Top Banner
G.W.Jiang source:IEEE
29

G.W.Jiang

Feb 22, 2016

Download

Documents

ilar

source:IEEE. G.W.Jiang. Outline. Introduction Experiments Results and Discussion Conclusion. Introduction. - PowerPoint PPT Presentation
Welcome message from author
This document is posted to help you gain knowledge. Please leave a comment to let me know what you think about it! Share it to your friends and learn new things together.
Transcript
Page 1: G.W.Jiang

G.W.Jiang

source:IEEE

Page 2: G.W.Jiang

1

Outline

Introduction

Experiments

Results and Discussion

Conclusion

Page 3: G.W.Jiang

2

Introduction The typical AlGaN EBL is insufficiently effective in

blocking the electron leakage and hole injection will be inhibited into the active region are generally recognized as the primary cause of efficiency droop.

Recently, graded AlGaN EBL has been suggested to benefit hole injection and electron confinement but is still under debate which kind of Al content variation trend best favors the reduction of efficiency droop.

Page 4: G.W.Jiang

In this letter, we use step-graded AlGaN EBLs with different Al content variation trend to compare with the original AlGaN EBL.

3

Page 5: G.W.Jiang

4

Experiments

chip size: 300 um × 300um Fig. 1. Schematic diagrams of the LEDs with the original.

170nm

x63nm/10nm

3um5x1018cm-3

25nm

2um

3x1019cm-3

5x1019cm-3

IEBL

DEBL

Page 6: G.W.Jiang

Fig. 2. (a) Light output power versus current (L-I) characteristics of the three samples, (b) EQE as a function of the injection current for the three samples. 5

Results and DiscussionA B C

Vf 3.16V 3.15V 3.15V

Ir 0.06uA 0.05uA 0.05uA

A>B 8%C>A 16%

Page 7: G.W.Jiang

Fig. 3. (a) Enlarged conduction band diagram, (b) Electron concentration distribution near the EBLs of the three samples at 200 mA forward current.

6

Page 8: G.W.Jiang

7

Fig. 3. (c) Enlarged valence band diagram, (d) Hole concentrationdistribution near the EBLs of the three samples at 200 mA forward current.

Page 9: G.W.Jiang

Fig. 4. (a) Electron and (b) hole concentration distribution in the threesamples at 200mA forward current.

8

Page 10: G.W.Jiang

Fig. 5. Simulated IQE as a function of the injection current for the threesamples. 9

IQEC>A 30%

A>B 17%

Page 11: G.W.Jiang

10

Conclusion The experimental results indicate that the adoption of step-

graded AlGaN EBLs has little influence on the electrical properties of the fabricated LEDs.

And experiments show that the IEBL gives rise to inferior optical performance, compared to the DEBL and original EBL.

Simulation results, the DEBL can improve performance is attributed to enhanced hole injection without losing the capability of electron confinement.

Page 12: G.W.Jiang

G.W.Jiang

11

source:IEEE

Page 13: G.W.Jiang

12

Outline

Introduction

Experiments

Results and Discussion

Conclusion

References

Page 14: G.W.Jiang

13

Introduction The optical performances of LEDs can be largely weakened

by several mechanisms; including carrier leakage due to the polarization effect、 Auger recombination、 current injection efficiency、 lack of hole injection、 the self-heating effect etc.

However, electron current leakage and poor hole injection efficiency are usually identified to be the major reasons for the efficiency droop issue.

Page 15: G.W.Jiang

Unfortunately, the conventional p-type AlGaN EBL cannot usually block the electron in the active region effectively due to the large band-bending caused by the polarization field.

In this paper, we propose a novel sawtooth-shaped EBL to improve the efficiency of electron confinement and hole injection .

14

Page 16: G.W.Jiang

15

Experiments

chip size: 300 um × 300um Fig. 1. Schematic diagram of the LED (left) and the schematic energy band diagrams of the four EBLs.

50nm

3um5x1018cm-3

1.2x1018cm-3

250nm

Al%

0~15%x53nm/10nm

15%

Page 17: G.W.Jiang

Fig. 2. Conduction energy band diagrams for LEDs with (a) conventional EBL, (b) sawtooth EBL (d =15 nm) at an injection current of 180 mA..

16

Results and Discussion

0%

15%

Page 18: G.W.Jiang

Fig. 2. Conduction energy band diagrams for LEDs (c) sawtooth EBL (d =10 nm), and (d) sawtooth EBL (d = 5 nm) at an injection current of 180 mA.

17

距離長Step 較多

Page 19: G.W.Jiang

18

Fig. 3. Valence energy band diagrams for LEDs with (a) a conventional EBL, (b) a sawtooth EBL (d = 15 nm), at an injection current of 180 mA.

Last barrier 較趨緩

Page 20: G.W.Jiang

Fig. 3. Valence energy band diagrams for LEDs with (c) a sawtooth EBL(d = 10 nm), and (d) a sawtooth EBL (d = 5 nm) at an injection current of 180 mA.

19

Step 較多

Page 21: G.W.Jiang

Fig. 4. Electrostatic fields in the five QWs and near last-barrier/EBL interfaces of the four LEDs at 180 mA.

20

GaN/InGaN接面處

0GaN/AlGaN接面處

Page 22: G.W.Jiang

21

Fig. 5. Electron current leakage profiles near the active region for the four LEDs at 180 mA.

判斷電子 confinement的好壞

Page 23: G.W.Jiang

22

Fig. 6. Electron concentrations within the active regions for the four LEDs at 180 mA.

Page 24: G.W.Jiang

23

Fig. 7. Hole concentrations within the active regions forthe four LEDs at 180 mA.

Page 25: G.W.Jiang

Fig. 8. Radiative recombination rates within the activeregion for the four LEDs at 180 mA.

24

Page 26: G.W.Jiang

Fig. 9. (color online) Curves of (a) internal quantum efficiency and (b)light output power versus injection current for the four LEDs.

Droop%

Con EBL=55.2%

D:5nm EBL = 35.4%

Output power

D:5nm / con =2.69

25

Page 27: G.W.Jiang

26

Conclusion When used a sawtooth-shaped EBL, the effective barrier

height of the conduction band is increased and the barrier obstacle in the valence band for holes is mitigated due to the correctly modified energy band of the EBL.

The electron confinement is enhanced and more holes can be transported from the p-type region into the MQW.

This effect prevents electron leakage and improves the radiative recombination rate in the QW, leading to a significant improvement in IQE and light output power.

Page 28: G.W.Jiang

27

References [21] Fiorentini V, Bernardini F and Ambacher O 2002

Appl. Phys. Lett. 80 1204

[22] Vurgaftman I and Meyer J R 2003 J. Appl. Phys. 94 3675 088504-

Page 29: G.W.Jiang

28

Thanks for your attention.