HSDSL, Technion Winter 2008 Characterization Presentation on: Skew And Jitter Generating And Measuring System For High Speed Experiments Undergraduate.

HSDSL, TechnionWinter 2008

Characterization Presentation on:

Skew And Jitter Generating And Measuring System For High Speed Experiments

Undergraduate Project By:Bassel MassadWasseem Zaher

5th March 2008

Agenda

• Definitions

• Project: Background And Objective

• System Architecture: Top Level

• System Analysis: Anchor Element

• Time Table: What next?

Definition: Skew

• A Constant Time Delay phenomenon.

sec

Signal

Skewed Signal

• Skew Range intended: few nanoseconds

Definition: Jitter

• Deterministic/Random Time delay, following a function of time.

Jitter

Wanted (ideal) Signal

Possible Real Signals

Time [sec]

Signal

[Volt]

• Usually unwanted phenomenon

• Classified into categories (Random, Deterministic, Periodic… more Details ahead)

• Each Category is treated differently in both Generating and Measuring techniques.

Agenda

Definitions

• Project: Background And Objective

• System Architecture: Top Level

• System Analysis: Anchor Element

• Time Table: What next?

Project: Background And Objective

Project Objective:Design a high speed experiments array for Generating and Measuring Skew and Jitter phenomena

Background:

A Variety of 60 High Speed Experiments distributed to 15 groups of which the user chose.

SourceHigh Speed

Experiments Unit

*

*

*

*

*

*

Samplers Samplers

General Control Unit

MeasuringUnit

Experiments LUT

Our Mission:

Designing A System which knows to do the following:

Generating Skew

Generating Jitter

Measuring Skew

Measuring Jitter

Agenda

Skew Definition Jitter Definition Project: Background And Objective

• System Architecture: Top Level

• System Analysis: Anchor Element

• Time Table: What next?

Generating SystemController Measuring

system

Next

Skew/Jitter Subsystem Architecture

Starting Point: Contains Initial restrictions and compatibility demands

source

Inputs fromController

source

Programmable Delay Chip

Skew / Jitter

ReferenceMeasuring

System

Generating UnitBack

To Controller מפצל שעון

Frequency Manipulation

Source From Generating Unit (Frequency=F0)

Commands form Users

Generating System

Controller

Encoding

LUT

Back

F/n

Memories Array

Memories Control

(Addresses,

Memories selection…)

n Select

54642A Oscilloscope Agilent

GPIB

computer

Measuring System

Generating System

Back

General Purpose Interface BUS

Agenda

Definitions Project: Background And Objective System Architecture: Top Level

• System Analysis: Anchor Element

• Time Table: What next?

Generating Unit Analysis

• Basis: source Manipulated to fit:– 5MHz Differential Signal

– Duty Cycle = 50%

– Short Rise/Fall Times (~300ps) Maximal Delay Chip Frequency follows 3x300ps Cycle time (Roughly

1.11GHz)

• Delay element: On Semiconductor’s MC100EP195B Suggested

– Programmable Range: 0ns to 10ns

– Resolution : 10psec Increments

– LVPECL Compatible IO VCC = [3.0v, 3.6v]

– Max Frequency: 1.2GHz

– Worst Case Timing:» Worst Case Timing: Max{ts+th}+Max{tPLH,tPHL}<16ns <Tcycle/2 Gives the impression we are to control cycle-to-cycle Jitter!

Tcycle=200ns

Analyze the system reverse-ward:

First show how we design the 195 with its environment

Agenda

Definitions Project: Background And Objective System Architecture: Top Level System Analysis: Anchor Element

• Time Table: What next?

Time Table

1st weak

2nd

weak3rd

weak4th

weak5th

weak

Characterization Presentation

Midterm Presentation

Memories: Study and Design

חקירת דרכי מדידה ותיאומם עם המערכת / בניית מחלקי תדר

לשאול את יוסי

מצגת

בניית מצביעים