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Annual Quality Report - Xilinx · Moore's Law and advanced test and manufacturing methodologies for known-good die selection SOC INTEGRATION, for simplifying SOC solutions and elevating

May 14, 2020

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Page 1: Annual Quality Report - Xilinx · Moore's Law and advanced test and manufacturing methodologies for known-good die selection SOC INTEGRATION, for simplifying SOC solutions and elevating
Page 2: Annual Quality Report - Xilinx · Moore's Law and advanced test and manufacturing methodologies for known-good die selection SOC INTEGRATION, for simplifying SOC solutions and elevating
Page 3: Annual Quality Report - Xilinx · Moore's Law and advanced test and manufacturing methodologies for known-good die selection SOC INTEGRATION, for simplifying SOC solutions and elevating
Page 4: Annual Quality Report - Xilinx · Moore's Law and advanced test and manufacturing methodologies for known-good die selection SOC INTEGRATION, for simplifying SOC solutions and elevating
Page 5: Annual Quality Report - Xilinx · Moore's Law and advanced test and manufacturing methodologies for known-good die selection SOC INTEGRATION, for simplifying SOC solutions and elevating
Page 6: Annual Quality Report - Xilinx · Moore's Law and advanced test and manufacturing methodologies for known-good die selection SOC INTEGRATION, for simplifying SOC solutions and elevating
Page 7: Annual Quality Report - Xilinx · Moore's Law and advanced test and manufacturing methodologies for known-good die selection SOC INTEGRATION, for simplifying SOC solutions and elevating
Page 8: Annual Quality Report - Xilinx · Moore's Law and advanced test and manufacturing methodologies for known-good die selection SOC INTEGRATION, for simplifying SOC solutions and elevating
Page 9: Annual Quality Report - Xilinx · Moore's Law and advanced test and manufacturing methodologies for known-good die selection SOC INTEGRATION, for simplifying SOC solutions and elevating
Page 10: Annual Quality Report - Xilinx · Moore's Law and advanced test and manufacturing methodologies for known-good die selection SOC INTEGRATION, for simplifying SOC solutions and elevating
Page 11: Annual Quality Report - Xilinx · Moore's Law and advanced test and manufacturing methodologies for known-good die selection SOC INTEGRATION, for simplifying SOC solutions and elevating
Page 12: Annual Quality Report - Xilinx · Moore's Law and advanced test and manufacturing methodologies for known-good die selection SOC INTEGRATION, for simplifying SOC solutions and elevating
Page 13: Annual Quality Report - Xilinx · Moore's Law and advanced test and manufacturing methodologies for known-good die selection SOC INTEGRATION, for simplifying SOC solutions and elevating
Page 14: Annual Quality Report - Xilinx · Moore's Law and advanced test and manufacturing methodologies for known-good die selection SOC INTEGRATION, for simplifying SOC solutions and elevating
Page 15: Annual Quality Report - Xilinx · Moore's Law and advanced test and manufacturing methodologies for known-good die selection SOC INTEGRATION, for simplifying SOC solutions and elevating
Page 16: Annual Quality Report - Xilinx · Moore's Law and advanced test and manufacturing methodologies for known-good die selection SOC INTEGRATION, for simplifying SOC solutions and elevating
Page 17: Annual Quality Report - Xilinx · Moore's Law and advanced test and manufacturing methodologies for known-good die selection SOC INTEGRATION, for simplifying SOC solutions and elevating