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Counting and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor of Environmental Engineering Department of Civil and Environmental Engineering The Pennsylvania State University Email: [email protected] http://www.engr.psu.edu/ce/enve/logan.htm
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Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

Mar 26, 2018

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Page 1: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

Counting and imaging bacteria using fluorescent microscopy

&Electron Microscopy and

Atomic Force Microscopy (AFM)

Bruce E. LoganKappe Professor of Environmental Engineering

Department of Civil and Environmental EngineeringThe Pennsylvania State University

Email: [email protected]://www.engr.psu.edu/ce/enve/logan.htm

Page 2: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

Viewing bacteria using a microscope

• Bacteria ~1 um in size • Invisible using brightfield microscopy• Use phase-contrast to see bacteria (wet

mount)• Staining bacteria can help differentiate them

(gram stain) based on cell structure

Page 3: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

Fluorescent staining• Fluorescence increases light sensitivity• Can stain cells for specific materials • General stains: Acridine orange

DAPI• Viability/Respiration: CTC• FISH- fluorescent in-situ hybridization

(allows staining of specific types of bacteria)

Page 4: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

Phase contrast image (isolate PDX)

Page 5: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

Natural assemblage of bacteria- AO stain

Page 6: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

Natural assemblage of

bacteria-AO stain

Page 7: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

Natural assemblage of bacteria- AO stain

Page 8: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

Water from Lake Constance (Germany): DAPI

Page 9: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

Soil bacteria: SYBR Green II stain)

From: Weinbauer et al. Appl. Environ. Microbiol. 64, 5000.

Page 10: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

Fluorescent redox probe (CTC) for actively respiring bacteria (P. putida)

From: Rodriguez et al. Appl. Environ. Microbiol. 58, 1801.

Page 11: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

Viewing particles in seawater on filters using cytoclear slides

Page 12: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

Closeup of Chaetoceros(brightfield image, AO, AB)

Page 13: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

Closeup of Chaetoceros(blue light, AO, AB)

Page 14: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

Viruses in Seawater(stained with Yo-Pro-1, a cyanine-based nucleic stain)

From: Hennes and Suttle, 1995, Limnol. Oceanogr. 40, 1050

Page 15: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

Material specific stains

• Other stains can be used to view materials in cells

• Alcian blue (AB) stains only negatively charged polysaccharides

• Used to identify material responsible for large particle aggregation in the ocean (TEP- transparent exopolymer particles)

Page 16: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

Alcian Blue stained phytoplankton culture

Page 17: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

Alcian Blue stained phytoplankton culture- phase contrast

Page 18: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

Using fluorecent in-situ hybridization (FISH)

with 16s rRNA-targed oligonucleotide probes

Page 19: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

FISH Analysis of Nitrifying BiofilmsNitrosomonas (ammonia oxidizing) Nitrospira (nitrite oxidizing)

From: Okabe et al. 1999, Appl. Environ. Microbiol. 65, 3182

Page 20: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

FISH Analysis of Toluene-degrading BiofilmsAcinetobacter sp Pseudomonas putida

From:Moller et al. 1998, Appl. Environ. Microbiol. 64, 721.

Page 21: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

Electron Microscopy

•Scanning Electron Microscopy (SEM)

•Transmission Electron Microscopy (TEM)

•Environmental SEM (ESEM)

Page 22: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

SEM Images

Burkholderia cepacia G4 Pseudomonas fluorescens P17

Page 23: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

TEM Images

Pseudomonas fluorescens

P17

Page 24: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

ESEM Images

Page 25: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

ESEM Images

Page 26: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

Atomic Force Microscopy (AFM)

Page 27: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

Imaging with the Bioscope Atomic Force Microscope

• Generate 3-D images of surfaces (topographic imaging)

• Provide information about surface properties such as adhesion properties and chemical composition (phase imaging)

Bacteria are attached to glass slides and once attached, AFM experiments can be performed.

Page 28: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

Configuration of the AFM

Sensor to measurecantilever position

Laser

Cantilever withsilicon nitridetip

Adapted from image on DigitalInstruments’ web page

Page 29: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

2.9 μm

AFM imaging: use a silicon nitride tip mounted on a cantilever

100 μm = width of human

hair!400 nm

Made of silicon nitride

Radius of tip = 5 – 50 nm

Spring constant of cantilever ~ 0.1 N/m

tips

Page 30: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

BIOSCOPE: Atomic Force Microscope (AFM) is

integrated with an inverted microscope

Page 31: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

AFM Head on microscope stage

Page 32: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

AFM Cantilever &Tip

Page 33: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

AFM Cantilever &Tip

Page 34: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

The Atomic Force Microscope (AFM) can be usedto provide data on:

- surface topography- surface heterogeneity- adhesion forces between tip and surface

Data is obtained in different ways, that include:- Contact mode- Tapping mode- Phase (in tapping mode)- Approach/Retraction curves

Samples can be imaged in water or in air

Page 35: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

AFM- Contact ModeThe topography of a surface is measuredby monitoring the deflection of the tip(using a laser) as it is pulled across asurface.

Tip

Cantilever

Page 36: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

AFM-Tapping Mode

The topography of asurface is also measuredbut the tip oscillatesduring scanning.

Page 37: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

dsetpoint

Height image

dsetpo

Deflection image

Δh(x) Δd(x)

Page 38: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

dsetpoint

Height image Deflection image

Δh(x) Δd(x)

dsetpoin

…Δhpiezo decreases

Page 39: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

“Height” images not as clear as “Deflection” images

Page 40: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

“Residuals” on Surfaces

TAPPING (Amplitude)

TAPPING

PHASE

PHASE

AFM images of bacteria in air often show some sort of “material” adjacent to cells

Page 41: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

0.44 μm

0.95 μm

1μm

Bacteria imaged with AFM show a “residual”

The side of the AFM tip makes contact with cell giving the appearance of a “Shadow”

Page 42: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

Bacteria imaged in air do not have

show artifacts

(they have less height)

C

Bacterium imaged while drying Dried bacterium

Water drops No residuals when dr

Page 43: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

AFM studies of cell morphology

Chemicals can be used to alter cell adhesion properties, but their effects on bacterial morphology are not well known.

Objective:

Use the AFM to probe morphological changes in response to chemical treatments.

Page 44: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

Low IS water

Disodium Tetraborate

Sodium Pyrophosphate

Lysozyme and EDTA

MOPS Buffer(Control)

Topographic Images of

Pseudomonas stutzeri KC

Page 45: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

Tapping Mode

TappingFluid Layer

Free Amplitude

Amplitude Reduced

Presenter
Presentation Notes
In air, the cantilever is oscillated at its resonant frequency using a piezoelectric crystal. The piezo motion causes the cantilever to oscillate at its free air amplitude (typically greater than 20 nm). The oscillating tip is then gradually moved closer to the sample until it begins to lightly tap the surface. As the oscillating tip begins to contact the surface, its amplitude is reduced due to energy loss caused by this contact. The reduction in amplitude is used to identify and measure surface features. When the tip passes over a bump in the surface, the cantilever has less room to oscillate and the amplitude of oscillation decreases. Conversely when the tip passes over a depression, the cantilever has more room to operate and the amplitude increases. The oscillation amplitude of the tip is measured by the detector and input to the electronics. Tapping mode can also be used in fluids, but we haven’t been able to do so yet.
Page 46: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

Tapping Mode Phase Imaging

Page 47: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

AFM Images (in air): Burkholderia cepacia G4exposed to Tween 20

Tapping mode image Phase image

Page 48: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

Disodium Tetraborate Tween 20

Tapping Mode PhaseImaging Pseudomonas stutzeri KC

Page 49: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

Bacterial interaction forces

Objectives:

•Use the AFM to measure forces between bacteria and surfaces.

Page 50: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

Surface

Repulsion?

Bacterium

Bacterium

What is the interaction force between a bacterium and a surface?

Page 51: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

A. Glass bead on a tipless cantilever

D. Too much glue on the bead (done intentionally)

C. Glass bead behind the pyramid shape tip

B. Glass bead in front of the pyramid shape tip

Page 52: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

Approach

Distance from surface

Attractive Force

AFM- Force Measurement

Page 53: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

Approach

Distance from surface

Repulsive Force

AFM- Force Measurement

Page 54: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

Distance from surface

Retraction

Approach

Retraction

Approach

AFM- Force Measurement

Page 55: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

Anatomy of a deflection curve

Page 56: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

Anatomy of a deflection curve

Page 57: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

Anatomy of a deflection curve

Page 58: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

Anatomy of a deflection curve

Page 59: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

Anatomy of a deflection curve

Page 60: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

EXAMPLE: Show that force curves must be done on the top of the bacterium

Presenter
Presentation Notes
-Determine how AFM tip interacts with bacterial surface -Quantify interaction forces -Understand bacterial adhesion -Develop methods to control adhesion -Materials -Polymeric coatings for bioaugmentation -Special growth conditions -Chemically modify LPS layer
Page 61: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

First, Zoom in on a single bacterium

Presenter
Presentation Notes
-Determine how AFM tip interacts with bacterial surface -Quantify interaction forces -Understand bacterial adhesion -Develop methods to control adhesion -Materials -Polymeric coatings for bioaugmentation -Special growth conditions -Chemically modify LPS layer
Page 62: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

Now you are ready for deflection curve analysis

Presenter
Presentation Notes
-Determine how AFM tip interacts with bacterial surface -Quantify interaction forces -Understand bacterial adhesion -Develop methods to control adhesion -Materials -Polymeric coatings for bioaugmentation -Special growth conditions -Chemically modify LPS layer
Page 63: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

Deflection curve on E. coli D21f2

Page 64: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

Deflection curve on E. coli D21f2

Page 65: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

Deflection curve on E. coli D21f2

Page 66: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

Deflection curve on E. coli D21f2

Page 67: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

Deflection curve on E. coli D21f2

Page 68: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

Deflection curve on E. coli D21f2

Page 69: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

X* X *

Deflection curve analysisMust be on the very top of a bacterium to obtain a good force curve

Page 70: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

Δhpiezo, nm

Δd

cant

ileve

r, nm

Understanding Force Curves

Challenge: Where is zero distance?

Force, nN = kcantileverΔd cantilever

Page 71: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

AFM Force Measurements (Non-interacting Sample and Tip, “Hard” Sample)

Tip-to-Sample Distance (nm)

spring constant, k [=] N/m

constant compliance region

00

Page 72: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

AFM Force Measurements (Non-interacting Sample and Tip, “Soft” Sample)

Tip-to-Sample Distance (nm)

spring constant, k [=] N/m

constant compliance region?

0 ?0

Page 73: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

(c)

(d)

(a)(b)

0

d, C

antil

ever

def

lect

ion

za

kc

kb

ha

(a)

db

ib

zb

(b)

dc

ic

hc

(c)

dd

id

zd

(d)

Page 74: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

Tip-to-Sample Distance (nm)0 100 200 300 400 500

Forc

e (n

N)

0

1

2

3

4

5

6

pH=2.2pH=4.75pH=7.00pH=8.67

Approach Curves

KT2442 in 1 mM MOPS Buffer

Page 75: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

Surface roughness is important

Page 76: Counting and imaging bacteria using fluorescent … and imaging bacteria using fluorescent microscopy & Electron Microscopy and Atomic Force Microscopy (AFM) Bruce E. Logan Kappe Professor

AFM vs Electron Microscopy

• AFM does not require the use of formaldehyde or other fixative chemicals

• AFM does not require ultrahigh vacuum, or even any vacuum

• Morphology more clearly observed using AFM• TEM is best for observing flagella• In ESEM, samples need not be dried, but we

found it very difficult to observe bacteria