Microelectronic Circuits, Kyung Hee Univ. Spring, 2016 1 Bipolar Junction Transistors
Microelectronic Circuits, Kyung Hee Univ. Spring, 2016
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Bipolar Junction Transistors
Microelectronic Circuits, Kyung Hee Univ. Spring, 2016
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Introduction
• physical structure of the bipolar transistor and how it works
• How the voltage between two terminals of the transistor controls the current that flows through the third terminal
• The equations that describe these current-voltage characteristics
• How to analyze and design circuits that contain bipolar transistors, resistors, and dc sources
Microelectronic Circuits, Kyung Hee Univ. Spring, 2016
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Introduction
• Three-terminal device
• Multitude of applications• Signal amplification/Digital logic/Memory circuit/Switch
• Voltage between two terminals to control the current flowing in third terminal
• Bipolar junction transistor (BJT)
• Metal-oxide-semiconductor field-effect transistor (MOSFET)
• BJT was invented in 1948 at Bell Telephone Laboratories
• Ushered in a new era of solid-state circuits
• It was replaced by MOSFET as predominant transistor used in modern electronics.
• BiCMOS
Microelectronic Circuits, Kyung Hee Univ. Spring, 2016
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4.1 Device Structure and Physical Operation
• Simplified structure of BJT
• Consists of three semiconductor regions:• Emitter region (n-type)
• Base region (p-type)
• Collector region (n-type)
• Type described above is referred to as npn
• Dual of npn is pnp transistor
• Three terminals: emitter(E), base(B), collector(C)
Microelectronic Circuits, Kyung Hee Univ. Spring, 2016
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4.1.1 Simplified Structure/Operation Modes
• Transistor consists of two pn-junctions:• Emitter-base junction (EBJ)
• Collector-base junction (CBJ)
• Operating mode depends on bias condition• Active mode – used for amplification
• Cutoff and saturation modes – used for switching application (logic circuits)
• Bipolar(electron and hole) participate in conduction
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4.1.2 npn-Transistor in the Active Mode
• Active mode is “most important”
• Two external voltage sources are required for biasing to achieve it
• Refer to Figure 4.3
Figure 4.3: Current flow in an npn transistor biased to operate in the active mode. (Reverse current components due to drift of thermally generated minority carriers
are not shown.)
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Current Flow
• Forward bias on emitter-base junction will cause current to flow
• This current has two components:• Electrons injected from emitter into base
• Holes injected from base into emitter
• It will be shown that first (of the two above) is desirable
• This is achieved with heavy doping of emitter, light doping of base
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Current Flow
• Emitter current (𝑖𝐸) : current which flows across EBJ • Flows “out” of emitter lead
• Dominate by electron components
• 𝑖𝐸 ∝ 𝑒 𝑣𝐵𝐸 𝑉𝑇
• Minority carriers – in p-type region• These electrons will be injected from emitter into base
• Small proportion of recombination process
• Reach most of diffusing electrons to the boundary of the collector-base depletion region
• Because base is thin, concentration of excess minority carriers within it will exhibit constant gradient
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Collector Current
• Reach most of diffusing electrons to the boundary of the collector-base depletion region
• Opposite direction to that of the flow of electrons
• 𝑖𝐶 = 𝐼𝑆 𝑒 𝑣𝐵𝐸 𝑉𝑇
• 𝐼𝑆: constant of proportionality (saturation current)• Inversely proportional to W and directly proportional to area of EBJ
• Typically between 10-12 and 10-18A
• Also referred to as scale current
• 𝑖𝐶 is independent of the value of 𝑣𝐶𝐵• As long as collector is positive, with respect to base
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Base Current
• Base current consists of 𝑖𝐵 = 𝑖𝐵1 + 𝑖𝐵2• 𝑖𝐵1: due to holes injected from base region into emitter
• 𝑖𝐵2: due to holes that have to be supplied by external circuit to replace those recombined
• Each current will be proportional to 𝑒 𝑣𝐵𝐸 𝑉𝑇
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Base Current
• Common-emitter current gain (𝛽)
• Is influenced by two factors:
• Width of base region (W)
• Relative doping of base / emitter regions (NA/ND)
• High Value of 𝛽 (50~200, >1000)
• Thin base (small W in nano-meters)
• Lightly doped base / heavily doped emitter (small NA/ND)
transistor parameter
/
(eq6.5)
(eq6.6) BE T
CB
v VSB
ii
Ii
e
(eq4.2)
(eq4.3)
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Emitter Current
• All current which enters transistor must leave
iE = iC + iB• Equations (4.7) through
(4.13) expand upon this idea
• α : common-base current gain (less than but very close to unity)
this expression is generated through combination of (6.5) and (6.7)
/(eq6.8/6.9)
(eq6.10)
(eq6.11
1
)
1
BE T
C
v VE C S
C E
i
i i I
i i
e
this parameter is reffered
/
toas
(eq6.13)
(eq6.1
1 1
2)
,
BE Tv VSE
Ii
common-base current gain
e
(eq4.8/4.9)
(eq4.10)
(eq4.11)
(eq4.12)
(4.5) and (4.7)
(eq4.13)
Microelectronic Circuits, Kyung Hee Univ. Spring, 2016
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The Emitter Current
• All current which enters transistor must leave
• iE = iC + iB• Equations (4.7)
through (4.10) expand upon this idea
• α : common-base current gain (less than but very close to unity)
• Small change in 𝛼correspond to very large changes in 𝛽
this expression is generated through combination of (6.5) and (6.7)
/(eq6.8/6.9)
(eq6.10)
(eq6.11
1
)
1
BE T
C
v VE C S
C E
i
i i I
i i
e
this parameter is reffered
/
toas
(eq6.13)
(eq6.1
1 1
2)
,
BE Tv VSE
Ii
common-base current gain
e
(eq4.5)
(eq4.7)
(eq4.8)
(eq4.9)
(4.2) and (4.4)
(eq4.10)
Microelectronic Circuits, Kyung Hee Univ. Spring, 2016
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0
0
( ) concentration of minority carriers a position x (where 0 represents EBJ boundary) thermal-equilibrium value of minority carrier (elect
/
ron) concentration in base
0
reg
(eq6.1) 0 BE
p
p
Tv
nn
Vp
x
n e
pn
pn
0
0
0
ionvoltage applied across base-emitter junction
thermal voltage (constant)
p
pBE
pT
nn
nv
V
Oxford University PublishingMicroelectronic Circuits by Adel S. Sedra and Kenneth C. Smith (0195323033)
Figure 4.4
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Minority-Carrier Distribution
• Concentration of minority carrier np at boundary EBJ is defined by (4.11)
• Concentration of minority carriers np at boundary of CBJ is zero• Positive vCB causes these electrons to be swept across junction
0
0
( ) concentration of minority carriers a position x (where 0 represents EBJ boundary) thermal-equilibrium value of minority carrier
/
(electron) concentration in ase
0
b
(eq6 0.1)
p
p
BE T
x
n
v V
n
pn e
pn
pn
0
0
0
regionvoltage applied across base-emitter junction
thermal voltage (constant)
p
pE
p
B
T
nn
nv
V
(eq4.11)
Microelectronic Circuits, Kyung Hee Univ. Spring, 2016
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Minority-Carrier Distribution
• Tapered minority-carrierconcentration profile exists
• It causes electrons injected into base to diffusethrough base toward collector
• As such, electron diffusion current (In) exists
cross-sectiona area of the base-emitter junction magnitude of the electr
this simplificationmay be made if
gradient assumedto be straight line
(e
(eq6.2)
q6.2)
0
E
p
n E n
p
E n
Aq
n
dn xI A qD
dx
dnAI qD
W
on charge electron diffusivity in base
width of basenD
W
(eq4.12)
Microelectronic Circuits, Kyung Hee Univ. Spring, 2016
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Current Flow
• Some “diffusing” electrons will combine with holes(majority carriers in base)
• Since base is very thin and lightly doped, recombination is minimal
• Recombination does, however, cause gradient to take slightly curved shape
• The straight line is assumed
Microelectronic Circuits, Kyung Hee Univ. Spring, 2016
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0
0
( ) concentration of minority carriers a position x (where 0 represents EBJ boundary) thermal-equilibrium value of minority carrier (elect
/
ron) concentration in base
0
reg
(eq6.1) 0 BE
p
p
Tv
nn
Vp
x
n e
pn
pn
0
0
0
ionvoltage applied across base-emitter junction
thermal voltage (constant)
p
pBE
pT
nn
nv
V
Oxford University PublishingMicroelectronic Circuits by Adel S. Sedra and Kenneth C. Smith (0195323033)
Recombination causes actual gradient to be curved, not straight.
Figure 4.4
(eq4.11)
Microelectronic Circuits, Kyung Hee Univ. Spring, 2016
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• It is observed that most diffusing electrons will reach boundary of collector-base depletion region
• Because collector is more positive than base, these electrons are swept into collector
• Collector current (iC) is approximately equal to In
• iC = In
Collector Current
intrinsic carrier density doping concentration of base
/
0
2
(eq6.3)
saturation current:
(eq6.4)
BE Tv VC S
E
n
n p
S
E n iS
A
iNA
i I
A qD nI
W
A qD nI
W N
e
(eq4.13)
Microelectronic Circuits, Kyung Hee Univ. Spring, 2016
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Recapitulation / Equivalent-Circuit Models
• Present first-order BJT model
• Assumes npn transistor in active mode
• Basic relationship is collector current (iC) is related exponentially to forward-bias voltage (vBE)
• It remains independent of vCB as long as this junction remains reverse biased• vCB > 0
• iB is much smaller than iC
• Nonlinear voltage-controlled current source
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Figure 4.5: Large-signal equivalent-circuit models of the npn BJT operating in the forward active mode.
Common base model
Common emitter model