Cost-Efficient Soft Error Protection for Embedded Microprocessors. Jason Blome 1 , Shuguang Feng 1 , Shantanu Gupta 1 , Scott Mahlke 1 , Daryl Bradley 2 University of Michigan 1 ARM, Ltd. 2. CLK. 0. Q. D. transient fault. soft error. The Soft Error Problem. 1. Register File. - PowerPoint PPT Presentation
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1 University of MichiganElectrical Engineering and Computer Science
Cost-Efficient Soft Error Protection for Embedded Microprocessors
Jason Blome1, Shuguang Feng1, Shantanu Gupta1, Scott Mahlke1, Daryl Bradley2
University of Michigan1
ARM, Ltd. 2
2 University of MichiganElectrical Engineering and Computer Science
The Soft Error Problem
transient fault soft error
0CLK
D Q1
3 University of MichiganElectrical Engineering and Computer Science
Fault Masking• Logical: faulted value does not affect logical
operation of the circuit
0
0
• Latching-Window: the fault pulse does not reach a state element within the latching window
• Electrical: the fault pulse is electrically attenuated by subsequent gates in the circuit
• Architectural/Software: incorrect state is written before it is read
CLK
tsetup thold
mov r5, 8
mov r2, 4------
…de
code
r
Register File
012345
add r6, r2, r5mov r5, 8
mov r2, 4
98
4add r6, r2, r5
4 University of MichiganElectrical Engineering and Computer Science
Soft Error Rate Trends
Shivakumar 2002
Soft Error Rate Contributions
Mitra 2005
49%
11%
40%
StaticCombinationalLogicUnprotectedSRAMs
SequentialElements
Increasing contribution of faults in combinational logic to the overall soft error rate
5 University of MichiganElectrical Engineering and Computer Science