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Algorithm for Fast Statistical Timing Analysis Jakob Salzmann , Frank Sill, Dirk Timmermann SOC 2007, Nov ‘07, Tampere, Finland Institute of Applied Microelectronics and Computer Engineering University of Rostock
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Dec 31, 2015

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Institute of Applied Microelectronics and Computer Engineering. Algorithm for Fast Statistical Timing Analysis Jakob Salzmann , Frank Sill, Dirk Timmermann SOC 2007, Nov ‘07, Tampere, Finland. University of Rostock. Outline. Motivation Static Timing Analysis Statistical Timing Analysis - PowerPoint PPT Presentation
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Page 1: Institute of Applied Microelectronics and Computer Engineering

Algorithm for Fast Statistical Timing Analysis

Jakob Salzmann, Frank Sill, Dirk Timmermann

SOC 2007,Nov ‘07, Tampere, Finland

Institute of Applied Microelectronics and

Computer Engineering University of

Rostock

Page 2: Institute of Applied Microelectronics and Computer Engineering

2

Outline

Motivation

Static Timing Analysis

Statistical Timing Analysis

Simulation Results

Conclusion & Outlook

Page 3: Institute of Applied Microelectronics and Computer Engineering

3

Motivation(1)

Progressive transistor scaling leads to higher impact of parameter

variations

Physical on-chip variations due toImprecise fabrication process

Gate oxide thicknessTransistor width, lengthDoping

EnvironmentAmbient temperatureCooling

TimeElectro migrationMechanical stressThermal stress

Page 4: Institute of Applied Microelectronics and Computer Engineering

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Motivation(2)

Parameter variations lead to unpredictable timing behavior

Chips compete against each otherBefore market entry, knowledge about maximum speed in the worst case Step forward: Information on speed distribution of a chip production set

Most chips are faster than worst case speed!

I1

I2Y

I1

I2

Y

Time

I1

I2

Y

Time

Delay

Delay ?

?

Page 5: Institute of Applied Microelectronics and Computer Engineering

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Static Timing Analysis

Classic Approach: Worst case analysis

Estimate margins of all parameters

Find parameter set which results in worst case delay

Simulate gate delay with worst case inputs

Add delays of each data path to get resulting delay of the circuit

No realistic representation of timing behavior

Overstated circuit delay

I1

I2

Y

TimeWorst case

delay

Page 6: Institute of Applied Microelectronics and Computer Engineering

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Statistical Timing Analysis(1)σ – standard deviation

μ – mean value

2

2

1

2*

1)(

x

exfPDF:

Innovative ApproachEstimate margins and Gaussian distribution of all possible

parameters

Monte-Carlo simulations to get delay probabilities

Estimate Probability Density Function (PDF) of gate delay

Calculate PDF of overall delay

More realistic representation of timing behavior

Prediction how many circuits match

estimated delay

μ

σ

Page 7: Institute of Applied Microelectronics and Computer Engineering

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Our new approach

Only one simulation set per gate

No underestimation of

standard deviation

Simple extension to gates with

more than 2 inputs

Low calculation effort

Multi input switching (MIS)

Former approach [Aga04]

Lot of simulation sets per gate

Imprecise calculation of standard

deviation

#Simulation sets ~ #input²

High calculation effort

Single input switching (SIS)

Simple mathematical approach

µY = µ1 + µ2, σY² = σ1² + σ2²

Correlations between gatesNot within scope of this

presentation

Statistical Timing Analysis(2)

Page 8: Institute of Applied Microelectronics and Computer Engineering

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Statistical Timing Analysis(3)

Multi input switching – Simulation

Theses:Resulting mean value depends on

Gate PDF

Input PDF

Order and time differences of inputs

µY increases in case of proximate inputs with high standard deviations

µG increases by proximate inputs

Resulting standard deviation depends on dominating input

Difference between Input Mean Values [ps]

Page 9: Institute of Applied Microelectronics and Computer Engineering

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Statistical Timing Analysis(4)

Approach to calculate proximate effect and dominating inputSeparate behavior of gate into impact of Inputs and Gate itself

“Resulting Input PDF“ by convolution of all Input-PDFs

Addition of “Resulting Input PDF“ and ”Gate PDF” by Single Input Switching algorithm

I I

σY² = σI² + σG² µY = µI + µG

Page 10: Institute of Applied Microelectronics and Computer Engineering

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Statistical Timing Analysis(4)

Approach for Resulting „Input PDF“ by convolution of all Input-PDFsIntegration of all „Input PDF“ to obtain their Cumulative Density Function (CDF)

Approximation of all „Input CDF“ by a set of linear equations

Multiply the edges of the „Input CDFs“ approximations to get a “Resulting Input CDF“

Mean value by intersection with probability 0.5

Standard deviation by root-mean-square

deviation of the points of the “Resulting Input

CDF” from mean value

Page 11: Institute of Applied Microelectronics and Computer Engineering

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Simulation Results(1)

Algorithm must not underestimate gate delay!Calculated mean value ≥ Simulated mean value

Calculated standard deviation ≥ Simulated standard deviation

Three example cases HSpice

Case1: σA = 5ps, σB = 10psCase2: σA = 20ps, σB = 40psCase3: σA = 40ps, σB = 80ps

Approximation

NAND2 - Gate

Page 12: Institute of Applied Microelectronics and Computer Engineering

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Simulation Results(2)

Tree structure – worst case of switching behavior

I1I2I3...

...I31I32

Y

Different input switching cases 0 → 1

Case1 Case 2 Case 3 Simulationtime

HSpice simulation

μ 1052 ps 975 ps 1001 ps 20 min

σ 32 ps 35 ps 38 ps

Presented algorithm

μ 1082 ps 1039 ps 1039 ps 75 ms

σ 33 ps 42 ps 42 ps

Former Approach (Agarwal)

μ 1044 ps 969 ps 989 ps 1.4 s

σ 27 ps 27 ps 27 ps

Static worst case timing analysis

μ 1295 ps 1295 ps 1295 ps 60ms

σ - - -

Page 13: Institute of Applied Microelectronics and Computer Engineering

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Conclusion & Outlook

Goal: Developing algorithm for calculating statistical timing behavior

of a Multi Input Gate

Only one simulation set per gate

No underestimation of gate delay

Simple extension to gates with more than 2 inputs

Low calculation effort

Automatic tool for calculating statistical timing behavior of larger (and

real) circuits

Page 14: Institute of Applied Microelectronics and Computer Engineering

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Questions?

Thank you for your attention!

[AGA04] A. Agarwal, F. Dartu, and D. Blaauw; Statistical Gate Delay Model

Considering Multiple Input Switching, 41st Design Automation

Conference, USA, 2004

References