Atomic Spectroscopy 1

Guide to Atomic SpectroscopyTechniques and Applications

A t o m i c S p e c t r o s c o p y

Life Sciences Optoelectronics Instruments Fluid Sciences

TABLE OF CONTENTS

SECTION 1 An Overview of Atomic Spectroscopy Page 3

SECTION 2 A Summary of Atomic Spectroscopy Reprints Page 11

SECTION 3 PerkinElmer Atomic Spectroscopy Instrumentation Page 23

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SECTION 1 An Overview of Atomic Spectroscopy

Atomic spectroscopy has experienced remarkable growth and diversification in the past decade.This publication is designed to provide a quick reference to the major atomic spectroscopy tech-niques and how they can be used to solve analytical problems. Included is a section on the fun-damentals of atomic spectroscopy, a bibliography listing selected articles on various applications,and a description of PerkinElmer’s complete line of atomic spectroscopy instrumentation andaccessories. Reprints of the articles listed in the bibliography are available free of charge (see Sec-tion 2). For more information contact your local PerkinElmer representative, fill out and mail orfax the attached business reply card, visit our website at: www.perkinelmer.com, email us at:[email protected], call (+1) 203-762-4000 or 800-762-4000, or Fax (+1) 203-762-4228.

are the most widely used. Our discussion willdeal with them and an affiliated technique,ICP Mass Spectrometry.

Atomic spectroscopy is actually not one tech-nique but three: atomic absorption, atomicemission, and atomic fluorescence. Of these,atomic absorption (AA) and atomic emission

WHAT IS ATOMIC SPECTROSCOPY?

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WHAT IS ATOMIC ABSORPTION?

Figure 1. Simplified drawing of a basic flame atomic absorption system.

Atomic absorption is the process thatoccurs when a ground state atom absorbsenergy in the form of light of a specific wave-length and is elevated to an excited state. Theamount of light energy absorbed at this wave-length will increase as the number of atoms ofthe selected element in the light path increas-es. The relationship between the amount oflight absorbed and the concentration of ana-lyte present in known standards can be usedto determine unknown concentrations bymeasuring the amount of light they absorb.Instrument readouts can be calibrated to dis-play concentrations directly.

The basic instrumentation for atomicabsorption (Figure 1) requires a primary lightsource, an atom source, a monochromator to

isolate the specific wavelength of light to beused, a detector to measure the light accu-rately, electronics to treat the signal, and adata display or logging device to show theresults. The light source normally used iseither a hollow cathode lamp or an electrode-less discharge lamp.

The atom source used must produce freeanalyte atoms from the sample. The source ofenergy for free atom production is heat, mostcommonly in the form of an air-acetylene ornitrous oxide-acetylene flame. The sample isintroduced as an aerosol into the flame. Theflame burner head is aligned so that the lightbeam passes through the flame, where thelight is absorbed.

WHAT IS GRAPHITE FURNACE ATOMIC ABSORPTION?

The major limitation of atomic absorptionusing flame sampling (flame AA) is that theburner-nebulizer system is a relatively ineffi-cient sampling device. Only a small fractionof the sample reaches the flame, and theatomized sample passes quickly through thelight path. An improved sampling devicewould atomize the entire sample and retainthe atomized sample in the light path for anextended period to enhance the sensitivity ofthe technique. Electrothermal vaporizationusing a graphite furnace provides those fea-tures.

With graphite furnace atomic absorption(GFAA), the flame is replaced by an electri-cally heated graphite tube. Sample is intro-duced directly into the tube, which is then

heated in a programmed series of steps toremove the solvent and major matrix compo-nents, and then to atomize the remainingsample. All of the analyte is atomized, andthe atoms are retained within the tube (andthe light path, which passes through the tube)for an extended period. As a result, sensitivi-ty and detection limits are significantlyimproved.

Graphite furnace analysis times are longerthan those for flame sampling, and fewer ele-ments can be determined using GFAA. How-ever, the enhanced sensitivity of GFAA andthe ability of GFAA to analyze very smallsamples and directly analyze certain types ofsolid samples significantly expands the capa-bilities of atomic absorption.

ATOMIC ABSORPTION

Lamp Flame Monochromator Detector

The earliest energy sources for excitationwere simple flames, but these often lackedsufficient thermal energy to be truly effectivesources. Later, electrothermal sources such asarc/spark systems were used, particularlywhen analyzing solid samples. These sourcesare useful for doing qualitative and quantita-tive work with solid samples, but are expen-sive, difficult to use, and have limitedapplications.

Due to the limitations of the early sources,atomic emission initially did not enjoy the uni-versal popularity of atomic absorption. Thischanged dramatically with the development ofthe Inductively Coupled Plasma (ICP) as asource for atomic emission. The ICP eliminatesmany of the problems associated with pastemission sources and has caused a dramaticincrease in the utility and use of emissionspectroscopy.

Atomic emission spectroscopy is a process inwhich the light emitted by excited atoms orions is measured. The emission occurs whensufficient thermal or electrical energy is avail-able to excite a free atom or ion to an unstableenergy state. Light is emitted when the atomor ion returns to a more stable configurationor the ground state. The wavelengths of lightemitted are specific to the elements which arepresent in the sample.

The basic instrument used for atomic emis-sion is very similar to that used for atomicabsorption with the difference that no prima-ry light source is used for atomic emission.One of the more critical components foratomic emission instruments is the atomiza-tion source, because it must also provide suf-ficient energy to excite the atoms as well asatomize them.

WHAT IS ATOMIC EMISSION?

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path. As they meet resis-tance to their flow, heatingtakes place and additionalionization occurs. Theprocess occurs almostinstantaneously, and theplasma expands to its fulldimensions.

As viewed from the top,the plasma has a circular,“doughnut” shape. Thesample is injected as anaerosol through the centerof the doughnut. This char-acteristic of the ICP con-fines the sample to anarrow region and pro-vides an optically thinemission source and a

chemically inert atmosphere. This results ina wide dynamic range and minimal chemicalinteractions in an analysis. Argon is alsoused as a carrier gas for the sample.

WHAT IS THE ICP? The ICP is an argon plasmamaintained by the interactionof an RF field and ionizedargon gas. The ICP is reportedto reach temperatures as highas 10,000°K, with the sampleexperiencing useful tempera-tures between 5,500 °K and8,000 °K. These temperaturesallow complete atomization ofelements, minimizing chemi-cal interference effects.

The plasma is formed by atangential stream of argon gasflowing between two quartztubes, as shown in Figure 2.Radio frequency (RF) power isapplied through the coil, andan oscillating magnetic field isformed. The plasma is created when theargon is made conductive by exposing it to anelectrical discharge which creates seed elec-trons and ions. Inside the induced magneticfield, the charged particles (electrons andions) are forced to flow in a closed annular

Figure 2. ICP torch assembly.

WHAT IS ICP MASS SPECTROMETRY?

As its name implies, ICP Mass Spectrometry(ICP-MS) is the synergistic combination of aninductively coupled plasma with a quadru-pole mass spectrometer. ICP-MS uses theability of the argon ICP to efficiently generatesingly charged ions from the elementalspecies within a sample. These ions are thendirected into a quadrupole mass spectrome-ter.

The function of the mass spectrometer issimilar to that of the monochromator in anAA or ICP emission system. However, ratherthan separating light according to its wave-length, the mass spectrometer separates theions introduced from the ICP according to

their mass-to-charge ratio. Ions of the selectedmass/charge are directed to a detector whichquantitates the number of ions present. Dueto the similarity of the sample introductionand data handling techniques, using an ICP-MS is very much like using an ICP emissionspectrometer.

ICP-MS combines the multielement capabilities and broad linear working range ofICP emission with the exceptional detectionlimits of graphite furnace AA. It is also one ofthe few analytical techniques that permits thequantitation of elemental isotopic concentra-tions and ratios.

Plasma

Aragon

Flame AA

ICP Emission - Radial

ICP Emission - Axial

Hydride Gen.AA

GFAA

ICP-MS

100 10 1 0.1 0.01 0.001

Detection Limit Ranges (µg/L)

the laboratory and the capabilities providedby the different techniques is necessary.

Important criteria for selecting an analyticaltechnique include detection limits, analyticalworking range, sample throughput, cost,interferences, ease of use, and the availabilityof proven methodology. These criteria are dis-cussed below for flame AA, graphite furnaceAA (GFAA), ICP emission, and ICP massspectrometry (ICP-MS).

With the availability of a variety of atomicspectroscopy techniques such as flame atom-ic absorption, graphite furnace atomicabsorption, inductively coupled plasmaemission, and ICP mass spectrometry, labora-tory managers must decide which techniqueis best suited for the analytical problems oftheir laboratory. Because atomic spectroscopytechniques complement each other so well, itmay not always be clear which technique isoptimum for a particular laboratory. A clearunderstanding of the analytical problem in

HOW TO SELECT THE PROPER ATOMIC SPECTROSCOPY TECHNIQUE

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ATOMIC SPECTROSCOPYDETECTION LIMITS

The detection limits achievable for individ-ual elements represent a significant criterionof the usefulness of an analytical techniquefor a given analytical problem. Without ade-quate detection limit capabilities, lengthyanalyte concentration procedures may berequired prior to analysis.

Typical detection limit ranges for the majoratomic spectroscopy techniques are shown inFigure 3, and Table I (on page 5) provides alisting of detection limits by element for sixatomic spectroscopic techniques: flame AA,hydride generation AA, graphite furnace AA(GFAA), ICP emission with radial and axialtorch configurations, and ICP mass spectrom-etry.

Generally, the best detection limits areattained using ICP-MS or graphite furnaceAA. For mercury and those elements thatform hydrides, the cold vapor mercury orhydride generation techniques offer excep-tional detection limits.

PerkinElmer defines its detection limitsvery conservatively with a 98% confidencelevel, based on established conventions for

the analytical technique. This means that if aconcentration at the detection limit weremeasured many times, it could be distin-guished from a zero or baseline reading in98% (3σ) of the determinations.

ANALYTICAL WORKINGRANGE

The analytical working range can be viewed as the concentration range over which quan-titative results can be obtained without hav-ing to recalibrate the system. Selecting atechnique with an analytical working range(and detection limits) based on the expectedanalyte concentrations minimizes analysistimes by allowing samples with varying ana-lyte concentrations to be analyzed together. Awide analytical working range also canreduce sample handling requirements, mini-mizing potential errors.

Figure 4 shows typical analytical working ranges with a single set of instrumental conditions.

Flame AA

GFAA

ICP Emission

ICP-MS

1 2 3 4 5 6 7 8

Orders of Magnitude of Signal Intensity

Figure 3. Typical detection limit ranges forthe major atomic spectroscopy techniques.

Figure 4. Analytical working ranges for themajor atomic spectroscopy techniques.

Flame Hg/ ICPElem AA Hydride GFAA Emission ICP-MS

Ag 1.5 0.005 0.6 0.002Al 45 0.1 1 0.005a

As 150 0.03 0.05 2 0.0006b

Au 9 0.15 1 0.0009B 1000 20 1 0.003c

Ba 15 0.35 0.03 0.00002d

Be 1.5 0.008 0.09 0.003Bi 30 0.03 0.05 1 0.0006Br 0.2C 0.8e

Ca 1.5 0.01 0.05 0.0002d

Cd 0.8 0.002 0.1 0.00009d

Ce 1.5 0.0002Cl 12Co 9 0.15 0.2 0.0009Cr 3 0.004 0.2 0.0002d

Cs 15 0.0003Cu 1.5 0.014 0.4 0.0002c

Dy 50 0.5 0.0001f

Er 60 0.5 0.0001Eu 30 0.2 0.00009F 372Fe 5 0.06 0.1 0.0003d

Ga 75 1.5 0.0002Gd 1800 0.9 0.0008g

Ge 300 1 0.001h

Hf 300 0.5 0.0008Hg 300 0.009 0.6 1 0.016i

Ho 60 0.4 0.00006I 0.002In 30 1 0.0007Ir 900 3.0 1 0.001K 3 0.005 1 0.0002d

La 3000 0.4 0.0009Li 0.8 0.06 0.3 0.001c

Lu 1000 0.1 0.00005Mg 0.15 0.004 0.04 0.0003c

Mn 1.5 0.005 0.1 0.00007d

Flame Hg/ ICPElem AA Hydride GFAA Emission ICP-MS

Mo 45 0.03 0.5 0.001Na 0.3 0.005 0.5 0.0003c

Nb 1500 1 0.0006Nd 1500 2 0.0004Ni 6 0.07 0.5 0.0004c

Os 6P 75000 130 4 0.1a

Pb 15 0.05 1 0.00004d

Pd 30 0.09 2 0.0005Pr 7500 2 0.00009Pt 60 2.0 1 0.002Rb 3 0.03 5 0.0004Re 750 0.5 0.0003Rh 6 5 0.0002Ru 100 1.0 1 0.0002S 10 28.jSb 45 0.15 0.05 2 0.0009Sc 30 0.1 0.004Se 100 0.03 0.05 4 0.0007b

Si 90 1.0 10 0.03a

Sm 3000 2 0.0002Sn 150 0.1 2 0.0005a

Sr 3 0.025 0.05 0.00002d

Ta 1500 1 0.0005Tb 900 2 0.00004Te 30 0.03 0.1 2 0.0008k

Th 2 0.0004Ti 75 0.35 0.4 0.003l

Tl 15 0.1 2 0.0002Tm 15 0.6 0.00006U 15000 10 0.0001V 60 0.1 0.5 0.0005W 1500 1 0.005Y 75 0.2 0.0002Yb 8 0.1 0.0002m

Zn 1.5 0.02 0.2 0.0003d

Zr 450 0.5 0.0003

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Table I.Atomic Spectroscopy Detection Limits (micrograms/liter)

All detection limits are given in micrograms per liter and were determined using elemental standards in dilute aqueous solution. All detectionlimits are based on a 98% confidence level (3 standard deviations).All atomic absorption (AAnalyst™ 800) detection limits were determined using instrumental parameters optimized for the individual element,including the use of System 2 electrodeless discharge lamps where available. All ICP emission (Optima 4300™) detection limits were obtained under simultaneous multielement conditions with the axial view of a dual-viewplasma using a cyclonic spray chamber and a concentric nebulizer. Cold vapor mercury detection limits were determined with a FIAS™-100 or FIAS-400 flow injection system with amalgamation accessory. Thedetection limit without an amalgamation accessory is 0.2 µg/L with a hollow cathode lamp, 0.05 µg/L with a System 2 electrodeless dischargelamp. (The Hg detection limit with the dedicated FIMS™-100 or FIMS-400 mercury analyzers is <0.005 µg/L without an amalgamation accessoryand <0.0002 µg/L with an amalgamation accessory.) Hydride detection limits shown were determined using an MHS-15 Mercury/Hydride system. Graphite furnace AA detection limits were determined on an AAnalyst 800 using 50-µL sample volumes, an integrated platform and full STPFconditions. SIMAA™ 6000 detection limits are similar or slightly better depending upon the element and the mode of instrument operation.Graphite furnace detection limits can be further enhanced by the use of replicate injections.Unless otherwise noted, ICP-MS detection limits were determined using an ELAN® 6100 equipped with Ryton® spray chamber, Type II Cross-Flow nebulizer, and nickel cones. All detection limits were determined using 3-second integration times and a minimum of 8 measurements. Letters following an ICP-MS detection limit value refer to the use of specialized conditions or a different model instrument as follows:a Run on ELAN DRC™ in standard mode using Pt cones and quartz sample introduction system. b Run on ELAN DRC in DRC mode using Ptcones and quartz sample introduction system. c Run on ELAN DRC in standard mode in Class-100 Clean Room using Pt cones and quartz sam-ple introducion system. d Run on ELAN DRC in DRC mode in Class-100 Clean Room using Pt cones and quartz sample introduction system. e Using C-13. f Using Dy-163. g Using Gd-157. h Using Ge-74. i Using Hg-202. j Using S-34. k Using Te-125. l Using Ti-49. m Using Yb-173.

COSTS

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As they are less complex systems, instrumen-tation for single-element atomic spectroscopy(flame AA and GFAA) is generally less costlythan that for the multielement techniques(ICP emission and ICP-MS). There can also bea considerable variation in cost among instru-mentation for the same technique. Instru-ments offering only basic features aregenerally less expensive than more versatilesystems, which frequently also offer a greaterdegree of automation. Figure 5 provides acomparison of typical cost ranges for themajor atomic spectroscopy techniques. Figure 5. Typical relative system costs for

atomic spectroscopy systems.

INTERFERENCES Few, if any, analytical techniques are free ofinterferences. With atomic spectroscopy tech-niques, however, most interferences havebeen studied and documented, and methodsexist to correct or compensate for those inter-ferences which may occur. A summary of

the types of interferences seen with atomicspectroscopy techniques, all of which arecontrollable, and the corresponding meth-ods of compensation are shown in Table II(see next page).

ICP Emission

Low Relative System Cost High

ICP-MS

GFAA

Flame AA

SAMPLE THROUGHPUT Sample throughput is the number of sampleswhich can be analyzed or elements whichcan be determined per unit time. For mosttechniques, analyses performed at the limitsof detection or where the best precision isrequired will be more time-consuming thanless demanding analyses. Where these factorsare not limiting, however, the number of ele-ments to be determined per sample and theanalytical technique will determine the sam-ple throughput.

Flame AA provides exceptional samplethroughput when analyzing a large number ofsamples for a limited number of elements. Atypical determination of a single elementrequires only 3–10 seconds. However, flameAA requires specific light sources and opticalparameters for each element to be determinedand may require different flame gases for dif-ferent elements. In automated multielementflame AA systems, all samples normally areanalyzed for one element, the system is thenautomatically adjusted for the next element,and so on. As a result, even though it is fre-quently used for multielement analysis, flameAA is generally considered to be a single-element technique.

Graphite Furnace AA (GFAA). As withflame AA, GFAA is basically a single-elementtechnique. Because of the need to thermallyprogram the system to remove solvent andmatrix components prior to atomization,GFAA has a relatively low sample through-put. A typical graphite furnace determinationnormally requires 2–3 minutes.

ICP emission is a true multielement tech-nique with exceptional sample throughput.ICP emission systems typically can determine10-40 elements per minute in individual sam-ples. Where only a few elements are to bedetermined, however, ICP is limited by thetime required for equilibration of the plasmawith each new sample, typically about 15–30seconds.

ICP-MS is also a true multielement tech-nique with the same advantages and limita-tions of ICP emission. The sample throughputfor ICP-MS is typically 20–30 element deter-minations per minute depending on such fac-tors as the concentration levels and requiredprecision.

• ICP Emission is the best overall multiele-ment atomic spectroscopy technique, withexcellent sample throughput and verywide analytical range. Good documenta-tion is available for applications. Operatorskill requirements are intermediatebetween flame AA and GFAA.

• ICP-MS is a technique with exceptionalmultielement capabilities at trace andultratrace concentration levels and theability to perform isotopic analyses. Goodbasic documentation for interferencesexists. Applications documentation is welldocumented and continues to grow rapidly.ICP-MS requires operator skills similar tothose for ICP emission and GFAA.

Other comparison criteria for analytical tech-niques include the ease of use, required oper-ator skill levels, and availability ofdocumented methodology.• Flame AA is very easy to use. Extensive

applications information is available.Excellent precision makes it a preferredtechnique for the determination of majorconstituents and higher concentration ana-lytes.

• GFAA applications are well-documented,though not as completely as with flameAA. GFAA has exceptional detection limitcapabilities but with a limited analyticalworking range. Sample throughput is lessthan that of other atomic spectroscopytechniques. Operator skill requirementsare somewhat more extensive than forflame AA.

Table II.Atomic Spectroscopy Interferences

Technique Type of Interference Method of Compensation

Flame AA Ionization Ionization bufferChemical Releasing agent or nitrous oxide-aceylene flamePhysical Dilution, matrix matching, or method of additions

GFAA Physical and chemical STPF conditionsMolecular absorption Zeeman or continuum source background

correctionSpectral Zeeman background correction

ICP Emission Spectral Background correction or the use of alternateanalytical lines

Matrix Internal standardization

ICP-MS Mass overlap Interelement correction, use of Dynamic ReactionCell™ (DRC™) technology, use of alternate massvalues, or higher mass resolution

Matrix Internal standardization

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OTHER COMPARISON CRITERIA

COMPARISON SUMMARY The main selection criteria for atomic spec-troscopy techniques—concentration rangeand analytical throughput—are summarizedin Figure 6. Where the selection is based onanalyte detection limits, flame AA and ICPemission are favored for moderate to high lev-els, while graphite furnace AA and ICP-MSare favored for lower levels. ICP emission andICP-MS are multielement techniques, favoredwhere large numbers of samples are to be ana-lyzed.

Figure 6. A general selection guide foratomic spectroscopy instrumentation based on sample throughput and concentration range.

ICP Em

High

Speed

Low

ICP MS

FL AA

High Detection Limits Low

GFAA

Worldwide Customer SupportOne way we satisfy users of our instrumenta-tion is to offer them extensive customer sup-port in addition to excellence in engineeringand technical expertise. PerkinElmer sup-plies this support in numerous ways:• Technical Specialists. PerkinElmer has

regional atomic spectroscopy specialistslocated throughout the world, responsiblefor providing customer training, demon-strations, technical assistance and semi-nars to all users and prospectivecustomers.

• Literature. The famous “Cookbook” is pro-vided with all Perkinelmer AA instrumentpurchases. It contains information on AAconditions for the determination of 72individual elements and over 400 analy-ses. A similar manual is provided witheach graphite furnace. PerkinElmer alsooffers an array of published articles, appli-cation notes, and other technical literatureon atomic spectroscopy (see Section 2).

• Customer Training Courses. PerkinElmeroffers customer training courses for flameAA, furnace AA, ICP emission, and ICP-MS on a regional basis at sites around theworld.

• Service and Support. PerkinElmer main-tains service and support offices through-out the world, staffed by service engineerswho have received extensive factory train-ing in atomic spectroscopy.

PerkinElmer Firsts• Since 1960, when PerkinElmer introduced

the first commercial double-beam atomicabsorption instrument, PerkinElmer prod-ucts have remained the standard to whichall atomic absorption instrumentation iscompared.

• PerkinElmer also introduced the firstgraphite furnace in 1970, and Zeeman-cor-rected graphite furnace analysis in 1981.PerkinElmer GFAA systems are being suc-cessfully used worldwide for the determi-nation of ultratrace elements in a widevariety of samples.

• In 1980, PerkinElmer announced the firstICP emission/AA system. Today, thou-sands of PerkinElmer ICP emission sys-tems are in operation.

• The PerkinElmer SCIEX ELAN® was thefirst commercially available ICP-MS sys-tem in 1984 and remains the standard inthis newest atomic spectroscopy tech-nique.

• For more than four decades, PerkinElmerhas consistently been the leader in atomicspectroscopy. We stay out in front becauseof our responsive engineering and technol-ogy. Our commitment to you is a total one.We want to do everything possible to satis-fy the users of our instruments because weare a full range analytical instrument com-pany. We know we must satisfy your ana-lytical needs with each of our products tomaintain your continued business.

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WHY PerkinElmer ATOMIC SPECTROMETRYINSTRUMENTS?

For information on the above and more, contact your local PerkinElmer sales representative orPerkinElmer Instruments LLC, 761 Main Avenue, Norwalk, CT, 06859-0010 U.S.A. via theattached business reply card, e-mail at: [email protected], Tel: (+1) 203-762-4000 or 800-762-4000, Fax: (+1) 203-762-4228, visit the PerkinElmer website at: www.perkinelmer.com

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This summary lists published application articles and PerkinElmer technical summaries availablefree of charge. Reprints can be ordered from PerkinElmer, 761 Main Avenue, Norwalk, CT, 06859-0010, U.S.A. via attached business reply card, or by e-mail at: [email protected], or call (+1)203-762-4000 or 800-762-4000, Fax (+1) 203-762-4228. Visit our website at www.perkinelmer.comWhen requesting reprints, please specify the order number (e.g., AS-1021 or TSMS-17).

The articles are arranged by analytical technique and subdivided by field of interest (i.e., agricul-ture, biochemistry) and general information. Most of the work described was done withPerkinElmer atomic spectroscopy instruments. Laboratories equipped with such instruments mayexpect similar performance. However, due to important differences among optics and electronics,one cannot be certain that all of these analyses can be repeated with other instruments.

Many of the articles listed were published in Atomic Spectroscopy, a bi-monthly journal on ana-lytical atomic spectroscopy. A moderate charge is made for subscriptions. A free one-year sub-scription is furnished with the purchase of a PerkinElmer AA, ICP, or ICP-MS. For a free copy ofthe journal or to publish an applications article, contact editor at e-mail: [email protected]

SECTION 2 A Summary of Atomic Spectroscopy Reprints

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ATOMIC ABSORPTION:TOXICOLOGIC, CLINICAL,AND FORENSIC

AA-1248 M. Feuerstein and G. Schlem-mer, Determination of Se in HumanSerum by GFAAS With TransverselyHeated Graphite Atomizer and Longitu-dinal Zeema-Effect Background Correc-tion, At. Spectrosc. 20(5), 180-185(1999).

AA-1245 T. Guo, J. Baasner and D.L.Tsalev, Fast Automated Determinationof Toxicologically Relevant Arsenic inUrine by Flowing Hydride PenetrationAAS, PerkinElmer Bodenseewerk (1998).

AA- 1238 T. Guo and J. Baasner, Techni-cal Note: Determination of Mercury inBlood by On-line Digestion with FIMS,Automatic Chem. 18(6), 217 (1996).

AA-1236 C.L. Wabner and D.C. Sears,Determination of Urinary Ca, Mg and LiUsing FI With Flame AAS, At. Spectrosc.17(3), 119 (1996).

AS-1226 C.L. Wabner and D.C. Sears,Determination of Urinary Ca, Mg, and LiUsing Flow Injection with Flame AAS,At. Spectrosc. 17(3), 119 (1996).

AS-1223 T. Guo, J. Baasner, M. Gradl,and A. Kistner, Determination of Mer-cury in Saliva with a Flow Injection Sys-tem, Anal. Chim. Acta 320, 171 (1996).

AS-1188 C.P. Bosnak, D. Bradshaw, R.Hergenreder, and K. Kingston, GraphiteFurnace Analysis of Pb in Blood UsingContinuum Source Background Correc-tion, At. Spectrosc. 14, 80 (1993).

AS-1184 C.P. Hanna, J.F. Tyson, and S. McIntosh, Determination of Inorganic

Arsenic and its Organic Metabolites inUrine by Flow-Injection Hydride Gener-ation Atomic Absorption Spectrometry, Clin. Chem. 39, 1662 (1993).

AS-1182 P.J. Parsons, A Rapid ZeemanGraphite Furnace Atomic AbsorptionSpectrometric Method for the Determi-nation of Lead in Blood, Spectrochim.Acta 48B, 925 (1993).

AS-1178 I. Shuttler, The Application of aTransversely Heated ElectrothermalAtomizer with Longitudinal Zeeman-Effect Background Correction to theDetermination of Vanadium in Urine,At. Spectrosc. 13(5), 174 (1992).

AS-1116 A. J. Schermaier, L. H. O’Con-nor, and K. H. Pearson, Semi-automatedDetermination of Chromium in WholeBlood and Serum by Zeeman Elec-trothermal Atomic Absorption Spec-trophotometry, Clin. Chim. Acta. 152,123 (1985).

AS-1110 B. Welz and G. Schlemmer,Determination of Arsenic, Selenium andCadmium in Marine Biological TissueSamples Using a Stabilized TemperaturePlatform Furnace and Comparing Deu-terium Arc with Zeeman-effect Back-ground Correction Atomic AbsorptionSpectrometry, J. Anal. At. Spectrom. 1,119 (1986).

AS-1042 F. Y. Leung and A. R. Hender-son, Determination of Aluminum inSerum and Urine Using Matrix Modifi-cation and the L’vov Platform, At. Spec-trosc. 4, 1 (1983).

ENV-12A PerkinElmer Method 245.1,Determination of Mercury in DrinkingWater and Wastewater by Flow InjectionAAS (Cold Vapor Technique).

AS-1207 J.C. Latino, D.C. Sears, F. Porta-la, and I.L. Shuttler, The SimultaneousDetermination of Dissolved Ag, Cd, Pb,and Sb in Potable Waters by ETAAS, At.Spectrosc. 16(3), 121 (1995).

AS-1197 S. McIntosh, J. Baasner, Z.Grosser, and C. Hanna, Improving theDetermination of Mercury in Environ-mental Samples Using a Dedicated FlowInjection Mercury System, At. Spectrosc.15, 161 (1994).

AA-1247 M. Feuerstein and G. Schlem-mer, The Simultaneous Determinationof Pb, Cd, Cr, Cu, and Ni in Potableand Surface Waters by GFAAS Accord-ing to International Regulations, At.Spectrosc. 20(4), 149-154 (1999).

AA-1237 T. Guo and J. Baasner, Techni-cal Note: Using FIMS to Determine Mer-cury Content in Sewage Sludge,Sediment and Soil Samples, AutomaticChem. 18(6), 221 (1996).

AA-1235 W.B. Barnett and P. Seferovic,Organizing AA and ICP Data for Regula-tory Compliance, Reporting and Archiv-ing, At. Spectrosc. 17(5), 190 (1996).

ATOMIC ABSORPTION:ENVIRONMENTAL

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AA-1233 M. Sperling, B. Welz, J.Hertzberg, C. Rieck and G. Marowsky,Temporal and Spatial Temperature Dis-tributions in Transversely HeatedGraphite Tube Atomizers and TheirAnalytical Characteristics for AAS,Spectrochim. Acta Part 51 B, 879-930(1996).

AA-1232 A.Kh. Gilmutdinov, B. Radz-iuk, M. Sperling and B. Welz, Spatiallyand Temporally Resolved Detection ofAnalytical Signals in GFAAS, Spec-trochim. Acta Part B 51, 1023-1044(1996).

AA-1231 A.Kh. Gilmutdinov, B. Radz-iuk, M. Sperling, B. Welz and K. Yu. Nag-ulin, Three-dimensional Structure of theRadiation Beam in AAS, Spectrochim.Acta Part B 51, 931-940 (1996).

AA-1229 F.J. Fernandez, R. Bourdoulous,and J. Vollmer, An Improved FlameAtomization System for AAS, At. Spec-trosc. 17(4), 167 (1996).

AA-914 R. D. Beaty and J. D. Kerber, Con-cepts, Instrumentation, and Techniquesin Atomic Absorption Spectrometry,PerkinElmer (1993).

AA-1250 Slawomir Garbos, Ewa Bulska,and Adam Hulanicki, Determination ofAntimony(III) by Flame AAS AfterMicrocolumn Preconcentration onDETA Sorbent, At. Spectrosc. 21(4), pp.128-131, Jul/Aug 2000.

AA-1249 Gerhard Schlemmer and MaxPetek, Optimization of a Class 100 CleanRoom Cabinet for Electrothermal Atom-ization AAS, At. Spectrosc. 21(1), pp. 1-4 (Jan/Feb 2000).

AA-1246 J. Baasner, D. Weber, U. Gün-ther, T. Leimbach and P. Obitz, Intelli-gent Automated System Control: FromOnline Sample Preparation to Printout,G.I.T. Lab. Journal. 3, 185-187 (1999).

AA-1243 M. Feuerstein, G. Schlemmerand B. Kraus, The Simultaneous GFAASDetermination of Various Elements atUltratrace Levels in Ultrapure Acidsand Photoresist Stripper Solutions, At.Spectrosc. 19(1), 1 (1998).

AA-1242 I.L. Shuttler, H. Schultze, F.Portala and J.D. Kerber, An AdvancedOptical Design for AAS, Am. Lab. 30(6),35 (1998).

ATOMIC ABSORPTION:GENERAL

GRAPHITE FURNACE ATOMIC ABSORPTION

AA-1225 B. Radziuk, G. Rödel, M. Zei-her, S. Mizuno, and K. Yamamoto, SolidState Detector for Simultaneous Multi-element ETAAS with Zeeman-EffectBackground Correction, JAAS 10, 415(1995).

AS-1203 B. Radziuk, G. Rödel, and H.Stenz, Spectrometer System for Simulta-neous Multielement ETAAS Using LineSources and Zeeman-Effect BackgroundCorrection, JAAS 10, 127 (1995).

AS-1199 I. Shuttler and H. Schulze, Mul-tielement ETAAS Becomes a Reality,Analysis Europa 1, 44 (1994).

AS-1175 B. Welz, G. Schlemmer, and J. R. Mudakavit, Palladium Nitrate-Mag-nesium Nitrate Modifier for GraphiteFurnace Atomic Absorption Spectrome-try, Parts 1 and 2, J. Anal. At. Spectrom.3 (1988).

AS-1169 N. J. Miller-Ihli, A SystematicApproach to Ultrasonic Slurry GFAAS,At. Spectrosc. 13, 1 (1992).

AS-997 W. Slavin, D. C. Manning, and G. R. Carnrick, The Stabilized Tempera-ture Platform Furnace, At. Spectrosc. 2,137 (1981).

AS-1193 C.A. Schneider, H. Schulze, J.Baasner, S. McIntosh, and C. Hanna,Optimizing Mercury Determinations,Amer. Lab. (Feb. 1994).

AS-1186 S. McIntosh, The Determina-tion of Mercury at Ultratrace LevelsUsing an Automated AmalgamationTechnique, At. Spectrosc. 14, 47 (1993).

AS-1138 M. W. Epstein, G. R. Carnrick,W. Slavin, and N. J. Miller-Ihli, Automat-ed Slurry Sample Introduction forAnalysis of a River Sediment byGraphite Furnace AAS, Anal. Chem. 61,1414 (1989).

AS-1123 V. A. Letourneau and B. M. Joshi,Comparison between Zeeman and Con-tinuum Background Correction forGraphite Furnace AA on EnvironmentalSamples, At. Spectrosc. 8, 145 (1987).

ATOMIC ABSORPTION:ENVIRONMENTAL (cont’d)

14

AS-1206 K.J. Kingston and S.A. McIn-tosh, Determination of Mercury in Geo-logical Samples by Flow Injection AAS,At. Spectrosc. 16(3), 115 (1995).

AS-1204 C.P. Hanna, G.R. Carnrick, S.A.McIntosh, L.C. Guyette, and D.E. Berge-mann, The Determination of Se in Nutri-tional Supplement Formulas by FlowInjection-Hydride Generation Coupledto GFAAS.

AS-1198 M.Brunetti, A. Nicolotti, M.Feuerstein, and G. Schlemmer, TheSimultaneous Determination of Cu, Fe,and Ni in Concentrated UltrapureAcids, At. Spectrosc. 15, 209 (1994).

AS-1172 N.J. Miller-Ihli and F. E. Greene,Graphite Furnace Atomic AbsorptionMethod for the Determination ofChromium in Foods and BiologicalMaterials, J.A.O.A.C. 75, 354 (1992).

AS-1105 C. Priest Bosnak, G. R. Carnrick,and W. Slavin, The Determination of Bis-muth in Nickel Alloys, At. Spectrosc. 3,5 (1986).

AS-1071 W. B. Barnett, A CalibrationAlgorithm for Atomic Absorption, Spec-trochim. Acta 39B, 6 (1984).

AA-914 R. D. Beaty and J. D. Kerber,Concepts, Instrumentation, and Tech-niques in Atomic Absorption Spectrom-etry, PerkinElmer (1993).

TSAA-27. Determination of Mercury in an Excess of Silver Nitrate by Means of Flow Injection Cold Vapor AAS(PerkinElmer).

TSAA-25. Analytical Lifetime of HGAGraphite Tubes — A Check List(PerkinElmer).

TSAA-23. Determination of Arsenic in Urine Using the Flow Injection Tech-nique (PerkinElmer).

TSAA-17. Factors Affecting HydrideGeneration Using Flow Injection(PerkinElmer).

TSAA-11. Analysis of Samples withHigh Dissolved Solids Content UsingFlow Injection-Flame Atomic Absorp-tion (PerkinElmer).

TSAA-10C. Recommended Analytical Conditions and General Information forFlow Injection Mercury/Hydride Analy-ses Using the FIAS-100/400(PerkinElmer).

TSAA-49E. The Determination of Mer-cury at Ultra-Trace Level Using FIMSand Amalgamation Technique(PerkinElmer).

TSAA-46. Analytical Advantages ofEnd-Capped Tubes Used With a Trans-verse-Heated Graphite Atomizer(PerkinElmer).

TSAA-39. THGA Performance Data 3.Improved Atomization Efficiency(PerkinElmer).

TSAA-38. THGA Performance Data 2.Tube Lifetime with Corrosive Matrices(PerkinElmer).

TSAA-36. The Determination of Mer-cury at Ultra-Trace Levels Using anAutomated Amalgamation Technique.(PerkinElmer).

TSAA-30. Converting Established HGAGraphite Furnace Programs to theTHGA System (PerkinElmer).

TSAA-29. Improving Mercury DetectionLimits Using the Amalgamation Tech-nique (PerkinElmer).

ATOMIC ABSORPTION:GENERAL (cont’d)

ATOMIC ABSORPTION:TECHNICAL SUMMARIES

ICP EMISSION:ENVIRONMENTAL

D-6278 ILM05 CLP Analysis for 22 Ele-ments with the Optima 2000 DV ICP-OES. PerkinElmer (1999).

D-6274 J. Nölte, Analysis of Low Levelsof Metals in Drinking Water with aScanning Array ICP Emission Spectrom-eter and Ultrasonic Nebulization,PerkinElmer (1999).

D-6262 J. Nölte and U. Lemp, Analysis ofLeachates from a Waste Disposal Site byScanning Array ICP Emission Spectrom-etry, PerkinElmer (2000).

D-6256 T.J. Gluodenis, D.A. Yates, andZ.A. Grosser, Determination of Metals inTCLP Extracts Using RCRAQ ICP-OESMethod 6010, PerkinElmer (1999).

15

ICP EMISSION:ENVIRONMENTAL (cont’d)

D-6254 J. Nölte, Fast and ReliableAnalysis of Wastewater and SludgesWith a Scanning Array ICP EmissionSpectrometer, PerkinElmer (1999).

D-6225 Solving Problems in Environ-mental Analysis with PerkinElmer Sup-port, PerkinElmer (1999).

ENVB-201 Standards for the Optima3000XL, PerkinElmer (1995).

ES-022 Krzysztof Mitko and MalgorzataBebek, Determination of Major Elementsin Saline Water Samples Using a Dual-View ICP-OES, At. Spectrosc. 21(3), pp.77-85 (May/June 2000).

ENVB-204 Financial Analysis of theAxial Plasma Technology vs. GraphiteFurnace Atomic Absorption,PerkinElmer (1995).

ENVB-202 Internal Standardization for the Optima 3000 XL ICP-OES,PerkinElmer (1995).

ENVA-200A CLP Analyses for 22 Ele-ments with the Optima 3000 XL,PerkinElmer (1995).

OAS-68 Determination of Metals inTCLP Extracts Using RCRA ICP Method6010, PerkinElmer (1993).

OAS-64 Analysis of Natural Waters,Waste-Waters, and Sludges, PerkinElmer(1992).

D-6277 L. Davidowski and Z.A. Grosser,The Determination of Major and MinorElements in Air Filters and Urine for Hazard Assessment, Using a New CCDDual-viewed ICP Optical Emission Spec-trometer, PerkinElmer (1999).

ICP EMISSION:FOOD

D-6266 K.D. Besecker and M.L. Duffy,Animal Feed Analysis Using ICP-OESand Microwave Digestion, PerkinElmer(2000).

D-6260 K. O’Hanlon, K.W. Barnes, TheAnalysis of NIST SRM 1548 Total Dietby Slurry Nebulization Axially ViewedICP-OES, PerkinElmer (1999).

D-6259 K.W. Barnes, The Analysis ofTrace Metals in Fruit, Juice, and JuiceProducts Using a Dual-View Plasma,PerkinElmer (1999).

D-6258 K.W. Barnes, E. Debrah, and Z.Li, The Nutritional Analysis of CornProducts, PerkinElmer (1999).

D-6257A K.W. Barnes, The NutritionalAnalysis of Fruit Juices, PerkinElmer(1999).

ES-017 K.W. Barnes, Trace Metal Deter-minations in Fruit, Juice and Juice Prod-ucts Using an Axially Viewed Plasma,At. Spectrosc. 18(3), 84-101 (1997).

ES-016 K.W. Barnes and E. Debrah,Determination of Nutrition LabelingEducation Act Minerals in Food by ICP-OES, At. Spectrosc. 18(2), 41-54 (1997).

ES-008 J. Schöppenthau, J. Nölte, and L. Dunemann, High-Performance LCCoupled with Array ICP-OES for theSeparation and Simultaneous Detectionof Metal and Non-Metal Species in Soy-bean Flour, Analyst 121, 845 (1996).

OAS-78 The Analysis of Trace Metals inFruit, Juice, and Juice Products Using anAxially Viewed Plasma, PerkinElmer(1995).

OAS-73 The Nutritional Analysis ofDairy Products, PerkinElmer (1994).

ICP EMISSION:OIL/WEAR METALS

D-6255 C. Anderau, K. Fredeen, M.Thomsen, and D.A. Yates, Analysis ofWear Metals in Oil, PerkinElmer (1999).

D-5892A Analysis of Wear Metals andAdditive Package Elements in New andUsed Oil Using the Optima Series Simul-taneous ICP-OES, PerkinElmer (1999).

D-5891A Comparisons Between XRFand ICP-OES for Metals Analysis in OilsUsing the ASTM 5185 Method.PerkinElmer (1999).

16

ICP EMISSION:LASER ABLATION

ES-014 J. Nölte, Improving Precision forLaser Solid Sampling for ICP Emissionwith an Array Spectrometer, FreseniusJ. Anal. Chem. 355, 889 (1996).

ES-011 J. Nölte, J. Schöppenthau, L.Dunemann, T. Schumann, and L.Moenke-Blankenburg, Coupling Tech-niques for ICP-OES Using an ArraySpectrometer for Laser Solid Samplingand Speciation, JAAS 10, 655 (1995).

ES-006 J. Nölte, L. Moenke-Blankenburg and Shumann, Laser Solid Sampling fora Solid-State-Detector ICP EmissionSpectrometer, Fresenius J. Anal. Chem.349, pp 131-135 (1994).

ICP EMISSION:FUNDAMENTALS

D-5446 C.B. Boss and K.J. Fredeen, Con-cepts, Instrumentation, and Techniquesin Inductively Coupled Plasma OpticalEmission Spectrometry, PerkinElmer(1997).

ES-010 J.C. Ivaldi and J.F. Tyson, Perfor-mance Evaluation of an Axially ViewedHorizontal ICP for OES, Spectrochim.Acta 50B, 1207 (1995).

ES-005 J. M. Mermet and J. Ivaldi, Real-time Internal Standardization for Induc-tively Coupled Plasma Atomic Emission Spectrometry Using a Custom Segment-ed-array Charge Coupled Device Detec-tor, J. of Anal. At. Spectrom. 8 (1993).

ES-004 J. Ivaldi and T. Barnard, Advan-tages of Coupling Multivariate DataTechniques with Simultaneous Induc-tively Coupled Plasma Optical EmissionSpectra, Spectrochim. Acta 48B, 12(1992).

ES-003 T. Barnard, M. Crockett, J. Ivaldi, P. Lundberg, D. Yates, P. Levine, and D.Sauer, Solid-State Detector for ICP-OES,Anal. Chem. 60, 9 (1993).

ES-002 T. Barnard, M. Crockett, J. Ivaldiand P. Lundberg, Design of an EchelleGrating Optical System for ICP-OES,Anal. Chem 60, 9 (1993).

ES-001 J. Ivaldi, D. Tracy, T. Barnard, and W. Slavin, Multivariate methods forinterpretation of emission spectra frominductively coupled plasma, Spec-trochim. Acta 47B, 12 (1992).

OAS-69 Effects of Spectrometer Settingsand Data Processing Techniques on Fig-ures of Merit for Optima 3000,PerkinElmer (1993).

ES-021 An Entry-level ICP with Scan-ning CCD Detector, Am. Lab. 32(3), 72(2000).

ES-20 J.W. Olesik, Echelle Grating Spec-trometers for ICP-OES, Spectroscopy.14(10), 36 (1999).

ES-019 J. Nölte, Minimizing SpectralInterferences With an Array ICP Emis-sion Spectrometer Using DifferentStrategies for Signal Evaluation, At.Spectrosc. 20(3), 103-107 (1999).

ES-018 M.L. Salit and G.C. Turk, A DriftCorrection Procedure, Anal. Chem.70(15), 3184-3190 (1998).

MS-131 R. Thomas, Choosing the RightTrace Element Technique, Today’sChemist at Work. 8(10), 42 (1999).

AA-1235 W.B. Barnett and P. Seferovic,Organizing AA and ICP Data for Regula-tory Compliance, Reporting and Archiv-ing, At. Spectrosc. 17(5), 190 (1996).

ICP EMISSION:GENERAL

D-6267 C. Verstraeten, The Determinationof Pb in NiNb Alloy by ICP-OES with MSF,PerkinElmer (2000).

D-6265 N. Bos, Determination of Impuri-ties in Dissolved Raw Material of Batteriesby Scanning ICP-OES, PerkinElmer (2000).

D-6253 D. Hilligoss, P. Crampitz, D.A. Yates,Analysis of Complex Alloys Containing Ni,Cr, Cu, and Al, PerkinElmer (1999).

D-6252 The Analysis of NIST GlassMaterials, PerkinElmer (1999).

D-6251 The Analysis of NIST GlassMaterials, PerkinElmer (1999).

D-6250 J.C. Ivaldi, The Determination ofIndium in a Matrix of Tungsten andMolybdenum Using MulticomponentSpectral Fitting, PerkinElmer (1999).

17

ICP MASS SPECTROMETRY:GENERAL

D-6061 S.D. Tanner and V.I. Baranov,Theory, Design, and Operation of aDynamic Reaction Cell for ICP-MS, At.Spectrosc. 20(2), 45 (1999).

MS-83 A New Approach to Extendingthe Dynamic Range in ICP-MS, Spec-troscopy. 12(2), 56-61 (1997).

MS-82 Characterization of Ionizationand Matrix Suppression in ‘Cold’ Plas-ma Mass Spectrometry, J. Anal. At. Spec-trom. 10, 905-921 (1995).

MS-79 Evaluation of a CommerciallyAvailable Microconcentric Nebulizer forICP-MS, J. Anal. At. Spectrom. 11, 543-548 (1996).

MS-72 E. Denoyer, An Advanced ICP-MS Instrument, American Lab. (Feb1995).

MS-71 Applications and Technology of aNew ICP Mass Spectrometer, SpecialIssue of Atomic Spectroscopy Vol. 16(1)(1995) dedicated to the ELAN® 6000 ICP-MS.

MS-50 E. Denoyer, An Evaluation ofSpectral Integration in ICP-MS, At.Spectrosc. 13, 3 (1992).

MS-1 R. S. Houk, Mass Spectrometry of Inductively Coupled Plasma, Anal. Chem. 58, 97A (1986).

D-6397 Maryanne Thomsen, Ruth E.Wolf, The Key to the Analysis of HighMatrix Samples by ICP-MS, PerkinElmer(2000).

MS-128 T.W. May and R.H. Wiedmeyer,The CETAC ADX-500 Autodiluter Sys-tem: A Study of Dilution PerformanceWith the ELAN 6000 ICP-MS and ELANSoftware, At. Spectrosc. 19(5), 143(1998).

MS-127 T.W. May and R.H. Wiedmeyer,A Table of Polyatomic Interferences inICP-MS, At. Spectrosc. 19(5), 150 (1998).

MS-120 E.R. Denoyer, S.D. Tanner andU. Völlkopf, A New Dynamic ReactionCell for Reducing ICP-MS InterferencesUsing Chemical Resolution, Spec-troscopy. 14(2), (1999).

D-6355 The 30-Minute Guide to ICP-MS,PerkinElmer (2000).

D-6354 ELAN DRC ICP-MS System withDynamic Bandpass Tuning, PerkinElmer(2000).

D-6173 Practical Advantages of theAutoLens Single Ion Optic System,PerkinElmer (1999).

D-6064 K. Neubauer, U. Völlkopf, TheBenefits of a Dynamic Reaction Cell toRemove Carbon- and Chloride-BasedSpectral Interferences by ICP-MS, At.Spectrosc. 20(2), 64 (1999).

D-6249 M. Uchiyama and D.A. Yates,The Analysis of Fe/Nd Alloys,PerkinElmer (1999).

ES-015 J.W. Milburn, Automated Addi-tion of Internal Standards for Axial-View Plasma ICP Spectrometry Usingthe Optima 3000 XL, At. Spectrosc.17(1), 9 (1996).

ES-012 B. Vaughan and L. Claassen,Optimizing an ICP Emission Spectrome-ter Analysis Time with the Use of aDirect Injection Nebulizer, Commun.Soil Sci. Plant Anal. 27(3&4), 819 (1996).

ES-009 M. Duffy and R. Thomas, Benefitsof a Dual-View ICP-OES for the Determi-nation of B, Ph, and S in Low AlloySteels, At. Spectrosc. 17(3), 128 (1996).

ES-007 K.-H. Ebert, Analysis of PortlandCement by ICP-AES, At. Spectrosc.16(3), 102 (1995).

OAS-80 The Analysis of AmmoniumFluoride, PerkinElmer (1995).

OAS-77 The Analysis of Lead BulletSamples, PerkinElmer, (1995).

OAS-70 The Analysis of Microwave-Digested Jellyfish, PerkinElmer (1995).

OAS-67 A Simple Continuous FlowHydride Generator for ICP-OES,PerkinElmer (1993).

OAS-66 Analysis of Portland Cement,PerkinElmer, (1992).

OAS-58 Catalyst Analysis, PerkinElmer(1992).

ICP EMISSION:GENERAL (cont’d)

18

D-6419 David E. Nixon et. al., Kenneth R.Neubauer, Ruth E. Wolf, Determinationof Copper and Iron in Liver Tissue Usingthe ELAN DRC ICP-MS, PerkinElmer(2000).

D-6420 David E. Nixon et. al., Kenneth R.Neubauer, Ruth E. Wolf, Determinationof Selenium in Serum and Urine Usingthe ELAN DRC ICP-MS, PerkinElmer(2000).

D-6356 D. Nixon, et. al, Determination ofChromium in Serum and Urine,PerkinElmer (2000).

MS-134 Isabel Chamberlain, KatherineAdams, and Stephanie Le, ICP-MSDetermination of Trace Elements inFish, At. Spectrosc. 21(4), 118, (2000.

MS-129 J. Kunze, S. Koelling, M. Reichand M.A. Wimmer, ICP-MS Determina-tion of Titanium and Zirconium inHuman Serum Using an Ultrasonic Neb-ulizer with Desolvator Membrane, At.Spectrosc. 19(5), 164 (1998).

MS-115 E. Pruszkowski, K. Neubauerand R. Thomas, An Overview of ClinicalApplications by ICPMS, At. Spectrosc.19(4), 111 (1998).

MS-114 R.D. Koons, Analysis of Gun-shot Primer Residue Collection Swabsby ICP-MS, Journal of Forensic Sciences,43(4), 748-754 (1998).

MS-110 H.T. Delves and C.E. Sieni-awska, Simple Method for the AccurateDetermination of Selenium in Serum byUsing ICPMS, J. Anal. At. Spectrom. 12,387-389 (1997).

MS-109 D.C. Paschal, K.L. Caldwell andB.G. Ting, Determination of Lead inWhole Blood Using Inductively CoupledArgon Plasma MS With Isotope Dilution,J. Anal. At. Spectrom. 10, 367-370(1995).

MS-108 D. Nixon and T. Moyer, RoutineClinical Determination of Lead, Arsenic,Cadmium and Thallium in Urine andWhole Blood by ICPMS, Spectrochim.Acta Part B 51, 13-25 (1996).

ICP MASS SPECTROMETRY:ENVIRONMENTAL

D-6357 K. Neubauer, R. Wolf, Determina-tion of Arnsenic in Chloride Matrices,PerkinElmer (2000).

D-6358 K. Neubauer, R. Wolf, Low LevelSelenium Determination, ELAN DRC,(2000)

ENVB-305 On-Line Addition of InternalStandards for ICP-MS Analysis,PerkinElmer (1996).

ENVB-302 Suggested Standards for EPAICP-MS Methods, PerkinElmer (1996).

ENVB-301 Environmental Financial Cri-teria for ICP-MS, PerkinElmer (1995).

ENVA-301 RCRA SW-846 Method 6020for the ICP-MS Analysis of Soils andSediments, PerkinElmer (1996).

ENVA-300A EPA Method 200.8 for theAnalysis of Drinking Water, PerkinElmer(1996).

ENV-1 The Application of ICP-MS to theUS EPA Contract Laboratory Program,PerkinElmer (1989).

MS-123 J. Allibone, E. Fatemian and P.J.Walker, Determination of Mercury inPotable Water by ICP-MS Using Gold asa Stabilising Agent, J. Anal. At. Spec-trom. 14, 235-239 (1999).

MS-99 T.W. May, R.H. Wiedmeyer, W.G.Brumbaugh and C.J. Schmitt, The Deter-mintation of Metals in Sediment PoreWaters and In 1N HC1-Extracted Sedi-ments by ICP-MS, At. Spectrosc. 18(5),133 (1997).

MS-98 R.E. Wolf, Analysis of Lead (Pb)in Antacids and Calcium Compoundsfor Proposition 65 Compliance, At.Spectrosc. 18(6), 169 (1997).

MS-95 R.E. Wolf and Z.A. Grosser,Overview and Comparison of ICP-MSMethods for Environmental Analyses,At. Spectrosc. 18(5), 145 (1997)

MS-90 R. Wolf and Z.A. Grosser, MethodDevelopment Strategies for ICP-MS, Am.Envir. Lab. (February, 1997).

MS-64 R. Thomas and K. Foster, Relyingon ICP-MS for Routine Analysis, Envi-ronmental Lab. (Feb/March 1994).

MS-45 P. Goergen, I. Murshak, P.Roettger, and V. Murshak, ICP-MSAnalysis of Toxicity CharacteristicLeaching Procedure Extract, At. Spec-trosc. 13, 1 (1992).

ICP MASS SPECTROMETERY:BIOLOGICAL / CLINICAL

ICP MASS SPECTROMETRY:LASER SAMPLING

MS-97 R.E. Wolf, C. Thomas and A.Bohlke, Analytical Determination ofMetals in Industrial Polymers by LaserAblation ICP-MS, Applied Surface Sci-ence. 127-129, 299-303 (1998).

MS-52 E. Denoyer, SemiquantitativeAnalysis of Environmental Materials by

Laser Sampling ICP-MS, J. Anal. At.Spectrom. 7, 1183 (Dec. 1992).

MS-25 M. Broadhead and R. Broadhead,Laser Sampling ICP-MS: Semiquantita-tive Determination of 66 Elements inGeological Samples, At. Spectrosc. 11, 6(1990).

MS-101 L. Halicz, M. Bar-Matthews, A.Ayalon and A. Kaufman, Determinationof Low Concentrations of U and Th inCarbonate Rocks Using FI-ICP-MS, At.Spectrosc. 18(6), 175 (1997).

MS-100 F. McElroy, A. Mennito, E.Debrah and R. Thomas, Uses and Appli-cations of ICP-MS in the PetrochemicalIndustry, Spectroscopy. 13(2), 42-53(1998).

MS-92 L. Halicz, I. Gavrieli and E. Dorf-man, On-line Method for ICP Mass Spec-trometric Determination of Rare EarthElements in Highly Saline Brines, J.Anal. At. Spectrom. 11, 811-814 (1996).

MS-85 A. Stroh, F. Bea and P.G. Mon-tero, Ultratrace-Level Determination ofRare Earth Elements, Thorium, and Ura-nium in Ultramafic Rocks by ICP-MS,At. Spectrosc. 16(1), 7 (1995).

19

MS-103 O. Mestek, M. Suchanek, Z.Vodickova, B. Zemanova and T. Zima,Comparison of the Suitability of VariousAA Techniques for the Determination ofSelenium in Human Whole Blood, J.Anal. At. Spectrom. 12, 85-89 (1997).

MS-93 A. Lorber, Z. Karpas and L. Hal-icz, FI Method for Determination of Ura-nium in Urine and Serum by ICPMS,Anal. Chim. Acta 334, 295-301 (1996).

MS-88 U. Völlkopf, Rapid MultielementAnalysis of Urine, At. Spectrosc. 16(1),19 (1995).

MS-67 A. Stroh, P. Brueckner, and U.Völl-kopf, Multielement Analysis ofWine Samples Using ICP-MS, At. Spec-trosc. Vol 15, No 2 (1994).

MS-65 A. Stroh, Determination of Pb and Cd in Whole Blood Using IsotopeDilution ICP-MS, At. Spectrosc. Vol 14,No. 5 (1993).

MS-38 B. Casetta, M. Roncadin, G. Mon-tanari and M. Furlanut, Determination ofPlatinum in Biological Fluids by ICP-MS, At. Spectrosc. 12, 3 (1991).

MS-33 B. Ting and M. Janghorbani, ICP-MS for Stable Isotope Tracer Investiga-tion, Microchim. Acta 3, 315 (1989).

ICP MASS SPECTROMETERY:BIOLOGICAL / CLINICAL(cont’d)

MS-69 M. Hollenbach, J. Grohs, S.Mamic, M. Koft, and E Denoyer, Deter-mination of Technetium 99, Thorium230 and Uranium 234 in Soils by ICP-MS Using Flow Injection Preconcentra-tion, J. Anal. At. Spectrom. Vol. 9 (Sep.1994).

MS-59 A. Stroh and U. Völlkopf, Effectsof Ca on Instrument Stability in theTrace Element Determination of Ca-RichSoils Using ICP-MS, At. Spectrosc. 14(3),(May/June 1993).

MS-49 A. Stroh, Analysis of Rare EarthElements in Natural Waters by ICP-MS, At. Spectrosc. 13, 3 (1992).

MS-27 B. Casetta, A. Giaretta, and G.Mezzacasa. Determination of Rare Earthand other Trace Elements in Rock Sam-ples by ICP-MS, At. Spectrosc. 11, 6(1990).

ICP MASS SPECTROMETRY:GEOCHEMICAL

MS-63 E. Denoyer and Q. Lu, Charateri-zation of Operating Parameters in FlowInjection ICP-MS, At. Spectrosc. Vol. 14(6), (1993).

MS-58 E. Denoyer, A Stroh, QinghongLu, High Sample Throughput withRapid Sampling Flow Injection ICP-MS,At. Spectrosc. Vol. 14(2), (1993).

MS-121 J.W. Lam and R.E. Sturgeon,Detection of As and Se in Seawater by FIVapor Generation ETV-ICP-MS, At.Spectrosc. 20(3), 79 (1999).

MS-104 S.N. Willie, Y. Iida and J.W.McLaren, Determination of Cu, Ni, Zn,Mn, Co, Pb, Cd, and V in Seawater UsingFlow Injection ICP-MS, At. Spectrosc.19(3), 67 (1998).

ICP MASS SPECTROMETRY:FLOW INJECTION ANDHYDRIDE GENERATION

FAR-01 A. Stroh, U. Völlkopf, E. Denoy-er, Qinghong Lu, Optimization and Useof Flow Injection Vapor Generation ICP-MS, FIAS Application Report,PerkinElmer.

MS-56 A. Stroh, U. Völlkopf, and E. Denoyer, Analysis of Samples Con-taining High Levels of Dissolved SolidsUsing Microsampling Flow InjectionICP-MS, J. Anal. At. Spectrom. Vol. 7, pp.1201-1205 (Dec. 1992).

MS-40 E. Denoyer and A. Stroh, Expand-ing ICP-MS Capabilities using FlowInjection Techniques, Am. Lab., 54 (Feb-ruary 1992).

20

ICP MASS SPECTROMETRY:ISOTOPE DILUTION / RATIO

D-6065 D.R. Bandura and S.D. Tanner,Effect of Collisional Damping in theDynamic Reaction Cell on the Precisionof Isotope Ratio Measurements, At.Spectrosc. 20(2), 69 (1999).

MS-78 Ludwik Halicz, Yigal Erel, andAlain Veron, Lead Isotope Ratio Mea-surements by ICP-MS: Accuracy, Preci-sion, and Long-Term Drift, At. Spectrosc.17(5), 185 (1996).

MS-74 T. Catterick, H. Handley, and Sh.Merson, Analytical Accuracy in ICP-MSUsing Isotope Dilution and Its Applica-tion to Reference Materials, At. Spec-trosc. 16(6), 229 (1995).

MS-22 H. Longerich, The Application ofIsotope Dilution to ICP-MS, At. Spec-trosc.10, 4 (1989).

EAR-1 S. Beres The Analysis of Semi-conductor Grade Hydrochloric Acid byETV-ICP-MS, EAR-1. The first ETV-ICP-MS Application Report.

L-1587 R. D. Ediger and S. A. Beres, The Role of Chemical Modifiers in AnalyteTransport Loss Interferences with Elec-trothermal Vaporization ICP-Mass Spec-trometry, Spectrochim. Acta 47B, 907(1992).

MS-112 L. Yu, S.R. Koirtyohann, M.L.Rueppel, A.K. Skipor and J.J. Jacobs,Simultaneous Determination of Alu-minium, Titanium and Vanadium inSerum by ETV-ICPMS, J. Anal. At. Spec-trom. 12, 69-74 (1997).

MS-107 S. Willie, D. C. Gregoire and R.E.Sturgeon, Determination of Inorganic

and Total Mercury in Biological Tissuesby Electrothermal Vaporization ICPMS,The Analyst. 122, 751-754 (1997).

MS-80 Direct Determination of TraceMetals in Sea-water Using Electrother-mal Vaporization ICPMS, J. Anal. At.Spectrom. 11, 549-553 (1996).

MS-76 D.W. Hastings, S.R. Emerson, andB.K. Nelson, Determination of PicogramQuantities of Vanadium in Calcite andSeawater by Isotope Dilution ICP-MSwith Electrothermal Vaporization, Anal.Chem. 68, 371 (1996).

MS-62 S. Beres, R. Thomas. and E.Denoyer, The Benefits of ElectrothermalVaporization for Minimizing Interfer-ences in ICP-MS, Spectroscopy Vol 9,No. 1 (Jan. 1994).

ICP MASS SPECTROMETRY:SEMICONDUCTOR

D-6063 D.S. Bollinger and A.J. Schleis-man, Analysis of High Purity AcidsUsing a Dynamic Reaction Cell ICP-MS,At. Spectrosc. 20(2), 60 (1999).

D-6062 U. Völlkopf, K. Klemm and M.Pfluger, The Analysis of High PurityHydrogen Peroxide by Dynamic Reac-tion Cell ICP-MS, At. Spectrosc. 20(2), 53(1999).

MS-105 G. Settembre and E. Debrah,Using VPD ICP-MS to Monitor TraceMetals on Unpatterned Wafer Surfaces,Micro. June (1998).

MS-94 R.A. Aleksejczyk and D. Gibilis-co, Determining Critical Trace Elementsin High-purity Phosphoric Acid, Micro.September, (1997).

ICP MASS SPECTROMETRY:ELECTROTHERMAL VAPORIZATION

ICP MASS SPECTROMETRY:FLOW INJECTION ANDHYDRIDE GENERATION(cont’d)

21

MS-73 E. Debrah, S.A. Beres, T.J. Gluo-denis, Jr., R.J. Thomas, and E.R. Denoyer,Benefits of a Microconcentric Nebulizerfor the Multielement Analysis of SmallSample Volumes by ICP-MS, At. Spec-trosc. 16(5), 197 (1995).

MS-61 M. Cawthorne, H. Enemoh, Devel-oping Highly Reliable Analytical Sys-tems for sub 1 ppb analysis of ElectronicProcess Chemicals, Proceedings of the1992 Micro-contamination Conference.

MS-87 S.D. Tanner, M. Paul, S.A. Beresand E. Denoyer, The Application of ColdPlasma Conditions for the Determina-tion of Trace Levels of Fe, Ca, K, Na, andNi by ICP-MS, At. Spectrosc. 16(1), 16(1995).

MS-86 E.R. Denoyer, P. Bruckner and E.Debrah, Determination of Trace Impuri-ties in Semiconductor-Grade Hydrofluo-ric Acid and Hydrogen Peroxide byICP-MS, At. Spectrosc. 16(1), 12 (1995).

MS-77 T. Jacksier, T.J. Gluodenis, Jr., andR.J. Thomas, Determining Critical TraceElements in High-Purity HydrochloricAcid by ICP-MS Alone. PerkinElmer(1996).

ICP MASS SPECTROMETRY:SEMICONDUCTOR (cont’d)

MS-102 H. Zhou and J. Liu, The Deter-mination of Rare Earth Elements inPlant Food by ICP-MS, At. Spectrosc.18(6), 192 (1997).

MS-96 H. Zhou and J. Liu, The Simulta-neous Determination of 15 Toxic Ele-ments in Foods by ICP-MS, At.Spectrosc. 18(4), 115 (1997).

MS-26 R. Roehl and M. Alforque, Comparison of Determination of Hexa-valent Chromium by Ion Chromatogra-phy ICP-MS with Colorimetric Methods,At. Spectrosc. 11, 6 (1990).

MS-24 H. Klukenberg, S. Van de Wal, J.Frusch, L. Terwint, and T. Beeren, Deter-mination of Tellurium Compounds byLiquid Chromatography ICP-MS, At.Spectrosc. 11, 5 (1990).

MS-133 C.F. Harrington, S. Elahi, P. Pon-nampalavanar and T.M. D’Silva, A Proto-col For the Multielemental Analysis ofTrace Metals in Food Samples by FICoupled to ICP-MS, At. Spectrosc. 20(5),174 (1999).

MS-132 S.A. Baker, D.K. Bradshaw andN.J. Miller-Ihli, Trace Element Determi-nations in Food and Biological SamplesUsing ICP-MS, At. Spectrosc. 20(5), 167(1999).

MS-126 P. Zbinden and D. Andrey,Determination of Trace Element Conta-minants in Food Matrices Using aRobust, Routine Analytical Method forICP-MS, At. Spectrosc. 19(6), 214 (1998).

MS-122 X. Wang, Z. Zhuang, D. Sun, J.Hong and X. Wu, Trace Metals in Tradi-tional Chinese Medicine: A PreliminaryStudy Using ICP-MS for Metal Determi-nation and As Speciation, At. Spectrosc.20(3), 86 (1999).

MS-111 E.H. Larsen, G. Pritzl and S.H.Hansen, Speciation of Eight ArsenicCompounds in Human Urine by High-performance LC with ICP Mass Spectro-metric Detection Using Antimonate forInternal Chromatographic Standardiza-tion, J. Anal. At. Spectrom. 8, 557-663(1993).

MS-125 R. Ritsema, L. Dukan, R.R.Navarro, W. van Leeuwen, N. Oliveira, P.Wolfs and E. Lebret, Speciation ofArsenic Compounds in Urine by LC-ICPMS, Applied Organometallic Chemistry.12, 591-599 (1998).

MS-124 B.P. Jackson and W.P. Miller,Arsenic and Selenium Speciation inCoal Fly Ash Extracts by Ion Chro-matography – ICP-MS, J. Anal. At. Spec-trom. 13, 1107-1112 (1998).

ICP MASS SPECTROMETRY:FOOD

ICP MASS SPECTROMETRY:SPECIATION

22

MS-91 L. Moens, T. DeSmaele, R. Dams,P. Van Den Broeck and P. Sandra, Sensi-tive, Simultaneous Determination ofOrganomercury, -lead, and -tin Com-pounds With Headspace Solid PhaseMicroextraction Capillary GC Com-bined with ICP-MS, Anal. Chem. 69(8),1604-1611 (1997).

MS-26 R. Roehl and M. Alforque, Comparison of Determination of Hexa-valent Chromium by Ion Chromatogra-phy ICP-MS with Colorimetric Methods,At. Spectrosc. 11, 6 (1990).

MS-24 H. Klukenberg, S. Van de Wal, J.Frusch, L. Terwint, and T. Beeren, Deter-mination of Tellurium Compounds byLiquid Chromatography ICP-MS, At.Spectrosc. 11, 5 (1990).

ICP MASS SPECTROMETRY:SPECIATION(cont’d)

23

SECTION 3 PerkinElmer Atomic Spectroscopy Instrumentation

PerkinElmer offers a complete line of atomic spectroscopy instrumentation designed to suitany analytical laboratory needs and budget. The following section provides a broad overviewof PerkinElmer systems, techniques, and accessories. For more detailed information contactyour local PerkinElmer representative, or fill out and mail/fax the attached business replycard, visit our website at: www.perkinelmer.com, email us at: [email protected], Tel: (+1) 203-762-4000 or 800-762-4000, or Fax (+1) 203-762-4228.

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The AAnalyst™ 100 is a double-beam spec-trometer with built-in keyboard control, a sin-gle lamp mount, automated wavelength andslit selection. The AAnalyst 100 includes ahigh light-throughput, double-beam opticalsystem with a dual-blazed grating monochro-mator for optimized performance over theentire AA wavelength range. Front-surfacedreflecting optics with protective coatings forimproved UV reflectivity and corrosion resis-tance are used throughout. The optical sys-tem is fully protected using covers with aunique system of tongue and groove closuresfor further protection against dust and corro-sive atmospheres.

The AAnalyst 100 AA spectrometer is avail-able in three configurations: (a) without back-ground corrector and motorized lamp turret,(b) with background corrector only, or (c) withboth background corrector and motorizedlamp turret. Three additional configurationsare available without a burner system for ded-icated use with graphite furnace (AA WinLabrequired) or hydride or Hg determinations.These determinations are (a) with backgroundand without a motorized lamp turret, (b) with-out background correction and with a motor-ized lamp turret, and (c) with backgroundcorrection and a motorized lamp turret.

All parameters, except burner adjustmentsand gas flows, are controlled via a built-inkeyboard and two-line alphanumeric vacuumfluorescent display which prompts the userthrough system setup for flame and furnacedeterminations and displays analyticalresults and error conditions. Method storage

is included for flame, furnace, and flow injec-tion methods. The AAnalyst 100 can alsodirectly access and select the stored methodsin the FIAS™-100 and FIAS™-400 FlowInjection Systems.

The AAnalyst 100 provides readings inemission intensity, absorbance, or concentra-tion. A built-in parallel printer connection isprovided for recording analytical results, cal-ibration curves, and peak profiles.

The AAnalyst 100 uses the PerkinElmerpremix burner system. The burner systemincludes a high-strength mixing chamber forchemical resistance, an adjustable high-preci-sion nebulizer, and an all-titanium 10-cm air-acetylene burner head. Various optionalnebulizers provide for maximum flexibility,permitting the analysis of a wide variety ofsample matrices. The entire burner assemblyis made for quick removal using the quickdisconnect mounting system.

The AAnalyst 100 gas controls include flowcontrol for air, nitrous oxide, and acetyleneand automatic flame ignition. Automaticsequencing of gases when lighting or extin-guishing a nitrous oxide-acetylene flame(even in the event of power failure) is provid-ed, as are burner head, nebulizer/end cap,flame sensing, fuel and oxidant pressuresensing, flame shield temperature, liquidlevel in drain vessel and a burner drain inter-lock. Purging of the gas box is controlledthrough the keyboard. The AAnalyst 100 alsoincludes a single lamp mount, operatinginstructions, and selected spare parts.

ATOMIC ABSORPTION:FLAME / FURNACE

AAnalyst 100 Atomic Absorption Spectrometer

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and factoring. The AA WinLab softwarealso includes an on-line, context-sensitivehelp mode as well as automatic qualitycontrol features such as check sampleswith user-specified tolerance ranges andcourses of action if the results are outsidethe allowable ranges. AA WinLab softwareallows data files to be transferred to otherWindows-based software providing ad-vanced, customized report generationcapabilities. Both alphanumeric andgraphic data may be printed with anoptional printer, which is required but notsupplied, for hard copy printout.

environment. The computer provides sin-gle keyboard control of wavelength, slitwidth, and gas flows. When used withPerkinElmer Lumina™ hollow cathodelamps, the AAnalyst 300 will automatical-ly align the lamp and set lamp current,wavelength, and slit settings.

• The AAnalyst 300 uses the PerkinElmerpremix burner system, which includes ahigh-strength mixing chamber for chemi-cal resistance, an adjustable high-precisionnebulizer, and an all-titanium 10-cm air-acetylene burner head. Various optionalnebulizers provide for maximum flexibili-ty permitting the analysis of a wide varietyof sample matrices.

• The entire burner assembly is made forquick removal using the quick disconnectmounting system. Automatic sequencingof gases when lighting or extinguishing anitrous-oxide-acetylene flame (even in theevent of a power failure) is provided, as areburner head, nebulizer/end cap, flamesensing, fuel and oxidant pressure sensing,flame shield temperature sensing, liquidlevel in drain vessel sensing, and a burnerdrain interlock.

• The AAnalyst 300 and its accessories arefully computer-controlled using the pow-erful AA WinLab™ software. AA WinLaboffers unmatched versatility and simplici-ty, GLP and GALP compliance and built-indiagnostics for performance verification.With AA WinLab data can be transferred toother Windows-based software providingadvanced, customized report generationcapabilities. Single-element and multi-ele-ment method files and analytical data filesmay be stored for later recall and use. Filesmay also be stored on floppy disks forarchival or back-up purposes. Graphic datamay also be stored and recalled for latermanipulation, including replot, scaling,

ATOMIC ABSORPTION:FLAME / FURNACE

AAnalyst 300 Atomic Absorption Spectrometer

HGA-850 Graphite Furnace for theAAnalyst 300 AAS

The HGA®-850 graphite furnace is the latestin advanced furnace designs which providesunparalleled performance, flexibility, ease-of-use, and advanced regulatory compliance for use with the AAnalyst 300 atomic absorp-tion spectrometer. It is fully computer-controlled, offers the best possible detectionlimits down to the pg range, sample con-sumption as low as a few µL, highest freedomfrom interferences, and proven reliability.

The AAnalyst™ 300 is designed forcost-effective, automatic flame,graphite furnace, FIAS, and mer-cury/hydride analyses. Standard fea-tures include complete systemcontrol from a single keyboard, amotor-driven 6-lamp turret for fullyautomatic multielement analyses,built-in deuterium arc backgroundcorrector, and the PerkinElmer burn-er with automatic, computer-pro-grammed flame gas control.• The AAnalyst 300 includes a high

light throughput, double-beamoptical system with a dual-blazedgrating monochromator for opti-mized performance over theentire AA wavelength range.Front-surfaced, reflecting opticswith protective coatings forimproved UV reflectivity and cor-rosion resistance are usedthroughout. The optical system isfully protected using covers witha unique system of tongue andgroove closures for further protec-tion against dust and corrosiveatmospheres.

• Full control of the spectrometerand optional accessories such asFlow Injection Systems,Flame/FIAS Autosamplers,HGA®-850 Graphite Furnace andFurnace Autosampler is via anindustry-standard personal com-puter (PC) using PerkinElmer AAWinLab software running underthe Microsoft Windows operating

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For the first time in AA history, the burnersystem for flame AA, the graphite furnace(HGA or THGA), either deuterium or Zee-man-effect background correction, and evenpower supplies for hollow cathode lamps(HCLs) and electrodeless discharge lamps(EDLs) are integrated in one instrument hous-ing. In addition, the AAnalyst 700 and 800include automated motorized flame–furnaceatomizer exchange, offering the full dynamicrange and versatility of AA—percent topicograms—under software control.

The AAnalyst 600, 700, and 800 instru-ments feature high-performance optics with acustomized solid-state detector from Hama-matsu Photronics K.K., the world leader inphoto detection technology. The detector isoptimized for high UV quantum efficiency,and is more efficient over the entire wave-length range than a conventional photomulti-plier. This optical system provides theAAnalyst 600, 700 and 800 with maximumlight throughput and exceptional signal-to-noise ratios. That translates directly intoimproved detection limits and precision.

The AAnalyst 600, 700 and 800 use state-of-the-art enhanced power control circuitry toprovide a furnace atomization heating rategreater than 2000 °C that is independent overa wide range of input line voltages (190-250V). The result is the highest degree of free-

The AAnalyst™ 600, 700, and 800AAS are highly integrated, high-per-formance atomic absorption spec-trometers.

The AAnalyst 600 is equippedwith a top-of-the-line transversely-heated THGA™ graphite furnace AAwith longitudinal Zeeman-effectbackground correction.

The AAnalyst 700 is equippedwith high-performance flame AAand classic HGA® graphite furnaceAA with deuterium background cor-rection.

The AAnalyst 800 uses the samefurnace as the AAnalyst 600, butalso includes a high-performanceflame AA.

ATOMIC ABSORPTION:FLAME / FURNACE

AAnalyst 600/700/800 Atomic Absorption Spectrometers

dom from interferences and the most repro-ducible characteristic mass values of any fur-nace available---winter and summer, anytime.

The high-performance flame AA of theAAnalyst 700 and 800 contains a wide vari-ety of performance, safety and ease of use fea-tures including automated burner positionoptimization and full safety interlocks. TheTotalFlow™ gas control system maintains gasflows at set levels even when subjected tooutside variations, such as nebulizer adjust-ment providing exceptional stability and per-formance.

The AAnalyst 600, 700, and 800 and theiraccessories are fully computer-controlledusing the powerful AA WinLab™ software.AA WinLab offers unmatched versatility andsimplicity, GLP and GALP compliance andbuilt-in diagnostics for performance verifica-tion. With AA WinLab data can be transferredto other Windows®-based software providingadvanced, customized report generationcapabilities.

The AS-800 Autosampler is a computer-controlled high-precision system that is stan-dard with the AAnalyst 600, 700 and 800.This autosampler can accommodate up to148 samples, standards or modifiers withtrue random sampling. Digital, micro-steppermotor-driven pipette motors provideunmatched accuracy and reproducibility.

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• Zeeman-effect background correction pro-vides the exceptional correction accuracyrequired with ultratrace GFAA analyses.The use of a longitudinal "AC" Zeemansystem further enhances system perfor-mance by eliminating the need for a polar-izer or other energy-reducing componentsin the optical system.

• A Transversely Heated Graphite Atomizer(THGA™) with an integrated L'vov plat-form is an integral part of the SIMAA 6000.This advanced furnace design provides auniform temperature over the entiregraphite tube length to minimize tempera-ture gradients and condensation effects.With the THGA, all graphite furnace ele-ments can be determined using the L'vovplatform and other key components of theStabilized Temperature Graphite Furnace(STPF) technology that provides nearlyinterference-free GFAA analysis.

• An 80-position AS-72 Furnace Autosam-pler is standard equipment with theSIMAA 6000. All autosampler parametersare set and controlled via the system com-puter and software.

The SIMAA™ 6000 AAS is a totally automat-ed simultaneous multi-element analysis sys-tem for graphite furnace atomic absorption.The SIMAA 6000 is a compact benchtop AAinstrument, including all spectrometer andfurnace components in a single unit for mini-mum space requirements. Full control of thespectrometer, graphite furnace, autosamplerand other accessories is via an industry stan-dard personal computer (PC) usingPerkinElmer AA WinLab™ software runningunder the Microsoft® Windows® operatingenvironment. • The SIMAA 6000 incorporates the unique

PerkinElmer Tetrahedral Echelle Polychro-mator (TEP) optical system for simultane-ous multi-element analysis. Wavelengthrange is from 190-860 nm on a two-dimen-sional focal plane. Scanning operation isavailable for automatic access of any wave-length on the focal plane. The detector is acustom-made monolithic solid-state typewith 61 high-performance photodiodesallowing for the simultaneous determina-tion of up to six elements. Built-in lamppower supplies are available for both thePerkinElmer hollow cathode lamps andthe PerkinElmer System 2 electrodelessdischarge lamps.

ATOMIC ABSORPTION:GRAPITE FURNACE

SIMAA 6000 Simultaneous Multi-Element Graphite Furnace AA Spectrometer

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Transversely heated graphitetube with integrated L’vov platform.

GRAPHITE FURNACE ATOMIC ABSORPTION SYSTEMS

Graphite furnace atomic absorption (GFAA)allows the determination of over 40 elementsin microliter sample volumes with detectionlimits typically 100 to 1000 times better thanthose of flame atomic absorption.PerkinElmer has been acknowledged as theleader in GFAA since it introduced the firstcommercially available graphite tube furnacein 1970.Optimum performance with GFAA requiresmore than merely replacing a burner systemwith a graphite furnace. The spectrometermust be optimally designed to meet the spe-cial requirements of the furnace. The opticalsystem must provide maximum lightthroughput without viewing the incandes-cent inner surfaces of the heated furnace.Instrument electronics must be able torespond accurately to the fast, transient sig-nals generated with furnace sampling and tocorrect for minor variations in the baselinesignal. Background correction systems mustbe able to accurately compensate for the high-er and more complex background absorptionseen with many sample types in the furnace.

The furnace must also be designed to provide optimum analytical conditions. Thesample must be atomized into a controlled,thermally stable environment to preventpotential interferences and analytical error.

• Transversely Heated Graphite Tube(THGA): L’vov Platform The preferred means of achieving a ther-mally stable environment is through theuse of transversely applied maximumpower heating and a device known as theL’vov platform. The function of the plat-form is to delay the vaporization and atom-ization of the sample until the furnaceatmosphere has reached equilibrium con-ditions.

In addition to the above requirements,all graphite components of the furnacemust be inert, long-lived, and of consis-tently high quality to ensure long-termreproducibility.

• STPF ConceptPerkinElmer has included these featuresand more in its THGA™ and HGA®

graphite furnace systems. Using anadvanced concept called the StabilizedTemperature Platform Furnace (STPF),PerkinElmer GFAA systems provide near-ly interference-free analyses.

PerkinElmer AA spectrometers withZeeman-effect background correction,combined with PerkinElmer STPFgraphite furnaces represent the state of theart in graphite furnace atomic absorptionanalysis.

Longitudinal Zeeman-effect background correction.

BACKGROUND CORRECTION FOR FLAMEAND GRAPHITE FURNACE AA

• Continuum source background correctioncan accurately compensate for almost allbackground problems encountered withflame AA. It is also adequate for many ofthe background problems encounteredwith graphite furnace AA (GFAA). Howev-er, GFAA can generate higher levels andmore spectrally complex backgroundabsorption than is seen with flame AA. Inthose instances, Zeeman-effect backgroundcorrection is the preferred compensationtechnique.

• Zeeman-effect background correction canbe used at very high background absorp-tion levels, can accurately correct for struc-tured background in most cases, and caneven eliminate some types of spectralinterferences encountered when using acontinuum source background correctionsystem. In addition, Zeeman-effect back-ground correction provides true double-beam operation while using only a single,time-shared light path.

Zeeman-effect background correctiontakes advantage of the fact that the absorp-tion profile for an element splits into sev-eral components in the presence of a

strong magnetic field. For most elements,the central (pi) component occurs at theabsorption wavelength for the element.The outlying components (called sigmacomponents) are usually sufficiently sepa-rated from the pi component that little orno atomic absorption occurs at these wave-lengths.

• In state-of-the-art longitudinal “AC” Zee-man systems, the graphite furnace is posi-tioned longitudinally relative to themagnetic field. The combined atomic andbackground absorption is measured whilethe magnetic field is off. The detector seesonly the background absorption when themagnetic field is on as the pi component isnot detected. The difference between thetwo signals is the corrected atomic absorp-tion signal. The major advantages of thelongitudinal “AC” Zeeman system are thatit measures background absorption atexactly the wavelength that it measuresatomic absorption and it does not requirethe use of a polarizer to eliminate the picomponent, thereby providing higher lightthroughput and improved analytical per-formance.

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GRAPHITE FURNACEAUTOSAMPLERS FOR AA

PerkinElmer graphite furnace autosamplersoffer two distinct advantages over manualsample introduction: automation andimproved performance. A complete set ofsamples and standards can be run totallyunattended. When used with today’sadvanced AA spectrometers, furnaceautosamplers can prepare working standardsfrom a concentrated stock standard, add the

proper amounts of matrix modifiers to bothsamples and standards, and even performanalyses using the method of additions—allautomatically and totally under the operator’scontrol. In addition to the obvious advantagesof automation, furnace autosamplers alsoguarantee accurate, reproducible sampleintroduction into the furnace for the best pos-sible analytical results.

THE DUAL OPTION BURNER SYSTEM FOR AA

The burner system is the heart of any atomicabsorption spectrometer. The performanceand durability of PerkinElmer's Dual OptionBurner System, which is supplied with allPerkinElmer atomic absorption instruments,have been proven in thousands of laborato-ries worldwide.

The Dual Option Burner System is con-structed of high strength, corrosion-resistantmaterials to provide safe operation and dura-bility. For optimum performance, three gasflows are used. The primary oxidant flow isdirected through the nebulizer and is fixed toensure a constant sample uptake rate andoptimum precision. A separate auxiliary oxi-dant flow is used to vary the total oxidant foroptimized performance with all sample andflame types. Fuel flow is also separately con-trolled, and fuel and oxidant are mixed inter-

nally in the burner chamber for maximumsafety. Burner heads supplied with the DualOption Burner System are made entirely oftitanium for maximum corrosion resistanceand optimum heat dissipation.

PerkinElmer AA instruments include ahigh-precision nebulizer. Various optionalnebulizers provide for maximum flexibilitypermitting the analysis of a wide variety ofsample matrices. An optional high-sensitivitynebulizer is available for those applicationsrequiring the utmost in sensitivity and detec-tion limits. All PerkinElmer AA nebulizersare adjustable, so that all types of samplematrices--aqueous or organic, acids or bases,dilute or concentrated--can be analyzedunder optimum conditions with maximumsignal stability and minimal carryover.

LUMINA HOLLOW CATHODE LAMPS (HCL) AND ELECTRODELESS DISCHARGE LAMPS (EDL)FOR AA INSTRUMENTS

PerkinElmer Lumina™ hollow cathodelamps for single-element and multielementdeterminations, come in two series: coded,cableless, and coded with cable. The coded,cableless series is designed for use withPerkinElmer’s AAnalyst Models 100/300/600/700/800 of instruments. The coded with cableseries includes a cable that allows Luminalamps to be recognized by the followinginstruments: Models SIMAA 6000, 5100,5100 PC, 4110 ZL, 4100, 4100 ZL, 3300, 2100,and 1100(B). With the appropriate adaptercable, Lumina hollow cathode lamps can alsobe used with all earlier PerkinElmer AA spec-trometers which do not have the automaticcode reading capability.

Where greater intensity is required for im-proved analytical performance, PerkinElmer’sEDL System 2 provides 5 to 20 times the inten-sity of conventional hollow cathode lamps.PerkinElmer System 2 EDLs also offer greaterspectral purity for many elements forenhanced sensitivity and extended linearworking ranges. They are also exceptionallylong-lived. System 2 EDLs fit all PerkinElmerlamp mounts and turrets. Because EDLs havedifferent power requirements than HCLs, anaccessory power supply is required to useEDLs with most instruments. (A System 2EDL Power Supply is built into the AAnalyst600, AAnalyst 700, AAnalyst 800, SIMAA6000 and 4110 ZL spectrometers.)

introduction with automatic intelligent selec-tion of dilution ranges. The AutoPrep 50 alsoautomatically prepares multiple standardsfrom a single stock solution and is fully con-trolled with AA WinLab software.

The AutoPrep 50 permits truly automatedflame atomic absorption spectroscopy. Withautomatic intelligent on-line dilution capabil-ities, the AutoPrep 50 increases laboratoryproductivity by eliminating the time-consum-ing task of manual sample dilution. TheAutoPrep 50 offers fully automatic sample

AUTOPREP 50 AUTOMATICDILUTION SYSTEM

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• Safe, stable, robust plasmaThe revolutionary, patented Optima 4000solid-state RF power supply providesexceptional ruggedness and reliability. Inaddition, the solid-state design creates anexceptionally compact power supply topreserve valuable bench space. Free-run-ning 40 MHz operation allows automaticoptimization with all sample matrices andsolvents.

• Solid and dependableThe Optima 4000 shatters the myth thatstate-of-the-art instruments require dedi-cated climate-controlled laboratories and alot of pampering. The optical system isenclosed in a temperature-controlled hous-ing, ensuring excellent performance in anormal laboratory environment. The sys-tem has no moving parts and requires min-imal maintenance. Plus, the unique opticalcompartment ensures exceptional long-and short-term wavelength stability forgreater accuracy, more repeatable resultsand improved productivity with less timespent on routine system calibration.

• SCD means high performance The exclusive, patented high-performance,Segmented-array Charge-coupled Device(SCD) detector, provides unparalleled per-formance required for complex matrices,including ultratrace and multi-elementsamples. With over 2,500 systems installed,the Optima solid-state detector has thewavelength flexibility to successfully com-plete thousands of applications, rangingfrom drinking water to precious metals

Optima 4000 DV SCD SeriesOnly the Optima 4000™ DV Seriesof ICP systems has the optimizeddesign essential to ensuring accura-cy, improving method development,and consistently delivering the cor-rect answer.

The Optima 4300™ DV ICP-OESoffers the performance required tomaximize productivity. While othersimultaneous ICPs claim "speed,"only the Optima 4000 has the opti-mized design required to ensureaccuracy, improve method develop-ment, and consistently deliver thecorrect answer. The system is idealfor laboratories with moderate toheavy loads of difficult samples.• Improved productivity

The Optima 4000 DV series sig-nificantly increases samplethroughput. It can measure over73 elements in seconds and runmore samples per hour at a lowercost per analysis than any othersystem. Sample throughput ismaximized in all areas of theinstrument from the sample intro-duction system to the uniqueautomated sample introductionmodes. The software offers specif-ic productivity tools; such asSmartRinse™, which customizesrinse times based on element con-centrations in each sample.

ICP EMISSION

With the introduction of these new Optima™ ICP systems and software, PerkinElmer has completely redefined the ICP marketplace. You can get all of the benefits of solid-state detector systems in either a scanning CCD system or in an SCD system.

and everything in between. Additionally,the Optima 4000 offers the industry’s onlyfive-year detector warranty. The system isavailable in multiple configurations tomeet your needs. For example, the Optima4300 model is the only ICP systemdesigned with two solid-state detectors tomaximize light throughput and resolutionat all wavelengths.

• Easy access, easy to use The large, easily accessible sample com-partment is environmentally controlled toensure fast equilibration, maximum sam-pling system stability and superior perfor-mance. The torch includes a trueno-tools-required, quick-change mount.Anyone can perform routine torch mainte-nance, change sample introduction sys-tems, and be back analyzing samples inminutes.

• Lowest detection limits, broadest workingrangeMethod-controlled dual-viewing of theplasma allows the widest working rangepossible. Axial viewing allows trace mea-surements because it provides a longeremission path for increased sensitivity andlower background levels. At the same time,radial viewing permits percentage concen-tration measurements. The Optima 4300offers the lowest detection limits and thegreatest concentration range in a singlesystem. You can even determine ultratraceand percentage concentration levels inyour samples in the same run, automati-cally, without the time-consuming hunt foralternative wavelengths.

Optima 4000 DV SCD Series ICP

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• Accurate and reliable The Optima 2000 features a high-speed,high-resolution double monochromatorand solid-state detector. High resolutionyields reduced interferences and improvedaccuracy. Limited component movementand Dynamic Wavelength Stabilizationensure exceptional wavelength accuracyand reliability. With the optical system’ssuperior light throughput and theunmatched quantum efficiency of thesolid-state detector, the Optima 2000 givesyou exceptional detection limits quicklyand routinely.

• Dynamic wavelength stabilization. Sincethe system continually references a neonbackground, the Optima 2000 is faster,more precise and stable than conventionalsystems that rely on mercury referencesbetween reads. Dynamic Wavelength Sta-bilization (DWS) allows direct on-peakmeasurement, eliminating the need forpeak searches.

tem, increasing lab productivity. The com-pact, benchtop design conserves valuable lab-oratory space.• Rugged, reliable power

The Optima 2000 features a true solid-state, RF power supply to provide excep-tional ruggedness and reliability,eliminating the need for power tubes.Solid-state design makes the power supplyexceptionally compact.

• Widest working rangeMethod-controlled dual-viewing of theplasma delivers the widest working rangepossible, giving the lowest detection limitsand the greatest concentration range in asingle system. Axial viewing allows tracemeasurements because it provides a longeremission path for increased sensitivity andlower background levels. At the same time,radial viewing permits percentage concen-tration measurements. With the Optima2000, trace and percentage concentrationlevels can be automatically determined inthe same run without having to search forunfamiliar alternative wavelengths.

• Shear gas advantageTo eliminate interferences caused by thecooler regions in the plasma gas, the Opti-ma 2000 uses a unique compressed airshear gas system to remove the cool tail-plume of the plasma. This provides amaintenance-free, reliable system com-pared to alternative methods, which useexpensive argon gas and water cooling andare prone to clogging

Optima 2000 DV Scanning CCD ICP

ICP EMISSION

The Optima 2000 DV Scanning CCD is the newest member of the industry’s most successful family of ICP instruments. AnotherPerkinElmer innovation, where scanning CCD technology results in highest performance and flexibility.

Optima 2000 Scanning CCDThe new Optima 2000™ ScanningCharge-Coupled Device (CCD) ICPsystem brings advanced technologyto the entry-level ICP market. TheScanning CCD detector collects acomplete simultaneous analytespectrum at speeds that far exceedconventional sequential systems.Automatic dual-viewing ensures thelowest detection limits and thewidest working ranges. The Optima2000 is the ideal solution forresearch and quality assurance labo-ratories that have a wide variety ofsamples and lower frequency ofanalysis.

The custom-designed solid-statedetector, solid-state RF power sup-ply and sealed optical system pro-vide both superior performance andenhanced reliability. That reducesoperating costs and, more impor-tantly, ensures that the instrument isavailable when needed. Computer-controlled gas flows and mass-flowcontrol of the nebulizer gas ensureday-to-day reproducibility.

The Optima’s proven 32-bit Win-dows® software, WinLab32™, makesit easy to get up and running in min-utes rather than days. Customizablemethod development enables ana-lysts to quickly configure the sys-

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added even more security features, includ-ing password-controlled access to softwarefunctions.

• Regulatory compliance Whether the regulations are internal or industry- or government-imposed, WinLab32 gives you the tools you need.Built-in compliance features include mul-tiple user-defined quality control (QC)standards, check samples and a selectionof calibration procedures.

• Reporting made easy The WinLab32 report function uses Wiz-ards to guide your customer through theprocess step-by-step. With WinLab32multi-tasking capabilities, your customercan even generate reports while the Opti-ma analyzes the next group of samples.WinLab32 stores all raw analytical data, sopreviously stored data can be reprocessedwith new conditions, eliminating time-consuming process of repeating analyses.

• Seamless data transferWinLab32 can automatically reformatresults for transfer to different programs orcomputers. Simply select the data andsamples and specify the file format. Win-Lab32 can automatically generate a fileconfigured for exporting directly into mostspreadsheet, database and word process-ing programs. Save the file to disk or sendit to any connected device.

Intuitive and flexible control boosts productivityFull-featured WinLab32™ software is easy tolearn and easy to use, yet providesunmatched features and flexibility, control-ling the entire family of Optima ICPs. Operat-ing under powerful Microsoft® WindowsNT®, WinLab32 has all the tools needed toanalyze samples, report and archive data, andensure regulatory compliance. Unlike othersoftware applications that look easy at firstbut lack depth; WinLab32 combines practicalfunctionality with advanced capability,ensuring that the software meets your cus-tomer’s needs now and in the future.• Tools for optimum performance

The unique optical system of the Optima2000 and its exceptional stability allowWinLab32 to include tools previouslyavailable only in high-end simultaneousICP-OES instruments. Features such assimultaneous background correction,inter-element correction (IEC) and multi-component spectral fitting (MSF) signifi-cantly enhance analytical performanceand minimize potential interferences.

• Confidence in your analysisBuilt-in diagnostics check each systemcomponent to verify proper operation.Windows NT is an exceptionally secureoperating environment, and WinLab32 has

WINLAB32 SOFTWARE FORTHE OPTIMA SERIES OF ICP INSTRUMENTS

A typical WinLab32 layout. The analyst determines what is displayed.

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ICP MASS SPECTROMETRY ELAN 6100 ICP-MSThe ELAN® 6100 ICP-MS simplifies ICP-MSby providing an easy-to-use, easy-to-maintaintool for routine ultra-trace level analysis. Theproven design of the ELAN 6100 ensuresaccuracy, improves method development andconsistently delivers the correct answer,reducing rework and improving productivity.The ELAN 6100 is ideal for environmental,clinical, geochemical and general testing lab-oratories with moderate to heavy loads ofultra-trace level samples. The ELAN 6100offers the following advantages:• Superior detection limits

The ELAN 6100 performs analyses at theparts-per-trillion level and lower.

• The industry’s only single ion lens makeschanging the exclusive SwiftMount™ ionlens as easy as changing a light bulb. Thelens is also inexpensive, making replace-ment an affordable option.

• The unique AutoLens™ lens adjustmentsystem dynamically adjusts the lens sys-tem to optimize voltage for each element.

• HF-resistant sample introduction systemallows the analysis of corrosive samples.

• Dual-stage detector measures both highand low level analytes simultaneously.

• Rugged construction means the systemwill perform even in the most difficultenvironments with the dirtiest of samples.

• Regulatory complianceThe ELAN 6100 guards against data tam-pering in conformance with the require-ments of regulated industries. Thepowerful quality control system allowsyou to set limits, parameters and standardsbased on U.S. EPA or other quality controlguidelines.

• Ease of use Based on the powerful Windows NT®

operating system, the simple, intuitivesoftware makes ICP-MS accessible tonovices and experts alike.

• Method development made easyThe PathFinder™ guide acts as an on-lineconsultant leading you step-by-stepthrough the method development process.

• Easy maintenance and low cost of owner-shipSystem design makes all maintenance easyto perform. Minimal routine maintenanceand long-lasting consumables help mini-mize operating costs.

• Integrated solutions for every applicationUsing a wide selection of options andaccessories, PerkinElmer can build a com-plete, fully integrated system that fits yourspecific application. The ELAN 6100 isfully compatible with sample introductionaccessories such as the FIAS™-400MS,HGA®-600MS, laser sampling, liquid chro-matography, and ultrasonic and micro-flow nebulizers.

ELAN 6100 ICP-MS and ELAN DRC ICP-MS

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• Chemical Resolution removes interferingpolyatomic or isobaric species from the ionbeam using controlled ion-molecule chem-istry.

• Dynamic Bandpass TuningThe use of a quadrupole inside the reac-tion cell provides the ability to performdynamic bandpass tuning, preventingunwanted side reactions from entering theanalyzer quadrupole where they can causeadditional interferences.

• ICP-MS Plus…The combination of dynamic bandpasstuning and selective reaction chemistryavailable on the ELAN DRC providesunequaled levels of interference suppres-sion. In addition to the standard features ofthe ELAN 6100, the ground-breaking inter-ference reduction capabilities of the ELANDRC provide the most flexible solution fordemanding applications, bringing a newdimension to ICP-MS analysis.

ELAN DRC ICP-MSFor laboratories with demanding applicationsthat extend beyond the capability of conven-tional ICP-MS, the revolutionary ELANDynamic Reaction Cell™ (DRC™) systembrings the speed and sensitivity of ICP-MS tonew and exciting samples. The ELAN DRCeliminates polyatomic interferences, provid-ing unequaled detection limits for challeng-ing applications.

The unique DRC technology not onlyreduces the primary interference; it elimi-nates reaction by-products that create newinterferences. The Dynamic Reaction Celleliminates common polyatomic interferencessuch as ArO+, ArAr+, ArCl+, and many others.This allows sub-ppt levels of elements thatcannot be determined easily by conventionalICP-MS, such as Fe, Ca, K, Mg, As, Cr, Se, andV to be determined with ease and without theuse of cold plasma conditions.

ICP MASS SPECTROMETRY

ICP MASS SPECTROMETRY:LASER ABLATION FOR THEELAN ICP-MS

The ELAN 6100 ICP-MS and the ELAN DRCICP-MS systems can be directly interfacedwith a wide variety of laser ablation systemsfor performing direct solid sampling. Laserablation systems using Nd:YAG or excimerlasers provide a powerful, pulsed laser beamwhich focuses the laser onto the surface of thesample. The resulting vaporized particles are

swept into the ICP Mass Spectrometer with astream of argon, where they are analyzed inthe conventional way. If sample dissolution isa problem, or spatially resolved solid sampleanalysis is required, then the combination oflaser sampling and ICP-MS will ideally suityour requirements.

LIQUID CHROMATOGRAPHY /ION CHROMATOGRAPHYCOUPLED WITH THE ELANICP-MS

The ELAN ICP-MS systems can also be cou-pled with either liquid chromatography (LC)or ion chromatography (IC) systems, provid-ing a complete system for the separation anddetermination of individual metal speciesand compounds. The PerkinElmer Series 200

LC pump and autosampler can be completelyintegrated with the ELAN ICP-MS systems.Combined with Turbochrom™, the industrystandard for chromatography software, theELAN provides a complete solution for yourspeciation needs.

The PerkinElmer FIAS™-400MS Flow Injec-tion System enhances the ELAN's samplehandling capabilities with numerous featuresand benefits, including on-line sample prepa-ration, the ability to use microliter sample vol-umes, increased sample throughput, reducedcontamination, and enhanced stability.

Due to the transient nature of the FIASinjection profile, the sample introduction sys-tem and the ICP-MS interface are exposed tomuch lower levels of potentially harsh sample

matrices. This greatly reduces the rate of sam-ple deposition on the interface cones, maxi-mizing stability and reducing the time spenton recalibration and maintenance.

Automated on-line chemistries open upnew approaches for difficult analyses. A widevariety of on-line sample preparation tech-niques are possible, including automatedhydride and cold vapor Hg generation, matrixseparation, analyte preconcentration and on-line dilution or reagent addition.

ICP MASS SPECTROMETRY:FLOW INJECTION SYSTEMS(FIAS) FOR THE ELAN ICP-MS

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resulting from batch or continuous-flow tech-niques. The injection volume can be varied tocompensate for different analytical workingranges. The FIMS-100 has one steppermotor-driven peristaltic pump with a max-imum of 8 channels for tubing. The FIMS-400 has two stepper motor-drivenperistaltic pumps for greater flexibilitywhen used with the optional accessories.

Detection limits of less than 5 parts-per-tril-lion can be achieved with the FIMS, and anoptional amalgamation accessory can be usedto improve detection limits even further.

The FIMS 100/400 can also be used in con-junction with a PerkinElmer AA to expandthe capabilities of the system to include all ofthe features found in PerkinElmer’s FIAS™flow injection systems. These include thedetermination of the hydride-forming ele-ments via hydride generation and flame-flowinjection techniques.

FIMS-100 AND FIMS-400 FLOW INJECTIONMERCURY SYSTEMS

The FIMS™-100 and FIMS™-400 are com-pact atomic absorption spectrometers dedi-cated to the determination of mercury. Basedon flow injection (FI) techniques, FIMS isfully automated, fast and cost-effective. TheFIMS uses a high-performance single-beamoptical system with a low-pressure Hg lampand solar-blind detector for maximum perfor-mance. Automatic baseline offset correction(BOC) immediately before each measurementprovides exceptional short- and long-termbaseline stability. Full control of the spec-trometer, FI components, autosampler andother accessories is via an industry-standardpersonal computer using PerkinElmer AAWinLab™ software based on the Microsoft®

Windows® operating environment.The instrument’s built-in flow injection sys-

tem allows small sample volumes (10 µL to 1 mL) to be introduced for more rapid analy-sis times and fewer memory effects than those

FLOW INJECTION SYSTEMS (FIAS)

FIAS-400 Flow Injection Systemfor Atomic Spectrometry with theoptional AS-90 Autosampler.

The PerkinElmer FIAS™ series of FlowInjection Systems for Atomic Spectrometry(FIAS) provide new levels of automation andsample handling for atomic absorption. Usedwith flame sampling, the FIAS systems canautomatically dilute samples, add reagents ormodifiers, remove interfering matrices, orconcentrate analyte elements. The FIAS sys-tems also provide a means to automaticallyanalyze microliter sample volumes or samplesolutions with exceptionally high amounts ofdissolved solids without burner clogging.

FIAS systems can also provide full automa-tion of analyses requiring complex samplepreparation, such as cold vapor mercurydeterminations and hydride generation deter-minations of As, Se, Te, Bi, Sb, Sn, and otherhydride-forming metals.

The entire FIAS series combines simplicityof operation, versatility and exceptional sen-sitivity with unmatched sample throughputand reduced operating expenses.

For the determination of mercury usingcold vapor techniques, FIAS units can useeither SnCl2 or NaBH4 as the reductant, ensur-ing compliance with government regulations.FIAS systems also can be equipped with anoptional amalgamation attachment whichpreconcentrates the evolved Hg for signifi-cantly lower detection limits.

PerkinElmer FIAS systems are available in avariety of configurations to meet user require-ments. All FIAS units are fully compatiblewith the AS-90 or larger capacity AS-91flame/FIAS autosampler for fully automatedsample handling.

AUTOSAMPLERS FOR FLAMEAND FLOW INJECTION AAS,ICP-OES,AND ICP-MS

The PerkinElmer AS-90plus and AS-93plusseries of autosamplers are multipurposesampling systems for flame and flow injec-tion atomic absorption, ICP-OES and ICP-MS. These autosamplers automate standardand sample introduction for instrument cali-bration and sample analysis, extending thespectrometer’s capabilities to those of a fullyautomated analytical working station.

The AS-90plus offers fast, accurate sam-pling with random access for added flexibili-ty. All sampling components are corrosion-resistant for maximum durability and life-time. Easily interchangeable sample racksaccommodate up to 144 samples.

The AS-93plus offers all of the features ofthe AS-90plus in addition to automatic rins-ing with a built-in peristaltic pump. This fea-ture is especially important for ICPapplications

The AS-93plus is compatible with com-monly used laboratory sample racks, e.g., Sci-enceware or Gilson®. Up to 200 samples canbe accomodated.

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MICROWAVE SAMPLEPREPARATION SYSTEM

The Multiwave® Microwave Sample Prepa-ration System is a versatile and powerfulmicrowave sample preparation system that iseasy to operate and ideally suited for atomicspectroscopy techniques. It offers:• Short analysis time due to fast and simul-

taneous decomposition of six to 12 sam-ples and short cool-down time with abuilt-in high-performance cooling system.

• Superior decomposition quality in closedquartz or fluorpolymer (TFM/PFA) vesselsfor minimum risk of sample contamina-tion.

• Operating pressures ranging from 20 bar(300 psi) to 75 bar (1100 psi).

• High digestion temperature up to 300ºC. • Unpulsed microwave power output from

0 – 1000 W.

• Continuous temperature and pressurecontrol in each vessel, such as simultane-ous pressure control in all vessels withPIC (Pressure Increase Control) software,metal alloy rupture disk, high-strengthPEEK protection jackets around the diges-tion vessels, and a protective shield onthe door.

• Additional accessories for drying, evapo-ration, and stirring during the digestionprocess are available to make the multi-wave a versatile sample preparation toolfor modern laboratories.

CONSUMABLES AND ACCESSORIES CATALOG

PerkinElmer offers a catalog featuring a com-plete line of accessories and replacementconsumable items to complement andenhance the performance of your atomicspectroscopy instrumentation. From autosam-plers to Z-fold printer paper, we provide the

tools you need to take full advantage of yourPerkinElmer atomic spectroscopy systems.Contact us today for a copy of PerkinElmer’saccessories/consumables catalog which is alsoavailable online at: www.orderessentials.com

You can depend on PerkinElmer . . .as your partner in providing total solutions for your analytical needs. Our comprehensive support system is designed to help yourlab operate with greater accuracy, efficiency and productivity.

Financing ProgramsPerkinElmer has a suite of leasing programs to complement the needs of today’s companies. In most cases, you can finance100% of the instrument, software and maintenance — or customize your own lease.

Unparalleled Customer SupportMost importantly, we’ve assembled a worldwide support team that’s unparalleled in the industry — highly trained, knowledgeable peo-ple standing by to make sure you always get the assistance you need, when you need it, whether on-site, on-line, or over the phone.

For more information, contact your local PerkinElmer representative, or fill out and mail/fax the attached business reply card, visit ourwebsite at: www.perkinelmer.com, email us at: [email protected], Tel: (+1) 203-762-4000 or 800-762-4000, or Fax (+1) 203-762-4228.

PerkinElmer Instruments761 Main Avenue Norwalk, CT 06859-0010 USAPhone: (800) 762-4000 or(+1) 203-762-4000Fax: (+1) 203-762-4228www.perkinelmer.com

PerkinElmer is a trademark of PerkinElmer, Inc. HGA and Intensitron are registered trademarks and AAnalyst, AutoAnalyst, AutoLens, DynaRinse, Dynamic Reaction Cell,DRC, FIAS, FIMS, GemCone, GemTip, Lumina, Optima, Optima 2000, Optima 4000, Optima 4300, PathFinder, QuickSteps, SignalGuard, SimulScan, SmartRinse, SIMAA,SwiftMount, TotalFlow, THGA, TotalQuant, Turbochrom, WinLab, and WinLab32 are trademarks of PerkinElmer Instruments LLC. ELAN, Plasmalok, and SCIEX are registeredtrademarks of MDS SCIEX, a division of MDS Inc. Microsoft, Windows, and Windows NT are registered trademarks of Microsoft Corporation. Ryton is a registered trademarkof Phillips Petroleum Company. Mutliwave is a registered trademark of Anton Paar, Austria.Registered names and trademarks, etc. used in this publication even without specific indication thereof are not to be considered unprotected by law.

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