DISTRIBUTION A: Approved for public release – distribution unlimited FOcal arrays for Curved Infrared Imagers (FOCII) Dr. Whitney Mason Program Manager Microsystems Technology Office FOCII Proposers Day August 13, 2019 SETA Support Dr. Dick Cheng Dr. Greg Jones Dr. Janet Liu Mr. Robert Faulkner 1
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FOcal arrays for Curved Infrared Imagers (FOCII) · • Stress/strain effects on infrared absorber optoelectronic property measurements and modeling • Algorithms when realized in
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DISTRIBUTION A: Approved for public release – distribution unlimited
FOcal arrays for Curved Infrared Imagers (FOCII)
Dr. Whitney MasonProgram Manager
Microsystems Technology Office
FOCII Proposers Day
August 13, 2019
SETA SupportDr. Dick ChengDr. Greg JonesDr. Janet Liu Mr. Robert Faulkner 1
DISTRIBUTION A: Approved for public release – distribution unlimited
Goals1. Present BAA to community – convey expectations for program2. Q&A for program clarification
• Collect questions (on note cards) • Gov’t team will generate answers during break, poster session, and after meeting• Review answers after the poster session• Publish Q&As in a FAQ attached to the FOCII site under www.darpa.mil/work-
with-us/opportunities3. Poster session – encourage collaboration and team forming
FOCII Proposer’s Day Welcome and Goals
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FOCII Scope and Objectives
FOCII will produce commercially scalable, large format IR imagers with small ROC3
FOCII will develop and demonstrate:
1) Using no changes to the underlying FPA design process, existing SOA large format (>2k x 2k , ≥55 mm diagonal) cryogenically cooled MWIR and/or LWIR detectors curved to a ROC of 70 mm
2) Using structured arrays, prototype large format (≥2k x 2k with ≥35 mm diagonal) cryogenically cooled MWIR and/or LWIR detectors curved to an extreme ROC of 12.5 mm
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• Evolutionary improvements to the existing state of practice • e.g. small format FPAs (<35 mm diagonal) at large (>70 mm) radius of curvatures (ROC)
• New detector materials• e.g. graphene, transition metal dichalcogenides, colloidal quantum dots, etc.
• Detectors that are not cryogenically cooled or have cutoffs less than 3 microns• e.g. microbolometers, visible, SWIR, or extended SWIR detectors
• Detectors where the integrated detector-ROIC stack is not curved • e.g. compound imagers, fiber bundle imagers
• Trading performance for curvature• e.g. flexible substrates, low fill factors, low QE, low sensitivity, etc.
What FOCII is NOT about
Proposals that principally rely on any of the above will be deemed non-conforming and will not be reviewed
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The FOCII program has two technical areas:• TA1: Curving state of the art, large format FPAs• TA2: Curving structured FPAs to extreme ROCs
Proposals and Awards:• Separate proposals required for each TA• Multiple awards anticipated for each TA
DISTRIBUTION A: Approved for public release – distribution unlimited
FOCII is an UNCLASSIFED program with Controlled Unclassified Information (CUI)• A CUI guide is published with the BAA
It is expected that FOCII performers will generate controlled unclassified information (CUI) and/or controlled technical information (CTI) as part of their research:• CUI is defined as is information that requires safeguarding or dissemination controls pursuant to and
consistent with applicable law, regulations, and government-wide policies but is not classified under Executive Order 13526 or the Atomic Energy Act, as amended, and all CUI shall be marked and safeguarded in accordance with DoDI 5200.01 Volume 4
• CTI is defined as technical information with military or space application that is subject to controls on its access, use, reproduction, modification, performance, display, release, disclosure, or dissemination
• Contractor information systems shall be subject to the security requirements in National Institute of Standards and Technology (NIST) Special Publication (SP) 800-171 “Protecting Controlled Unclassified Information in Nonfederal Information Systems and Organizations”
• NIST SP 800-171 implementation guidance can be found at: https://nvlpubs.nist.gov/nistpubs/specialpublications/nist.sp.800-171.pdf
FOCII Security
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DISTRIBUTION A: Approved for public release – distribution unlimited
• Technical Area I: Curving state of the art FPAs • Specific technology and processing methods to achieve low ROCs on continuous, integrated FPAs resulting in
strains beyond I% • Specific processing methods for curving continuous, integrated FPAs tied to an advancement of state-of-the-art
infrared imaging performance • Specific performance of curved continuous FPAs, including metrics and specifications
• Technical Area 2: Curving structured FPAs• Specific technology and methods to mitigate stress and strain in structured FPAs• Specific technology and processing methods to produce seam widths between adjacent segments ofless than 20
microns • Specific processing methods for curving discontinuous, integrated FPAs tied to an advancement of state-of-the-
art infrared imaging performance • Specific performance of curved discontinuous FPAs, including metrics and specifications
Definition of CTI for FOCII
Performers uncertain about whether a given dataset contains CTI should request guidance from DARPA7
DISTRIBUTION A: Approved for public release – distribution unlimited
Technical Area 1: Curving state of the art FPAs • General technology and methods to curve continuous FPAs • Stress, strain, and other mechanical measurements and modeling, including development of mechanical
models for complex and potentially unstable structures• Stress/strain effects on infrared absorber optoelectronic property measurements and modeling • Algorithms when realized in source code, executable formats, or documented in written reports
Technical Area 2: Curving structured FPAs• General technology and methods to relieve stress in structured (i.e. discontinuous) FPAs • Stress, strain, and other mechanical measurements and modeling, including development of mechanical
models for complex stress mitigations• Stress/strain effects on infrared absorber optoelectronic property measurements and modeling • Algorithms when realized in source code, executable formats, or documented in written reports
What is not CTI in FOCII
ALL PUBLICATIONS resulting from FOCII-funded R&D must go through the formal DARPA DISTAR process for pre-publication review and may have publication restrictions in accordance with the contractual requirements
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• FOCII seeks to enable:• Uniform performance across the field of view, even with compact optics• New application spaces by shrinking size, weight, and cost of infrared imaging systems
• TA1: Curving SOA FPAs• Enable ultimate performance optically and electrically
• TA2: Curving structured FPAs• Enable minimal size with exquisite performance for new capabilities
FOCII overview: Curve large format FPAs to small ROCs
FOCII’s key challenge will be mitigating the stresses that result from curving a flat focal plane to small radius of curvatureDISTRIBUTION A: Approved for public release – distribution unlimited
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0 10 20 30
Half FOV (degrees)
Illumination
% Diffraction Limited
Nor
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Sig
nal
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MTF
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Motivation: Flat focal plane arrays have poor edge illumination and resolution
Today FOCII
∆r ≫ ∆r’
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0 5 10 15 20 25 30Half FOV (degrees)
Illumination% Diffraction Limited
Performance at edge:Illumination ↆ 72% Resolution ↆ 74%
Performance at edge:Illumination ↆ 8% Resolution ↆ 4%
High performance wide field of view imagers require large arrays and small radius of curvature
Nor
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Sig
nal
Nor
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MTF
MTF=Modulation Transfer Function
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DISTRIBUTION A: Approved for public release – distribution unlimited
Motivation: Flat focal plane arrays require large and heavy optics
Today FOCII
• Complex optics system design to fix aberration• Large size and weight
• Simplified optics system to minimize aberration• Low size and weight
Complex interactions between the different stresses and current strain limit of silicon need to be overcome
ε = 1%
ε = 6%
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Typical bulk silicon limit
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Challenge 2: Managing absorbing layer strain
Conduction Band
Valence Band
Non-uniform stress results in changes in band structure
1% residual non-uniformity can have a 2x impact on range
Changes in the band structure alter detector performance
0% strain-0.84% strain
InP/InGaAs QWIP
Gusakov, APL 79, (2001), 2508
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• Dark current non-uniformity• Responsivity non-uniformity• Signal-to-noise ratio non-uniformity• Spectral response non-uniformity
Deleterious effects of band structure variation
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Parameter Units SoA1 Phase 12 Phase 2 Phase 3Size (Diagonal) mm ≥ 55 ≥ 55 ≥ 55 ≥ 55Radius of curvature mm ∞ 140 140 70# of pixels MP >16 N/A > 4 > 4 Pixel fill factor3 % > 90 > 80 > 80 > 80Operability4,5 % >99 N/A ≥ 90 ≥ 95Waveband µm 3-5 3-5 or 8-12 3-5 or 8-12 3-5 or 8-12Noise Equivalent Temperature Difference mK 25 N/A ≤ 25 ≤ 25
Thermal cycles6 - >1000 N/A 200 1000
Dewar bake - 5 days at 100⸰C N/A 1 day at
100⸰C5 days at
100⸰C
FOCII Metrics: TA1
(1) 4096 x 4096, 10 µm pitch, MWIR (2) Surrogate FPA materials(3) Pixel fill factor defined as the ratio of light-sensitive area of a pixel to total pixel area in an image sensor(4) Relative to flat FPA(5) Operability defined as: 0.5*Rmean<R<1.5*Rmean; NEDT < 4X NEDTmean; no row/column outages; no clusters larger than 5x5;(6) One thermal cycle is defined as 300K to 77K to 300K; FPA must still be operable post cycling
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DISTRIBUTION A: Approved for public release – distribution unlimited
Parameter Units SoA1 Phase 12 Phase 2 Phase 3Size (Diagonal) mm 35 ≥ 35 ≥ 35 ≥ 35Radius of Curvature mm ∞ ≤12.5 ≤12.5 ≤12.5# of pixels MP >2 N/A > 2 > 2Pixel fill factor3 % > 90 N/A > 80 > 80Operability4,5 % ≥ 99 N/A ≥ 95 ≥ 99Waveband µm 8-10.5 3-5 or 8-12 3-5 or 8-12 3-5 or 8-12Noise Equivalent Temperature Difference mK 25 N/A < 25 < 25
(1) 1280 x 1024, 12 µm pitch, LWIR (scaled)(2) Surrogate FPA materials(3) Pixel fill factor defined as the ratio of light-sensitive area of a pixel to total pixel area in an image sensor(4) Relative to flat FPA
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(5) Operability defined as: 0.5*Rmean<R<1.5*Rmean; NEDT < 4X NEDTmean; no row/column outages; no clusters larger than 5x5(6) Seam width defined as the width of the discontinuity between the physical edges of adjacent absorbing regions after curving or integration(7) Spherical deviation defined as max│Ras_built- Rspec│/ Rspec(8) One thermal cycle is defined as 300K to 77K to 300K; FPA must still be operable post cycling
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Geometric definitions
Radius of Curvature Seam Width Spherical Deviation
𝑆𝑆𝑆𝑆 =𝑚𝑚𝑚𝑚𝑚𝑚 |𝑅𝑅′ − 𝑅𝑅|
𝑅𝑅
R R’
R R’
R R’
R R’
Center of curvature
(imaginary)
Radius of curvature, R
Imaginary circle completing the curve
R
D
minimum R=D/π
Deliverables
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• Demonstrate curved FPA performance with improved seams
• Demonstrate focal array performance • Demonstrate operability/thermal reliability• Test integrated camera
TA1
TA2
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• Posting Date (PD): August 9, 2019• Proposers Day: August 13, 2019• Abstract Due Date: September 3, 2019• Abstract Feedback: September 17, 2019• FAQ Submission Deadline: October 4, 2019 • Full Proposal Due Date: October 18, 2019
Important FOCII Dates
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• Please submit questions via webex module, or via notecard • If questions arise after industry day, please submit questions to [email protected]
• Answers to most questions will be provided after the poster session• All relevant questions and answers will be published as part of the official FOCII FAQs located
at www.darpa.mil/work-with-us/opportunities under FOCII