APPROVED FOR PUBLIC RELEASE; DISTRIBUTION IS UNLIMITED Title S&T Campaign: Sciences for Maneuver Logistics & Sustainability Michael Coatney, (410) 278-9834, [email protected] Asha Hall, Ph.D., (410) 278-2384, [email protected] SCM 027 Prognostics and Diagnostics Laboratory • Acoustic Emission System ‒ 16-channel, low frequency, ultrasonic conditioning unit ‒ Frequency Range: 1.6 kHz to 40 MHz ‒ Up to 10 MHz sampling rate ‒ Detect cracks and crack locations in structural components; detect fiber breaks and delaminations in composites ‒ Acellent’s ScanSentry and ScanGenie II diagnostic unit generates and captures signals from piezoelectric sensors and actuators using Lamb waves ‒ Able to actively interrogate metallic and composite structures in-plane and out-of-plane • Lamb Wave Diagnostics • Impact Modal Analysis ‒ Adapts to FFT analyzers for structural behavior testing ‒ 0–5,000 lb/ft impact loading ‒ x1, x10, x100 gain signal conditioning ‒ High speed interrogator capable of monitoring and analyzing FBG sensors with up to 4 channels simultaneously ‒ Up to 500 kHz for a single channel of 100 kHz on four simultaneous channels ‒ Sensitivity of 0.02 µe for periodic vibrations • High-Speed Optical Sensing Lamb Wave Diagnostics Research Facilities Supports prognostics health management research activities such as structural health monitoring and life prognosis; propulsion health monitoring; machinery and dynamic component diagnostics; physics, materials, electronics, advanced sensing, and data acquisition hardware Equipment Available Flaw Detection using Pulse Thermography Sensor Path Configuration Prestine Notched Specimen Specimen Subjected under Fatigue Loading Damage recognition using Acellent’s SMART patch technology Acoustic Emission System High-Speed Optical Sensing Impact Modal Analysis Pulse Thermography • Pulse Thermography ‒ Fast, non-contact, wide area, non-destructive inspection of flat and curved structures ‒ Can measure depth and area of subsurface defects • Ultrasonics ‒ Fast, non-contact, wide area, non-destructive inspection of flat and curved structures ‒ Can measure depth and area of subsurface defects AE Sensors Damage Location Recognition Vallen Systeme AMSY-6 AE System Ultrasonics RITEC RAM-5000 Controlled Ultrasonic System Flash Source 240v, 20A Specimen Hi-speed IR camera Flash Source 240v, 20A 1D Heat conduction IR radiation Data acquisition Strike Face Back Face Strike face and back face scan of S-2 Glass composite panel with porosity and density gradients