Analog to Digital Conversion. Introduction Main characteristics Resolution Dynamic range Bandwidth Conversion time Linearity Integral Differential Different types Successive approximation Slope integration Flash FADC Sigma Delta Applications. Analog to Digital Converter. - PowerPoint PPT Presentation
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CERN ELEC 2002 ADC 1Ph. Farthouat
Analog to Digital Conversion
Introduction Main characteristics
– Resolution– Dynamic range– Bandwidth– Conversion time
Linearity– Integral– Differential
Different types– Successive approximation– Slope integration– Flash
FADC Sigma Delta Applications
CERN ELEC 2002 ADC 2Ph. Farthouat
Analog to Digital Converter
Analog input - Digital output– Most of the time commercial ASICs
– Converts voltage or current What is to be converted?
– Voltage, Current, Charge, Time
– Analog input processing is necessary» To convert the measured quantity in a tension» To adapt the impedances » To filter» To adapt the amplitude
What is the expected resolution? What is the dynamic range? What is the expected linearity? How often is a conversion needed?
CERN ELEC 2002 ADC 3Ph. Farthouat
Resolution
An ADC is given as an n-bit ADC The least significant bit gives the resolution of the ADC Related to full scale if the ADC is linear
– LSB = A/2n
– Linear 8-bit ADC with a 1V full scale input
– Resolution = 1/28 = 3.9 mV (0.39%)
CERN ELEC 2002 ADC 4Ph. Farthouat
Dynamic range
Ratio between the minimum and the maximum amplitude to be measured– e.g. calorimeter signal 10 MeV to 2 TeV gives a 2 106 dynamic range
In case of linear system the dynamic range is related to the number of bits (and hence the resolution)– an 8-bit ADC has a 256 dynamic range
In case of large dynamic range (as for a calorimeter) some non-linearity has to be introduced– linear ADC for the previous example would require 21 bits!
Often used terms in physics:– n-bit resolution– n-bit dynamic range– example:
» 8-bit resolution for a 12-bit dynamic range means that a signal in the range 1-4000 is measured with a resolution of 0.39%
CERN ELEC 2002 ADC 5Ph. Farthouat
Conversion time and Bandwidth
How often can a conversion be done– a few ns to a few ms depending on the technology
» 100 MHz FADC to slow sigma-delta
Input bandwidth– Maximum input signal bandwidth
» Track and hold input circuitry» Conversion frequency (FADC)
CERN ELEC 2002 ADC 6Ph. Farthouat
ADC transfer curve
Ideal ADC Errors
– Offset
– Integral non-linearity
– Differential non-linearity
-2
0
2
4
6
8
10
12
0 2 4 6 8 10 12
Vin
AD
C c
ou
nt
CERN ELEC 2002 ADC 7Ph. Farthouat
Integral linearity
Non linearity: maximum difference between the best linear fit and the ideal curve
0
2
4
6
8
10
12
0 5 10 15
Vin
AD
C c
ou
nt
Vout
Ideal
Linear (Vout)
Non Linearity
0
20
40
60
80
100
120
0 20 40 60 80 100 120
CERN ELEC 2002 ADC 8Ph. Farthouat
Differential non-linearity
Least Significant Bit (LSB) value should be constant but it is not The difference with the ideal value shall not exceed 0.5 LSB Easy way of seeing the effect
An n-bit conversion requires n steps Requires a Start and an End signals
Typical conversion time– 1 to 50 s
Typical resolution– 8 to 12 bits
Cost– 15 to 600 CHF
CERN ELEC 2002 ADC 11Ph. Farthouat
Single slope integration
Start to charge a capacitor at constant current
Count clock ticks during this time Stop when the capacitor voltage reaches
the input Cannot reach high resolution
– capacitor– comparator
-
+IN
C
R
S Enable
N-bit Output
Q
Oscillator Clk
Co
un
ter
StartConversion
StartConversion
02468
101214161820
0 2 4 6 8 10 12 14 16
Time
Vo
lta
ge
acc
ross
th
e c
ap
aci
tor
Vin
Counting time
CERN ELEC 2002 ADC 12Ph. Farthouat
Dual slope integration (Wilkinson)
Capacitor charged with a current proportional to the input during a fixed time
Discharge at constant current Count of clock ticks during the discharge
02468
101214161820
0 20 40 60 80 100 120Time
Vo
lta
ge
acc
ross
th
e c
ap
aci
tor
Counting time
Charge with a currentproportional to the input
CERN ELEC 2002 ADC 13Ph. Farthouat
Dual slope integration (2)
Advantages– Capacitor value is not important although has to be of good quality
– Comparator error can be canceled by beginning and ending each conversion cycle at the same voltage
– Clock frequency errors can be cancelled by using the same clock to define the charge time
Typical resolution– 10 to 18 bit
Conversion time– Depends on the clock frequency
CERN ELEC 2002 ADC 14Ph. Farthouat
Flash ADC
Direct measurement with 2n-1 comparators
Typical performance:– 4 to 10-12 bits
– 15 to 300 MHz
– High power
Half-Flash ADC– 2-step technique
» 1st flash conversion with 1/2 the precision
» Subtracted with a DAC» New flash conversion
Waveform digitizing applications
CERN ELEC 2002 ADC 15Ph. Farthouat
Flash ADC (cont)
Pipeline ADC Input-to-output delay = n clocks for n stages One output every clock cycle Saves power (less comparators)
S&H
3-bit FADC 3-bit DAC
-X 4
3-bit
S&H Stage 1 Stage 2 Stage 3 Stage 4 4-bit FADC
Time Adjustment & Digital Error Correction
3-bit 3-bit 3-bit 3-bit 4-bit
12-bit
Input
CERN ELEC 2002 ADC 16Ph. Farthouat
Effective number of bits
Effective number of bits of an n-bit FADC– n’ giving the correct SNR
Example: AD9235 12-bit 20 to 65 MHz– SNR = 70 dB
– Effective number of bits = 11.4
0
0.5
1
1.5
2
2.5
3
3.5
0 0.5 1 1.5 2 2.5 3 3.5
(x)q
dxxq
1
2
q
2
q
2
q
2
q22
12
q
An n bit ADC introduces a quantization error
Encoding a signal (A/2) sint with A being the full scale will give an error
n2
222
212
A
12
q
dB8.1n6
212
A8
A
log10x
log10SNR
n2
2
2
2
2
Signal to Noise Ratio
CERN ELEC 2002 ADC 17Ph. Farthouat
Shannon Theorem
A signal x(t) has a spectral representation |X(f)|; X(f) = Fourier transform of x(t) A signal x(t) after having been digitised at the frequency fs, has a spectral
representation equal to the spectral representation of x(t) shifted every fs
If X(f) is not equal to zero when f > fs/2, there is spectrum overlapping
The Shannon theorem says that x(t) can be reconstructed after digitisation if the digitising frequency is at least twice the maximum frequency in x(t) spectral representation
This is mathematical only, as it supposes perfect filtering
-150 -100 -50 0 50 100 150
|X(f)|
Fre
qu
ency
[M
Hz]
CERN ELEC 2002 ADC 18Ph. Farthouat
Example (1)
“Typical” physics pulse– 100 ns rising and falling edge
Effect of a digitisation at 10 MHz and 20 MHz
X(f)
-20
0
20
40
60
80
100
120
-60 -40 -20 0 20 40 60
Frequency (MHz)
x(t)
-2
0
2
4
6
8
10
12
-30 -20 -10 0 10 20 30
Time (*10 ns)
Digitisation at 10 MHz
-20
0
20
40
60
80
100
120
-60 -40 -20 0 20 40 60
Frequency (MHz)
Digitisation at 20 MHz
-20
0
20
40
60
80
100
120
-60 -40 -20 0 20 40 60
Frequency (MHz)
CERN ELEC 2002 ADC 19Ph. Farthouat
Example (2)
100 ns square pulse Digitisation at 10 MHz and 20 MHz
0
2
4
6
8
10
12
-30 -20 -10 0 10 20 30
time (*10 ns)
x(t)
-40
-20
0
20
40
60
80
100
120
-50 -40 -30 -20 -10 0 10 20 30 40 50
Frequency (MHz)
X(f
)
Digitisation at 10 MHz
-40
-20
0
20
40
60
80
100
120
-60 -40 -20 0 20 40 60
Frequency (MHz)
X(f
)
Digitisation at 20 MHz
-40
-20
0
20
40
60
80
100
120
-60 -40 -20 0 20 40 60
Frequency (MHz)
X(f
)
CERN ELEC 2002 ADC 20Ph. Farthouat
Using FADC
Do not forget to make a frequency analysis of the signal – Any spectrum overlapping introduces noise– Take into account the effective number of bits
Filtering is necessary– Before digitisation (analog) to cut the input signal frequency spectrum– After digitisation (digital) to extract the signal frequency spectrum and to
compensate the effect of digitisation over a finite time window
0
2
4
6
8
10
12
-30 -20 -10 0 10 20 30
Measurement window (-T0, +T0)
x(t)
-T0 +T0
-40
-20
0
20
40
60
80
100
120
-50 -40 -30 -20 -10 0 10 20 30 40 50
Frequency
1/2*T0
CERN ELEC 2002 ADC 21Ph. Farthouat
Over-sampling ADC
If fs is higher than the frequency f0 of the signal to be measured then after filtering the error will become
0
0.5
1
1.5
2
2.5
3
3.5
0 0.5 1 1.5 2 2.5 3 3.5
(x)q
12
qdxx
q
1
2
q
2
q
2
2
q
2
q22
bitsofnumberthenandscalefullthebeingAwithf
f
12
1
2
A
f
f
s
0
n
s
0
Assuming the error is a white noise, its power spectral density is flat within the range [–fs/2,fs/2]
-fs/2 +fs/2f
|(f)|
sf
1
12
q
CERN ELEC 2002 ADC 22Ph. Farthouat
Over-sampling ADC (cont)
Hence it is possible to increase the resolution by increasing the sampling frequency and filtering
Example :an 8-bit ADC becomes a 9-bit ADC with an over-sampling factor of 4
– But the 8-bit ADC must meet the linearity requirement of a 9-bit
The signal to noise ratio when encoding a signal (A/2) sint, with A being the full scale, will be
bitsofnumbereffectivethebeing'n'n68.1SNR
dBf
flog10n68.1
f
f
212
A8
A
log10x
log10SNR0
s
s
0
n2
2
2
2
2
CERN ELEC 2002 ADC 23Ph. Farthouat
Sigma-Delta ADC
The output of this modulator is a digital stream – Average = Input
Over-sampling ratio M=fs/f0
1-bit ADC
1-bit DAC
-Input Output
1rst Order Sigma-Delta Modulator
3M
A
3
2
CERN ELEC 2002 ADC 24Ph. Farthouat
Sigma-Delta ADC (cont)
Gain of 1.5 bits per octave increase of M– M = 2350 to have a 16-bit ADC
– 10-bit, 10 MSPS core used in ALICE TPC read-out: <20 mW
– 24-bit, 1 kSPS: 45 mW
CERN ELEC 2002 ADC 27Ph. Farthouat
Applications
In HEP we are facing large number of channels The quantity to be measured depends on the type of detector
– Charge in the case of a lead glass calorimeter with PM read-out
– Voltage in the case of a lead glass calorimeter with triode and preamplifier shaper read-out
Low cost Charge integrating ADC for a LEP calorimeter High speed peak sensing ADC for a neutrino experiment Non linear ADC for an LHC experiment FADC with numerical filtering for an LHC trigger application
CERN ELEC 2002 ADC 28Ph. Farthouat
Charge integrating ADC (1)
High resolution: 12-bit High dynamic range: 15-bit High density: 96 channel per Fastbus board Low speed: 1 ms conversion time Low cost per channel Principle:
– Single ADC for 48 channels
– Charge input integration and storage
CERN ELEC 2002 ADC 29Ph. Farthouat
Charge integrating ADC (2)
Block diagram
MUX&
ADC
MUX&
ADC
MEMORY&
FASTBUSSLAVEPORT
FASTBUS
CIFE 1
CIFE 48
CIFE 49
CIFE 96 IN96
IN49
IN48
IN1
GATE &
CLEAR
GATE
CLEAR
START OF
CONVERSION
TEST TEST
FASTBUSAUXILLIARYBACKPLANE
ANALOG SUMCIRCUITRY
OUT1
OUT48
OUT49
OUT96
OUT<1:96>
+-
Iin
I0
Ci
CLEAR
GATE
SW
SWC
V
I TO ICONVERTER
VIRTUAL GROUND
• Sensitivity : 1.6 mV/pC (maximum output 1.5 V)• Gate width : 50 to 2000 ns• Noise (r.m.s) : 25 fC (600 ns GATE)• Maximum input slew rate : 2 mA/ns• Fast clear time : 300 ns for less than 300 µV at the output• Output settling time : 1000 ns• Voltage losses on the integrating capacitor : less than1mV/ms
CERN ELEC 2002 ADC 30Ph. Farthouat
Charge integrating ADC (3)
Performance– 12-bit resolution, 15-bit dynamic range
– Conversion time tcvt = 48 (tc + ts) = 960 µs
» where tc = ADC conversion time = 12 µs
» and ts = settling time for multiplexer and amplifiers = 8 µs.
ADC1
ADC2
x 1
x 8
Substract
MULTIPLEXER
48 :1
CIFE1
CIFE48
CIFE REF
12 bit
12 bit
Memory
Memory
STARTOF
CONVERSION
IN48
IN1
CERN ELEC 2002 ADC 31Ph. Farthouat
Peak sensing ADC (1)
12-bit resolution Low dead-time : 8 s Data buffering
CERN ELEC 2002 ADC 32Ph. Farthouat
Peak sensing ADC (2)
Block diagram
Vin
-
+
C-
+ADC FIFO Read-out
12-bit
Gate
CERN ELEC 2002 ADC 33Ph. Farthouat
ADC for an LHC experiment (1)
ATLAS Liquid Argon calorimeter High dynamic range: 16-bit Shaping of the signal to minimise pile-up Sampling every 25 ns (bunch crossing period) Level-1 pipeline
Shaping
CERN ELEC 2002 ADC 34Ph. Farthouat
ADC for an LHC experiment (2)
Block diagram
CERN ELEC 2002 ADC 35Ph. Farthouat
ADC for an LHC experiment (3)
Performance– Pedestal stability to 0.1 ADC counts
– Noise equivalent to 20 MeV
– Integral non-linearity below 0.25%
– Conversion time : 25 ns per sample
CERN ELEC 2002 ADC 36Ph. Farthouat
FADC for LHC trigger purpose (1)
Analog summation on the detector to form the trigger tower Shaping time covers several bunch crossings FADC and numerical filtering to: