Shenzhen Huaxia Testing Technology Co., Ltd 1F., Block A of Tongsheng Technology Building, Huahui Road, Dalang Street, Longhua District, Shenzhen, China Telephone: +86-755-26648640 Fax: +86-755-26648637 Website: www.cqa-cert.com Report Template Version: V03 Report Template Revision Date: Mar.1st, 2017 FCC Test Report * In the configuration tested, the EUT complied with the standards specified above. The test report is effective only with both signature and specialized stamp, The result(s) shown in this report refer only to the sample(s) tested. Without written approval of CQA, this report can’t be reproduced except in full. Report No. : CQASZ20180400045E-02 Applicant: 1MORE INC. Address of Applicant: Tianliao Building F14 East Block (New Materials Industrial Park), Xueyuan Road, Nanshan District, Shenzhen, China Manufacturer: 1MORE Shen Zhen Acoustic Technology Co., Ltd. Address of Manufacturer: Tianliao Building 1403-1411, Zone A Tianliao Industrial Park, Taoyuan Street, Nanshan District, Shenzhen, P.R. China Equipment Under Test (EUT): Product: 1MORE Triple Driver BT In-Ear Headphones Model No.: E1001BT Brand Name: 1MORE FCC ID: 2AF8ZE1001BT Standards: 47 CFR Part 15, Subpart C Date of Test: 2018-04-25 to 2018-07-04 Date of Issue: 2018-07-04 Test Result : PASS* Tested By: ( Martin Lee) Reviewed By: (Jack Ai) Approved By: ( Jack Ai)
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Shenzhen Huaxia Testing Technology Co., Ltd
1F., Block A of Tongsheng Technology Building, Huahui Road, Dalang Street, Longhua District, Shenzhen, China
Antenna Requirement 47 CFR Part 15, Subpart C Section
15.203/15.247 (c) ANSI C63.10 2013 PASS
AC Power Line
Conducted
Emission
47 CFR Part 15, Subpart C Section
15.207 ANSI C63.10 2013 N/A
Conducted Peak Output
Power
47 CFR Part 15, Subpart C Section
15.247 (b)(3) ANSI C63.10 2013 PASS
6dB Occupied
Bandwidth
47 CFR Part 15, Subpart C Section
15.247 (a)(2) ANSI C63.10 2013 PASS
Power Spectral Density 47 CFR Part 15, Subpart C Section
15.247 (e) ANSI C63.10 2013 PASS
Band-edge for RF
Conducted Emissions
47 CFR Part 15, Subpart C Section
15.247(d) ANSI C63.10 2013 PASS
RF Conducted Spurious
Emissions
47 CFR Part 15, Subpart C Section
15.247(d) ANSI C63.10 2013 PASS
Radiated Spurious
Emissions
47 CFR Part 15, Subpart C Section
15.205/15.209 ANSI C63.10 2013 PASS
Restricted bands around
fundamental frequency
(Radiated Emission)
47 CFR Part 15, Subpart C Section
15.205/15.209 ANSI C63.10 2013 PASS
N/A: Not Applicable, the EUT was working by battery.
Note: When the EUT charging, BLE will not work.
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQASZ20180400045E-02
Page:4 of 41
3 Contents
Page
1 VERSION .................................................................................................................................................................. 2
2 TEST SUMMARY .................................................................................................................................................... 3
4 GENERAL INFORMATION ................................................................................................................................... 5
4.1 CLIENT INFORMATION .......................................................................................................................................... 5 4.2 GENERAL DESCRIPTION OF EUT .......................................................................................................................... 5 4.3 TEST ENVIRONMENT ............................................................................................................................................ 7 4.4 DESCRIPTION OF SUPPORT UNITS ......................................................................................................................... 7 4.5 STATEMENT OF THE MEASUREMENT UNCERTAINTY ............................................................................................. 7 4.6 TEST LOCATION ................................................................................................................................................... 7 4.7 TEST FACILITY ..................................................................................................................................................... 8 4.8 DEVIATION FROM STANDARDS ............................................................................................................................. 8 4.9 OTHER INFORMATION REQUESTED BY THE CUSTOMER ........................................................................................ 8 4.10 EQUIPMENT LIST .................................................................................................................................................. 9
5 TEST RESULTS AND MEASUREMENT DATA .............................................................................................. 10
Lab to ISO/IEC 17025:2005 General Requirements for the Competence of Testing and Calibration
Laboratories (CNAS-CL01 Accreditation Criteria for the Competence of Testing and Calibration
Laboratories) for the competence in the field of testing.
• A2LA (Certificate No. 4742.01) Shenzhen Huaxia Testing Technology Co., Ltd., Shenzhen EMC Laboratory is accredited by the
American Association for Laboratory Accreditation(A2LA). Certificate No. 4742.01.
• FCC Registration No.: 522263 Shenzhen Huaxia Testing Technology Co., Ltd., Shenzhen EMC Laboratory has been registered and fully described in a report filed with the (FCC) Federal Communications Commission. The acceptance letter from the FCC is maintained in our files. Registration No.:522263
4.8 Deviation from Standards
None.
4.9 Other Information Requested by the Customer
None.
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQASZ20180400045E-02
Page:9 of 41
4.10 Equipment List
Item Test Equipment Manufacturer Model No. Instrument No.
The temporary antenna connector is soldered on the PCB board in order to perform conducted tests and this
temporary antenna connector is listed in the equipment list.
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQASZ20180400045E-02
Page:10 of 41
5 Test results and Measurement Data
5.1 Antenna Requirement
Standard requirement: 47 CFR Part 15C Section 15.203 /247(c)
15.203 requirement:
An intentional radiator shall be designed to ensure that no antenna other than that furnished by the
responsible party shall be used with the device. The use of a permanently attached antenna or of an
antenna that uses a unique coupling to the intentional radiator, the manufacturer may design the unit
so that a broken antenna can be replaced by the user, but the use of a standard antenna jack or
electrical connector is prohibited.
15.247(b) (4) requirement:
The conducted output power limit specified in paragraph (b) of this section is based on the use of
antennas with directional gains that do not exceed 6 dBi. Except as shown in paragraph (c) of this
section, if transmitting antennas of directional gain greater than 6 dBi are used, the conducted output
power from the intentional radiator shall be reduced below the stated values in paragraphs (b)(1),
(b)(2), and (b)(3) of this section, as appropriate, by the amount in dB that the directional gain of the
antenna exceeds 6 dBi.
EUT Antenna:
The antenna is Ceramic antenna. The best case gain of the antenna is 2.72dBi.
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQASZ20180400045E-02
Page:11 of 41
5.2 Conducted Peak Output Power
Test Requirement: 47 CFR Part 15C Section 15.247 (b)(1)
Test Method: ANSI C63.10 2013
Test Setup:
Remark: Offset=Cable loss+ attenuation factor.
Limit: 30dBm
Test Mode: Transmitting with GFSK modulation.
Instruments Used: Refer to section 5.11 for details.
Test Results: Pass
Measurement Data
GFSK mode
Test channel Peak Output Power (dBm) Limit (dBm) Result
Lowest -4.91 30.00 Pass
Middle -3.67 30.00 Pass
Highest -4.02 30.00 Pass
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQASZ20180400045E-02
Page:12 of 41
Test plot as follows:
Graphs
LCH
Ref 25 dBm Att 20 dB **
*
*
Offset 11.4 dB
A
LVL
3DB
RBW 3 MHz
VBW 10 MHz
SWT 100 ms*
Center 2.402 GHz Span 10 MHz1 MHz/
1 PK
VIEW
-70
-60
-50
-40
-30
-20
-10
0
10
20
1
Marker 1 [T1 ]
-4.91 dBm
2.402128205 GHz
Date: 2.JUL.2018 16:17:37
MCH
A
Offset 11.3 dB
LVL
Att 20 dB **Ref 25 dBm
Center 2.44 GHz Span 10 MHz1 MHz/
3DB
RBW 3 MHz*
VBW 10 MHz*
SWT 100 ms*
1 PK
VIEW
-70
-60
-50
-40
-30
-20
-10
0
10
20
1
Marker 1 [T1 ]
-3.67 dBm
2.439679487 GHz
Date: 2.JUL.2018 16:20:32
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQASZ20180400045E-02
Page:13 of 41
HCH
A
Offset 11.3 dB
LVL
Att 20 dB **Ref 25 dBm
Center 2.48 GHz Span 10 MHz1 MHz/
3DB
RBW 3 MHz*
VBW 10 MHz*
SWT 100 ms*
1 PK
VIEW
-70
-60
-50
-40
-30
-20
-10
0
10
20
1
Marker 1 [T1 ]
-4.02 dBm
2.479695513 GHz
Date: 2.JUL.2018 16:26:25
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQASZ20180400045E-02
Page:14 of 41
5.3 6dB Occupy Bandwidth
Test Requirement: 47 CFR Part 15C Section 15.247 (a)(2)
Test Method: ANSI C63.10 2013
Test Setup:
Remark: Offset=Cable loss+ attenuation factor.
Limit: ≥ 500 kHz
Test Mode: Transmitting with GFSK modulation.
Instruments Used: Refer to section 5.11 for details.
Test Results: Pass
Measurement Data
GFSK mode
Test channel 6dB Occupy Bandwidth (MHz) Limit (kHz) Result
Lowest 0.686 ≥500 Pass
Middle 0.686 ≥500 Pass
Highest 0.692 ≥500 Pass
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQASZ20180400045E-02
Page:15 of 41
Test plot as follows:
Graphs
LCH
A
Offset 11.4 dB
LVL
Att 20 dB*Ref 25 dBm
Center 2.402 GHz Span 4 MHz400 kHz/
3DB
RBW 100 kHz
SWT 2.5 ms
*
VBW 300 kHz*
1 PK
VIEW
-70
-60
-50
-40
-30
-20
-10
0
10
20
1
Marker 1 [T1 ]
-12.02 dBm
2.401653846 GHz
2
Marker 2 [T1 ]
-5.94 dBm
2.401993590 GHz
3
Delta 3 [T1 ]
0.01 dB
685.897435897 kHz
D1 -11.938 dBm
Date: 2.JUL.2018 16:17:02
MCH
A
Offset 11.3 dB
LVL
Att 20 dB*Ref 25 dBm
Center 2.44 GHz Span 4 MHz400 kHz/
3DB
RBW 100 kHz
SWT 2.5 ms
*
VBW 300 kHz*
1 PK
VIEW
-70
-60
-50
-40
-30
-20
-10
0
10
20
1
Marker 1 [T1 ]
-10.78 dBm
2.439653846 GHz
2
Marker 2 [T1 ]
-4.71 dBm
2.440000000 GHz
3
Delta 3 [T1 ]
0.04 dB
685.897435897 kHz
D1 -10.713 dBm
Date: 2.JUL.2018 16:19:57
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQASZ20180400045E-02
Page:16 of 41
HCH
A
Offset 11.3 dB
LVL
Att 20 dB*Ref 25 dBm
Center 2.48 GHz Span 4 MHz400 kHz/
3DB
RBW 100 kHz
SWT 2.5 ms
*
VBW 300 kHz*
1 PK
VIEW
-70
-60
-50
-40
-30
-20
-10
0
10
20
1
Marker 1 [T1 ]
-11.40 dBm
2.479647436 GHz
2
Marker 2 [T1 ]
-5.10 dBm
2.479993590 GHz
3
Delta 3 [T1 ]
0.25 dB
692.307692307 kHz
D1 -11.103 dBm
Date: 2.JUL.2018 16:25:50
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQASZ20180400045E-02
Page:17 of 41
5.4 Power Spectral Density
Test Requirement: 47 CFR Part 15C Section 15.247 (e)
Test Method: ANSI C63.10 2013
Test Setup:
Remark: Offset=Cable loss+ attenuation factor.
Limit: ≤8.00dBm/3kHz
Test Mode: Transmitting with GFSK modulation.
Instruments Used: Refer to section 5.11 for details.
Test Results: Pass
Measurement Data
GFSK mode
Test channel Power Spectral Density (dBm/3kHz) Limit (dBm/3kHz) Result
Lowest -20.520 ≤8.00 Pass
Middle -19.390 ≤8.00 Pass
Highest -19.750 ≤8.00 Pass
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQASZ20180400045E-02
Page:18 of 41
Test plot as follows:
Graphs
LCH
A
Offset 11.4 dB
LVL
Att 20 dB*Ref 25 dBm
Center 2.402 GHz Span 1.029 MHz102.9 kHz/
3DB
RBW 3 kHz
SWT 115 ms
*
VBW 10 kHz*
1 PK
VIEW
-70
-60
-50
-40
-30
-20
-10
0
10
20
1
Marker 1 [T1 ]
-20.52 dBm
2.401975264 GHz
Date: 2.JUL.2018 16:17:53
MCH
Ref 25 dBm Att 20 dB*
*
*
Offset 11.3 dB
A
LVL
3DB
RBW 3 kHz
VBW 10 kHz
SWT 115 ms
Center 2.44 GHz Span 1.029 MHz102.9 kHz/
1 PK
VIEW
-70
-60
-50
-40
-30
-20
-10
0
10
20
1
Marker 1 [T1 ]
-19.39 dBm
2.439975264 GHz
Date: 2.JUL.2018 16:20:48
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQASZ20180400045E-02
Page:19 of 41
HCH
A
Offset 11.3 dB
LVL
Att 20 dB*Ref 25 dBm
Center 2.48 GHz Span 1.038 MHz103.8 kHz/
3DB
RBW 3 kHz
SWT 120 ms
*
VBW 10 kHz*
1 PK
VIEW
-70
-60
-50
-40
-30
-20
-10
0
10
20
1
Marker 1 [T1 ]
-19.75 dBm
2.479973385 GHz
Date: 2.JUL.2018 16:26:41
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQASZ20180400045E-02
Page:20 of 41
5.5 Band-edge for RF Conducted Emissions
Test Requirement: 47 CFR Part 15C Section 15.247 (d)
Test Method: ANSI C63.10 2013
Test Setup:
Remark: Offset=Cable loss+ attenuation factor.
Limit: In any 100 kHz bandwidth outside the frequency band in which the spread spectrum intentional radiator is operating, the radio frequency power that is produced by the intentional radiator shall be at least 20 dB below that in the 100 kHz bandwidth within the band that contains the highest level of the desired power, based on either an RF conducted or a radiated measurement.
Test Mode: Transmitting with GFSK modulation.
Instruments Used: Refer to section 5.11 for details.
Test Results: Pass
GFSK mode
Test channel Frequency(MHz) Emission Level(dBm) Limit(dBm) Result
Lowest 2400 -51.020 -25.97 Pass
Highest 2483.5 -52.240 -25.08 Pass
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQASZ20180400045E-02
Page:21 of 41
Test plot as follows:
Graphs
LCH
Ref 25 dBm Att 20 dB*
*
*
Offset 11.4 dB
A
LVL
3DB
RBW 100 kHz
VBW 300 kHz
SWT 10 ms
Center 2.4 GHz Span 60 MHz6 MHz/
1 PK
VIEW
-70
-60
-50
-40
-30
-20
-10
0
10
20
1
Marker 1 [T1 ]
-5.97 dBm
2.402019231 GHz
2
Marker 2 [T1 ]
-51.02 dBm
2.400000000 GHz
3
Marker 3 [T1 ]
-51.85 dBm
2.390000000 GHz
4
Marker 4 [T1 ]
-5.97 dBm
2.402019231 GHz
D1 -25.97 dBm
Date: 2.JUL.2018 16:18:13
HCH
A
Offset 11.3 dB
LVL
Att 20 dB*Ref 25 dBm
Center 2.4835 GHz Span 60 MHz6 MHz/
3DB
RBW 100 kHz
SWT 10 ms
*
VBW 300 kHz*
1 PK
VIEW
-70
-60
-50
-40
-30
-20
-10
0
10
20
1
Marker 1 [T1 ]
-5.08 dBm
2.480038462 GHz
2
Marker 2 [T1 ]
-52.24 dBm
2.483500000 GHz
3
Marker 3 [T1 ]
-51.38 dBm
2.500000000 GHz
4
Marker 4 [T1 ]
-49.40 dBm
2.485230769 GHz
D1 -25.08 dBm
Date: 2.JUL.2018 16:26:57
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQASZ20180400045E-02
Page:22 of 41
5.6 Spurious RF Conducted Emissions
Test Requirement: 47 CFR Part 15C Section 15.247 (d)
Test Method: ANSI C63.10 2013
Test Setup:
Remark: Offset=Cable loss+ attenuation factor.
Limit: In any 100 kHz bandwidth outside the frequency band in which the spread spectrum intentional radiator is operating, the radio frequency power that is produced by the intentional radiator shall be at least 20 dB below that in the 100 kHz bandwidth within the band that contains the highest level of the desired power, based on either an RF conducted or a radiated measurement.
Test Mode: Transmitting with GFSK modulation.
Instruments Used: Refer to section 5.11 for details.
Test Results: Pass
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQASZ20180400045E-02
Page:23 of 41
Test plot as follows:
BLE_LCH_Graphs
Pref/BLE/LCH
Ref 25 dBm Att 20 dB*
*
*
Offset 11.4 dB
A
LVL
3DB
RBW 100 kHz
VBW 300 kHz
SWT 35 ms
Center 2.402 GHz Span 4 MHz400 kHz/
1 PK
VIEW
-70
-60
-50
-40
-30
-20
-10
0
10
20
1
Marker 1 [T1 ]
-5.92 dBm
2.401992000 GHz
D1 -25.92 dBm
Date: 2.JUL.2018 16:18:29
Puw/BLE/LCH
A
Att 30 dB*
Offset 11.4 dB
LVL
Ref 30 dBm
3DB
RBW 100 kHz
SWT 1.2 s
*
VBW 300 kHz*
Start 30 MHz Stop 12 GHz1.197 GHz/
1 PK
VIEW
-70
-60
-50
-40
-30
-20
-10
0
10
20
30
1
Marker 1 [T1 ]
-6.98 dBm
2.402055000 GHz
2
Marker 2 [T1 ]
-41.58 dBm
3.120654000 GHz
D1 -25.92 dBm
Date: 2.JUL.2018 16:18:52
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQASZ20180400045E-02
Page:24 of 41
Ref 30 dBm Att 30 dB*
Offset 11.4 dB
A
LVL
Start 12 GHz Stop 25 GHz1.3 GHz/
*
3DB
RBW 100 kHz
SWT 1.3 s
* VBW 300 kHz
1 PK
VIEW
-70
-60
-50
-40
-30
-20
-10
0
10
20
30
1
Marker 1 [T1 ]
-39.47 dBm
24.675866667 GHz
D1 -25.92 dBm
Date: 2.JUL.2018 16:19:13
BLE_MCH_Graphs
Pref/BLE/MCH
A
Offset 11.3 dB
LVL
Att 20 dB*Ref 25 dBm
3DB
RBW 100 kHz*
VBW 300 kHz*
SWT 35 ms
Center 2.44 GHz Span 4 MHz400 kHz/
1 PK
VIEW
-70
-60
-50
-40
-30
-20
-10
0
10
20
1
Marker 1 [T1 ]
-4.62 dBm
2.439993000 GHz
D1 -24.62 dBm
Date: 2.JUL.2018 16:21:04
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQASZ20180400045E-02
Page:25 of 41
Puw/BLE/MCH
A
Att 30 dB*
Offset 11.3 dB
LVL
Ref 30 dBm
3DB
RBW 100 kHz
SWT 1.2 s
*
VBW 300 kHz*
Start 30 MHz Stop 12 GHz1.197 GHz/
1 PK
VIEW
-70
-60
-50
-40
-30
-20
-10
0
10
20
30
1
Marker 1 [T1 ]
-4.92 dBm
2.439960000 GHz
2
Marker 2 [T1 ]
-41.76 dBm
2.726442000 GHz
D1 -24.62 dBm
Date: 2.JUL.2018 16:21:27
Ref 30 dBm Att 30 dB*
Offset 11.3 dB
A
LVL
Start 12 GHz Stop 25 GHz1.3 GHz/
*
3DB
RBW 100 kHz
SWT 1.3 s
* VBW 300 kHz
1 PK
VIEW
-70
-60
-50
-40
-30
-20
-10
0
10
20
30
1
Marker 1 [T1 ]
-40.74 dBm
24.880833333 GHz
D1 -24.62 dBm
Date: 2.JUL.2018 16:21:48
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQASZ20180400045E-02
Page:26 of 41
BLE_HCH_Graphs
Pref/BLE/HCH
A
Offset 11.3 dB
LVL
Att 20 dB*Ref 25 dBm
3DB
RBW 100 kHz*
VBW 300 kHz*
SWT 35 ms
Center 2.48 GHz Span 4 MHz400 kHz/
1 PK
VIEW
-70
-60
-50
-40
-30
-20
-10
0
10
20
1
Marker 1 [T1 ]
-5.04 dBm
2.479998000 GHz
D1 -25.04 dBm
Date: 2.JUL.2018 16:27:13
Puw/BLE/HCH
A
Att 30 dB*
Offset 11.3 dB
LVL
Ref 30 dBm
3DB
RBW 100 kHz
SWT 1.2 s
*
VBW 300 kHz*
Start 30 MHz Stop 12 GHz1.197 GHz/
1 PK
VIEW
-70
-60
-50
-40
-30
-20
-10
0
10
20
30
1
Marker 1 [T1 ]
-6.44 dBm
2.479860000 GHz
2
Marker 2 [T1 ]
-41.36 dBm
8.513937000 GHz
D1 -25.04 dBm
Date: 2.JUL.2018 16:27:36
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQASZ20180400045E-02
Page:27 of 41
Ref 30 dBm Att 30 dB*
Offset 11.3 dB
A
LVL
Start 12 GHz Stop 25 GHz1.3 GHz/
*
3DB
RBW 100 kHz
SWT 1.3 s
* VBW 300 kHz
1 PK
VIEW
-70
-60
-50
-40
-30
-20
-10
0
10
20
30
1
Marker 1 [T1 ]
-40.33 dBm
24.999133333 GHz
D1 -25.04 dBm
Date: 2.JUL.2018 16:27:57
Remark:
Pretest 9kHz to 25GHz, find the highest point when testing, so only the worst data were shown in the test
report. Per FCC Part 15.33 (a) and 15.31 (o) ,The amplitude of spurious emissions from intentional radiators
which are attenuated more than 20 dB below the permissible value need not be reported unless specifically
required elsewhere in this part.
Shenzhen Huaxia Testing Technology Co., Ltd
Report No.: CQASZ20180400045E-02
Page:28 of 41
5.7 Radiated Spurious Emission & Restricted bands
5.7.1 Spurious Emissions
Test Requirement: 47 CFR Part 15C Section 15.209 and 15.205
Test Method: ANSI C63.10 2013
Test Site: Measurement Distance: 3m (Semi-Anechoic Chamber)