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Ch.6 Logic Verification Standard Cell Design TAIST ICTES Program VLSI Design Methodology Hiroaki Kunieda Tokyo Institute of Technology
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Ch.6 Logic Verification Standard Cell Design TAIST ICTES Program VLSI Design Methodology Hiroaki Kunieda Tokyo Institute of Technology.

Dec 14, 2015

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Page 1: Ch.6 Logic Verification Standard Cell Design TAIST ICTES Program VLSI Design Methodology Hiroaki Kunieda Tokyo Institute of Technology.

Ch.6 Logic Verification

Standard Cell Design

TAIST ICTES ProgramVLSI Design Methodology

Hiroaki Kunieda

Tokyo Institute of Technology

Page 2: Ch.6 Logic Verification Standard Cell Design TAIST ICTES Program VLSI Design Methodology Hiroaki Kunieda Tokyo Institute of Technology.

Design Verification

How to confirm the correctness of design result

50-70% of design period is used for design verification.

Methods Logic Simulation and Emulation Formal Verification

Page 3: Ch.6 Logic Verification Standard Cell Design TAIST ICTES Program VLSI Design Methodology Hiroaki Kunieda Tokyo Institute of Technology.

Logic Design

Functional Verification

Logic Synthesis

Scan Path Design

RTL SimulationRTL

Synthesis Netlist

Scan Netlist Timing Analysis

Functional Verification

Page 4: Ch.6 Logic Verification Standard Cell Design TAIST ICTES Program VLSI Design Methodology Hiroaki Kunieda Tokyo Institute of Technology.

6.1 Logic Simulation

Page 5: Ch.6 Logic Verification Standard Cell Design TAIST ICTES Program VLSI Design Methodology Hiroaki Kunieda Tokyo Institute of Technology.

Logic Design 1

HDL Simulation

[Objective]

to correct HDL description by simulating its performance and checking its timing due to delays of logic circuit.

[Method]1. HDL/Logic Simulator

Page 6: Ch.6 Logic Verification Standard Cell Design TAIST ICTES Program VLSI Design Methodology Hiroaki Kunieda Tokyo Institute of Technology.

0 1 x z

0 0 0 0 0

1 0 1 x x

x 0 x x x

z 0 x x x

Truth Table of AND Gate

Logic Design 1

Four Valued Logic

Not only 0 and 1, but other values such as UNKNOWN X,HIGH IMPEDANCE Z are used for the simulation. Their responseare described by truth table.

Page 7: Ch.6 Logic Verification Standard Cell Design TAIST ICTES Program VLSI Design Methodology Hiroaki Kunieda Tokyo Institute of Technology.

Simulation Method

1. Event Driven Simulation Outputs of the gates has been evaluated by truth table , only when an event occurs on inputs of the gates. Since small portion of whole circuit works at a time, this scheme avoid waste

computation. Thus, simulator keeps track of those events.

2. Time wheel Event TableChange of outputs of the gates are stored as an event. That event occurs delayed at component delay after event of inputs occurs. The time of next events are stored in event table. The table is considered to be wheel so that it can store events of all simulation periods, efficiently.

Page 8: Ch.6 Logic Verification Standard Cell Design TAIST ICTES Program VLSI Design Methodology Hiroaki Kunieda Tokyo Institute of Technology.

Event Driven

• Event is a change of logic value.• The event entered into a gate may generate another event at the output of the gate after the gate delay time.• Event of Signals propagates through Logic circuits.• Event Driven Analysis is to update Logic values only when events occur at the wire so as to minimize computational complexity.• 30% or less logic parts is running at the same time.

Page 9: Ch.6 Logic Verification Standard Cell Design TAIST ICTES Program VLSI Design Methodology Hiroaki Kunieda Tokyo Institute of Technology.

Logic Simulation Example

Page 10: Ch.6 Logic Verification Standard Cell Design TAIST ICTES Program VLSI Design Methodology Hiroaki Kunieda Tokyo Institute of Technology.

6.2 Formal Verification

Page 11: Ch.6 Logic Verification Standard Cell Design TAIST ICTES Program VLSI Design Methodology Hiroaki Kunieda Tokyo Institute of Technology.

Formal Verification

Functional Verification

Logic Synthesis

Scan Path Design

RTL SimulationRTL

Synthesis Netlist

Scan Netlist

Timing Analysis

Functional Verification

Page 12: Ch.6 Logic Verification Standard Cell Design TAIST ICTES Program VLSI Design Methodology Hiroaki Kunieda Tokyo Institute of Technology.

Logic Design 3

Formal Verification

[Objective]

to confirm coincidence between HDL description and designed logic circuit. Simulation uses various test inputs, while formal verification uses equivalence of two functions.

[Method]

BDD method (Binary Decision Diagram)

It is effective way to show equivalent representation of logic functions for two targets.

[Problem]1. Reduction of scan path flip flops2. Speed up of testing such as concurrent testing

Page 13: Ch.6 Logic Verification Standard Cell Design TAIST ICTES Program VLSI Design Methodology Hiroaki Kunieda Tokyo Institute of Technology.

Logic Design 3

BDD Representation 1

1

0

1

111

1

1

0

000

0

0

BDD representation will be unique according to the best variable order.There was heuristic algorithm to derive the reduced BDD from original.

Page 14: Ch.6 Logic Verification Standard Cell Design TAIST ICTES Program VLSI Design Methodology Hiroaki Kunieda Tokyo Institute of Technology.

BDD Operation (1)

Merge of 2 isomorphic subgraphs

Page 15: Ch.6 Logic Verification Standard Cell Design TAIST ICTES Program VLSI Design Methodology Hiroaki Kunieda Tokyo Institute of Technology.

BDD Operation (1)

Merge of 2 isomorphic subgraphs

Page 16: Ch.6 Logic Verification Standard Cell Design TAIST ICTES Program VLSI Design Methodology Hiroaki Kunieda Tokyo Institute of Technology.

BDD Operation (2)

Eliminate node, whose son nodes are isomorphic.

Page 17: Ch.6 Logic Verification Standard Cell Design TAIST ICTES Program VLSI Design Methodology Hiroaki Kunieda Tokyo Institute of Technology.

BDD Operation (2)

Page 18: Ch.6 Logic Verification Standard Cell Design TAIST ICTES Program VLSI Design Methodology Hiroaki Kunieda Tokyo Institute of Technology.

Order of nodes

X3

X5 X5

X2 X2 X2 X2

X3

X5 X5

X4 X4

X6

X1

1

0

Worst

Best

X1X2X3X4X5X6

X5

X2

X3

X4

X6

X1

10

Page 19: Ch.6 Logic Verification Standard Cell Design TAIST ICTES Program VLSI Design Methodology Hiroaki Kunieda Tokyo Institute of Technology.

Optimal Order Searchi-1

i

i+1 i+1

i

i+1 i+1

0 1

(A) (B) (C) (D)

i

i-1

i+1 i+1

i-1

i+1 i+1

0 1

(A) (C) (B) (D)

i-1

i i

0 1

f1 f2 f3

i

i-1

0 1

f1 f2 f3

Page 20: Ch.6 Logic Verification Standard Cell Design TAIST ICTES Program VLSI Design Methodology Hiroaki Kunieda Tokyo Institute of Technology.

Verification example Ia b q

1q0 d 1 d 0

0 0 0 0 0 0

0 1 0 0 0 1

1 0 0 0 0 0

1 1 0 0 0 1

0 0 0 1 0 0

0 1 0 1 1 1

1 0 0 1 0 0

1 1 0 1 1 0

0 0 1 0 1 0

0 1 1 0 1 1

1 0 1 0 1 0

1 1 1 0 1 0

0 0 1 1 1 0

0 1 1 1 1 0

1 0 1 1 0 0

1 1 1 1 1 0

d 0=bq1’q0’+a’bq1’+a’ b q0’d1=q1q0’+a’q1+ b q0

Page 21: Ch.6 Logic Verification Standard Cell Design TAIST ICTES Program VLSI Design Methodology Hiroaki Kunieda Tokyo Institute of Technology.

Verification example II

F1=q0’ ・ a’

q0’

a’

q1’

F2=(q0’+a’)q1‘

q0’+a’

(F1+F2)’

F1=q0’ ・ a’ の補正のため葉の 0 と1を交換

Page 22: Ch.6 Logic Verification Standard Cell Design TAIST ICTES Program VLSI Design Methodology Hiroaki Kunieda Tokyo Institute of Technology.

Verification example III

d 0=bq1’q0’+a’bq1’+a’ b q0’

Page 23: Ch.6 Logic Verification Standard Cell Design TAIST ICTES Program VLSI Design Methodology Hiroaki Kunieda Tokyo Institute of Technology.

6.3 Timing Analysis

Page 24: Ch.6 Logic Verification Standard Cell Design TAIST ICTES Program VLSI Design Methodology Hiroaki Kunieda Tokyo Institute of Technology.

Timing Analysis

Timing Analysis is to check the timing violation of logic circuits, due to gate delays and wire delays. In order to reduce computation, critical paths analysis is done by using graph representation.

Pre Layout timing analysis:   Only gate delay is considered.

Post Layout timing analysis:  Gate delay and wire delay are considered. The latter delays are decided by layout pattern. This analysis is only performed after layout design.

Page 25: Ch.6 Logic Verification Standard Cell Design TAIST ICTES Program VLSI Design Methodology Hiroaki Kunieda Tokyo Institute of Technology.

Timing Analysis

․Calculate timing of synthesized netlist ⎯ Make sure circuit operates correctly under specified timing

constraints

․Static Timing Analysis (STA) ⎯ Timing analysis without input patterns

  - Fast but not accurate ⎯ Used after logic synthesis

․Dynamic Timing Analysis ⎯ Timing analysis with input patterns ⎯ Slow but accurate ⎯ Used after physical design with few patterns

Page 26: Ch.6 Logic Verification Standard Cell Design TAIST ICTES Program VLSI Design Methodology Hiroaki Kunieda Tokyo Institute of Technology.

Timing Analysis identifies critical path with graph model, instead of exhausted search with logic simulator.

Logic Design 5

Timing Analysis (Pre)

nodes

1 2 3 4 5 6 7 8 9 10

1 50 50 50 50 50 50

2 50 50 50 50 62 62 50 60 88

3 50 50 50 50 62 62 50 100 100

100

4 50 50 50 50 62 62 50 100 100

112