ANL MCP #145 Phosphor Tests 1/24/2011 • Incom substrate, 33mm diameter, ANL MCP#145 • 20µm pores, 8° bias, 60:1 L/D, 65% OAR • Chemistry 2 resistive layer, MgO SEE layer • Electrode deposited on top of ALD layers • Annealing conditions unknown (Anil?) • 25MΩ in air with DMM. • 25MΩ in vacuum initially with DMM, then drifts up to 70MΩ. • 25MΩ in vacuum at voltage (20µA at 500V) 25 January 2011 J. McPhate – LAPP Main Telecon 1
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J. McPhate – LAPP Main Telecon 1
ANL MCP #145 Phosphor Tests1/24/2011
• Incom substrate, 33mm diameter, ANL MCP#145• 20µm pores, 8° bias, 60:1 L/D, 65% OAR• Chemistry 2 resistive layer, MgO SEE layer• Electrode deposited on top of ALD layers• Annealing conditions unknown (Anil?)• 25MΩ in air with DMM.• 25MΩ in vacuum initially with DMM, then drifts up
to 70MΩ.• 25MΩ in vacuum at voltage (20µA at 500V)