Department of Chemistry, University of Helsinki, Finland METOREX International Oy, Espoo, Finland Characterisation of TlBr Crystals for Detector Applications V. Kozlov, M. Leskelä and H. Sipilä Department of Chemistry, University of Helsinki, Finland METOREX International Oy, Espoo, Finland IWORID2004
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Characterisation of TlBr Crystals for Detector Applications
Characterisation of TlBr Crystals for Detector Applications. V. Kozlov, M. Leskelä and H. Sipilä. Department of Chemistry, University of Helsinki, Finland METOREX International Oy, Espoo, Finland. IWORID2004. Detector properties. Crystal quality Purity (composition) - PowerPoint PPT Presentation
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Department of Chemistry, University of Helsinki, Finland METOREX International Oy, Espoo, Finland
Characterisation of TlBr Crystals for
Detector Applications
V. Kozlov, M. Leskelä and H. Sipilä
Department of Chemistry, University of Helsinki, Finland METOREX International Oy, Espoo, Finland
IWORID2004
Department of Chemistry, University of Helsinki, Finland METOREX International Oy, Espoo, Finland
Detector properties
• Crystal quality
• Purity (composition)
• Previous study* => Chemical aspects• Crystal growth
• Purification
• * V. Kozlov, M. Leskelä, T. Prohaska, G. Schultheis, G. Stingeder and H. Sipilä, Nucl. Instr. and Meth. A (2004) (in press)
Department of Chemistry, University of Helsinki, Finland METOREX International Oy, Espoo, Finland
This study => Crystal quality
• Crystal growth
• Annealing (+hydrothermal)
• Methods:• X-ray rocking curve
• IV & photo-current
• X-ray Cu-radiation
• Polarisation microscope
Department of Chemistry, University of Helsinki, Finland METOREX International Oy, Espoo, Finland
Sample production from the ingot and wafer mapping
• Wafers and, then, slices were cut as is presented in Figure
Sohkl
• Two large crystals of diameter 21 mm were grown using Bridgman method
•<= Reference surface: plane (100) or (111)
Department of Chemistry, University of Helsinki, Finland METOREX International Oy, Espoo, Finland
Rocking curve mapping
1 3 (1 ) m a x -s
M 1 3 ( 1 ) 4 ( 1 ) S e t 2 2
M 1 3 (1 ) 4M 1 3 ( 1 ) 3 ( 3 ) S e t 4 5 M 1 3 ( 1 ) 3 ( 2 ) S e t 4 5 n e w
M 1 3 (1 ) 3M 1 3 ( 1 ) 2 ( 3 ) M 1 3 ( 1 ) 2 ( 1 ) S e t 6 7
M 1 3 (1 ) 2M 1 3 ( 1 ) 1 ( 2 ) s e t 0 0
M 1 3 (1 ) 1
Reference slices =>
All slices were cut || to reference surface
Department of Chemistry, University of Helsinki, Finland METOREX International Oy, Espoo, Finland