C3 / MAPLD2004Lake1 Radiation Effects on the Aeroflex RadHard Eclipse FPGA Ronald Lake Aeroflex Colorado Springs.

C3 / MAPLD2004Lake 1

Radiation Effects on the Aeroflex RadHard Eclipse FPGA

Ronald Lake

Aeroflex Colorado Springs

C3 / MAPLD2004Lake 2

RadHard Eclipse Radiation Effects Overview

• Test Techniques

• Single Event Effects Results

– Single Event Upset

– Single Event Latch-up

• Total Ionizing Dose

– DC Characteristics

– AC Characteristics

• TMR Effects on SEU

• Summary

C3 / MAPLD2004Lake 3

Hardness Testing Conditions - SEE

• SEU - 25oC, 2.25V core and 3.0V I/O, in accordance with EIA/JESD57

• SEU - FPGA programmed (configured) with three data storage components

– Dynamic Shift Registers - Two at 560 bits

– Static Register File - 64 x 16 bits

– Static RAM - 55,296 bits

• SEL - 125oC, 2.7V core and 3.6V I/O, in accordance with EIA/JESD57

• 208-lead ceramic quad flat-pack (CQFP)

C3 / MAPLD2004Lake 4

Hardness Testing Conditions - SEU

• Alternating ones and zeros data used for all three storage components of the FPGA

• National Instruments tester at 1MHz frequency

– Write/read shift register

– Read only register file and RAM

– After a cell upsets, the correct data is re-written to the cell

• Texas A&M University Cyclotron Institute

– Au, Kr, and Ar from 0o (normal incidence) to 60o

C3 / MAPLD2004Lake 5

Heavy Ion Beam For SEU Analysis

C3 / MAPLD2004Lake 6

Hardness Testing Conditions - SEL

• Devices statically biased during irradiation

– Supply currents monitored for latch-up

• Lawrence Berkeley National Laboratory

– Au at 41o

– Effective fluence at 1E7 ions/cm2

– Effective LET = 120 MeV-cm2/mg

• Devices functionally re-verified after irradiation

C3 / MAPLD2004Lake 7

Heavy Ion Chamber for SEL Analysis

C3 / MAPLD2004Lake 8

Hardness Testing Conditions - TID

• Irradiated under worst case temperature (25oC) and static bias conditions (max VDD) per MIL-STD-883E Method 1019

• FPGA programmed with 60 AC paths

• J.L. Shepherd model 81-22 Cobalt 60 gamma cell

C3 / MAPLD2004Lake 9

Cobalt 60 Total Ionizing Dose System

C3 / MAPLD2004Lake 10

Single Event Upset Data Plot

1.0E-10

1.0E-09

1.0E-08

1.0E-07

1.0E-06

0 20 40 60 80 100

LET (MeV-cm2/mg)

Cro

ss-s

ecti

on

(cm

2/b

it)

Register File

RegF Weibull

Shift Reg

ShiftR Weibull

RAM

RAM Weibull

C3 / MAPLD2004Lake 11

Hardness Results - SEE

SEU - Error-rates - GEO orbit, Adam’s 90% WC

FPGAComponent

Temp(C)

VDDCore & I/O

(V)

Numberof storage

cells

WeibullShape

WeibullWidth

SaturatedX-section

(cm2/bit)

Onset LET

MeV-cm2/mgError-rate

(errors/bit-day)

RegF 25 2.25/3.00 1,024 1.4 90 2.0E-07 20 4.7E-09ShiftR 25 2.25/3.00 1,120 1.4 55 4.0E-07 14 3.6E-08RAM 25 2.25/3.00 55,296 1.95 125 9.0E-08 17.5 6.3E-10

SEL - No latch-up to 120 MeV-cm2/mgConditionsVDD I/O, VDD

Core, TempSN Ion

Normal LET, MeV-cm²/mg

Angledegrees

Flux

ions/cm2-sLatchup

Fluence (normal)

ions/cm2

Effective Fluence

ions/cm2

Effective LET MeV-cm²/mg

3.6, 2.7, 125C 24 Au 90.3 41 7.8E+04 0 1.3E+7 1.0E+7 1203.6, 2.7, 125C 10 Au 90.3 41 6.9E+04 0 1.3E+8 1.0E+8 1203.6, 2.7, 125C 22 Au 90.3 41 6.0E+04 0 1.3E+7 1.0E+7 1203.6, 2.7, 125C 2 Au 90.3 41 6.3E+04 0 1.3E+7 1.0E+7 120

TID - 113 rads(Si)/s

FPGA meets datasheet ACs and DCs post 300 krad(Si)

C3 / MAPLD2004Lake 12

Hardness Results - TID - Supply Current DCs

Temp(C)

Test ConditionVDD

Core (V)VDD

I/O (V)Units Pre-rad

Post100k rad

Post300k rad

Delta100k - Pre

Delta300k - Pre

25 QIDD 2.7 3.6 mA 0.19 0.2 3.5 0.01 3.3125 AIDD 1 MHz 2.7 3.6 mA 198 203 631 5 43325 AIDD 5 MHz 2.7 3.6 mA 304 309 732 5 42825 AIDD 10 MHz 2.7 3.6 mA 437 442 860 5 42325 AIDD 20 MHz 2.7 3.6 mA 688 688 1110 0 42225 AIDD 50 MHz 2.7 3.6 mA 1393 1402 1770 9 37725 AIDD 100 MHz 2.7 3.6 mA 1660 1643 1813 -17 153

Most Shifted DCs - Post radiation minus Pre-rad

C3 / MAPLD2004Lake 13

Hardness Results - 100 krad(Si) TID - ACs

5 most shifted ACs on each of 2 devicesPost 100 krad(Si) minus Pre irradiation

SN Temp TestVDD

Core (V)VDD

I/O (V)Units Pre-rad

Post100 krad

Post-Pre%

Change25 25 TPLH_sr_16_2_a21 2.5 3 ns 7.73 7.66 -0.07 -0.9625 25 TPHL_sr_16_2_a21 2.5 3 ns 9.08 8.98 -0.09 -1.0225 25 TPLH_sr_16_2_f21 2.5 3 ns 7.47 7.38 -0.09 -1.2425 25 TPHL_sr_16_2_qb2 2.5 3 ns 5.62 5.54 -0.07 -1.3225 25 TPHL_sr_16_2_qa2 2.5 3 ns 5.57 5.50 -0.07 -1.3326 25 TPHL_sr_16_2_qa2 2.7 3.6 ns 5.14 5.13 -0.07 -1.2526 25 TPHL_sr_16_2_a21 2.5 3 ns 9.08 9.17 -0.12 -1.3026 25 TPHL_sr_16_2_f21 2.5 3 ns 8.55 8.71 -0.14 -1.5726 25 TPHL_sr_16_2_qb2 2.5 3 ns 5.62 5.67 -0.10 -1.7726 25 TPHL_sr_16_2_qa2 2.5 3 ns 5.57 5.56 -0.10 -1.80

C3 / MAPLD2004Lake 14

Hardness Results - 300 krad(Si) TID - ACs

SN Temp TestVDD

Core (V)VDD

I/O (V)Units Pre-rad

Post300 krad

Post-Pre%

Change25 25 TPLH_inv_ch_i3_t 2.5 3 ns 152.1 160.8 8.7 5.725 25 TPLH_inv_ch_i2_t 2.5 3 ns 155.4 164.3 8.9 5.725 25 TPHL_inv_ch_i1_t 2.5 3 ns 154.6 163.4 8.8 5.725 25 TPHL_nand16_o2 2.5 3 ns 52.8 55.7 2.9 5.525 25 TPHL_nand16_o0 2.5 3 ns 52.2 55.1 2.9 5.526 25 TPLH_inv_ch_i2_t 2.5 3 ns 156.7 163.8 7.1 4.526 25 TPHL_inv_ch_i1_t 2.5 3 ns 155.8 162.8 7.0 4.526 25 TPHL_sr_d_so 2.5 3 ns 5.9 6.1 0.3 4.426 25 TPLH_inv_ch_i3_t 2.5 3 ns 153.3 160.0 6.7 4.426 25 TPLH_inv_ch_i2_t 2.7 3.6 ns 144.4 150.0 5.7 3.9

5 most shifted ACs on 2 devicesPost 300 krad(Si) minus Pre irradiation

C3 / MAPLD2004Lake 15

RadHard Eclipse Single Voter TMR

MUX4x0

S0S1

I722

I723

I724

I725

I726

I727

I728

I729

I730

I731

I732

I733

I734

I735

I736

I737

I738

I739

DFFPC

I713

CLR

D

PRE

Q

DFFPC

I714

CLR

D

PRE

Q

DFFPC

I715

CLR

D

PRE

Q

DFFPC

I51

CLR

D

PRE

Q

DFFPC

I61

CLR

D

PRE

Q

DFFPC

I71

CLR

D

PRE

Q

SHIFT_REG_TMR_200

6/19/2004 10:35:40 AM

UT6325_SEE_TOP

UT6325_SEE_TOP.I183

w_set w_set w_set w_setw_reset w_reset w_reset w_reset

N_1

w_dedclk w_dedclk w_dedclk w_dedclkw_set w_set w_set w_set

w_reset w_reset w_reset w_reset

N_1 .I183-q4

w_dedclk w_dedclk w_dedclk w_dedclkw_set w_set w_set w_set

w_reset w_reset w_reset w_reset

N_1

w_dedclk w_dedclk w_dedclk w_dedclk

C3 / MAPLD2004Lake 16

RadHard Eclipse Single Voter Data

123ABMUX4x0S0S1I722I723I724I725I726I727I728I729I730I731I732I733I734I735I736I737I738I739DFFPCI713CLRDPREQDFFPCI714CLRDPREQDFFPCI715CLRDPREQDFFPCI51CLRDPREQDFFPCI61CLRDPREQDFFPCI71CLRDPREQSHIFT_REG_TMR_2006/19/200410:35:40 AMUT6325_SEE_TOPUT6325_SEE_TOP.I183w_setw_setw_setw_setw_resetw_resetw_resetw_resetN_1w_dedclkw_dedclkw_dedclkw_dedclkw_setw_setw_setw_setw_resetw_resetw_resetw_resetN_1 .I183-q4w_dedclkw_dedclkw_dedclkw_dedclkw_setw_setw_setw_setw_resetw_resetw_resetw_resetN_1w_dedclkw_dedclkw_dedclkw_dedclk

* Estimate based on assumed onset LET of 100 and saturated x-section of 7E-9

FPGAComponent

Temp(C)

VDDCore & I/O

(V)

WeibullShape

WeibullWidth

SaturatedX-section

(cm2/bit)

Onset LET

MeV-cm2/mgError-rate

(errors/bit-day)

No TMR 25 2.25/3.00 1.4 55 4.0E-07 14 3.6E-08TMR Single Voter 25 2.25/3.00 1.8 25 7.0E-08 64 2.3E-10TMR Triple Voter * 25 2.25/3.00 1.8 25 7.0E-09 100 5.3E-15

1E-10

1E-9

1E-8

1E-7

1E-6

1E-5

0 20 40 60 80 100

LET (MeV-cm 2/mg)

Cro

ss S

ecti

on

(cm

2 /

bit

)

No TMR Shift Register

No TMR Weibull

TMR Single Voter

TMR SV Weibull

No errors at LET of 64

MeV-cm2/mg. Not tested between LET of 64 and 90 MeV-cm2/mg

Error-rates based on SpaceRadiation 4.0 Weibull analysis, Geo orbit, Adam’s 90% WC environment

C3 / MAPLD2004Lake 17

RadHard Eclipse Single Voter Data

123ABMUX4x0S0S1I722I723I724I725I726I727I728I729I730I731I732I733I734I735I736I737I738I739DFFPCI713CLRDPREQDFFPCI714CLRDPREQDFFPCI715CLRDPREQDFFPCI51CLRDPREQDFFPCI61CLRDPREQDFFPCI71CLRDPREQSHIFT_REG_TMR_2006/19/200410:35:40 AMUT6325_SEE_TOPUT6325_SEE_TOP.I183w_setw_setw_setw_setw_resetw_resetw_resetw_resetN_1w_dedclkw_dedclkw_dedclkw_dedclkw_setw_setw_setw_setw_resetw_resetw_resetw_resetN_1 .I183-q4w_dedclkw_dedclkw_dedclkw_dedclkw_setw_setw_setw_setw_resetw_resetw_resetw_resetN_1w_dedclkw_dedclkw_dedclkw_dedclk

1E-10

1E-9

1E-8

1E-7

1E-6

1E-5

0 20 40 60 80 100 120

LET (MeV-cm2/mg)

Cro

ss S

ecti

on

(cm

2 / b

it)

030927 BNL

Weibull

030927 QL BNL

031106 LBNL

031212 LBNL

040629 SN A

040629 SN B

040629 SN C

040629 SN D

040219 BNL

BNL QL FPGA

8/17/4 TMR2 Data : TAMU

C3 / MAPLD2004Lake 18

Summary

• Completed RadHard Eclipse FPGA pre-qualification evaluation of radiation performance– Low Single Event Upset error rate (geosynchronous orbit,

Adams 90% worst case environment)– Single Event Latch-up immune to > 108 MeV-cm2/mg– Passes datasheet parameters to > 300 krad(Si) Total

Ionizing Dose– TMR design maps well to logic cell architecture

• Offered as a flight qualified QML Q & V RadHard Standard Microcircuit Drawing device