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IMPRS: Ultrafast Source Technologies 1 Lecture V: February 26, 2015: Ultrafast Electron Sources and Accelerators Franz X. Kärtner Electron Gun Key Parameters: operation mode: pulsed or CW single bunch charge time structure of the beam normalized transverse emittance longitudinal phase space for compression Different Guns/Photo Injectors for Diff. Applications: Direct current (DC) gun Normal conducting (NC) RF gun Superconducting (SC) RF gun
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IMPRS: Ultrafast Source Technologies · -5 . Semiconductors: 10-2 . Fast response time: < 100 ps ; uniform emission, flat surface, less than nm level surface roughness low dark

Oct 04, 2020

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Page 1: IMPRS: Ultrafast Source Technologies · -5 . Semiconductors: 10-2 . Fast response time: < 100 ps ; uniform emission, flat surface, less than nm level surface roughness low dark

IMPRS: Ultrafast Source Technologies

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Lecture V: February 26, 2015: Ultrafast Electron Sources and Accelerators

Franz X. Kärtner Electron Gun Key Parameters:

• operation mode: pulsed or CW • single bunch charge • time structure of the beam • normalized transverse emittance • longitudinal phase space for compression

Different Guns/Photo Injectors for Diff. Applications: • Direct current (DC) gun • Normal conducting (NC) RF gun • Superconducting (SC) RF gun

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Electron Emission and Cathode Emittance

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There typically is a high electron density in a metal or semi- conductor: 1 electron per unit cell with length scale of about 3 Å.

We need to apply work to remove electrons from bulk reservoir:

Thermal Emission: Richardson-Laue-Dushman et al., Rev. of Mod. Phys. 21, 185 (1949)

Field Emission: Fowler Nordheim E.L. Murphy, and R.H. Good, Phys. Rev 102, 1464 (1956).

Photo Emission: Fowler- Dubridge, L.A. DuBridge Phys. Rev 43, 0727 (1933).

Dr. K. Jensen, Naval Research Laboratory

F: DC, RF, (THZ, MID-IR or VIS)

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How short is a Femtosecond

3 USPAS 2013_ Smedley 3

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USPAS 2013_ Smedley 4

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USPAS 2013_ Smedley 5

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USPAS 2013_ Smedley 6

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USPAS 2013_ Smedley 7

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USPAS 2013_ Smedley

Key-Quantitiy: Beam Brilliance

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Page 10: IMPRS: Ultrafast Source Technologies · -5 . Semiconductors: 10-2 . Fast response time: < 100 ps ; uniform emission, flat surface, less than nm level surface roughness low dark

Other important cathode properties

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Quantum Efficiency: Metals: 10-5 Semiconductors: 10-2

Fast response time: < 100 ps ; uniform emission, flat surface, less than nm level surface roughness low dark current and low field emission at high fields

life time > 1 year at reasonable pressure < 10-10 Torr

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USPAS 2013_ Smedley / Dowell 11

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USPAS 2013_ Smedley 12

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USPAS 2013_ Smedley 13

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USPAS 2013_ Smedley 14

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USPAS 2013_ Smedley 15

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USPAS 2013_ Smedley 16

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Cockcroft-Walton Accelerator

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4 MeV, 100 mA

DC - Accelerator Technology

from K. Wille

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Van de Graaf Generator / Accelerator

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10 MeV

from K. Wille

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RF - Zyklotron

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> 600 MeV

from K. Wille

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850 MeV

Microtron

from K. Wille

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Synchrotron

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5 -10 GeV

from K. Wille

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RF – Linear Accelerator

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SLAC, 50 GeV

from K. Wille

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References:

K.L. Jensen et al., „Theoretical model of the intrinsic emittance of a photocathode,”Appl. Phys. Lett. 89, 224103 (2006). W. E. Spicer, Phys. Rev. Lett. 11, 243 (1963). David H. Dowell and John F. Schmerge, „Quantum efficiency and thermal emittance of metal photocathodes,“ PRSTAB 12, 074201 (2009). K. Wille, „Physik der Teilchenbeschleuniger und Synchrotronstrahlungsquellen,“ Teubner Studienbücher (1992). US PARTICLE ACCELERATOR SCHOOL, uspas.fnal.gov

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