8/18/2019 IEEE-32.pdf http://slidepdf.com/reader/full/ieee-32pdf 1/45 ANSI/IEEE Std 32-1972 An American National Standard IEEE Standard Requirements, Terminology, and Test Procedure for Neutral Grounding Devices Surge Protective Devices Committee of the IEEE Power Engineering Society IEEE Standards Board American National Standards Institute Abstract: IEEE Standard Requirements, Termin ology, and Test Procedu res for Neutral Groundin g Device sThe Institute of Electrical and Electronics Engineers, Inc 345 East 47th Street, New York, NY 10017, USA No part of this publication may be reproduced in any form, in an electron ic retrieval system or otherwise, without prior w ritten perm ission of the publ isher. yright The Institute of Electrical and Electronics Engineers, Inc. ded by IHS under license with IEEE Licensee=CH2M Hill Worldwide/5960458046, User=Puga, Jose David Not for Resale, 10/08/2013 16:39:04 MDT eproduction or networking permitted without license from I HS - - ` , ` , , ` , , , ` , , ` , ` , , , , ` , ` ` , , , , ` - ` - ` , , ` , , ` , ` , , ` - - -
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8/18/2019 IEEE-32.pdf
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ANSI/IEEE Std 32-1972
An American National Standard
IEEE Standard Requirements, Terminology,and Test Procedure for Neutral GroundingDevices
Surge Protective Devices Committee
of the
IEEE Power Engineering Society
IEEE Standards Board
American National Standards Institute
Abstract: IEEE Standard Requirements, Terminology, and Test Procedures for
Neutral Grounding Devices
The Institute of Electrical and Electronics Engineers, Inc
345 East 47th Street, New York, NY 10017, USA
No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without prior written permission of the publisher.
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CLAUSE PAGE
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CLAUSE PAGE
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IEEE Standard Requirements,Terminology, and Test Procedure forNeutral Grounding Devices
1. General
1.1 Scope
1.2 Service Conditions
1.2.1 Usual Temperature and Altitude Service Conditions .
°
°
°
1.2.2 Unusual Temperature and Altitude Service Conditions .
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IEEE Std 32-1972 IEEE STANDARD REQUIREMENTS, TERMINOLOGY, AND
1.2.3 Other Unusual Service Conditions .
X/R
1.3 Operation at Altitudes in Excess of 3300 ft (1000 m)
1.3.1 Insulation .
1.3.2 Operation at Rated Current .
Table 1— Dielectric Strength Correction Factors for Standard Devices at Altitudes Greater than 3300 ft (1000 m)
Altitude
meters feet
Factor for
Correction
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TEST PROCEDURE FOR NEUTRAL GROUNDING DEVICES IEEE Std 32-1972
2. Basis for Rating
2.1 Conditions
2.2 Rated Current
I
Continuous Duty Current in Percent of
Thermal Current Rating
Reactors, Ground-Fault
Neutralizers, and
Transformers Used For
Grounding
Rated Time of
Device Resistors
I c KI
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IEEE Std 32-1972 IEEE STANDARD REQUIREMENTS, TERMINOLOGY, AND
K
I
2.3 Rated Voltage (see definition in Section 13)
°
Table 2—
Table 3— Value of K for Eq 1
Maximum Allowable Average Temperature,* Degrees Celsius of Cooling Air for Carrying Rated Current
Methods of Cooling
Apparatus
3300 ft
(1000 m)
6600 ft
(2000 m)
9900 ft
(3000 m)
13 200 ft
(4000 m)
°
°
°
X/ R K X/R K X/R K
K π R/X
X/R
X/R X R K I
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IEEE Std 32-1972 IEEE STANDARD REQUIREMENTS, TERMINOLOGY, AND
Table 4— Insulation Classes for Neutral Grounding Devices
Insulation Class
System Insulation
Class, kV (See Note 1)
Fault Voltage Criteria
(See Note 2)
Column 1 Column 2 Column 3 Column 4
Class BIL kV kV
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TEST PROCEDURE FOR NEUTRAL GROUNDING DEVICES IEEE Std 32-1972
3.2 Dielectric Withstand Test Levels
3.3 Protective Devices
4. Temperature Limitations
4.1 Limits
4.2 Steady-State Temperature Rises (see definition in Section 3)
T
4.3 Rated-Time Temperature Rises (see definition in Section 13)
4.3.1 Ten-Second and One-Minute Ratings .
4.3.2 Ten-Minute Ratings .
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IEEE Std 32-1972 IEEE STANDARD REQUIREMENTS, TERMINOLOGY, AND
4.3.3 Extended-Time Ratings (see definition in Section 13)
5. Tests
5.1 Routine Tests (see definitions in Section 13)
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IEEE Std 32-1972 IEEE STANDARD REQUIREMENTS, TERMINOLOGY, AND
T a b l e 6
— L
i m i t i n g T e m p e r a t u r e R i s e s A
b o v e 3 0 ° ° ° °
C A m b i e n t f o r C u r r e n t C
a r r y i n g P a r t s — N e u t r a l D e v i c e s
* †
C o l u m n 1
C o l u m n 2
C o l u m n 3
C o l u m n 4
C o l u m n 5
C o l u m n 6
C o l u m n 7
5 5 ° ° ° ° C
O i l - I m m e r s e d
5 5 ° ° ° ° C
D r y - T y p e
8 0 ° ° ° ° C
D r y - T y p e
1 5 0 ° ° ° ° C
D r y - T y p e
R e s i s t o r s
T e
m p e r a t u r e R i s e , ° ° ° ° C
T e m p e r a t u r e
R i s e
° ° ° ° C
T i m e
F a c t o r ‡
s e c o n d s
T e m p e
r a t u r e
R i s e
° ° ° ° C
T i m e
F a c t o r ‡
s e c o n d s
T e m p e r a t u r e
R i s e
° ° ° ° C
T i m e
F a c t o r ‡
s e
c o n d s
T e m p e r a t u r e
R i s e
° ° ° ° C
T i m e
F a c t o r ‡
s e c o n d s
S
t a i n l e s s
S t e e l * *
C a s t
G r i d #
S t e a d y S t a t e
R a t e d T i m e
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TEST PROCEDURE FOR NEUTRAL GROUNDING DEVICES IEEE Std 32-1972
θ
°
°
θ
θ θ
°
θ °
θ °
θ °
θ
θ
θ
P
C
M
T a b l e 6 — L
i m
i t i n g T e m p e r a t u r e R i s e s A b o v e 3 0 ° ° ° °
C A m b i e n t f o r C u r r e n t C a r r y i n g P a r t s — N e u t r a l D e v i c e s
* † (
C o n t i n u e d )
C o l u m n 1
C o l u m n 2
C o l u m n 3
C o l u m n 4
C o l u m n 5
C o l u m n 6
C o l u m n 7
5 5 ° ° ° ° C
O i l - I m m e r s e d
5 5 ° ° ° ° C
D r y - T y p e
8 0 ° ° ° ° C
D r y - T y p e
1 5 0 ° ° ° ° C
D r y - T y p e
R e s i s t o r s
T e
m p e r a t u r e R i s e , ° ° ° ° C
T e m p e r a t u r e
R i s e
° ° ° ° C
T i m e
F a c t o r ‡
s e c o n d s
T e m p e
r a t u r e
R i s e
° ° ° ° C
T i m e
F a c t o r ‡
s e c o n d s
T e m p e r a t u r e
R i s e
° ° ° ° C
T i m e
F a c t o r ‡
s e
c o n d s
T e m p e r a t u r e
R i s e
° ° ° ° C
T i m e
F a c t o r ‡
s e c o n d s
S
t a i n l e s s
S t e e l * *
C a s t
G r i d #
C θ M
P
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TEST PROCEDURE FOR NEUTRAL GROUNDING DEVICES IEEE Std 32-1972
5.2.1 Impulse Tests (see definition in Section 13).
×
Reduced Full-Wave Test
Chopped-Wave Test
Full-Wave Test
×
×
5.2.2 Applied-Potential Test (See definition in Section 13).
5.2.3 Induced-Potential Test (see definition in Section 13).
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IEEE Std 32-1972 IEEE STANDARD REQUIREMENTS, TERMINOLOGY, AND
5.3 Losses and Impedance
°
6. Construction
6.1 Bushings, Insulators, and Oil
6.2 Nameplates
°
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TEST PROCEDURE FOR NEUTRAL GROUNDING DEVICES IEEE Std 32-1972
6.3 Tanks and Enclosures
7. Reactors
7.1 Insulation Levels
7.2 Dielectric Tests
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IEEE Std 32-1972 IEEE STANDARD REQUIREMENTS, TERMINOLOGY, AND
7.2.1 Impulse Tests .
7.2.2 Applied-Potential Tests .
7.2.3 Induced-Potential Tests .
8. Ground-Fault Neutralizers
8.1 Insulation Levels
8.2 Dielectric Tests
8.2.1 Impulse Tests .
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TEST PROCEDURE FOR NEUTRAL GROUNDING DEVICES IEEE Std 32-1972
8.2.2 Applied-Potential Tests .
8.2.3 Induced-Potential Tests .
9. Grounding Transformers
9.1 Insulation Levels
9.2 Dielectric Tests
9.2.1 Impulse Tests .
Line End Ground End
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IEEE Std 32-1972 IEEE STANDARD REQUIREMENTS, TERMINOLOGY, AND
9.2.2 Applied-Potential Tests .
9.2.3 Induced-Potential Tests .
10. Resistors
10.1 Resistor Element
10.1.1 Rated Voltage (see definition in Section 13).
°
10.1.2 Temperature Coefficient of Resistance .
R R θ θ
a R R
R θ θ ( )
R R a θ θ ( )[ ]
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TEST PROCEDURE FOR NEUTRAL GROUNDING DEVICES IEEE Std 32-1972
10.1.3 Conductor Connections .
10.1.4 Resistance Test .
±
10.2 Insulation Levels
10.3 Dielectric Tests
10.3.1 Impulse Tests .
10.3.2 Applied-Potential Tests .
10.3.3 Induced-Potential Tests .
11. Capacitors
11.1 Insulation Levels
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IEEE Std 32-1972 IEEE STANDARD REQUIREMENTS, TERMINOLOGY, AND
11.2 Dielectric Tests
11.2.1 Impulse Tests .
11.2.2 Applied-Potential Tests .
11.2.3 Induced-Potential Tests .
12. Combination Devices
12.1 Insulation Levels
12.2 Dielectric Tests
Line End Ground End
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TEST PROCEDURE FOR NEUTRAL GROUNDING DEVICES IEEE Std 32-1972
12.2.1 Impulse Tests .
12.2.2 Applied-Potential Tests .
12.2.3 Induced-Potential Tests .
13. Definitions and Terminology
acceptance test:
ambient temperature:
applied-potential test:
askarel:
basic impulse insulation level (BIL):
chopped wave:
compound-filled (for a grounding device):
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IEEE Std 32-1972 IEEE STANDARD REQUIREMENTS, TERMINOLOGY, AND
conservator system or expansion tank system:
critical impulse flashover voltage:
design test:
dielectric tests:
disconnectable device:
dry-type (for a grounding device):
extended-time rating (of a grounding device):
gas-oil sealed system:
ground:
ground current:
grounded:
grounded circuit:
grounded concentric wiring system:
grounded conductor:
grounded parts:
grounded system:
ground end (of a neutral grounding device):
ground-fault neutralizer:
ground-fault neutralizer grounded:
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TEST PROCEDURE FOR NEUTRAL GROUNDING DEVICES IEEE Std 32-1972
grounding device:
grounding transformer:
impedance grounded:
impedance voltage:
impulse flashover voltage:
impulse tests:
×
impulse withstand voltage:
induced-potential test:
inert gas-pressure system:
inhibited oil: insulation class (of a grounding device):
insulating materials:
line end (of a neutral grounding device):
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IEEE Std 32-1972 IEEE STANDARD REQUIREMENTS, TERMINOLOGY, AND
Table 9— Classification of Insulating Materials
losses (of a grounding device): I R
° °
°
°
°
°
°
°
°
°
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TEST PROCEDURE FOR NEUTRAL GROUNDING DEVICES IEEE Std 32-1972
mechanical limit:
minimum impulse flashover voltage:
neutral grounding device:
neutral-grounding capacitor:
neutral grounding impedor:
neutral grounding reactor:
neutral grounding resistor:
neutral grounding wave trap:
oil:
oil-immersed (for a grounding device):
permanently grounded device:
rated continuous current:
rated current (of a neutral device) (current rating):
rated frequency (of a grounding device):
rated thermal current:
rated time (time rating):
rated-time temperature rise (for a grounding device):
rated voltage:
reactance grounded:
resistance grounded:
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IEEE Std 32-1972 IEEE STANDARD REQUIREMENTS, TERMINOLOGY, AND
resistance method of temperature determination:
routine test:
sealed tank system:
short-time rating (of a grounding device):
solidly grounded:
starting temperature (for a grounding device):
steady-state temperature rise (for a grounding device):
tap:
thermal current rating:
thermometer method of temperature determination:
ungrounded:
uninhibited oil:
voltage to ground:
14. Test Code
14.1 Resistance Measurements
14.1.1 Necessity for Resistance Measurements .
I R
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TEST PROCEDURE FOR NEUTRAL GROUNDING DEVICES IEEE Std 32-1972
14.1.2 Determination of Cold Temperature .
14.1.2.1 General .
14.1.2.2 Windings Out of Oil .
14.1.2.3 Windings Immersed in Oil .
14.1.3 Drop-of-Potential Method .
Figure 1— Connections for the Drop-of-Potential Method of Resistance Measurement
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IEEE Std 32-1972 IEEE STANDARD REQUIREMENTS, TERMINOLOGY, AND
14.1.4 Bridge Methods.
14.2 Dielectric Tests
14.2.1 Test Procedure.
14.2.1.1 Factory Dielectric Tests .
14.2.1.2 Insulation Resistance .
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TEST PROCEDURE FOR NEUTRAL GROUNDING DEVICES IEEE Std 32-1972
14.2.1.3 Periodic Dielectric Tests in the Field .
14.2.1.4 Tests on Bushings .
14.2.2 Applied-Potential Tests.
Neutral Capacitor Terminal-to-Case
Neutral Resistor
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IEEE Std 32-1972 IEEE STANDARD REQUIREMENTS, TERMINOLOGY, AND
14.2.3 Induced-Potential Tests
14.2.3.1 Grounding Transformers and Ground-Fault Neutralizers .
14.2.3.2 Dry-Type Current-Limiting Reactors .
14.2.3.3 Oil-Immersed Current-Limiting Reactors .
Frequency in Hz Duration in seconds
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TEST PROCEDURE FOR NEUTRAL GROUNDING DEVICES IEEE Std 32-1972
14.2.3.4 Neutral Capacitors .
14.2.3.5 Neutral Resistors .
14.2.4 Standard Impulse Tests.
14.2.4.1 Reduced Full-Wave Test .
14.2.4.2 Chopped-Wave Test .
14.2.4.3 Full-Wave Test .
14.2.4.4 Connections for Impulse Tests .
Ω
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IEEE Std 32-1972 IEEE STANDARD REQUIREMENTS, TERMINOLOGY, AND
14.2.4.5 Detection of Failure .
14.2.4.6 Wave to be Used for Impulse Tests .
×
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TEST PROCEDURE FOR NEUTRAL GROUNDING DEVICES IEEE Std 32-1972
14.3 Impedance and Loss Measurements
Figure 2— Connections for Impedance Voltage and Impedance Loss Tests
E
E E I
E E I P
I
I R
°
T
T
P ′ P ′ θ′; P P
E r
P
I
E x E
E r
P x′
P xT θ′
T θ
P s′ P s T θT θ′
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IEEE Std 32-1972 IEEE STANDARD REQUIREMENTS, TERMINOLOGY, AND
14.3.1 Wattmeter Method.
I R
I R
I R
E E E
I R
14.3.2 Bridge Method.
14.4 Temperature-Rise Tests
14.4.1 Loading for Temperature-Rise Tests.
14.4.2 Determination of Average Measured Winding Temperature by the Hot-Resistance Method.
θ R
Ro
T θo( ) T
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TEST PROCEDURE FOR NEUTRAL GROUNDING DEVICES IEEE Std 32-1972
T
T
θ R
θ R
R
R
A B F
A
θ R Ro
Ro
T θo( ) θo
A ( )
× F ( )
B ( )
F ( )×
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TEST PROCEDURE FOR NEUTRAL GROUNDING DEVICES IEEE Std 32-1972
14.4.4 Temperature-Rise Tests — Dry-Type Devices.
°
K
T
T
θ °
K T
T θ
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IEEE Std 32-1972 IEEE STANDARD REQUIREMENTS, TERMINOLOGY, AND
14.4.5 Correction Back to Shutdown
14.4.5.1 Empirical Method .
°
I R
°
14.4.5.2 Cooling Curve Method .
14.5 Temperature-Rise Calculations
14.5.1 Thermal Short-Time Capability Calculations for Reactors, Ground-Fault Neutralizers, and
Transformers Used for Grounding.
θ
θ t
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TEST PROCEDURE FOR NEUTRAL GROUNDING DEVICES IEEE Std 32-1972
m at
t
T
T
θ t
θ
θ °
W
W ° e
e
e °
C
∈
C θ °
θ T θ s( ) e( )m m
[ ]
aW s
C av
T θ s
W x
C av T ( )
e( )T
T θ s
θ T θ s( ) εm
e εm ( ) [ ]
C x θ x Ai
Ac
C x θ x Ai
Ac
C x θ x Ai
Ac
C x θ x Ai
Ac
yright The Institute of Electrical and Electronics Engineers, Inc.ded by IHS under license with IEEE Licensee=CH2M Hill Worldwide/5960458046, User=Puga, Jose David
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IEEE Std 32-1972 IEEE STANDARD REQUIREMENTS, TERMINOLOGY, AND
A
A
Table 10— Respective Metric and English System Nomenclature for Eqs 15 and 16
14.5.2 Thermal Capability Calculation for Neutral Resistors
14.5.2.1 Respective Metric and English System Equations for Temperature Rise and Current
Density, When Current is Constant .
Symbol and Identity Metric English
θ ° °
θ ° °
θ ° θ ° θ
a
° °
δ
C
J
r
t
− x
°⋅
°⋅
Ω
Ω
θ
ao
aor otJ o
C δ
θ
yright The Institute of Electrical and Electronics Engineers, Inc.ded by IHS under license with IEEE Licensee=CH2M Hill Worldwide/5960458046, User=Puga, Jose David
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TEST PROCEDURE FOR NEUTRAL GROUNDING DEVICES IEEE Std 32-1972
14.5.2.2 Respective Metric and English System Equations for Temperature Rise and Current