in-put.

Real-Time DataCollection (RTDC)

Provides the most comprehensive data collection control. You can selectsampling intervals. RTDC is commonly used in a real–time network envi-ronment as it allows for transfer of Log data at the end of each test run.RTDC requires a Data Collection Options file (.dco) as input.

Figure 3–17 DIAGNOSE Page

After you have run the test program many times and have collected data on the componentstested in the program, you are ready to analyze the collected component data. The collectedcomponent data is placed into a formatted ASCII file with a .log extension during testing. The datathat is stored in the .log file is not sorted or statistically processed.


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Summary reports are formatted ASCII files with a specific number of statistical entries. You usesummary reports as input for further processing. The three summary report types generated bythe .log report generator are:

Report Type Description

Statistics Contains board–level data for analyzing the current data or summary file. Itincludes the:� Time period for which the report was generated � Number of failing, passing, and total boards tested � Total testing, waiting, and elapsed times� Average passing, failing, and actual board test times� Throughput per hour� Total faults and faults per failing board, if failure data was collected

Failure Data Contains current failure data on a component level in addition to board–levelstatistics. The information includes the total number of failures and faults perfailing board for each failing component. Also, you can generate a failuretrend analysis in this mode if you specify the .LOG and .SUM files to be usedin the comparison in the LOG = fields. Both current and summary failure dataare reported, and any significant difference in failure rates for a componentare flagged to bring attention to it.

ComponentPlots

Component plots generate a distribution of test measurements over a rangeon the component–level in addition to total number of failures andboard–level statistics. The range is determined by the component test limitsand measured values for all logged current data. No trend analysis isperformed in this mode.


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Data Display (datad) extracts process performance statistics from the test system log file. Itidentifies trends or deficiencies in particular components by analyzing the failures that occur whenyou test a board. Collected data can also be graphed and plotted using the Data Displaygraphical software.

You access data display from the Start menu or by clicking its icon from the GR228X ProgramLauncher.

Analyzing test results with Data Display requires you to import the files you want to analyze, thenchoose the type of report you want to generate. Data Display offers these features:

� Custom report generation

� Multi–line color charts

� 3–D bar charts

� Run Chart

� User–annotated charts

� Hard copy reports

Use Data Display to generate these reports and charts:

� Tester Yield Report

� Test Times Report

� Passing Board Volume Report

� Parts Overview Chart

� Top Failing Parts Chart

� Top Failing Components Chart

� Measured Values Chart

For detailed information about Data Display, refer to the GR228X Production Test User’s Guide.


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GenRad offer these separately licensed software products that you can use on off-lineprogramming stations.

� ATG Xpress

� TRACS III

� GRXpert

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ATG Xpress is a separately licensed option that enables you to develop a test program off-line ona PC. For more information, refer to the ATG Xpress User’s Guide.

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TRACS III is a process information system designed to give you a clear and comprehensivepicture of your manufacturing operation. TRACS III links all of your test processes together whichenables you to determine what is actually occurring in your manufacturing processes. You canobtain reports on a wide range of data, such as defects and yields. For more information, refer tothe TRACS III documentation.

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GRXpert is a software translation tool that converts HP3065/3070 or Schlumberger TechnologiesSeries 30 in–circuit test programs to GenRad GR227X/228X language. The program is designedto facilitate the smooth transfer of previously debugged HP3065/3070 or SchlumbergerTechnologies (Factron/Fairchild) Series 30 test programs to GenRad’s GR227X/228X platforms.

GRXpert translates HP in–circuit test program files (TESTPLAN), wirelist files (WIRELIST), digitalexecutables (all digital ASCII source files under the BOARD digital directory) and their associatedcircuit description files (.BCF) to GenRad GR227X/228X circuit descriptions (.CKT) and testprogram (.TPG) files.

GRXpert also translates Schlumberger Technologies in–circuit test program files (.BA), CHIPSdigital test routines (.SR), and their associated circuit description files (.FX) to GenRadGR227X/228X Circuit Descriptions (.CKT) and Test Program (.TPG) files.

For more information, refer to the GRXpert User’s Guide.


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At times you may want to move a test set to a different system model in the GR228X family. It ispossible to use a GR228X test program and fixture that was developed for one type of GR228XTest System on a different type of GR228X Test System. The process of transferring the testprogram and fixture from one system type to another is called migration.

In most cases, a test set developed on a GR227X Test System can be used on your GR228XTest System. These test sets can be transferred and modified as necessary.

Table 3–2 identifies which GR228X test sets can be migrated to GR228X Test Systems.

Table 3–2Supported Migration to GR228X Testers

GR228X Target Test System

Source

Tester 2280 2281 2281A 2282 2283 2284 2285 2286 2287 2287L/LX

2287A 2288

2289

GR2270 Y � Y � Y � Y Y � Y � Y � Y Y Y Y � Y Y

GR2271 Y � Y � Y � Y Y � Y � Y � Y Y Y Y � Y Y

GR2272 Y � Y � Y � Y Y � Y � Y � Y Y Y Y � N Y

GR2275 Y Y Y � Y Y Y Y Y Y Y Y � Y Y

GR2276 Y Y Y � Y Y Y Y Y Y Y Y � Y Y

GR2280 Y Y � Y Y Y Y Y Y Y Y � N � Y

GR2281 N � Y � N � N � Y Y N � Y Y Y � N � Y

GR2281A N � Y N � N � Y Y N � Y Y Y � N � Y

GR2282 Y Y Y � Y Y Y Y Y Y Y � N � Y

GR2283 Y Y Y � Y Y Y Y Y Y Y � N � Y

GR2284 N � Y � Y �� N � N � Y N � Y Y Y � N � Y

GR2285� N �� Y � Y �� N � N � Y N � Y Y Y � N � Y

GR2286 Y � Y � Y �� Y Y Y Y � Y Y Y � N � Y

GR2287 N � Y � Y �� N � N �� Y � Y � N � Y Y � N � Y

GR2287L,GR2287LX

N � Y �� Y �� N � N � Y � Y � N � Y Y �� N � Y �

GR2287A N � Y � Y � N � N � Y Y N � Y Y N � Y

GR2288 N � Y � Y � N � N � Y � Y � N � Y � Y � Y � Y �

GR2289� N � Y � Y �� N � N � Y � Y � N � Y Y Y � N �

� Limited due to converter wiring and target test system pin count limitations.

� Limited due to target test system pin count limitations.

� System tests analog components exclusively, it does not support digital component testing.

� Requires a fixture converter that has 1-to-1 nail mapping. There is also a constraint on the number of source test program nails (1 -1152).

� Not supported because there is a greater multiplexing ratio.

� Requires any SET TIMING statements be rewritten as SET CLOCK statements. Tests must have 5MHz capability.

For a detailed explanation on migrating a test set from one system to another, refer to theGR228X Migration User’s Guide.


Windows NT SystemEnvironment

This chapter provides a brief description of the Windows NT-based GR228X system environmenttools which include:

� Editing Tools

� User Interfaces

� Help Tools

For more information on the Windows NT-based GR228X system environment, refer to theGR228X System Administration User’s Guide, or the non-GenRad documentation that shippedwith the test system.

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The GR228X software is shipped with these text editors:

� Programmer’s File Editor (PFE)

� emacs

� vim

In addition, Window NT provides text editors such as Edit, Notepad, and WordPad. Refer to theWindows NT online help for more information about these editors. You can also install third-partytext editors such as MicroSoft Word or EDT.

4

4-2 Windows NT System Environment

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The Programmer’s File Editor (PFE) is a 32–bit, large–capacity text file editor. Its capacity islimited only by the total amount of memory available on your system. There are noeditor–imposed limits on the number of files that you can edit simultaneously, nor on the numberof edit windows that you can have open. There is no limit on the size of file that can be handled,and no limit the number of lines that a file may contain. PFE adheres strictly to the Windows MDIconventions.

Some of the feature of PFE enable you to:

� Invoke most commands and facilities from menus

� Navigate with a mouse or with keyboard shortcuts

� Cut and paste from the clipboard

� Reconfigure the use of keys

� Run DOS commands, such as compilers, and to capture their output into windows forinspection

� Define sets of templates that you can insert into the file you’re editing.

� Group templates into distinct files and load them for use automatically.

The documentation describing how to use PFE is available via online help topics. Click the Helpmenu for the available help options.


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emacs is a powerful text editor that is distributed through the Free Software Foundation, whichdevelops GNU software.

emacs contains many powerful features and it has been tailored to work well under the Windowsenvironment. When you run emacs, a separate emacs window is created, complete with menusthat permit you to enter emacs commands with the mouse.

GenRad recommends that you become familiar with emacs and use it as your default editorbecause it is fast, powerful, works well in a Windows environment, and is available on a numberof different operating systems.

Refer to the GR228X Test Program Generation Manual for more information that can assist you inlearning the emacs editor. In addition, refer to the online help for emacs.

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vim is a display–oriented text editor that is available for Windows–NT. Expert vim users can makeediting changes very quickly; however, beginners find vim difficult and hard to use.

A brief list of common vim editing commands can be found in Appendix E. Also, more informationabout vim command line options, refer to the online help.

There are two modes in vim:

� Insert mode

Insert mode enables you to add text to your file by typing at the keyboard.

� Command mode

Command mode enables you to enter vim commands using the keyboard. You are placed incommand mode when you first enter vim.

Refer to the GR228X Test Program Generation Manual for more information. In addition, refer tothe online help for vim.


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The GR228X Test Systems offer two user interfaces: TestFlo and the GR228X Monitor. You canuse either TestFlo or the monitor as your default user interface when you are developing new testprograms.

You must use the GR228X monitor page interface when migrating a test program and fixture fromone test system to another.

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The TestFlo user interface is an easy to use environment that helps you develop test programswithout needing to know all the details of the individual files. TestFlo brings you through the testdevelopment process in the sequence necessary to generate an accurate and complete test set.It conveniently manages much of the complex test development process for you. Figure 4–1shows TestFlo’s main window.

NOTE If you have a GR2281A, or GR2287A Test System, the default user interfaceis TestFlo.

You can use TestFlo for developing test programs for new PCBs as well as performing an ECO.You cannot use TestFlo to migrate to another GR228X Test System. Refer to the GR228X TestProgram Generation Manual for a detailed explanation of the TestFlo Program PreparationManager interface.

Figure 4–1 TestFlo PPM Main Window


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The GR228X monitor user interface helps you to develop and debug test programs, performproduction testing, and collect test results data. When using the monitor pages, you control everydetail of the test development process. This amount of control is often desired by experiencedusers of GR228X Test Systems. You require complete control of the test system environmentwhen performing ECOs or migrating to another GR228X Test System.

NOTE If you have a GR2280, GR2281, GR228X e-Series, GR228X i-Series,or aWindows NT PC Retrofitted Test System, the default user interface is theGR228X monitor.

The test development process for generating an accurate and complete test set is the same nomatter which interface you choose. During the test development process, you will use severalmonitor pages. Figure 4–2 shows the DIAGNOSE Monitor page which is the default when youaccess the GR228X monitor page.

The monitor utility pages are described in the GR228X System Administration User’s Guide. Mostof the monitor pages are described with their corresponding function in the GR228X Test ProgramGeneration Manual. Some monitor page descriptions are presented in the GR228XDocumentation as they are used during the test development process.

Figure 4–2 GR228X Monitor Page Interface


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There are a variety of online help options available to you within the GR228X Test SystemEnvironment. The GR228X Test Systems contain these on-line help tools:

� GR228X monitor page help

� Online help topics

� Online manuals

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Monitor help is available for both command mode and screen–editing mode.

In command mode, you can invoke monitor help by:

Action Description

Typing Help at commandprompt

Displays monitor help. Press the space bar to page throughmonitor help. Press Return to quit help.

Clicking PF4 from VT100keypad

Displays monitor help. Press the space bar to page throughmonitor help. Press Return to quit help.

Typing Help optionnameat command prompt

Displays monitor help for the specified option. The helpdisplays in the bottom three lines of the monitor page. To clearoption help, click PF4 from the VT100 keypad.

In screen–editing mode, you can toggle the display of monitor option help for the selected optionby clicking PF4 from the VT100 keypad. When option help is enabled, the option help changeswhen you move from one field to another.

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There are several levels of GR228X online help. You can access:

� All of the help topics for the GR228X system

To access all of the help topics for the GR228X system, click Start and point to Programs.Then, point to GenRad 228x and click GR228X Help.

� Help topics for a particular application

The help topics for a particular application, such as the Library Toolset or the Power Editor,are available from the applications Help menu by double-clicking the Help Topics option.

� Context Sensitive Help

For most applications, clicking the F1 key or a toolbar icon enables context sensitive help,which enables you to get specific help information for parts of the graphical user interface. Inaddition, some application Help menus provide access to specific help topics.


Figure 4–3 shows the help topics window for the GR228X online help. This window has threetabs:

� Contents

� Index

� Find

Figure 4–3 Help Topics Window


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Figure 4–3 shows the help topics window with the Contents tab selected. This tab displays helptopics organized by category. Double–clicking a book icon shows the help topics for that category.Double–clicking a document icon displays the help text for that topic. You can double–click anopen book icon to close it. Figure 4–4 shows the organization within a typical category.

Figure 4–4 Help Topics Window with Contents Tab Selected


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Figure 4–5 shows the help topics window with the Index tab selected. This tab displays the helpindex. To find a topic you want, type its name in the search edit box. Or, you can scroll throughthe list of index entries. Click the entry you want, and then click Display to display the help text forthe selected entry. Alternatively, you can double–click the entry to display its help text.

Figure 4–5 Help Topics Window with Index Tab Selected

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Selecting the Find tab enables you to search for specific words or phrases used in the help topics,instead of searching by category or index entry. Before using Find for the first time, you mustcreate a database of the words used in all of the help topics. You have three choices for creatingthe database:

� Minimize database size (recommended)

� Maximize search capabilities

� Custom search capabilities

Be sure that you have sufficient disk space available for creating this database.


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The GR228X software manuals are supplied in electronic format and are available from theGenRad 228X menu. With manuals in electronic format, you can navigate quickly through thedocumentation and locate specific information.

The online manuals can be viewed using the Adobe Acrobat Reader 4.0. You can use Acrobat toview, navigate, and print documents, which are stored in Adobe Portable Document Format(PDF). Acrobat Reader 4.0 and the online manuals are provided and installed on your system, ifyou choose to install them, during the GR228X installation procedure.

The online manuals are available from the Start menu, in the GenRad 228X menu.

The Acrobat Reader allows you to perform full-text searches over the entire set of GR228X onlinemanuals using the Search command. A master index of the GR228X online manuals is providedfor this purpose. Also, Search provides a number of ways to limit or expand your search.

For more information about using the Acrobat Reader, refer to Acrobat’s Reader Guide, which isaccessible by click Help > Reader Guide.

A-1Introduction to GR228X Test Systems

Documentation QuickReference

Use the tables in this chapter to quickly locate detailed information that will help you tounderstand and perform GR228X Test System tasks. Use the Table of Contents or Index of thedocument referenced to find the chapter or page where the task starts, or refer to the MasterIndex.

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If you want information on ... Refer to your system’s ...

System site requirements Site Preparation Guide

System and peripheral installation procedures Installation Manual

Preparation and wiring of a test fixture Test Fixture Manual

System configuration and functional description,preventive maintenance, system verification program,and automatic calibration

Maintenance Manual

Servicing information, diagnostic procedures, removaland replacement, and calibration

Service Manual

System diagrams and related part lists Diagrams and Parts List Manual

A

A-2 Documentation Quick Reference

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If you want information about... Refer to the...

The process of preparing and developing a testset


Debugging test programs GR228X Test Program Debug Manual

Performing production tests GR228X Production Test User’s Guide

How to write library routines GR228X Test Library Programming ReferenceManual

How to create a new test program or modify anexisting test program, and GR228X languagecommands

GR228X Test Language Reference Manual

Device library models that currently exist GR228X Device Library Reference Manual

Advanced applications and test methods GR228X Advanced Applications ProgrammingGuide

Managing the system and its user accounts, filetransfers, backup, software installation, systemerror messages, and system startup/shutdown

GR228X System Administration User’s Guide

How to test panels of boards, how to use serialnumbers, and how to use a split fixture

GR228X Panel Test, Serial Numbering, andSplit Fixturing Manual

Converting test program files, device libraries,and test fixtures from one type of system toanother system

GR228X Migration User’s Guide

Developing test programs for use with the guidedprobe which execute an arbitrary number offunctional block tests (bursts) on functionally ortopologically partitioned PCBs

Pinpoint Guided Probe User’s Guide

AFTM hardware and software GR228X Analog Functional Test Module(AFTM) User’s Guide

DSM hardware and software GR228X Deep Serial Memory (DSM) User’sGuide

How to use Scan Pathfinder software GR228X Scan Pathfinder User’s Guide

Testing for open pins without power or vectors TEST XPRESS User’s Guide

Using Xpress Model to develop DTS modelsusing regular and pseudo–random patterntechniques

Xpress Model User’s Guide

Hardware and software features for GR2285 andGR2289 10–MHz systems

GR228X Xtended Performance OperationManual

Software to generate digital test source (DTS)models that comply with the IEEE 1149.1 1990standard

BasicSCAN User’s Guide

How to use the Import CAD Data subflow withinthe TestFlo user interface.

Importing CAD Data Tutorial

The various data importers that create a GenCADfile from CAD file(s).

CB/Test User’s Guide

A-3Introduction to GR228X Test Systems

If you want information about... Refer to the...

GR228X test system architecture, standard andoptional hardware, and features of the testprogram developement software.

Introduction to GR228X Test Systems

The Multi-Protocol Instrument module, whichprovides functional test capabilities for a GR228Xtest sytem.

Multi-Protocol Instrument User’s Guide

The installation, setup, and use of theFrequency/Time Interval Instrument as well as thetest language system subroutines that support it.

Frequency/Time Interval Instrument User’sGuide

The installation, setup, and use of the VehicleControl Interface module as well as the testlanguage system subroutines that support it

Vehicle Control Interface User’s Guide

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If you want information on... Refer to the...

The DEC PC DECpc 400ST Series User’s Guide

Instructions for running and analyzing theQAPlus diagnostics

DIAGSOFT QAPlus Manual

Installation, operation, and preventivemaintenance procedures for the Magnetecprinter

GenRad Magnetec Model 960S Printer Manual

Installation and preventive maintenanceprocedures for the Microline printer

Okidata Microline 320/321 Printer Setup Guide

Installation, preventive maintenanceprocedures, and troubleshooting for the Seikoprinter

Seiko DPU–5300 Line Thermal Printer User’sGuide

Setup, operation, and troubleshooting ofUninterruptable Power Supplies

Smart–UPS 600 BatteryBackup/Uninterruptable Power Supply Owner’sManual

Software for the Battery Backup/UninterruptablePower Supply

PowerChute Plus for Windows NT Manual

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Introduction to GR228X Test Systems

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