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Data Converters for Solving Hard Problems Advanced Techniques of Higher Performance Signal Processing Presenter: Hank Zumbahlen
59

Data Conversion: Hard Problems Made Easy - VE2013

May 22, 2015

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Data conversion for data acquisition is a two-part process that involves sampling and then converting signals into digital venues. These processes inherently remove part of the complete analog signal in exchange for the power and robustness of digital signal handling. This becomes especially difficult when trying to capture signals at the limits of the resolution and speed of our systems. In this session, learn how to design a data conversion system that minimizes the signal loss to match the signal handling requirements … even on the hard ones.
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Page 1: Data Conversion: Hard Problems Made Easy - VE2013

Data Converters for Solving Hard Problems Advanced Techniques of Higher Performance Signal Processing

Presenter: Hank Zumbahlen

Page 2: Data Conversion: Hard Problems Made Easy - VE2013

Legal Disclaimer

Notice of proprietary information, Disclaimers and Exclusions Of Warranties The ADI Presentation is the property of ADI. All copyright, trademark, and other intellectual property and proprietary rights in the ADI Presentation and in the software, text, graphics, design elements, audio and all other materials originated or used by ADI herein (the "ADI Information") are reserved to ADI and its licensors. The ADI Information may not be reproduced, published, adapted, modified, displayed, distributed or sold in any manner, in any form or media, without the prior written permission of ADI. THE ADI INFORMATION AND THE ADI PRESENTATION ARE PROVIDED "AS IS". WHILE ADI INTENDS THE ADI INFORMATION AND THE ADI PRESENTATION TO BE ACCURATE, NO WARRANTIES OF ANY KIND ARE MADE WITH RESPECT TO THE ADI PRESENTATION AND THE ADI INFORMATION, INCLUDING WITHOUT LIMITATION ANY WARRANTIES OF ACCURACY OR COMPLETENESS. TYPOGRAPHICAL ERRORS AND OTHER INACCURACIES OR MISTAKES ARE POSSIBLE. ADI DOES NOT WARRANT THAT THE ADI INFORMATION AND THE ADI PRESENTATION WILL MEET YOUR REQUIREMENTS, WILL BE ACCURATE, OR WILL BE UNINTERRUPTED OR ERROR FREE. ADI EXPRESSLY EXCLUDES AND DISCLAIMS ALL EXPRESS AND IMPLIED WARRANTIES OF MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE AND NON-INFRINGEMENT OF ANY THIRD PARTY INTELLECTUAL PROPERTY RIGHTS. ADI SHALL NOT BE RESPONSIBLE FOR ANY DAMAGE OR LOSS OF ANY KIND ARISING OUT OF OR RELATED TO YOUR USE OF THE ADI INFORMATION AND THE ADI PRESENTATION, INCLUDING WITHOUT LIMITATION DATA LOSS OR CORRUPTION, COMPUTER VIRUSES, ERRORS, OMISSIONS, INTERRUPTIONS, DEFECTS OR OTHER FAILURES, REGARDLESS OF WHETHER SUCH LIABILITY IS BASED IN TORT, CONTRACT OR OTHERWISE. USE OF ANY THIRD-PARTY SOFTWARE REFERENCED WILL BE GOVERNED BY THE APPLICABLE LICENSE AGREEMENT, IF ANY, WITH SUCH THIRD PARTY.

2

Page 3: Data Conversion: Hard Problems Made Easy - VE2013

Today’s Agenda

Data converters in the signal chain

Basics of data conversion

Dynamic signal processing

Driving ADCs

Input structures

DACs for high speed and high resolution

3

Page 4: Data Conversion: Hard Problems Made Easy - VE2013

Analog to Electronic Signal Processing

4

SENSOR (INPUT)

DIGITAL PROCESSOR

AMP CONVERTER

ACTUATOR (OUTPUT)

AMP CONVERTER

Page 5: Data Conversion: Hard Problems Made Easy - VE2013

Analog to Electronic Signal Processing

5

SENSOR (INPUT)

DIGITAL PROCESSOR

AMP ADC

ACTUATOR (OUTPUT)

AMP DAC

Page 6: Data Conversion: Hard Problems Made Easy - VE2013

Analog and Digital Domains Why Convert to Digital?

6

Analog signals are continuous and provide the entire signal

Digital signals capture only a portion of the signal

Why digitize? Improved signal analysis potential More robust storage More accurate transmission

Why not digitize? Cost Complexity Processing time available.

Development objective of sampled data systems is to minimize effect of the sampling process

Page 7: Data Conversion: Hard Problems Made Easy - VE2013

Basic ADC with External Reference

7

VDD

VSS

GROUND (MAY BE INTERNALLY CONNECTED TO VSS)

ANALOG INPUT

VREF

DIGITAL OUTPUT

SAMPLING CLOCK

CONTROL SIGNALS (EOC, DATA READY, ETC.)

ADC

VDIO

Page 8: Data Conversion: Hard Problems Made Easy - VE2013

Sampled Data System: Sampling and Quantization

8

LPF OR BPF

N-BIT ADC DSP N-BIT

DAC

LPF OR BPF

fa

fs fs

t

AMPLITUDE QUANTIZATION DISCRETE

TIME SAMPLING

fa

1 fs

ts=

Page 9: Data Conversion: Hard Problems Made Easy - VE2013

Unipolar Binary Code, 4-Bit Converter

9

+15+14+13+12+11+10+9+8+7+6+5+4+3+2+1

0

BASE 10NUMBER SCALE +10 V FS BINARY

1111111011011100101110101001100001110110010101000011001000010000

9.3758.7508.1257.5006.8756.2505.6255.0004.3753.7503.1252.5001.8751.2500.6250.000

+FS – 1 LSB = 15/16 FS+7/8 FS

+13/16 FS+3/4 FS

+11/16 FS+5/16 FS+9/16 FS+1/2 FS

+7/16 FS+3/8 FS

+5/16 FS+1/4 FS

+3/16 FS+1/8 FS

1 LSB = +1/16 FS0

+15+14+13+12+11+10+9+8+7+6+5+4+3+2+1

0

BASE 10NUMBER SCALE +10 V FS BINARY

1111111011011100101110101001100001110110010101000011001000010000

9.3758.7508.1257.5006.8756.2505.6255.0004.3753.7503.1252.5001.8751.2500.6250.000

+FS – 1 LSB = 15/16 FS+7/8 FS

+13/16 FS+3/4 FS

+11/16 FS+5/16 FS+9/16 FS+1/2 FS

+7/16 FS+3/8 FS

+5/16 FS+1/4 FS

+3/16 FS+1/8 FS

1 LSB = +1/16 FS0

Page 10: Data Conversion: Hard Problems Made Easy - VE2013

Bipolar Codes, 4-bit Converter

10

+4.375+3.750+3.125+2.500+1.875+1.250+0.625

0.000–0.625–1.250–1.875–2.500–3.125–3.750–4.375–5.000

1 1 1 11 1 1 01 1 0 11 1 0 01 0 1 11 0 1 01 0 0 11 0 0 00 1 1 10 1 1 00 1 0 10 1 0 00 0 1 10 0 1 00 0 0 10 0 0 0

0 1 1 10 1 1 00 1 0 10 1 0 00 0 1 10 0 1 00 0 0 1

*0 0 0 01 1 1 01 1 0 11 1 0 01 0 1 11 0 1 01 0 0 11 0 0 0

+FS – 1LSB = +7/8 FS+3/4 FS+5/8 FS+1/2 FS+3/8 FS+1/4 FS+1/8 FS

0– 1/8 FS– 1/4 FS– 3/8 FS–1/2 FS–5/8 FS–3/4 FS

– FS + 1LSB = –7/8 FS– FS

±5V FSSCALE0 1 1 10 1 1 00 1 0 10 1 0 00 0 1 10 0 1 00 0 0 10 0 0 01 1 1 11 1 1 01 1 0 11 1 0 01 0 1 11 0 1 01 0 0 11 0 0 0

0 1 1 10 1 1 00 1 0 10 1 0 00 0 1 10 0 1 00 0 0 1

*1 0 0 01 0 0 11 0 1 01 0 1 11 1 0 01 1 0 11 1 1 01 1 1 1

OFFSETBINARY

TWOSCOMP.

ONESCOMP.

SIGNMAG.

0+ 0 0 0 00– 1 1 1 1

0 0 0 01 0 0 0

ONESCOMP.

SIGNMAG.

CODES NOT NORMALLY USEDIN COMPUTATIONS (SEE TEXT)

+7+6+5+4+3+2+1

0–1–2–3–4–5–6–7–8

BASE 10NUMBER

*

Page 11: Data Conversion: Hard Problems Made Easy - VE2013

The Size of a Least Significant Bit (LSB)

11

VOLTAGE (10V FS)

2.5 V

625 mV

156 mV

39.1 mV

9.77 mV (10 mV)

2.44 mV

610 µV

153 µV

38 µV

9.54 µV (10 µV)

2.38 µV

596 nV*

ppm FS

250,000

62,500

15,625

3,906

977

244

61

15

4

1

0.24

0.06

% FS

25

6.25

1.56

0.39

0.098

0.024

0.0061

0.0015

0.0004

0.0001

0.000024

0.000006

dB FS

-12

-24

-36

-48

-60

-72

-84

-96

-108

-120

-132

-144

RESOLUTION N

2-bit

4-bit

6-bit

8-bit

10-bit

12-bit

14-bit

16-bit

18-bit

20-bit

22-bit

24-bit

2N

4

16

64

256

1,024

4,096

16,384

65,536

262,144

1,048,576

4,194,304

16,777,216

*600nV is the Johnson Noise in a 10kHz BW of a 2.2kΩ Resistor @ 25°C

Page 12: Data Conversion: Hard Problems Made Easy - VE2013

Practical Resolution Needs for Data Converters

Instrumentation measurements Sensor resolution/accuracy of 0.5% = 1/200 8 bits equivalent to 1/256 -- digitizing will lose information 10x sensor resolution = 1/2000 -- 12 bits is 1/4096 Allows discrimination of small changes Can also be driven by display requirements

12

Page 13: Data Conversion: Hard Problems Made Easy - VE2013

Transfer Functions for Ideal 3-Bit DAC and ADC

13

DIGITAL INPUT

ANALOGOUTPUT

FS

000 001 010 011 100 101 110 111 ANALOG INPUT

DIGITALOUTPUT

FS000

001

010

011

100

101

110

111

QUANTIZATIONUNCERTAINTY

QUANTIZATIONUNCERTAINTY

DAC ADC

Page 14: Data Conversion: Hard Problems Made Easy - VE2013

Primary Errors in Data Converters (DC Parametrics)

Instrumentation and measurement Described in LSBs (least-significant-bit), % of FS, ppm of FS Offset error – the input level needed to change the first code Gain/full-scale error – the input level need to change the last code Nonlinearity – deviation of codes from the line from zero to FS Differential nonlinearity – code-to-code deviation from 1 LSB Transition noise – ADC uncertainty in code center point

14

Page 15: Data Conversion: Hard Problems Made Easy - VE2013

Primary Errors in Data Converters (AC Parametrics)

15

Dynamic systems

SINAD (Signal-to-Noise-and-Distortion Ratio): The ratio of the rms signal amplitude to the mean value of the root-sum-squares (RSS) of all other spectral components, including harmonics, but excluding DC.

ENOB (Effective Number of Bits):

SNR (Signal-to-Noise Ratio), or Signal-to-Noise Ratio without Harmonics: The ratio of the rms signal amplitude to the mean value of the root-sum-squares (RSS) of all other spectral components, excluding the first 5 harmonics and DC

SFDR (Spurious-Free-Dynamic-Range) Signal dynamic range in the bandwidth of interest containing no frequency noise spurs

ENOB = SINAD – 1.76dB 6.02dB

Page 16: Data Conversion: Hard Problems Made Easy - VE2013

Quantifying Data Converter Dynamic Performance

16

Harmonic Distortion Worst Harmonic Total Harmonic Distortion (THD) Total Harmonic Distortion Plus Noise (THD + N) Signal-to-Noise-and-Distortion Ratio (SINAD, or S/N +D) Effective Number of Bits (ENOB) Signal-to-Noise Ratio (SNR) Analog Bandwidth (Full-Power, Small-Signal) Spurious Free Dynamic Range (SFDR) Two-Tone Intermodulation Distortion Multi-tone Intermodulation Distortion Noise Power Ratio (NPR) Adjacent Channel Leakage Ratio (ACLR) Noise Figure Settling Time, Overvoltage Recovery Time

Page 17: Data Conversion: Hard Problems Made Easy - VE2013

The Comparator: A 1-Bit ADC

17

DIFFERENTIAL ANALOG INPUT

LOGIC OUTPUT

LATCH ENABLE

DIFFERENTIAL ANALOG INPUT

COMPARATOR OUTPUT

"0"

"1"

0

VHYSTERESIS

+

Page 18: Data Conversion: Hard Problems Made Easy - VE2013

Quantization and Quantization Noise

18

001

010

011

100

101

110

111

1/8 2/8 3/8 4/8 5/8 6/8 7/8 FS NORMALIZED ANALOG INPUT

DIG

ITAL

OU

TPU

T

Quantization noise error: RMS value is LSB/3.464

Quantization error function

Page 19: Data Conversion: Hard Problems Made Easy - VE2013

Ideal ADC Sampling 3 Different Frequencies, Sampled the Same

19

Page 20: Data Conversion: Hard Problems Made Easy - VE2013

Ideal ADC Sampling Once Sampled, Information Is Lost

20

Page 21: Data Conversion: Hard Problems Made Easy - VE2013

Nyquist's Criteria

A signal with a maximum bandwidth of fa must be sampled at a rate fs > 2fa or information about the signal will be lost because of aliasing.

Aliasing occurs whenever fs < 2fa

A signal which has frequency components between fa and fb must be sampled at a rate fs > 2 (fb – fa) in order to prevent alias components from overlapping the signal frequencies.

The concept of aliasing is widely used in communications applications such as direct IF-to-digital conversion.

21

Page 22: Data Conversion: Hard Problems Made Easy - VE2013

Analog Signal fa Sampled @ fs Has Images (Aliases) At |±Kfs ±fa|, K = 1, 2 ...

22

Page 23: Data Conversion: Hard Problems Made Easy - VE2013

Oversampling Relaxes Requirements on Baseband Antialiasing Filter

23

B A

DR

f s

f a f s – f a Kfs – f

a f a

fs 2

Kfs Kfs 2

STOPBAND ATTENUATION = DR TRANSITION BAND: fa to fs – fa CORNER FREQUENCY: fa

STOPBAND ATTENUATION = DR TRANSITION BAND: fa to Kfs – fa CORNER FREQUENCY: fa

Page 24: Data Conversion: Hard Problems Made Easy - VE2013

Advantages of Differential Analog Input Interfaces for Data Converters Differential inputs give twice the signal swing vs. single-ended

(especially important for low voltage single-supply operation)

Differential inputs help suppress even order distortion products

Many IF/RF components such as SAW filters and mixers are differential

Differential inputs suppress common-mode ADC switching noise including LO feed-through from mixer and filter stages

Differential ADC designs allow better internal component matching and tracking than single-ended. Less need for trimming

Helps minimize the effects of noise on the ground.

If you drive them single-ended, you will have degradation in distortion and noise performance

However, many signal sources are single-ended, so the differential amplifier is useful as a single-ended to differential converter

2.24

Page 25: Data Conversion: Hard Problems Made Easy - VE2013

ADA4941 Driving AD7690 18-Bit PulSAR® ADC in +5V Application

2.25

After filter, noise = 13 µV rms due to amp Signal = 8V p-p differential SNR = 107 dB

+5V

+2.1V

+1.75V

9.53kΩ

10.0kΩ 8.45kΩ

0.1µF

0.1µF

11.3kΩ

4.02kΩ

806Ω

ADR444

+5V VREF = +4.096V 0.1µF

REF

+5V

VDD

IN+

IN–

+

+

CF

VIN = ± 10V

+2.1V +/– 2V

+2.1V – /+ 2V

ADA4941-1

41.2Ω

41.2Ω

3.9nF

3.9nF

AD7690, 400kSPS AD7691, 250kSPS 18-BIT PulSAR ADCs

LPF CUTOFF = 1MHz

VCM = +2.1V R R

0.1µF

VREF = +4.096V

INPUT RANGE = 8.192V p-p DIFF.

10.2nV/√Hz

SNR = 100dB FOR AD7690

Page 26: Data Conversion: Hard Problems Made Easy - VE2013

ADA4937-1 Driving AD6645 in +5V DC-Coupled Application

2.26

AD6645 SPECS: INPUT BW = 270MHz 1 LSB = 134µV SNR = 75dB

5nV/√Hz 1.57×270×106 = 103µV rms OUTPUT NOISE =

OUTPUT SNR = 20 log 103×10–6

0.778 = 77.6dB

+

AD6645 14-BIT ADC

AIN–

AIN+

VIN

±1.1V

65.5Ω

200Ω

200Ω

200Ω

226Ω

24.9Ω

24.9Ω

+2.4V

VOCM ADA4937-1

0.1µF

0.1µF

0.1µF

+1.2V + / – 0.275V

+2.4V – / + 0.55V

+2.4V + / – 0.55V

2.2V p-p DIFFERENTIAL INPUT SPAN

+5V

FROM 50Ω SOURCE

fs = 80/105MSPS

VREF

5nV/√Hz

+5V

C

Page 27: Data Conversion: Hard Problems Made Easy - VE2013

Buffered and Unbuffered Differential ADC Inputs Structures

2.27

BUFFERED INPUTS

UNBUFFERED INPUT

S5

V INB

+

-

A

V IN A

C P

C P S1

S2

S3

S4

S6

C H

5 p F

C H

5 p F S7 Z IN

(A) (B)

(C)

GND

AVDD

V INB

R1 R1

R2 R2

INPUT BUFFER SHA

V INA INPUT

BUFFER SHA

V REF

V INA

V INB

Page 28: Data Conversion: Hard Problems Made Easy - VE2013

Input Impedance Model for Buffered and Unbuffered Input ADCs

2.28

R C

ADC

ZIN

BUFFERED INPUT R and C are constant over frequency Typically: R: 1 kΩ – 2 kΩ C: 1.5 pF – 3 pF

UNBUFFERED INPUT

R and C vary with both frequency and mode (track/hold)

Use Track mode R and C at the input frequency of interest

Page 29: Data Conversion: Hard Problems Made Easy - VE2013

2.29

Unbuffered CMOS ADC (AD9236 12-Bit, 80 MSPS) Series Input Impedance in Track Mode and Hold Mode

REAL Z, HOLD

REAL Z, TRACK

IMAG Z, TRACK

IMAG Z, HOLD

ANALOG INPUT FREQUENCY (MHz)

SER

IES

REA

L IM

PED

ANC

E (O

HM

S)

SER

IES

IMAG

INAR

Y IM

PED

ANC

E (p

F)

200

180

160

140

120

100

80

60

40

20

0

20 18 16 14 12 10 8 6 4 2 0

0 100 200 300 400 500 600 700 800 900 1000

RS ZIN

CS

Page 30: Data Conversion: Hard Problems Made Easy - VE2013

Basic Principles of Resonant Matching

2.30

(2π f )2 CS

RS ZIN CS

RP ZIN CP

LS/2

LS/2 LP

LS = 1

(2π f )2 CP LP = 1

SERIES RESONANT @ f (70MHz) PARALLEL RESONANT @ f (70MHz)

ZIN = RS + j0 @ f ZIN = RP + j0 @ f

ADC ADC

Make XLS = XCS Make XLP = XCP

f

|ZIN| RP

|ZIN|

RS f

4kΩ @ 70MHz For AD9236

69Ω @ 70MHz For AD9236

(69Ω)

(4.3pF) (4kΩ) (4.3pF)

(1.2µH) (1.2µH)

Page 31: Data Conversion: Hard Problems Made Easy - VE2013

Before and After Adding Matching Analog Antialiasing Filter Network

2.31

SFDR Improved by 13.4 dB, SNR improved by 10.7 dB Note: Measured at maximum gain of 35 dB (gain code 255, high gain mode) using

76.8 MHz sampling clock

SAMPLING RATE = 76.8MSPSINPUT = 70MHzNOISE FLOOR = –84.3dBFSTHD = –63.9dBcSFDR = 68.0dBcSNR = 42.1dBFS

SAMPLING RATE = 76.8MSPSINPUT = 70MHzNOISE FLOOR = –84.3dBFSTHD = –63.9dBcSFDR = 68.0dBcSNR = 42.1dBFS

WITHOUT NETWORK

SAMPLING RATE = 76.8MSPSINPUT = 70MHzNOISE FLOOR = –95dBFSTHD = –76.8dBcSFDR = 81.4dBcSNR = 52.8dBFS

WITH NETWORK

Page 32: Data Conversion: Hard Problems Made Easy - VE2013

Effects of Aperture Jitter and Sampling Clock Jitter

32

ANALOG INPUT

TRACK

HOLD

dv dt

v dv dt

t RMS = APERTURE JITTER

v RMS

NOMINAL HELD OUTPUT

= t

= SLOPE = APERTURE JITTER ERROR ∆

Page 33: Data Conversion: Hard Problems Made Easy - VE2013

Theoretical SNR and ENOB Due to Jitter vs. Full-Scale Sinewave Analog Input Frequency

33

SNR ( d B ) ENOB

1 0 0

8 0

6 0

4 0

2 0

1 6

1 4

1 2

1 0

8

6

4

1 3 10 30 100

tj = 1ns

tj = 100ps

tj = 10ps

tj = 1ps

tj = 0.1ps

120

18

FULL-SCALE SINEWAVE ANALOG INPUT FREQUENCY (MHz)

SNR = 20log 10 1

2 π f t j

tj = 50fs

Page 34: Data Conversion: Hard Problems Made Easy - VE2013

Oscillator Requirements vs. Resolution and Analog Input Frequency

tj (ps)

Page 35: Data Conversion: Hard Problems Made Easy - VE2013

Clock and Timing IC Jitter

35

Sig

nal t

o N

oise

Rat

io (S

NR

) in

dB

Frequency of Fullscale Analog Input to ADC in MHz 45.0

50.0

55.0

60.0

65.0

70.0

75.0

80.0

85.0

90.0

100 1000

50 fs

100 fs

200 fs

400 fs

800 fs AIN = 200 MHz

300 MHz

400 MHz

500 MHz

Page 36: Data Conversion: Hard Problems Made Easy - VE2013

4.36

SNR Plot for the AD9445 Evaluation Board with Proper Decoupling

Page 37: Data Conversion: Hard Problems Made Easy - VE2013

4.37

AD9445 Pinout Diagram

Page 38: Data Conversion: Hard Problems Made Easy - VE2013

4.38

SNR Plot for an AD9445 Evaluation Board with Caps Removed from the Analog Supply

Page 39: Data Conversion: Hard Problems Made Easy - VE2013

4.39

SNR Plot for an AD9445 Evaluation Board with Caps Removed from the Digital Supply

Page 40: Data Conversion: Hard Problems Made Easy - VE2013

ADIsimADC

40

Page 41: Data Conversion: Hard Problems Made Easy - VE2013

ADIsimADC

41

Page 42: Data Conversion: Hard Problems Made Easy - VE2013

VisualAnalog™

42

Page 43: Data Conversion: Hard Problems Made Easy - VE2013

SPI Controller

43

Page 44: Data Conversion: Hard Problems Made Easy - VE2013

ADC References

Input level compared to reference ADC accuracy is relative to that reference

Internal reference Simplicity and lower cost Reference tuned to ADC performance Specifications all-inclusive

External reference Can be chosen for higher absolute accuracy Allows common reference in multiple-ADC system Common reference for sensor driver and ADC

Power supply as reference Lowest cost in most cases Noise is biggest issue Tolerance and drift may degrade accuracy

44

Page 45: Data Conversion: Hard Problems Made Easy - VE2013

Voltage Reference Comparison

45

Page 46: Data Conversion: Hard Problems Made Easy - VE2013

ADC References

46

Page 47: Data Conversion: Hard Problems Made Easy - VE2013

Analog to Electronic Signal Processing

47

SENSOR (INPUT)

DIGITAL PROCESSOR

AMP ADC

ACTUATOR (OUTPUT)

AMP DAC

Page 48: Data Conversion: Hard Problems Made Easy - VE2013

DAC Signal Construction

48

t

SAMPLED SIGNAL

t

RECONSTRUCTED SIGNAL

1 fc

IDEAL TRANSITION TRANSITION WITH DOUBLET GLITCH

TRANSITION WITH UNIPOLAR (SKEW) GLITCH

t t t

Page 49: Data Conversion: Hard Problems Made Easy - VE2013

DAC sin x/x Roll Off (Amplitude Normalized)

49

0.5fc fc 1.5fc 2fc 2.5fc 3fc

A = sin

π f fc

π f fc

1

f

A

t

–3.92dB

RECONSTRUCTED SIGNAL

0

1 fc

IMAGES IMAGES

IMAGES

FS – FOUT FS + FOUT 2FS – FOUT 2FS + FOUT

Page 50: Data Conversion: Hard Problems Made Easy - VE2013

LPF Required to Reject Image Frequency

50

Page 51: Data Conversion: Hard Problems Made Easy - VE2013

Analog Filter Requirements for fo = 10 MHZ: fc = 30 MSPS, and fc = 60 MSPS

51

f CLOCK = 30MSPS

d B

IMAGE

10 20 30 40 50 60 70 80

f o

AN AL OG L PF

10 20 30 40 50 60 70 80

IMAGE

A N AL OG LPF

FREQUENCY (MHz)

IMAGE IMAGE IMAGE

IMAGE

f o

f CLOCK = 60MSPS

d B

A

B

Page 52: Data Conversion: Hard Problems Made Easy - VE2013

DAC Images (continued)

52

As the DAC output (FOUT) approaches Nyquist frequency, the images come closer together, making it extremely difficult to filter the image from the signal.

0 50 100 150 200 250 0

101

102

X X X

FREQUENCY

POW

ER

In the above example, FOUT = 0.45 3 Fs

Page 53: Data Conversion: Hard Problems Made Easy - VE2013

Interpolation

Maximum Output Frequency of Standard DAC is FCLOCK ÷ 2 (Nyquist Rate).

In an Interpolating D/A Converter, Digital Interpolation Filters and a PLL Clock Multiplier Are Used to Multiply the Input Data Rate to the DAC by a Factor of x Times the Clock Rate.

Produces an Image at x Times FSIGNAL, Smoothing the Sine Function and Simplifying the Filter Requirements and Digital Interface.

53

fSIGNAL fCLOCK = 2 x fSIGNAL fSIGNAL fCLOCK = 8 x fSIGNAL

Page 54: Data Conversion: Hard Problems Made Easy - VE2013

Oversampling Interpolating TxDAC® Simplified Block Diagram

54

fo

K•fcfc

LATCH LATCH DAC

LPF

DIGITALINTERPOLATION

FILTER

PLL

N N N N

TYPICAL APPLICATION: fc = 160MSPSfo = 50MHzK = 2Image Frequency = 320– 50 = 270MHz

Page 55: Data Conversion: Hard Problems Made Easy - VE2013

AD9772: 2X Interpolation vs. Nyquist DAC

55

Nyquist DAC AD9772 DAC

1st IMAGE 1st NEW IMAGE

IMAGES FILTERED BY DIGITAL 2X

INTERPOLATION

Page 56: Data Conversion: Hard Problems Made Easy - VE2013

Tweet it out! @ADI_News #ADIDC13

What We Covered

Data converters in the signal chain

Basics of data conversion

Dynamic signal processing

Driving ADCs

Input structures

DACs for high speed and high resolution

56

Page 57: Data Conversion: Hard Problems Made Easy - VE2013

Tweet it out! @ADI_News #ADIDC13

Design Resources Covered in This Session

Design tools & resources:

Ask technical questions and exchange ideas online in our EngineerZone® Support Community Choose a technology area from the homepage: ez.analog.com

Access the Design Conference community here: www.analog.com/DC13community

57

Name Description URL

ADIsimADC Shows dynamic performance of ADCs in real applications

Voltage Reference Selection Wizard Visual Analog

SPI Controller

Page 58: Data Conversion: Hard Problems Made Easy - VE2013

The Data Conversion Handbook

58

The Data Conversion Handbook, edited by Walt Kester (Newnes, 2005), is written for design engineers who routinely use data converters and related circuitry. Comprising Data Converter History, Fundamentals of Sampled Data Systems, Data Converter Architectures, Data Converter Process Technology, Testing Data Converters, Interfacing to Data Converters, Data Converter Support Circuits, Data Converter Applications, and Hardware Design Techniques, it may be the ultimate expression of product "augmentation" as it relates to data converters. The last chapter discusses practical issues, including common pitfalls and solutions related to the non-ideal properties of passive components. The Data Conversion Handbook can be purchased from your favorite bookseller.

Individual chapters--or a zip file containing all chapters--of the original Basic Linear Design seminar notes can be downloaded by selecting the appropriate links below

http://www.analog.com/library/analogDialogue/archives/39-06/data_conversion_handbook.html

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Linear Circuit Design Handbook

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Linear Circuit Design Handbook, edited by Hank Zumbahlen (Newnes, 2008), bridges the gap between circuit component theory and practical circuit design. Effective analog circuit design requires a strong understanding of core linear devices and how they affect analog circuit design. This book provides complete coverage of important analog devices and how to use them in designing linear circuits, and serves as a useful learning tool and reference for design engineers involved in analog and mixed-signal design. It features complete coverage of analog circuit components for the practicing engineer; market-validated design information for all major types of linear circuits; practical advice on how to read op amp data sheets and how to choose off-the-shelf op amps; printed circuit board design issues; and over 1000 figures, including working circuit diagrams. Analog Dialogue readers can get a 20% discount when they order this book directly from Newnes. Enter discount code 92222.

Individual chapters--or a zip file containing all chapters--of the original Basic Linear Design seminar notes can be downloaded by selecting the appropriate links below

http://www.analog.com/library/analogDialogue/archives/43-09/linear_circuit_design_handbook.html