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FEST ECE 477 Fall 2011 TEAM 5 Gloria Budiman Alexander Kidarsa Christopher Sakalis Vishal Gala
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Mar 19, 2016

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FEST. ECE 477 Fall 2011 TEAM 5 Gloria Budiman Alexander Kidarsa Christopher Sakalis Vishal Gala. fEST. Far End Speakerphone Test System. Introduction. Design constraint. Telephone line, ~300-3400 Hz By Nyquist Rate, 8000Hz 16-bit data depth per channel - PowerPoint PPT Presentation
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Page 1: FEST

FESTECE 477 Fall 2011

TEAM 5

Gloria Budiman

Alexander Kidarsa

Christopher Sakalis

Vishal Gala

Page 2: FEST

FEST

Far

End

Speakerphone

Test

System

Page 3: FEST

INTRODUCTION

Page 4: FEST

DESIGN CONSTRAINT

Telephone line, ~300-3400 Hz

By Nyquist Rate, 8000Hz

16-bit data depth per channel

Requires to playback and record four different audio files

MCU has only one storage media

Large, fast-access internal memory needed

Page 5: FEST

COMPUTATION REQUIREMENT

FFT

Normalized LMS

Auto-correlation

Page 6: FEST

INTERFACE REQUIREMENT

SD card

USB*

2 Push Buttons• Reset• Start/Stop

2 Switch

LCD/7-Segment-Display

LED

Page 7: FEST

ON-CHIP & OFF-CHIP

On-Chip• Serial Peripheral Interface• SD Card• USB*

Off-Chip• DAC - To playback audio data from MCU• ADC - To record audio data to the MCU

Page 8: FEST

POWER, PACKAGING & COST

A.C. powered• Back up battery necessary for 24-hour operation

Packaging• Portable• But handheld form factor not desired

Unique device

Page 9: FEST

COMPONENT SELECTION

TMS320F-28035 MCU• Lower pin count, 128KB on-chip Flash• Other Options

• TMS320F-28335 (same family, 100+ pins, 256KB on-chip Flash)• C5000 low-power MCU (500+ pins)• C6000 single-core DSP (700+ pins, BGA only)

TLV320AIC23 Audio Codec• Modularity• Extendibility• Other Options

• PCM3008 (low-end, non-configurable)• TLV320AIC320, PCM3070 (non-hand-solderable)

Page 10: FEST

SUMMARY