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25 YEARS OF TUG Marijn Achterkamp, Salland Engineering [email protected] Clint Hutchinson, Teradyne [email protected] Zarni Tun, National Semiconductor [email protected] Cost effective Concurrent Test Solution for an Audio Subsystem IC with class-D output Testing an Audio Sub-System with Class-D output
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Cost effective Concurrent Test Solution for an Audio Subsystem IC ...

Jan 06, 2017

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Page 1: Cost effective Concurrent Test Solution for an Audio Subsystem IC ...

25 YEARS OF TUG

Marijn Achterkamp, Salland [email protected]

Clint Hutchinson, [email protected]

Zarni Tun, National [email protected]

Cost effective Concurrent Test Solution for an Audio Subsystem IC with class-D output

Testing an Audio Sub-System with Class-D output

Page 2: Cost effective Concurrent Test Solution for an Audio Subsystem IC ...

Teradyne Users Group 2008 25 Years of TUG

Austin, TX - April 27-30

Zarni Tun, Marijn Achterkamp, Clint Hutchinson

Contents

• Introduction (Description of test challenge)• Current setup• Issues with current setup• HDACTO solution• Conversion• Benefits with HDACTO solution• Summary & Conclusions• Questions???

Page 3: Cost effective Concurrent Test Solution for an Audio Subsystem IC ...

Teradyne Users Group 2008 25 Years of TUG

Austin, TX - April 27-30

Zarni Tun, Marijn Achterkamp, Clint Hutchinson

Introduction

• LM49370 audio subsystem• Many Analog I/O

• LS, HP, Cellphone,MIC• High Performance

• SNR 98dB• THD 0.04%

• Cell phone• Pressure on COT

• Testtime ↓• Sitecount ↑

Page 4: Cost effective Concurrent Test Solution for an Audio Subsystem IC ...

Teradyne Users Group 2008 25 Years of TUG

Austin, TX - April 27-30

Zarni Tun, Marijn Achterkamp, Clint Hutchinson

Current setup

• Tested on uFlex platform• Quad site• 2 * BBAC• 3 * DC-30 (continuity, power, etc.)• 1 * POOL (continuity)• 2 * HSD200• 1 * DC-90 (high current)• = 9 instrument slots occupied from

12 available

Page 5: Cost effective Concurrent Test Solution for an Audio Subsystem IC ...

Teradyne Users Group 2008 25 Years of TUG

Austin, TX - April 27-30

Zarni Tun, Marijn Achterkamp, Clint Hutchinson

Issues with current setup

• Complex DIB design• High relay count (almost 200!)

• Pushing Utility supply to limits• Signal degradation• Low MTBF

• Max quad site

Page 6: Cost effective Concurrent Test Solution for an Audio Subsystem IC ...

Teradyne Users Group 2008 25 Years of TUG

Austin, TX - April 27-30

Zarni Tun, Marijn Achterkamp, Clint Hutchinson

BBACSrc

+

-

CPI_P

MIC_N

CPI_N

MIC_P

DC30

DC30

DC30

DC30AUX_L

AUX_R

Number of relays per site: 10!

LM49370 Analog Inputs using BBAC

Page 7: Cost effective Concurrent Test Solution for an Audio Subsystem IC ...

Teradyne Users Group 2008 25 Years of TUG

Austin, TX - April 27-30

Zarni Tun, Marijn Achterkamp, Clint Hutchinson

LM49370 Analog Outputs using BBAC

BBACCap

+

-

CPO_P

EP_N

CPO_N

EP_P

DC30

DC30

DC30

DC30AUX_LAUX_R

HP_L

HP_R

LS_NLS_P

DC30

DC30

HP_MID

DC30

DCdiff

DCdiff

DC30

Number of relays per site: 22!

Page 8: Cost effective Concurrent Test Solution for an Audio Subsystem IC ...

Teradyne Users Group 2008 25 Years of TUG

Austin, TX - April 27-30

Zarni Tun, Marijn Achterkamp, Clint Hutchinson

Issues with current setup

• High cost of test• High testtime due to serial testing

• E.g. THD test

• Total testtime (dual site) ~4.1 sec• High number of instruments/channels needed

• 2 * BBAC (1 channel/site)• 3 * DC-30 (1 used for dps, 2 others for

continuity)

HPR HPL AUXEPCPO TestLS

~400 ms

Setup

Page 9: Cost effective Concurrent Test Solution for an Audio Subsystem IC ...

Teradyne Users Group 2008 25 Years of TUG

Austin, TX - April 27-30

Zarni Tun, Marijn Achterkamp, Clint Hutchinson

HDACTO overview• Salland Engineering’s 2nd

OpenFlex instrument• High Density AC Test Option• Modular, Scalable Concept• Source & Capture• High Performance

Page 10: Cost effective Concurrent Test Solution for an Audio Subsystem IC ...

Teradyne Users Group 2008 25 Years of TUG

Austin, TX - April 27-30

Zarni Tun, Marijn Achterkamp, Clint Hutchinson

HDACTO Features

• Capture: 32 Differential channels• Source: 64 SE / 32 Differential• Mix and match source and capture modules (any

combination possible)• 8 modules• PPMU per channel

(total of 72)• Supports FLEX G4

DSP background processing

• 20-bit Vref on eachmodule

Page 11: Cost effective Concurrent Test Solution for an Audio Subsystem IC ...

Teradyne Users Group 2008 25 Years of TUG

Austin, TX - April 27-30

Zarni Tun, Marijn Achterkamp, Clint Hutchinson

20080306 154309 AP Cap-Diff. 1Vpp 0.977kHz 2MSps, 131.072KSmp, Slot 13 Mod 5 Chan 1 Zoom level - 4858%

Frequency(Hertz)0 2k 4k 6k 8k 10k 12k 14k 16k 18k 20k

-180dB

-170dB

-160dB

-150dB

-140dB

-130dB

-120dB

-110dB

-100dB

-90dB

-80dB

-70dB

-60dB

-50dB

-40dB

-30dB

-20dB

-10dB

0dB

HDACTO Source & Capture• Capture

• 4 Diff/SE Channels• 2Msps• 1M memory/channel

• Source• 4 Diff/8 SE Channels• 2Msps• 1M memory / DAC

• Fs: 2Msps Fi: 1kHz• SNR >100dB• THD <-104dB

• PPMU (4 Quadrant)• +/- 32uA to +/- 32mA• -1.0V to 6.5V

• VREF• 20 bits• +/- 102 PPM• 0V to 6V

Page 12: Cost effective Concurrent Test Solution for an Audio Subsystem IC ...

Teradyne Users Group 2008 25 Years of TUG

Austin, TX - April 27-30

Zarni Tun, Marijn Achterkamp, Clint Hutchinson

Conversion (Channelmap)• Before

• After

Page 13: Cost effective Concurrent Test Solution for an Audio Subsystem IC ...

Teradyne Users Group 2008 25 Years of TUG

Austin, TX - April 27-30

Zarni Tun, Marijn Achterkamp, Clint Hutchinson

Conversion (Continuity)• Before

• After

Page 14: Cost effective Concurrent Test Solution for an Audio Subsystem IC ...

Teradyne Users Group 2008 25 Years of TUG

Austin, TX - April 27-30

Zarni Tun, Marijn Achterkamp, Clint Hutchinson

Conversion (Source example)

• BBAC

• HDACTO

Page 15: Cost effective Concurrent Test Solution for an Audio Subsystem IC ...

Teradyne Users Group 2008 25 Years of TUG

Austin, TX - April 27-30

Zarni Tun, Marijn Achterkamp, Clint Hutchinson

HDACTOSrc

+

-CPI_P

MIC_N

CPI_N

MIC_P

AUX_L

AUX_R

HDACTOSrc

+

-

HDACTOSrc

+

-

Number of relays per site: 0!

LM49370 Analog Inputs using HDACTO

Page 16: Cost effective Concurrent Test Solution for an Audio Subsystem IC ...

Teradyne Users Group 2008 25 Years of TUG

Austin, TX - April 27-30

Zarni Tun, Marijn Achterkamp, Clint Hutchinson

CPO_P

EP_N

CPO_N

EP_P

AUX_LAUX_R

HP_L

HP_R

LS_NLS_P

HP_MID

HDACTOCap

+

-

HDACTOCap

+

-

HDACTOCap

+

-

HDACTOCap

+

-

HDACTOCap

+

-

Number of relays per site: 1!

LM49370 Analog Outputs using HDACTO

Page 17: Cost effective Concurrent Test Solution for an Audio Subsystem IC ...

Teradyne Users Group 2008 25 Years of TUG

Austin, TX - April 27-30

Zarni Tun, Marijn Achterkamp, Clint Hutchinson

Saving testtime (1)

• Continuity test (BBAC)• Connect BBAC• Measure• Disconnect• Connect DCVI• Measure• Disconnect• Connect POOL• Measure• Disconnect

• Testtime ~180 ms (Quad site)

• Continuity test (HDACTO)• Connect all PPMU’s• Measure• Disconnect

• Testtime ~55 ms (Quad site)

Page 18: Cost effective Concurrent Test Solution for an Audio Subsystem IC ...

Teradyne Users Group 2008 25 Years of TUG

Austin, TX - April 27-30

Zarni Tun, Marijn Achterkamp, Clint Hutchinson

Saving testtime (2)

• PSRR test (BBAC)• Connect BBAC• Measure• Disconnect• Connect DCVI• Measure• Disconnect• Connect POOL• Measure• Disconnect

• Testtime ~370 ms (Quad site)

• PSRR test (HDACTO)• Connect all PPMU’s• Measure• Disconnect

• Testtime ~176 ms (Quad site)

Page 19: Cost effective Concurrent Test Solution for an Audio Subsystem IC ...

Teradyne Users Group 2008 25 Years of TUG

Austin, TX - April 27-30

Zarni Tun, Marijn Achterkamp, Clint Hutchinson

Testtime

Total Analog reduction (dual site)30.68%

1005.88ms2386.802273.143442.973279.02Total

100.65ms586.88558.93532.32565.20538.29Dig_Check

200.25ms574.61547.25521.19700.88667.50Vol_Cntl

174.43ms391.89373.23355.45575.04547.66THD_Power

95.17ms328.53312.89297.99428.46408.06SNR

204.86ms176.03167.64159.66370.13352.50PSRR

39.87ms409.23389.74371.18430.10409.62T_swing

48.51ms158.07130.54123.37188.00179.05V_offset

123.43ms55.5752.9250.40185.17176.35Continuity

gain (ms)4 sites (approx)2 sites (approx)1 site

4 sites (approx)2 sites1 site

TesttimeHDACTOBBAC

Testtime Profile

Page 20: Cost effective Concurrent Test Solution for an Audio Subsystem IC ...

Teradyne Users Group 2008 25 Years of TUG

Austin, TX - April 27-30

Zarni Tun, Marijn Achterkamp, Clint Hutchinson

Saving Capital Cost

• Only 1 DC30 Needed (power supply)

• No BBAC needed• No POOL needed

microFlex Configuration

BBAC HDACTO

Page 21: Cost effective Concurrent Test Solution for an Audio Subsystem IC ...

Teradyne Users Group 2008 25 Years of TUG

Austin, TX - April 27-30

Zarni Tun, Marijn Achterkamp, Clint Hutchinson

Benefits with HDACTO

• Reducing DIB complexity• Direct connections• Reducing relay count

• Saving Testtime (>30%)• Concurrent testing• Enabling Octal site

• Saving capital cost• Only 1 DC-30 needed• No BBAC needed

248

144

392

Octal Site

1246231Saving

723618HDACTO

1969849BBAC

Quad Site

Dual Site

Single Site

Total nr. of relays

Page 22: Cost effective Concurrent Test Solution for an Audio Subsystem IC ...

Teradyne Users Group 2008 25 Years of TUG

Austin, TX - April 27-30

Zarni Tun, Marijn Achterkamp, Clint Hutchinson

Questions???