High-K Dielectrics The Future of Silicon Transistors Matthew Yang EECS 277A Professor Nelson.

High-K DielectricsThe Future of Silicon Transistors

Matthew Yang

EECS 277A

Professor Nelson

Outline• Introduction

• Problem with SiO2

• Solution: High-K Dielectric

• High-K Dielectric Performance

• Manufacturing Process

• Summary

Introduction• Continual size reduction of transistors.

– Decrease in channel length.– Decrease in gate dielectric thickness.

Introduction• Currently, gate dielectric approaching

thickness of a few atoms.– Problem: Quantum Mechanics– Electron tunneling gate current leakage

• With the number of transistors on a single chip growing exponentially, power dissipation becomes a big problem.

Problem with SiO2

• SiO2 layer is too thin.– 90nm node has a

dielectric thickness of 1.2nm.

• Low relative dielectric constant.

• If there is to be any increase in performance, an alternative must be found.

Image courtesy of Intel.

Solution: High-K Dielectric• Options:

– Increase dielectric thickness.– Increase relative dielectric constant.

• High-k dielectrics are a logical solution.

Solution: High-K Dielectric• Problems with high-k/poly-si:

– Increased threshold voltage

Image courtesy of Intel.

Solution: High-K Dielectric• Problems with high-k/poly-si:

– Increased threshold voltage– Decreased channel mobility

Image courtesy of Intel.

Solution: High-K Dielectric• Replace poly-si gates with doped, metal gates.

– Improved mobility.

Image courtesy of Intel.Image courtesy of Intel.

High-K Dielectric Performance• Performance with high-k dielectric and metal

gate:

Image courtesy of Intel.

Manufacturing Process• Several types of high-k dielectric: HfO2, ZrO2,

TiO2.

• Chemical vapor deposition:

Image courtesy of Intel.

Summary• As transistors shrink in size, an alternative to

SiO2 must be found.

• HfO2, in conjunction with metal gates, improves leakage current, gate capacitance, and speed.

• By replacing SiO2 with HfO2, transistors will be able to continue to shrink without sacrificing performance.

SourcesChau, Robert, et. al. "Application of High-K Dielectrics and Metal Gate

Electrodes to Enable Silicon and Non-Silicon Logic Nanotechnology." Microelectronic Engineering. Vol.80 (2005): 1-6.

Chau, Robert. "Role of High-k Gate Dielectrics and Metal Gate Electrodes in Emerging Nanoelectronic Devices." 14th Biennial Conference on Insulating Films on Semiconductors 2005. Leuven, Belgium. 22-24 June 2005.

Chau, Robert. "Gate Dielectric Scaling for High-Performance CMOS: from SiO2/PolySi to High-k/Metal-Gate." International Workshop on Gate Insulator 2003. Tokyo, Japan. 6-7 November 2003.

Chau, Robert, et. al. "High-k/Metal-Gate Stack and Its MOSFET Characteristics" _IEEE Electron Device Letters_. 25:6 (June 2004): 408-410.

Intel (4 November 2003). "Intel's High-K/Metal Gate Announcement." Press Release. Retrieved on 2008-11-03.