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Supporting Information for:
Inkjet-printed Porphyrinic Metal-Organic Framework
Thin Films for Electrocatalysis
Chun-Hao Su, Chung-Wei Kung, Ting-Hsiang Chang, Hsin-Che Lu, Kuo-Chuan
Ho*, and Ying-Chih Liao*
Department of Chemical Engineering, National Taiwan University, Taipei, Taiwan
*#1 Sec. 4 Roosevelt Rd., Taipei, Taiwan, e-mail: [email protected]
Contents:
1. Stability tests for MOF-525 inks
2. Photo and Optical microscopic images of MOF thin film.
3. Cross-section SEM images of MOF thin film.
4. CV curves of the M1.35 thin films with different layers.
5. Faradaic efficiency for MOF thin film
6.SEM image and XRD patterns of MOF thin film before and after the CV tests.
7. Recyclability test for MOF thin film by CV test
Electronic Supplementary Material (ESI) for Journal of Materials Chemistry A.This journal is © The Royal Society of Chemistry 2016
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Fig. S1. Stability tests for MOF-525 inks with M2.7, M2.0, M1.35, M 1.1 and M0.9:
sedimentation process of MOF-525 crystals dispersed in DMF under regular
gravity. All samples have the same concentration of MOF-525 crystals (10
mg/mL) and were placed in a sonication bath for half an hour before the test.
M 2.7 M 1.35 M 0.9 M 2.0 M 1.1
M 2.7 M 1.35 M 0.9 M 2.0 M 1.1
M 2.7 M 1.35 M 0.9 M 2.0 M 1.1
M 2.7 M 1.35 M 0.9 M 2.0 M 1.1
Start
6 hrs
16 hrs
24 hrs
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Fig. S2. (a)Photo of the inkjet-printed M1.35 thin film after printing for six layers on the
ITO glass.(b) Photo of the inkjet-printed M1.35 thin film pattern on the ITO
glass. Optical microscopic images of M1.35 thin films after printing for (c) two
layers, (d) six layers, (e) ten layers, and (f) twenty layers.
500 μm
500 μm 500 μm
500 μm
(c) (d)
(e) (f)
Two layers Six layers
Ten layers Twenty layers
(a)
1 cm 5 mm
(b)
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Fig. S3. Optical microscopic images of the inkjet printed (a) M 2.7, (b) M 2.0, (c) M1.35,
(d) M1.1, and (e) M0.9 thin films with six layers of printing.
500 μm
500 μm
500 μm
500 μm
500 μm
(a) (b)
(c) (d)
(e)
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Fig. S4. Cross-section SEM images of the (a) M2.7, (b) M2.0, (c) M1.35, (d) M1.1, and
(e) M0.9 thin films at low magnification, and (f) M2.7, (g) M2.0, (h) M1.35, (i)
M1.1, and (j) M0.9 thins film at high magnification.
5 μm
5 μm
3 μm
3 μm
3 μm
1 μm
1 μm
500 nm
500 nm
(a)
(i)
(j)
500 nm
19.26±0.71 μm
14.60±0.81 μm
9.13±0.46 μm
6.61±0.13 μm
5.75±0.07 μm
(b)
(c)
(d)
(e)
(g)
(h)
(f)
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Fig. S5. CV curves of the M1.35 thin films with (a) two layers, (b) four layers, (c) six
layers, (d) eight layers, (e) ten layers, (f) fifteen layers, and (g) twenty layers,
measured in 0.1 M KCl solutions containing various concentrations of nitrite.
0.0 0.2 0.4 0.6 0.8 1.0
0
50
100
150
200
250
300
350
400
C
urr
en
t d
en
sit
y(
A/c
m2)
Potential (V) vs. Ag/AgCl
Tested in 0.1M KCl (aq)
Scan rate:25 mV/s
Background
0.25mM NaNO2
0.50mM NaNO2
0.75mM NaNO2
8 Layers
0.0 0.2 0.4 0.6 0.8 1.0
0
50
100
150
200
250
300
350
400
C
urr
en
t d
en
sit
y(
A/c
m2)
Potential (V) vs. Ag/AgCl
Tested in 0.1M KCl (aq)
Scan rate:25 mV/s
Background
0.25mM NaNO2
0.50mM NaNO2
0.75mM NaNO2
2 Layers
0.0 0.2 0.4 0.6 0.8 1.0
0
50
100
150
200
250
300
350
400
C
urr
en
t d
en
sit
y(
A/c
m2)
Potential (V) vs. Ag/AgCl
Tested in 0.1M KCl (aq)
Scan rate:25 mV/s
Background
0.25mM NaNO2
0.50mM NaNO2
0.75mM NaNO2
4 Layers
0.0 0.2 0.4 0.6 0.8 1.0
0
50
100
150
200
250
300
350
400
C
urr
en
t d
en
sit
y(
A/c
m2)
Potential (V) vs. Ag/AgCl
Tested in 0.1M KCl (aq)
Scan rate:25 mV/s
Background
0.25mM NaNO2
0.50mM NaNO2
0.75mM NaNO2
6 Layers
0.0 0.2 0.4 0.6 0.8 1.0
0
50
100
150
200
250
300
350
400
C
urr
en
t d
en
sit
y(
A/c
m2)
Potential (V) vs. Ag/AgCl
Tested in 0.1M KCl (aq)
Scan rate:25 mV/s
Background
0.25mM NaNO2
0.50mM NaNO2
0.75mM NaNO2
20 Layers
0.0 0.2 0.4 0.6 0.8 1.0
0
50
100
150
200
250
300
350
400
C
urr
en
t d
en
sit
y(
A/c
m2)
Potential (V) vs. Ag/AgCl
Tested in 0.1M KCl (aq)
Scan rate:25 mV/s
Background
0.25mM NaNO2
0.50mM NaNO2
0.75mM NaNO2
15 Layers
(a) (b)
(c) (d)
0.0 0.2 0.4 0.6 0.8 1.0
0
50
100
150
200
250
300
350
400
C
urr
en
t d
en
sit
y(
A/c
m2)
Potential (V) vs. Ag/AgCl
Tested in 0.1M KCl (aq)
Scan rate:25 mV/s
Background
0.25mM NaNO2
0.50mM NaNO2
0.75mM NaNO2
10 Layers(e) (f)
(g)
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We used the Griess reagent to calibrate the nitrite concentration with
spectrophotometer (Fig. S6 (a)). Then, the M1.1 thin film was used in an amperometric
test at 0.85 V in stationary 0.1 M KCl containing 30 M of nitrite for 1 hour. The total
volume of test fluid was 5 mL. After the electro catalytic reaction, we found the
absorbance at 523 nm declined from 0.3585 to 0.3495, indicating a nitrite concentration
decline from 30.04 M to 29.098 M. From the charge amount supplied (1.68 × 10-3 C),
the Faradaic efficiency is calculated to be about 54%.
Fig. S6. (a) the Griess reagent to calibrate the nitrite concentration with
spectrophotometer. (b) the absorbance for nitrite concentration before and
after electro catalytic
0 10 20 30 40 500.0
0.1
0.2
0.3
0.4
0.5
0.6
Nitrite concentration (M)
ANO2-= 0.0088+0.01164CNO
2-
R2=0.9994
ab
so
rba
nce
at
52
3 n
m
500 520 5400.25
0.30
0.35
0.40
before the electro catalytic
after the electro catalytic
absorb
ance
Wavelength (nm)
(a) (b)
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Fig. S7. SEM images of the M1.1 thin film (a) before and (b) after the CV tests.(c) XRD
patterns of M1.1 powder and after the CV test.
1 μm
(a)
1 μm
(b)
M 1.1
M 1.1
Before electrocatalyticmeasurements
After electrocatalyticmeasurements
3 4 5 6 7 8 9 10 11 12
Inte
ns
ity
(a
.u.)
M 1.1 powder
M 1.1 thin film after electro catalytic
measurements
2 Theta (degree)
(c)
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Fig. S8. Recyclability test for M1.1 thin film by CV test
0.0 0.2 0.4 0.6 0.8 1.0
0
50
100
150
200
C
urr
en
t d
en
sit
y(
A/c
m2)
Potential (V) vs. Ag/AgCl
Tested in 0.1M KCl (aq)
Scen rate:25 mV/s
1st test
2nd test
3rd test
4th test
M1.1 thin film