Ajay P. Malshe, Tel (479) 575-6561 / E-mail <[email protected]> Metrology and Metrology and Instrumentation Instrumentation Challenges for Challenges for Nanomanufacturing and Nanomanufacturing and Product Realization of Product Realization of Integrated Systems Integrated Systems Ajay P. Malshe, Ph.D. Mechanical Engineering University of Arkansas, Fayetteville, AR, U.S.A. Convergence Convergence of Scales-Signals-Domains for Integrated Systems… of Scales-Signals-Domains for Integrated Systems…
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Ajay P. Malshe, Ph.D. Mechanical Engineering University of Arkansas, Fayetteville, AR, U.S.A.
Metrology and Instrumentation Challenges for Nanomanufacturing and Product Realization of Integrated Systems. Convergence of Scales-Signals-Domains for Integrated Systems…. Ajay P. Malshe, Ph.D. Mechanical Engineering University of Arkansas, Fayetteville, AR, U.S.A. - PowerPoint PPT Presentation
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Metrology and Metrology and Instrumentation Challenges Instrumentation Challenges for Nanomanufacturing and for Nanomanufacturing and Product Realization of Product Realization of Integrated SystemsIntegrated Systems
Ajay P. Malshe, Ph.D.Mechanical EngineeringUniversity of Arkansas, Fayetteville, AR, U.S.A.
ConvergenceConvergence of Scales-Signals-Domains for Integrated Systems… of Scales-Signals-Domains for Integrated Systems…
Examples of integration of nano-micro-bio fornanomanufacturing of integrated systems, (a) nano mechanical machining system on chip
(status- fabrication complete and is being released);
(b) femto second, 380 fs, written periodic feature on diamond, smallest feature is about 50 nm;
(c) E. Coli Cellular actuation using 30 nm flagilar motors (see attached movie);
(d) 3D assembled cBN 0-2 um sized particles in TiN matrix (technology used to spin-off NanoMech);
(e) nanomechanical silicon beam for NEMS devices;
(f) nano mechanical patterning of GaAs surface for growing array of quantum structures 1.5μm scan of sample after a 5x5 grid of 25 (30 nm) 40μN indents spaced approximately 200nm apart.
(c)
(d)
15nm
(b)
(a)
50nm
(111)
(c)
cBN-TiN compositecoating
(d)
(e)
NanoMEEG
(f)
(d)
Nanotechnology for Mechanical Engineers Glimpses of Work in Malshe’s Materials and Manufacturing Research Group:
Key challenges for metrology and instrumentation…Key challenges for metrology and instrumentation…
Nano materials- functional and dimensional classification
Tools and systems for reproducible nano manipulation* and post-synthesis processing (* self and/or intentional)- tolerance, materials and interfacial analysis
Integration and packaging- interconnects across the scale and functional boundaries
Addressing component reliability and system durability- known standards
Addressing “application specific” scientific and engineering designing-to-processing issues- proven design , modeling and scale up tools
Integrated CircuitsICs
Micro Electro Mechanical Systems (MEMS)
Quantum structure, Laser Dots
DNA Computing
Trend of Progress in the Field of Micro and Nano SystemsTrend of Progress in the Field of Micro and Nano Systems
DMII- National Science Foundation (NSF) EPSCoR- National Science Foundation (NSF)ECS- National Science Foundation (NSF) Air Force Office of Scientific Research (AFOSR) Students and post-doctoral fellows, and colleagues. Collaborators from SNL, LBNL, UNL and OSU, Valenite, Coherent and Texas A&M. Fayetteville and Springdale high schools.