Agilent 3070/i5000GOEPEL electronics‘ Boundary Scan integration
for Agilent In-Circuit tester
• reduction of adapter costs through Boundary Scan in In-Circuit
tester
• integration packages for Plug-In card (PIC) and Performance
Port (PPT)
• faster test times through optimized interface
• galvanically isolated interface for Boundary Scan
• decoupled power supply for SCANFLEX®
• active delay compensation for optimizing of the TAP
• integrated program execution
• CION integration and manual interaction
• fast system diagnostics in case of errors
JTAG/Boundary Scan
BS/Agilent3070 / E / 06-2014
ISO 9001 certified
GOEPEL electronic GmbH
Goeschwitzer Str. 58 /60
07745 Jena /Germany
Phone: +49 (0) - 3641 - 6896 -0
Fax: +49 (0) - 3641 -6896 - 944
Email: [email protected]
Web: www.goepel.com
Authorised Distributor:
[email protected] [email protected] [email protected]
[email protected] [email protected]
Xvision error indication
Test plan GOEPEL electronics
JTAG/Boundary ScanAgilent 3070/i5000
Agilent Medialist i5000
GOEPEL electronics offers a professional Boundary Scan op-tion
especially for In-Circuit testers of the 3070/i5000 series by
Agilent. It provides signifi cant advantages in automatic
produc-tion compared to classic stand-alone solutions.
The integrated error report shows errors for the In-Circuit test
as well as for the Boundary Scan test in the output window of the
Agilent system. Boundary Scan combined with ICT reduces
requirements for the mechanic access, which minimizes adapter costs
and enables testability for otherwise untestable nets.
GOEPEL electronics offers complete integration packages in
dif-ferent levels, which differ in hardware performance and
software options.
Each integration package contains the PCI controller and a
special SCANFLEX transceiver for installation into the Agilent
In-Circuit tester. It is available in versions as a Plug-in Card
(PIC) or Performance Port Card (PPT). Both versions are designed
with 4 TAPs and decouple all Boundary Scan signals from the ICT
interface with relays to avoid interferences during non-operating
state. The power supply of the transceiver is provided through a
SCANFLEX power supply to ensure the galvanic isolation from the
ICT.
Furthermore, each package includes „SYSTEM CASCON™ for Agilent
3070“, a demo reference board for quick system diag-nostics and a
one-year maintenance contract for software and hardware.
The SCANFLEX principle offers optimized signal quality for test
frequencies up to 80 MHz under ideal conditions. Thereby, mo-dern
ESA technologies such as VarioTAP® and ChipVORX® can be used
effectively on the ATE.
Optionally, interactive tests between Boundary Scan and ICT can
be realized by installing CION modules into the test adapter.
Many developers and manufacturers of electronic products have
already optimized their production systems through system
integration.