COPPERHEAD (MPC5554) ULTRA FLEX B PLATFORM QUALIFICATION Page 1 of 41 1. INTRODUCTION This document states the Correlation and Qual result of * COPPERHEAD (MPC5554) device in order to qualify Ultra Flex-B Tester as qualified platform for direct shipment to customer. All evaluations stated in this document have been discussed and agreed by both OHT and KLM, based on KLM Class A Qualification and Correlation Procedure (*Spec#: 12MRQ85104A) PRODUCT INFORMATION COPPERHEAD (MPC5554) Product Line : S9U5554,G9U5554 Target Device : MPC5554MZP, MPC5554MVR, MPC5554MZP80, MPC5554MZP132, MPC5554MVR132, MPC5554MZP112, MPC5554MVR113, MPC5554AZP132 Mask : M68C Package Code : 5252 (416 PBGA 27 X 27) Assembly Site : KLM PTI Code : JBEC This document also states the results of all evaluations listed in the correlation plan and Class A Qual. Any requirements stated in the KLM Site Qualification Procedure (Spec#: 12MRQ85104A) which cannot be fulfilled will require approval from OHT’s & KLM’s PE and RQA. Hardware Requirements: System (Tester) Type : J750 – 1024 Handler Type : Delta Flex X4 Load board : ATX-7202 Software (Test Program) : MPC5554_M68C_C05 System (Tester) Type : Ultra Flex-B Handler Type : Delta Castle X4 Load board : ATX-7493B Software (Test Program) : MPC5554_M68C_UC06 2. BIN TO BIN CORRELATION
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COPPERHEAD (MPC5554) ULTRA FLEX B PLATFORM QUALIFICATION
Page 1 of 41
1. INTRODUCTION
This document states the Correlation and Qual result of * COPPERHEAD (MPC5554) device in order to qualify Ultra Flex-B Tester as qualified platform for direct shipment to customer. All evaluations stated in this document have been discussed and agreed by both OHT and KLM, based on KLM Class A Qualification and Correlation Procedure (*Spec#: 12MRQ85104A)
MPC5554AZP132Mask : M68CPackage Code : 5252 (416 PBGA 27 X 27) Assembly Site : KLMPTI Code : JBEC
This document also states the results of all evaluations listed in the correlation plan and Class A Qual. Any requirements stated in the KLM Site Qualification Procedure (Spec#: 12MRQ85104A) which cannot be fulfilled will require approval from OHT’s & KLM’s PE and RQA.
Hardware Requirements:System (Tester) Type : J750 – 1024Handler Type : Delta Flex X4Load board : ATX-7202Software (Test Program) : MPC5554_M68C_C05
System (Tester) Type : Ultra Flex-B Handler Type : Delta Castle X4Load board : ATX-7493BSoftware (Test Program) : MPC5554_M68C_UC06
2. BIN TO BIN CORRELATION
COPPERHEAD (MPC5554) ULTRA FLEX B PLATFORM QUALIFICATION
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Action: A minimum of 1000 units from three different wafers lots to be tested at each temperature Room, Hot and Cold insertion in J750-1K, and then Ultra Flex-B tester.
Accept Criteria: All units must achieve 100% bin to bin correlation. All good units from pilot site correlate 100% at transfer site. All reject units from pilot site correlate 100 % bin to bin.
Result
Lot Number WEMHA0NWQD01Target Device MPC5554MZPTrace Code QQGM0806CWafer Lot Number MXDD435001
FINAL TEST ROOM (25 C):
KTM TEST RESULT
Binning Bin1 Bin3 Bin4 Bin5 Bin6 Bin7 Bin8
Bin1 976
Bin3 35
Bin4 0
Bin5 3
Bin6 0
Bin7 12
KL
M T
ES
T R
ES
UL
T
Bin8 0
COPPERHEAD (MPC5554) ULTRA FLEX B PLATFORM QUALIFICATION
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FINAL TEST HOT (145 C):
KTM TEST RESULT
Binning Bin1 Bin3 Bin4 Bin5 Bin6 Bin7 Bin8
Bin1 929
Bin3 35
Bin4 0
Bin5 6
Bin6 0
Bin7 6
KL
M T
ES
T R
ES
UL
T
Bin8 0
FINAL TEST COLD (-45 C):
KTM TEST RESULT
Binning Bin1 Bin3 Bin4 Bin5 Bin6 Bin7 Bin8
Bin1 923
Bin3 0
Bin4 0
Bin5 3
Bin6 0
Bin7 3
KL
M T
ES
T R
ES
UL
T
Bin8 0
Summary:All units from WEMHA0NWQD01 tested at KLM and KTM site are 100% correlated.
COPPERHEAD (MPC5554) ULTRA FLEX B PLATFORM QUALIFICATION
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Lot Number WEMHA0NWRE01Target Device MPC5554MZPTrace Code QQGR0806 Wafer Lot Number MXDD432001
FINAL TEST ROOM (25 C):
KTM TEST RESULT
Binning Bin1 Bin3 Bin4 Bin5 Bin6 Bin7 Bin8
Bin1 960
Bin3 107
Bin4 0
Bin5 9
Bin6 0
Bin7 5
KL
M T
ES
T R
ES
UL
T
Bin8 0
FINAL TEST HOT (145 C):
KTM TEST RESULT
Binning Bin1 Bin3 Bin4 Bin5 Bin6 Bin7 Bin8
Bin1 954
Bin3 0
Bin4 0
Bin5 3
Bin6 0
Bin7 3
KL
M T
ES
T R
ES
UL
T
Bin8 0FINAL TEST COLD (-45 C):
KTM TEST RESULT
Binning Bin1 Bin3 Bin4 Bin5 Bin6 Bin7 Bin8
COPPERHEAD (MPC5554) ULTRA FLEX B PLATFORM QUALIFICATION
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Bin1 943
Bin3 0
Bin4 0
Bin5 9
Bin6 0
Bin7 2
KL
M T
ES
T R
ES
UL
T
Bin8 0
Summary:All units from WEMHA0NWRE01 tested at KLM and KTM site are 100% correlated.
Lot Number WEMHA0NQHH01Target Device MPC5554MZPTrace Code QQGD0805 Wafer Lot Number M1DD432011
COPPERHEAD (MPC5554) ULTRA FLEX B PLATFORM QUALIFICATION
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FINAL TEST ROOM (25 C):
KTM TEST RESULT
Binning Bin1 Bin3 Bin4 Bin5 Bin6 Bin7 Bin8
Bin1 988
Bin3 115
Bin4 0
Bin5 8
Bin6 0
Bin7 21
KL
M T
ES
T R
ES
UL
T
Bin8 1
FHA(145 C):
KTM TEST RESULT
Binning Bin1 Bin3 Bin4 Bin5 Bin6 Bin7 Bin8
Bin1 985
Bin3 0
Bin4 0
Bin5 3
Bin6 0
Bin7 2
KL
M T
ES
T R
ES
UL
T
Bin8 0FINAL TEST COLD (-45 C):
KTM TEST RESULT
Binning Bin1 Bin3 Bin4 Bin5 Bin6 Bin7 Bin8
Bin1 973
Bin3 0
Bin4 0
Bin5 9KL
M T
ES
T
RE
SU
LT
Bin6 0
COPPERHEAD (MPC5554) ULTRA FLEX B PLATFORM QUALIFICATION
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Bin7 3
Bin8 0
Summary:
All units from 3 lots achieve 100% bin to bin correlation.
3. PARAMETRIC COMPARISON
Action:A sample of 50 units for 5 parametric tests between J750-1K and Ultra Flex B shall be used for parametric comparison.
Accept Criteria:T-test and F-test should be no significant difference with p-value more than 0.05.
Result:
FINAL TEST ROOM PARAMENTRIC COMPARISON (25’C)T-Test : P Value F-Test : P-Value
COPPERHEAD (MPC5554) ULTRA FLEX B PLATFORM QUALIFICATION
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stopidd_vdd(UFlex)
stopidd_vdd(J750)
0.000220.000200.000180.000160.0001495% Bonferroni Confidence Intervals for StDevs
stopidd_vdd(UFlex)
stopidd_vdd(J750)
0.00400.00380.00360.00340.00320.0030Data
Test Statistic 0.97P-Value 0.919
Test Statistic 0.14P-Value 0.708
F-Test
Levene's Test
Test for Equal Variances for stopidd_vdd(J750), stopidd_vdd(UFlex)
Summary:
T-Test and F-Test of the selected parametric test is within the acceptance criteria, with a p-value of more than 0.05.
4. GAGE REPEATABILITY AND REPRODUCIBILITY STUDY (GRR)
Action:
3 parameters will be taken for this study. The collection of data will be captured and arranged as follow:
Factor Levels Comment
Unit 10 Process
Site (Dut)4 Reproducibility
Repeat 5 Repeatability
COPPERHEAD (MPC5554) ULTRA FLEX B PLATFORM QUALIFICATION
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Accept Criteria:
Tolerance of all GR&R study must not exceed 10%
Result:
Omni GR&R result can be obtained from the link below:http://globalomni/QU/ZeroDefect/GageDetail.aspx?u=r63668&g=4967bbfe-4601-4b7b-818c-124311daa0be&n=1833
Omni GR&R summary result as below:
Details analysis for selected test for GR&R as below:
COPPERHEAD (MPC5554) ULTRA FLEX B PLATFORM QUALIFICATION
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5. WAVEFORM CHECK
Action:
Perform signal waveform scoping on power supply pins to check for over voltage (+30% from test VDD). Waveform scoping study performed using the first insertion’s test program, Post Room.
Accept Criteria:
Zero over voltage spike and zero under voltage spike.
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Results:
HDVS Channel 23e.401 (VDD)
Summary:
30% of the maximum Vdd Voltage Level = 1.5 + (1.5 x30%) = 1.95V. None of the Vdd pin exceeds 1.78V, no over-voltage observed
COPPERHEAD (MPC5554) ULTRA FLEX B PLATFORM QUALIFICATION
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30% of the minimum Vdd Voltage Level = 0 - (1.5 x30%) = - 0.45V. None of the Vdd pin has voltage lower than 0V, no over-voltage observed
Results :
HDVS Channel 23m.407 (VDDE)
Summary:
30% of the maximum Vdde Voltage Level = 3.3 + (3.3 x 30%) = 4.29V. None of the Vdde pin exceeds 3.86V, no over-voltage observed
COPPERHEAD (MPC5554) ULTRA FLEX B PLATFORM QUALIFICATION
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30% of the minimum Vdde Voltage Level = 0 - (3.3 x30%) = - 0.99V. None of the Vdde pin has voltage lower than 0V, no over-voltage observedResults :
HDVS Channel 23m.414 (VDD33)
Summary:
30% of the maximum Vdd33 Voltage Level = 3.3 + (3.3 x 30%) = 4.29V. None of the Vdd33 pin exceeds 3.74V, no over-voltage observed
30% of the minimum Vdd33 Voltage Level = 0 - (3.3 x30%) = - 0.99V.
COPPERHEAD (MPC5554) ULTRA FLEX B PLATFORM QUALIFICATION
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None of the Vdd33 pin has voltage lower than 0V, no over-voltage observed
Results :
HDVS Channel 23e.407 (VDDFlash)
Summary:
30% of the maximum VddFlash Voltage Level = 3.3 + (3.3 x 30%) = 4.29V. None of the VddFlash pin exceeds 3.81V, no over-voltage observed
COPPERHEAD (MPC5554) ULTRA FLEX B PLATFORM QUALIFICATION
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30% of the minimum VddFlash Voltage Level = 0 - (3.3 x30%) = - 0.99V. None of the VddFlash pin has voltage lower than 0V, no over-voltage observedResults :
HDVS Channel 23m.412 (VDDA)
Summary:
30% of the maximum Vdda Voltage Level = 3.3 + (3.3 x 30%) = 4.29V. None of the Vdda pin exceeds 3.76V, no over-voltage observed
30% of the minimum Vdda Voltage Level = 0 - (3.3 x30%) = - 0.99V.
COPPERHEAD (MPC5554) ULTRA FLEX B PLATFORM QUALIFICATION
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None of the Vdda pin has voltage lower than 0V, no over-voltage observedResults :
HSDM Channel 13.d313 (AN34)
Summary:
30% of the maximum AN34 Voltage Level = 3.3 + (3.3 x 30%) = 4.29V. None of the AN34 pin exceeds 3.96V, no over-voltage observed
30% of the minimum AN34 Voltage Level = 0 - (3.3 x30%) = - 0.99V. None of the AN34 pin has voltage lower than 0V, no over-voltage observed
COPPERHEAD (MPC5554) ULTRA FLEX B PLATFORM QUALIFICATION
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COPPERHEAD (MPC5554) ULTRA FLEX B PLATFORM QUALIFICATION
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6. CONCLUSION
Base on above data, Ultra Flex B is now a qualified production tester.
KLM responsible engineer:
TPE:Name/Core ID: Li Hong FeyE-mail: [email protected] Tel: 03-78734068 / #6773
MBG PE:Name/Core ID: Mark WagnerE-mail: [email protected] Tel: 1-512-8953189