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CCS Technology Synopsys Interoperability Forum November 9, 2005 Bill Mullen Vice President of Engineering Synopsys, Inc.
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Page 1: CCS Technical

CCS Technology

Synopsys Interoperability ForumNovember 9, 2005

Bill MullenVice President of EngineeringSynopsys, Inc.

Page 2: CCS Technical

© 2005 Synopsys, Inc. (2)

Composite Current Source (CCS)Timing

NoiseNoise PowerPowerTimingTiming

Page 3: CCS Technical

© 2005 Synopsys, Inc. (3)

Delay Calculation Requirements• Driver Model: drive arbitrary interconnect, including

high-impedance nets• Receiver model: complex input capacitance• Efficient characterization• Vdd & Temperature scaling for IR drop, multi-Vdd, DVFS,

corners

driver

load1

load2Driver Model

Receiver Model

Page 4: CCS Technical

© 2005 Synopsys, Inc. (4)

NLDM Based Driver/Receiver Models

Driver Model• Ramp voltage source,

fixed drive resistance• Very fast – accurate for

most nets• Limited accuracy for

high impedance networks with large drivers (RC-009)

Receiver Model• min/max rise/fall input caps

• Doesn’t model capacitance variation during transition

Reduced-OrderNetwork Modelv(t)

+-

Rd

Input cap –single value

Cinp

Page 5: CCS Technical

© 2005 Synopsys, Inc. (5)

Basics of CCS Timing

C1 C2

Receiver model

i(t,v)

Nonlinear Current Source

Driver model

Load1

Load2

Driver

C1, C2 vary with

Input slew

Output load

Rise vs. fall

State of cell

Page 6: CCS Technical

© 2005 Synopsys, Inc. (6)

Cell Delay / Slew Tables

Characterization for NLDM

output cap

inputslew

0.7

0.5

0.2

0.1

.023 .047 .065 .078 .091

Measure cell delay and output slew Measure current

and voltage at input pin for receiver model

Pin Capacitance

output cap

inputslew

0.7

0.5

0.2

0.1

.023 .047 .065 .078 .091

Cinp(single value)

3.313.31 3.613.61 3.983.98 4.124.12 5.325.32

2.722.72 3.123.12 3.433.43 3.823.82 4.254.25

2.222.22 2.542.54 2.722.72 3.113.11 3.473.47

1.311.31 1.751.75 1.991.99 2.312.31 2.772.77

Page 7: CCS Technical

© 2005 Synopsys, Inc. (7)

Driver Model

Characterization for CCS Timing

output cap

inputslew

0.7

0.5

0.2

0.1

.023 .047 .065 .078 .091

Measure current through load cap for driver modelMeasure current

and voltage at input pin for receiver model

Receiver Model

output cap

inputslew

0.7

0.5

0.2

0.1

.023 .047 .065 .078 .091

C1,C2

C1,C2

C1,C2

C1,C2

C1,C2

C1,C2

C1,C2

C1,C2

C1,C2

C1,C2

C1,C2

C1,C2

C1,C2

C1,C2

C1,C2

C1,C2

C1,C2

C1,C2

C1,C2

C1,C2

Page 8: CCS Technical

© 2005 Synopsys, Inc. (8)

CCS Receiver Model Advantage

Miller effect at input pin of inverter

CCS Receiver Model matches

both delay & slew

C1C2

CCS Receiver model

One Cinpvalue is

insufficient

Input cap:single value Cinp

Page 9: CCS Technical

© 2005 Synopsys, Inc. (9)

Vdd and Temperature

• CCS Timing enables high accuracy delay calculation for wide range of Vdd and Temperature

• For power-aware design styles:Single VddMultiple VddDynamic Voltage & Frequency Scaling (DVFS)

• Advanced analysis including IR Drop effects• What is scaled:

Driver modelReceiver modelTiming constraints: setup, hold, recovery, removal, MPW

• Straightforward characterization

lib_0.8v.db

lib_1.0v.db

lib_1.2v.db

Separate CCSLibraries

Page 10: CCS Technical

© 2005 Synopsys, Inc. (10)

Constraint Arcs: Vdd & Temperature

• Constraint arc (timing check) values depend on Vdd and Temperature

• CCS Timing supports nonlinear scaling of constraint arcs

tsetup

Setup vs. Vdd

60

65

70

75

80

85

90

95

100

105

110

0.8 0.85 0.9 0.95 1 1.05 1.1 1.15 1.2

Vdd (V)

setu

p (p

s)CK

D

CK

D

Page 11: CCS Technical

CCS Timing Results

Page 12: CCS Technical

© 2005 Synopsys, Inc. (12)

Results: STARC, TSMC

Delay (HSPICE vs PT-liberty,PT-CCS)

0

500

1000

1500

2000

2500

3000

3500

0 500 1000 1500 2000 2500 3000 3500

HSPICE[ps]

liberty,CCS[ps]

liberty

-3%

+3%

CCS

Delay (HSPICE vs PT-liberty,PT-CCS)

600

650

700

750

800

850

900

600 650 700 750 800 850 900

HSPICE[ps]

liberty,CCS[ps]

liberty

-3%

+3%

CCS

PrimeTime2004.12 with STARC 90nm CCS liberty librariesError : < 3% vs. HSpice

STARC Major Foundry

3% vs.HSPICE

2% vs.HSPICE

PrimeTime2005.06 with 90nm CCS liberty librariesError : < 2% vs. HSpice

Page 13: CCS Technical

© 2005 Synopsys, Inc. (13)

90nm LibraryMajor Electronics Firm in Asia

CCS Accuracy v s. HSPICE

0

1

2

3

4

5

0 1 2 3 4 5

Hspice [ns]

CC

S [

ns] CCS

-2%

+2%

+/-2%

Customers Demonstrate CCS Accuracy

65nm LibraryLeading Global IDM

CCS & NLDM vs. HSPICE

-

1,000

2,000

3,000

4,000

5,000

6,000

0 1,000 2,000 3,000 4,000 5,000 6,000

PrimeTime

HSP

ICE NLDM

CCS

+3%

-3%

+/-3%

Page 14: CCS Technical

© 2005 Synopsys, Inc. (14)

CCS Timing Summary

• High accuracy delay and slew calculationAdvanced driver and receiver modelingResults within 2% of SPICEPowerful scaling for Vdd and Temperature

• No impact on analysis runtime• Easy and efficient characterization• Industry Support

ARM, TSMC, Virage Logic, STARC, Library Technologies, Synopsys NanoChar

Page 15: CCS Technical

© 2005 Synopsys, Inc. (15)

Composite Current Source (CCS)Noise

NoiseNoise PowerPowerTimingTiming

Page 16: CCS Technical

© 2005 Synopsys, Inc. (16)

Noise Analysis

Aggressor

0Victim

Calculate Glitch

Propagated Glitch

Failure Analysis

Page 17: CCS Technical

© 2005 Synopsys, Inc. (17)

Noise Modeling Requirements

• Accurate model to support:Noise bump calculationNoise propagationDriver weakening (combination of propagated and injected bumps)Vdd and Temperature scaling

• Characterization should be fast and cover a broad set of cell types

• Model must enable efficient calculation in analysis and implementation tools

Page 18: CCS Technical

© 2005 Synopsys, Inc. (18)

NLDM Noise Modeling in Liberty

Aggressor

0Victim

I/V CurveNoise

Propagation

Noise Immunity

Curve

Table-based noise immunity and propagation characterization require extensive circuit simulation

Page 19: CCS Technical

© 2005 Synopsys, Inc. (19)

Introducing CCS Noise

• Faster Characterization:100X faster characterization vs. NLDM Noise

• Much less circuit simulation is neededTypical 90nm library in under 4 hours on 10 cpus

• High Accuracy:Accurately models noise propagation and driver weakeningAccurate voltage and temperature scaling using the same scaling mechanism as CCS TimingSame accurate receiver modeling as CCS Timing

Page 20: CCS Technical

© 2005 Synopsys, Inc. (20)

DFF: multi-stage cell

CK

D

Q

CCS Noise: Cell Model

• First and last transistor stages are modeled

Inverter: 1 stage cell

AND: 2 stage cell

CCS-N

CCS-N

CCS-N

CCS-N

CCS-N

CCS-N

CCS-N

Page 21: CCS Technical

© 2005 Synopsys, Inc. (21)

Pin-Based Model

CK

D

Q

Arc and Pin CCS Noise Models• Input stage: Noise immunity• Output stage: Driving strength• Arc: Immunity + Driving Strength + Noise Propagation

For paths of one or two stages

Arc-based Model

CCS-N

CCS-N

CCS-N

CCS-N

CCS-N

CCS-N

Page 22: CCS Technical

© 2005 Synopsys, Inc. (22)

Arc-Based Example: AND2

A2

A1

CCS-N

CCS-N

CCS-NA1

A2

ZZN_7

Page 23: CCS Technical

© 2005 Synopsys, Inc. (23)

AND2 – Liberty Syntaxpin(Z) {

direction : output;…timing() {related_pin : "A1";ccsn_first_stage() { /* A1 to N_7 */

…}ccsn_last_stage() { /* N_7 to Z */…

}}timing() {related_pin : "A2";ccsn_first_stage() { /* A2 to N_7 */

…}ccsn_last_stage() { /* N_7 to Z, copy of the above */…

}}

}

Page 24: CCS Technical

© 2005 Synopsys, Inc. (24)

CCS Noise Stage Contents

CCS Noise stage

Each CCS Noise stage has three components:

1. DC Current Table

2. Dynamic Behavior Information

3. Parameters

Page 25: CCS Technical

© 2005 Synopsys, Inc. (25)

Characterization: DC Current Table

• DC Current table represents output current as a function of two variables

Vin: Input voltageVout: Output voltage

• A fast DC sweep simulation is used to capture data

Vin Vout

+-

+-

Page 26: CCS Technical

© 2005 Synopsys, Inc. (26)

Characterization: Dynamic Behavior

• Small number of transient simulation runsInputs: A few ramps and a few glitchesOutput response is used to derive the dynamic behavior of the stage

Page 27: CCS Technical

© 2005 Synopsys, Inc. (27)

Noise Propagation Accuracy

• CCS Noise accurately models dynamic effects such as the impact of charging/discharging of internal nodes

0 100 200 300 400Time (ps)

0

0.5

1

Vol

tage

(V

)

Input noise waveform(HSPICE)

Propagated noisewaveform (HSPICE)

Propagated noisewaveform (PTSI)

Internal Nodes

Page 28: CCS Technical

© 2005 Synopsys, Inc. (28)

CCS Noise Bump Height Correlation

A B

0 0.2 0.4 0.6 0.8 1 1.2SPICE Noise Height (V)

0

0.2

0.4

0.6

0.8

1

1.2

PTSI

Noi

se H

eigh

t (V

)

0 0.2 0.4 0.6 0.8 1 1.2SPICE Noise Height (V)

0

0.2

0.4

0.6

0.8

1

1.2

PTSI

Noi

se H

eigh

t (V

)

Noise Bump Calculation(Node A)

Noise Propagation(Node B)

aggressor

(quiet) victim

aggressor

Page 29: CCS Technical

© 2005 Synopsys, Inc. (29)

Noise Propagation Correlation

0 0.2 0.4 0.6 0.8 1 1.2SPICE Noise Height (V)

0

0.2

0.4

0.6

0.8

1

1.2

PTSI

Noi

se H

eigh

t (V

)0 0.2 0.4 0.6 0.8 1 1.2

SPICE Noise Height (V)

0

0.2

0.4

0.6

0.8

1

1.2

PTSI

Noi

se H

eigh

t (V

)

CCS NoiseNLDM Noise

10%

Page 30: CCS Technical

© 2005 Synopsys, Inc. (30)

CCS Noise – Fast Characterization

3 hrs

4 hrs

1 hr

4 hrs

2 hrs

1.5 hrs

Characterization time on 10 CPUs

1304Lib5 90-nm

541Lib4 90-nm

593Lib3 90-nm

766Lib6 65-nm

Number of cells

Library Technology

747Lib2 90-nm

595Lib1 90-nm

Page 31: CCS Technical

© 2005 Synopsys, Inc. (31)

CCS Noise Summary

• Very good customer beta test results• Fast characterization

Typical library in under 4 hours on 10 cpusFor large blocks, only need to characterize boundary stages

• Fast calculation – no measurable overhead during noise analysis

• High AccuracyNoise propagation and driver weakeningVoltage and temperature scaling

Page 32: CCS Technical

© 2005 Synopsys, Inc. (32)

Composite Current Source (CCS)Power

NoiseNoise PowerPowerTimingTiming

Page 33: CCS Technical

© 2005 Synopsys, Inc. (33)

Power Library Requirements

• Address needs of Multi-Voltage designsMulti-Rail cells (Vdd, Vss)Non-zero ground railMTCMOS (power gating)

• Static and dynamic rail analysisSupport accurate voltage (IR) drop calculation

• Single library / model for all power related applications

• Fast and easy library characterization

Page 34: CCS Technical

© 2005 Synopsys, Inc. (34)

Power Gating (MTCMOS)Reduce Leakage by turning block off

Block ABlock A

Block CBlock C

Block BBlock B

Power switch controlPower switch control

MTCMOSMTCMOS

VirtualVdd

Sleep-mode

VsleepVVdddd

LVtIN OUT

Sleep

Fine Grain:Fine Grain:Sleep transistor within each cellSleep transistor within each cell

VD

DV

SS

VDD

INTERNAL VSS INTERNAL VSS

Coarse Grain:Coarse Grain:Sleep transistor for entire blockSleep transistor for entire block

Challenge: Analyze “in-rush current” when block turns on

Page 35: CCS Technical

© 2005 Synopsys, Inc. (35)

Introducing CCS Power

• Switching current waveform for each power or ground pinFiner time resolutionFull Multi-Voltage support

• Equivalent parasitics as seen from the power networkAllows fast yet accurate rail analysis

• Support for macro power modeling for memory and IP• Unified library model for power optimization, power

analysis, rail analysisFast and easy to characterize

Page 36: CCS Technical

© 2005 Synopsys, Inc. (36)

Characterization for NLPMLiberty Non-Linear Power Model

inputslew

0.7

0.5

0.2

0.1

.023 .047 .065 .078 .091

3.613.61 3.983.98 4.124.12 5.325.32

2.722.72 3.123.12 3.433.43 3.823.82 4.254.25

2.222.22 2.542.54 2.722.72 3.113.11 3.473.47

1.311.31 1.751.75 1.991.99 2.312.31 2.772.77

output cap

3.313.31

Leakage power per state

Internal Energy per transition

Page 37: CCS Technical

© 2005 Synopsys, Inc. (37)

Characterization for CCS Power

i(t)

Dynamic Current Dynamic Current Waveform per Waveform per

transition per Railtransition per Rail

output cap

inputslew

0.7

0.5

0.2

0.1

.023 .047 .065 .078 .091Leakage current per state per rail

Can characterize CCS Power switching information concurrently with CCS Timing

Page 38: CCS Technical

© 2005 Synopsys, Inc. (38)

CCS Power Characterization• HSPICE Simulation: AND gate with rising input

Power pin (Vdd) currentPower pin (Vdd) currentGround pin (Vss) currentGround pin (Vss) current

Page 39: CCS Technical

© 2005 Synopsys, Inc. (39)

Advantages: Time Resolution

• Captures complete power and ground pin current waveforms

Charge/energy can be calculated by integrating current

( ) ( )( )∑∫

= −

−−

−+∞ −

+−+

≈n

i nn

nnnii

ii

IIttIttIIIdt

1 1

11

1

0 ln2

Page 40: CCS Technical

© 2005 Synopsys, Inc. (40)

Dynamic Rail Analysis

• Compute instance-specific voltage drop at all power/ground pins

• Requires cell model for switching and non-switching cases

VDD1

GND

RparCpar

Page 41: CCS Technical

© 2005 Synopsys, Inc. (41)

Equivalent Parasitics for Non-Switching Case• Essential for accurate rail analysis – additional decoupling cap• Cpar per input state for each power or ground pin• Rpar per input state for each power or ground pin to each output

CintIN2

IN1

OUT

Rpar

Cpar CloadCload

Equivalent Parasitics

Page 42: CCS Technical

© 2005 Synopsys, Inc. (42)

CCS Power Summary

• Single Power Model For All Power Applications: Power Optimization, Dynamic Rail Analysis, Power Analysis

• Accurately Models:Transient current during switchingEquivalent parasitics for non-switching caseLeakage current Multi-Voltage designs

• Multi-rail cells• Non-zero ground rail

MTCMOS: fine-grain or coarse-grain• Characterized concurrently with CCS Timing

Page 43: CCS Technical

© 2005 Synopsys, Inc. (43)

CCS SummaryContinuing With A Tradition Of Innovation

NoiseNoise PowerPowerTimingTiming

• CCS - Next Generation Modeling TechnologyOpen SourceUnified Model For Timing, Noise and PowerHigher Accuracy as Needed By 90nm and Below

• Easy and Efficient Library Characterization• Complete Ecosystem: Models, Format, Characterization

Page 44: CCS Technical

© 2005 Synopsys, Inc. (44)

Technical Collateral Material

• Technical collateral material for CCS is available on:www.synopsys.com/products/solutions/galaxy/ccs/cc_source.html

• It includes:CCS BackgrounderWhite PapersFormat SpecificationFAQ