Development of CCDs and Relevant Electronics for the X-ray CCD camera of the MAXI Experiment onboard the International Space Station Osaka University E. Miyata, C. Natsukari, T. Kamazuka, H. Kouno, H. Tsunemi NASDA (National Space Agency of Japan) M. Matsuoka, H. Tomida, S. Ueno, K. Hamaguchi Graduate University for Advanced Studies I. Tanaka OUTLINE • International Space Station • MAXI : Monitor of All-sky X-ray Image • X-ray CCD Camera onboard MAXI --- SSC • Engineering Models of SSC components • Development of Electronics for SSC • Summary
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Development of CCDs and Relevant Electronics for the X-ray CCD camera of the MAXI Experiment onboard the International Space Station Osaka University E.
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Development of CCDs and Relevant Electronics for the X-ray CCD camera of the MAXI
Experiment onboard the International Space Station
Osaka UniversityE. Miyata, C. Natsukari, T. Kamazuka, H. Kouno, H. Tsunemi
NASDA (National Space Agency of Japan) M. Matsuoka, H. Tomida, S. Ueno, K. Hamaguchi
Graduate University for Advanced StudiesI. Tanaka
OUTLINE• International Space Station• MAXI : Monitor of All-sky X-ray Image• X-ray CCD Camera onboard MAXI --- SSC• Engineering Models of SSC components• Development of Electronics for SSC• Summary
• To improve the radiation hardness– using Si3N4 gate– having notch structure– having charge injection gate
Radiation Damage Test with Proton
• We are now performing the radiation damage test using the Van-de-Graaff accelerator in our faculty• We will verify our improvements and test the charge injection method to recover
100 keV 2MeV 4MeV
To Evaluate & Maximizethe CCD Performance
We need to optimize
clocking pattern and clocking voltages
(high energy resolution, high Q.E. etc.)
clocking pattern
to recover the performance for
a degraded chip due to radiation damage
(charge injection method etc.)
We need highly flexible CCD driver system !
Previous Driver System
D I/O
AnalogSwitch
CCD
Use DAC to determine high & low levels for each clock
Use analog switch to select the voltage levels
DACAnalogSwitch
AnalogSwitch
AnalogSwitch
OPamp
OPamp
OPamp
OPamp
X Low flexibility
Δ Relatively complex circuit
O Small number of digital I/O pins
high
highlow
low
AnalogSwitch
New Concept: Fast DAC & Fast FPGA
o High flexibilities
o Relatively simple circuit
x Large number of digital I/O pins
CCD
512 KbyteSram
FPGA
DACOPamp
New Generation Driver System
E. Miyata et al. NIM (2001)
Sample Waveform
E-NA System with SSCE Integration Board
55Fe Spectrum (ASCA grades 02346)
Energy [keV]
Counts
readout noise 3e- rms
55Fe Spectrum (Log Scaled)
Energy [keV]
Counts
Summary of EM CCDs
• Achieve 40 µm for epitaxial CCD and bulk CCDs in low dark current mode (voltage of vertical transfer gate is 4 V)
• To achieve thick depletion layer and good energy resolution,epitaxial4 or bulk3 chips will be selected for flight devices
Summary• We have developed the engineering models for
– SSC CCDs– SSC analog electronics– SSC digital electronics– SSC cooling systemAll components function well.We are now ready to construct the flight models.
• We have developed the DAQ system with low-noise, high flexible, high speed– achieve 3e- rms readout noise including CCD– achieve ~40 µm depletion layer in low dark
mode
Near Future Plan
• Radiation damage test is now performing
• Flight design will be fixed in this summer
• Thermal and mechanical test will be performed in the end of this year
SSC… First X-ray CCD Camera
All Fabricated in Japan• We, the Japanese X-ray CCD team, have developed (just started to construct) X-ray CCD camera onboard– ASCA (SIS)– ((( Astro-E ))) ((((( XIS )))))– Astro-E II ( XIS II )
• We developed neither CCD chip nor analog electronics• We like and need to develop all for X-ray CCD for the
future mission (carry CCD, I do hope !)
• This is the first time to develop all for X-ray CCD camera
• For success of our mission, we need to developCCDs having high Q.E. and high E/EAE having low noise capabilityAE to maximize the CCD performance