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Impurities in ethylene oxide Fast analysis of impurities in ethylene oxide Application Note Materials Testing & Research Introduction Gas chromatography with an Agilent CP-Sil 5 CB column and Agilent 490 Micro GC separates carbon dioxide and water impurities in ethylene oxide in 26 seconds. Authors Agilent Technologies, Inc.
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Fast analysis of impurities in ethylene oxide - Agilent · Impurities in ethylene oxide Fast analysis of impurities in ethylene oxide Application Note Materials Testing & Research

Mar 26, 2019

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Page 1: Fast analysis of impurities in ethylene oxide - Agilent · Impurities in ethylene oxide Fast analysis of impurities in ethylene oxide Application Note Materials Testing & Research

Impurities in ethylene oxideFast analysis of impurities in ethylene oxide

Application Note

Materials Testing & Research

IntroductionGas chromatography with an Agilent CP-Sil 5 CB column and Agilent 490 Micro GC separates carbon dioxide and water impurities in ethylene oxide in 26 seconds.

AuthorsAgilent Technologies, Inc.

Page 2: Fast analysis of impurities in ethylene oxide - Agilent · Impurities in ethylene oxide Fast analysis of impurities in ethylene oxide Application Note Materials Testing & Research

www.agilent.com/chemThis information is subject to change without notice.© Agilent Technologies, Inc. 2011Printed in the USA31 October, 2011First published prior to 11 May, 2010A02060

ConditionsTechnique : Micro-GC

GC-Channel : Agilent CP-Sil 5 CB

Temperature : 40 °C

Carrier Gas : Helium, 26 psig

Injector : 50 ms, 110 °C

BackFlush : after 7 s

Detector : chip TCD

Courtesy : Jim Luong, Dow Chemical Canada

Peak identification1. 11.5 s air (balance)2. 12.1 s CO2 (0.03% v/v)3. 14.7 s water (0.07% v/v)4. 24.0 s ethylene oxide (20% v/v)