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CERN ELEC 2002 ADC 1 Ph. Farthouat Analog to Digital Conversion Introduction Main characteristics Resolution Dynamic range Bandwidth Conversion time Linearity Integral Differential Different types Successive approximation Slope integration Flash FADC Sigma Delta Applications
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Analog to Digital Conversion

Jan 15, 2016

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Analog to Digital Conversion. Introduction Main characteristics Resolution Dynamic range Bandwidth Conversion time Linearity Integral Differential Different types Successive approximation Slope integration Flash FADC Sigma Delta Applications. Analog to Digital Converter. - PowerPoint PPT Presentation
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Page 1: Analog to Digital Conversion

CERN ELEC 2002 ADC 1Ph. Farthouat

Analog to Digital Conversion

Introduction Main characteristics

– Resolution– Dynamic range– Bandwidth– Conversion time

Linearity– Integral– Differential

Different types– Successive approximation– Slope integration– Flash

FADC Sigma Delta Applications

Page 2: Analog to Digital Conversion

CERN ELEC 2002 ADC 2Ph. Farthouat

Analog to Digital Converter

Analog input - Digital output– Most of the time commercial ASICs

– Converts voltage or current What is to be converted?

– Voltage, Current, Charge, Time

– Analog input processing is necessary» To convert the measured quantity in a tension» To adapt the impedances » To filter» To adapt the amplitude

What is the expected resolution? What is the dynamic range? What is the expected linearity? How often is a conversion needed?

Page 3: Analog to Digital Conversion

CERN ELEC 2002 ADC 3Ph. Farthouat

Resolution

An ADC is given as an n-bit ADC The least significant bit gives the resolution of the ADC Related to full scale if the ADC is linear

– LSB = A/2n

– Linear 8-bit ADC with a 1V full scale input

– Resolution = 1/28 = 3.9 mV (0.39%)

Page 4: Analog to Digital Conversion

CERN ELEC 2002 ADC 4Ph. Farthouat

Dynamic range

Ratio between the minimum and the maximum amplitude to be measured– e.g. calorimeter signal 10 MeV to 2 TeV gives a 2 106 dynamic range

In case of linear system the dynamic range is related to the number of bits (and hence the resolution)– an 8-bit ADC has a 256 dynamic range

In case of large dynamic range (as for a calorimeter) some non-linearity has to be introduced– linear ADC for the previous example would require 21 bits!

Often used terms in physics:– n-bit resolution– n-bit dynamic range– example:

» 8-bit resolution for a 12-bit dynamic range means that a signal in the range 1-4000 is measured with a resolution of 0.39%

Page 5: Analog to Digital Conversion

CERN ELEC 2002 ADC 5Ph. Farthouat

Conversion time and Bandwidth

How often can a conversion be done– a few ns to a few ms depending on the technology

» 100 MHz FADC to slow sigma-delta

Input bandwidth– Maximum input signal bandwidth

» Track and hold input circuitry» Conversion frequency (FADC)

Page 6: Analog to Digital Conversion

CERN ELEC 2002 ADC 6Ph. Farthouat

ADC transfer curve

Ideal ADC Errors

– Offset

– Integral non-linearity

– Differential non-linearity

-2

0

2

4

6

8

10

12

0 2 4 6 8 10 12

Vin

AD

C c

ou

nt

Page 7: Analog to Digital Conversion

CERN ELEC 2002 ADC 7Ph. Farthouat

Integral linearity

Non linearity: maximum difference between the best linear fit and the ideal curve

0

2

4

6

8

10

12

0 5 10 15

Vin

AD

C c

ou

nt

Vout

Ideal

Linear (Vout)

Non Linearity

0

20

40

60

80

100

120

0 20 40 60 80 100 120

Page 8: Analog to Digital Conversion

CERN ELEC 2002 ADC 8Ph. Farthouat

Differential non-linearity

Least Significant Bit (LSB) value should be constant but it is not The difference with the ideal value shall not exceed 0.5 LSB Easy way of seeing the effect

– random input covering the full range

– frequency histogram should be flat

– differential non-linearity introduces structures

Differential non-linearity

98.5

99

99.5

100

100.5

101

101.5

0 20 40 60 80

ADC count

Fre

qu

en

cy

Ideal Frequency

Measured frequencyADCbitn2

V LSB 1

n

max

Page 9: Analog to Digital Conversion

CERN ELEC 2002 ADC 9Ph. Farthouat

Types of ADC

Successive approximation Single slope integration Dual slope integration Flash ADC Sigma-Delta

Page 10: Analog to Digital Conversion

CERN ELEC 2002 ADC 10Ph. Farthouat

Successive approximation

Compare the signal with an n-bit DAC output

Change the code until – DAC output = ADC input

An n-bit conversion requires n steps Requires a Start and an End signals

Typical conversion time– 1 to 50 s

Typical resolution– 8 to 12 bits

Cost– 15 to 600 CHF

Page 11: Analog to Digital Conversion

CERN ELEC 2002 ADC 11Ph. Farthouat

Single slope integration

Start to charge a capacitor at constant current

Count clock ticks during this time Stop when the capacitor voltage reaches

the input Cannot reach high resolution

– capacitor– comparator

-

+IN

C

R

S Enable

N-bit Output

Q

Oscillator Clk

Co

un

ter

StartConversion

StartConversion

02468

101214161820

0 2 4 6 8 10 12 14 16

Time

Vo

lta

ge

acc

ross

th

e c

ap

aci

tor

Vin

Counting time

Page 12: Analog to Digital Conversion

CERN ELEC 2002 ADC 12Ph. Farthouat

Dual slope integration (Wilkinson)

Capacitor charged with a current proportional to the input during a fixed time

Discharge at constant current Count of clock ticks during the discharge

02468

101214161820

0 20 40 60 80 100 120Time

Vo

lta

ge

acc

ross

th

e c

ap

aci

tor

Counting time

Charge with a currentproportional to the input

Page 13: Analog to Digital Conversion

CERN ELEC 2002 ADC 13Ph. Farthouat

Dual slope integration (2)

Advantages– Capacitor value is not important although has to be of good quality

– Comparator error can be canceled by beginning and ending each conversion cycle at the same voltage

– Clock frequency errors can be cancelled by using the same clock to define the charge time

Typical resolution– 10 to 18 bit

Conversion time– Depends on the clock frequency

Page 14: Analog to Digital Conversion

CERN ELEC 2002 ADC 14Ph. Farthouat

Flash ADC

Direct measurement with 2n-1 comparators

Typical performance:– 4 to 10-12 bits

– 15 to 300 MHz

– High power

Half-Flash ADC– 2-step technique

» 1st flash conversion with 1/2 the precision

» Subtracted with a DAC» New flash conversion

Waveform digitizing applications

Page 15: Analog to Digital Conversion

CERN ELEC 2002 ADC 15Ph. Farthouat

Flash ADC (cont)

Pipeline ADC Input-to-output delay = n clocks for n stages One output every clock cycle Saves power (less comparators)

S&H

3-bit FADC 3-bit DAC

-X 4

3-bit

S&H Stage 1 Stage 2 Stage 3 Stage 4 4-bit FADC

Time Adjustment & Digital Error Correction

3-bit 3-bit 3-bit 3-bit 4-bit

12-bit

Input

Page 16: Analog to Digital Conversion

CERN ELEC 2002 ADC 16Ph. Farthouat

Effective number of bits

Effective number of bits of an n-bit FADC– n’ giving the correct SNR

Example: AD9235 12-bit 20 to 65 MHz– SNR = 70 dB

– Effective number of bits = 11.4

0

0.5

1

1.5

2

2.5

3

3.5

0 0.5 1 1.5 2 2.5 3 3.5

(x)q

dxxq

1

2

q

2

q

2

q

2

q22

12

q

An n bit ADC introduces a quantization error

Encoding a signal (A/2) sint with A being the full scale will give an error

n2

222

212

A

12

q

dB8.1n6

212

A8

A

log10x

log10SNR

n2

2

2

2

2

Signal to Noise Ratio

Page 17: Analog to Digital Conversion

CERN ELEC 2002 ADC 17Ph. Farthouat

Shannon Theorem

A signal x(t) has a spectral representation |X(f)|; X(f) = Fourier transform of x(t) A signal x(t) after having been digitised at the frequency fs, has a spectral

representation equal to the spectral representation of x(t) shifted every fs

If X(f) is not equal to zero when f > fs/2, there is spectrum overlapping

The Shannon theorem says that x(t) can be reconstructed after digitisation if the digitising frequency is at least twice the maximum frequency in x(t) spectral representation

This is mathematical only, as it supposes perfect filtering

-150 -100 -50 0 50 100 150

|X(f)|

Fre

qu

ency

[M

Hz]

Page 18: Analog to Digital Conversion

CERN ELEC 2002 ADC 18Ph. Farthouat

Example (1)

“Typical” physics pulse– 100 ns rising and falling edge

Effect of a digitisation at 10 MHz and 20 MHz

X(f)

-20

0

20

40

60

80

100

120

-60 -40 -20 0 20 40 60

Frequency (MHz)

x(t)

-2

0

2

4

6

8

10

12

-30 -20 -10 0 10 20 30

Time (*10 ns)

Digitisation at 10 MHz

-20

0

20

40

60

80

100

120

-60 -40 -20 0 20 40 60

Frequency (MHz)

Digitisation at 20 MHz

-20

0

20

40

60

80

100

120

-60 -40 -20 0 20 40 60

Frequency (MHz)

Page 19: Analog to Digital Conversion

CERN ELEC 2002 ADC 19Ph. Farthouat

Example (2)

100 ns square pulse Digitisation at 10 MHz and 20 MHz

0

2

4

6

8

10

12

-30 -20 -10 0 10 20 30

time (*10 ns)

x(t)

-40

-20

0

20

40

60

80

100

120

-50 -40 -30 -20 -10 0 10 20 30 40 50

Frequency (MHz)

X(f

)

Digitisation at 10 MHz

-40

-20

0

20

40

60

80

100

120

-60 -40 -20 0 20 40 60

Frequency (MHz)

X(f

)

Digitisation at 20 MHz

-40

-20

0

20

40

60

80

100

120

-60 -40 -20 0 20 40 60

Frequency (MHz)

X(f

)

Page 20: Analog to Digital Conversion

CERN ELEC 2002 ADC 20Ph. Farthouat

Using FADC

Do not forget to make a frequency analysis of the signal – Any spectrum overlapping introduces noise– Take into account the effective number of bits

Filtering is necessary– Before digitisation (analog) to cut the input signal frequency spectrum– After digitisation (digital) to extract the signal frequency spectrum and to

compensate the effect of digitisation over a finite time window

0

2

4

6

8

10

12

-30 -20 -10 0 10 20 30

Measurement window (-T0, +T0)

x(t)

-T0 +T0

-40

-20

0

20

40

60

80

100

120

-50 -40 -30 -20 -10 0 10 20 30 40 50

Frequency

1/2*T0

Page 21: Analog to Digital Conversion

CERN ELEC 2002 ADC 21Ph. Farthouat

Over-sampling ADC

If fs is higher than the frequency f0 of the signal to be measured then after filtering the error will become

0

0.5

1

1.5

2

2.5

3

3.5

0 0.5 1 1.5 2 2.5 3 3.5

(x)q

12

qdxx

q

1

2

q

2

q

2

2

q

2

q22

bitsofnumberthenandscalefullthebeingAwithf

f

12

1

2

A

f

f

s

0

n

s

0

Assuming the error is a white noise, its power spectral density is flat within the range [–fs/2,fs/2]

-fs/2 +fs/2f

|(f)|

sf

1

12

q

Page 22: Analog to Digital Conversion

CERN ELEC 2002 ADC 22Ph. Farthouat

Over-sampling ADC (cont)

Hence it is possible to increase the resolution by increasing the sampling frequency and filtering

Example :an 8-bit ADC becomes a 9-bit ADC with an over-sampling factor of 4

– But the 8-bit ADC must meet the linearity requirement of a 9-bit

The signal to noise ratio when encoding a signal (A/2) sint, with A being the full scale, will be

bitsofnumbereffectivethebeing'n'n68.1SNR

dBf

flog10n68.1

f

f

212

A8

A

log10x

log10SNR0

s

s

0

n2

2

2

2

2

Page 23: Analog to Digital Conversion

CERN ELEC 2002 ADC 23Ph. Farthouat

Sigma-Delta ADC

The output of this modulator is a digital stream – Average = Input

Over-sampling ratio M=fs/f0

1-bit ADC

1-bit DAC

-Input Output

1rst Order Sigma-Delta Modulator

3M

A

3

2

Page 24: Analog to Digital Conversion

CERN ELEC 2002 ADC 24Ph. Farthouat

Sigma-Delta ADC (cont)

Gain of 1.5 bits per octave increase of M– M = 2350 to have a 16-bit ADC

Higher orders sigma-delta are implemented

Examples (Analog Devices)– 16-bit, 2.5 MHz– 24-bit, 1kHz

The design of low-voltage, low-power sigma-delta modulatorsShahriar Rabii & Bruce WooleyKluwer academic publisher

The signal to noise ratio when encoding a signal (A/2) sint, with A being the full scale, will be

bitsofnumbereffectivethebeing'n'n68.1SNR

dB4.3Mlog302

M9log10

M

A

9

28

A

log10x

log10SNR2

3

3

22

2

2

2

Page 25: Analog to Digital Conversion

CERN ELEC 2002 ADC 25Ph. Farthouat

Resolution/Throughput Rate

<10kHz 10 – 100 kHz 0.1 – 1 MHz 1 – 10 MHz 10 – 100 MHz > 100 MHz

>17 bits

14 – 16 bits

12 – 13 bits

10 – 11 bits

8 – 9 bits

<8 bits

Page 26: Analog to Digital Conversion

CERN ELEC 2002 ADC 26Ph. Farthouat

Power

Power is going down Examples

– 8-bit, 200MSPS: 1.3 mW/MSPS

– 10-bit, 10 MSPS core used in ALICE TPC read-out: <20 mW

– 24-bit, 1 kSPS: 45 mW

Page 27: Analog to Digital Conversion

CERN ELEC 2002 ADC 27Ph. Farthouat

Applications

In HEP we are facing large number of channels The quantity to be measured depends on the type of detector

– Charge in the case of a lead glass calorimeter with PM read-out

– Voltage in the case of a lead glass calorimeter with triode and preamplifier shaper read-out

Low cost Charge integrating ADC for a LEP calorimeter High speed peak sensing ADC for a neutrino experiment Non linear ADC for an LHC experiment FADC with numerical filtering for an LHC trigger application

Page 28: Analog to Digital Conversion

CERN ELEC 2002 ADC 28Ph. Farthouat

Charge integrating ADC (1)

High resolution: 12-bit High dynamic range: 15-bit High density: 96 channel per Fastbus board Low speed: 1 ms conversion time Low cost per channel Principle:

– Single ADC for 48 channels

– Charge input integration and storage

Page 29: Analog to Digital Conversion

CERN ELEC 2002 ADC 29Ph. Farthouat

Charge integrating ADC (2)

Block diagram

MUX&

ADC

MUX&

ADC

MEMORY&

FASTBUSSLAVEPORT

FASTBUS

CIFE 1

CIFE 48

CIFE 49

CIFE 96 IN96

IN49

IN48

IN1

GATE &

CLEAR

GATE

CLEAR

START OF

CONVERSION

TEST TEST

FASTBUSAUXILLIARYBACKPLANE

ANALOG SUMCIRCUITRY

OUT1

OUT48

OUT49

OUT96

OUT<1:96>

+-

Iin

I0

Ci

CLEAR

GATE

SW

SWC

V

I TO ICONVERTER

VIRTUAL GROUND

• Sensitivity : 1.6 mV/pC (maximum output 1.5 V)• Gate width : 50 to 2000 ns• Noise (r.m.s) : 25 fC (600 ns GATE)• Maximum input slew rate : 2 mA/ns• Fast clear time : 300 ns for less than 300 µV at the output• Output settling time : 1000 ns• Voltage losses on the integrating capacitor : less than1mV/ms

Page 30: Analog to Digital Conversion

CERN ELEC 2002 ADC 30Ph. Farthouat

Charge integrating ADC (3)

Performance– 12-bit resolution, 15-bit dynamic range

– Conversion time tcvt = 48 (tc + ts) = 960 µs

» where tc = ADC conversion time = 12 µs

» and ts = settling time for multiplexer and amplifiers = 8 µs.

ADC1

ADC2

x 1

x 8

Substract

MULTIPLEXER

48 :1

CIFE1

CIFE48

CIFE REF

12 bit

12 bit

Memory

Memory

STARTOF

CONVERSION

IN48

IN1

Page 31: Analog to Digital Conversion

CERN ELEC 2002 ADC 31Ph. Farthouat

Peak sensing ADC (1)

12-bit resolution Low dead-time : 8 s Data buffering

Page 32: Analog to Digital Conversion

CERN ELEC 2002 ADC 32Ph. Farthouat

Peak sensing ADC (2)

Block diagram

Vin

-

+

C-

+ADC FIFO Read-out

12-bit

Gate

Page 33: Analog to Digital Conversion

CERN ELEC 2002 ADC 33Ph. Farthouat

ADC for an LHC experiment (1)

ATLAS Liquid Argon calorimeter High dynamic range: 16-bit Shaping of the signal to minimise pile-up Sampling every 25 ns (bunch crossing period) Level-1 pipeline

Shaping

Page 34: Analog to Digital Conversion

CERN ELEC 2002 ADC 34Ph. Farthouat

ADC for an LHC experiment (2)

Block diagram

Page 35: Analog to Digital Conversion

CERN ELEC 2002 ADC 35Ph. Farthouat

ADC for an LHC experiment (3)

Performance– Pedestal stability to 0.1 ADC counts

– Noise equivalent to 20 MeV

– Integral non-linearity below 0.25%

– Conversion time : 25 ns per sample

Page 36: Analog to Digital Conversion

CERN ELEC 2002 ADC 36Ph. Farthouat

FADC for LHC trigger purpose (1)

Analog summation on the detector to form the trigger tower Shaping time covers several bunch crossings FADC and numerical filtering to:

– Extract the energy

– Extract the bunch crossing responsible for it

Page 37: Analog to Digital Conversion

CERN ELEC 2002 ADC 37Ph. Farthouat

FADC for LHC trigger purpose (2)

Block diagram

Page 38: Analog to Digital Conversion

CERN ELEC 2002 ADC 38Ph. Farthouat

FADC for LHC trigger purpose (3)

Filter algorithm : Finite Impulse Response