HKL EBSD – CSEM 2003 EBSD – Fundamentals SEM based technique –70° tilted specimen –1-10 nA, ~20 kV Detector –Phosphor + CCD camera EBSP –Kikuchi bands.

HKL EBSD – CSEM 2003

EBSD – Fundamentals• SEM based technique

– 70° tilted specimen– 1-10 nA , ~20 kV

• Detector– Phosphor + CCD camera

• EBSP– Kikuchi bands (planes)– Zones (directions)

• Orientation– Sub-micron resolution– ~0.5deg angular

resolution• Surface Effect

– Sampling upper 30-50nm– Surface prep important!

Sample

Pole piece

EBSP

Camera

Phosphor Screen

Forescatter Electron Detector

HKL EBSD – CSEM 2003

What does an EBSP look like?

Silicon at 20kV

HKL EBSD – CSEM 2003

• The Electron beam strikes the specimen

• Scattering produces electrons travelling in all directions in a small volume (the excitation volume)

• Electrons that travel in a direction that satisfies the Bragg condition (n=2dhkl.sin) for a plane (hkl) are channeled Kikuchi bands

• The electrons hit the imaging phosphor and produce light

• The light is detected by a CCD camera and converted to an image

• Which is indexed...

Spherical Kikuchi map

70°(202)

(022)

(220)

Silicon

Phosphor

How it works - EBSP formation

HKL EBSD – CSEM 2003

Indexing Cycle• Position electron beam• Capture EBSP• Perform Hough transform, find

peaks (= band position & orientation)

• Compare to possible peak positions and intensity heirarchy versus theoretical for potential match phases

• If match is made within acceptable error limits, store data & repeat for next point

Collected EBSP

Indexed EBSPPhase and orientation

Hough space

Move beam or stage

Save data to file

Currently, our system can perform as many as 90 cycles per second!(sample/conditions dependent)

HKL EBSD – CSEM 2003

General Micro-structure

=100 µm; BC+GB+DT+E1-3; Step=1 µm; Grid297x227

Pixel map of pattern quality + crystal orientation + grain boundary location and character

Deformed silica (quartz)

Visualization of Data