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Page 1: ADVANTECH US INC 160 INDUSTRY DRIVE RIDC PARK WEST PITTSBURGH PA 15275 USA  Evaporation Printing of Patterned Thin Films May, 2013.

ADVANTECH US INC160 INDUSTRY DRIVERIDC PARK WESTPITTSBURGH PA 15275 USAwww.advantechus.com

Evaporation Printing of Patterned Thin Films

May, 2013

Page 2: ADVANTECH US INC 160 INDUSTRY DRIVE RIDC PARK WEST PITTSBURGH PA 15275 USA  Evaporation Printing of Patterned Thin Films May, 2013.

Advantech US, Inc. COPYRIGHT 2013 2

OUTLINE

• Introduction• Company Overview and Key Staff• Evaporation Printing of Patterned Thin Films Technology

– Show mask management– Alignment registration

• Market Applications– Active Matrix Display Backplanes

• ESL• OLED

– Printed Electronics• Fine Lines• Embedded Components

• Facility Description• Technology and Product Roadmap

Page 3: ADVANTECH US INC 160 INDUSTRY DRIVE RIDC PARK WEST PITTSBURGH PA 15275 USA  Evaporation Printing of Patterned Thin Films May, 2013.

ADVANTECH US INC160 INDUSTRY DRIVERIDC PARK WESTPITTSBURGH PA 15275 USAwww.advantechus.com

Overview

Page 4: ADVANTECH US INC 160 INDUSTRY DRIVE RIDC PARK WEST PITTSBURGH PA 15275 USA  Evaporation Printing of Patterned Thin Films May, 2013.

Advantech US, Inc. COPYRIGHT 2013 4

INTRODUCTION

1. Fabricate patterned thin films with feature size down to five micron with alignment accuracy better than one micron.

2. Simple approach to printed electronics thin film fabrication using additive manufacturing called evaporation printing

– Utilizes vapor deposition of evaporable metals, oxides and semiconductor materials through a shadow mask

– Nearly any substrate– Roll-to-roll capable

3. Simple, fast, low cost, efficient and green technology

4. Usage of multiple shadow masks combined with precision alignment enables multi-layer fabrication of arrays including embedded TFTs, capacitors and resistors

5. Active matrix backplanes for OLED and ePaper displays have been fabricated and demonstrated

6. Fine line and passive and active component fabrication development ability underway

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Advantech US, Inc. COPYRIGHT 2013 5

COMPANY OVERVIEW

• Founded by Dr. Peter Brody– active matrix display backplane pioneer– Winner of numerous awards including Draper Prize in 2012

• Developed alternative to photolithography-based microcircuit manufacturing– Display backplanes matrices – OLED and ePaper– Fine lines for chip packaging– Passive and active components

• Funded by private equity and successful entrepreneur family• Technology has been proven• Scaling up low volume in-line beta tool • Developing production process• Business model

– Sell products to prove process and tool– Sell process equipment; License Technologies

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Advantech US, Inc. COPYRIGHT 2013 6

MANAGEMENT & KEY STAFFADVANTECH TALENT BASE IS CONSIDERABLE

Sr. Management: CEO Whit Little, MBA, Edinburgh (Scotland). An experienced financial & operational officer in both technology startups and manufacturing.

VP Blake Brocato, with 30 years in thin film deposition with Seagate Technology and others.

VP Scott Lauer, EE and MBA, University of Pittsburgh 17 years in control systems and automation, with Rockwell Automation and II-IV, Inc. A licensed professional engineer.

Key Technical Staff:Tom Ambrose PhD, material physics (Johns Hopkins). Expert in thin film deposition methodologies.

Brian Bucci, PhD mechanical engineering (Pitt) with precision equipment experience

Prashin Sharma, mechanical eng’g MS degree (Carnegie-Mellon. Former researcher in micro-nano tooling.)

Chuck Harrigal, EE (Penn State). Multiple industry experience in embedded hardware/software development.

John Shelapinsky, ME (CMU), MBA (CMU). Prior electro- and optics-mechanical designer.

Jeff Conrad , Over 30 years experience with vacuum deposition equipment.

Tim Cowen, Over 30 years experience in shadow-mask vacuum deposition.

CONTINUED

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Advantech US, Inc. COPYRIGHT 2013 7

MANAGEMENT & KEY STAFFAMAX’S TALENT BASE IS CONSIDERABLE (CONTINUED)

Contracted Senior Staff:

Poohsan Tamura, optical sensing PhD (Arizona). expert in optical sensing, metrology and inspection. Vladimir Brajovic, PhD in Robotics, Carnegie Mellon. Broad research & applications expertise in computational imaging, algorithms and architecture.

Nebojsa Jankovic, PhD Professor University of Nis, Serbia Faculty of Electronic Engineering (EF) Department of Microelectronics

Bud Smith, mechanical engineer with MBA from MIT. Prior Booz-Allen consultant & senior executive/CEO in process control, microprocessing and tool manufacturing. University of Pittsburgh business faculty.

Joshua Ziff, nuclear eng’g (Purdue) &MBA (Carnegie-Mellon). Ex-CEO of Bridge Semiconductor.

Jean Nagy, Accounting (Penn State) and CPA. Prior Arthur Andersen auditor, and financial/operations director at GlaxoSmithKline.

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ADVANTECH US INC160 INDUSTRY DRIVERIDC PARK WESTPITTSBURGH PA 15275 USAwww.advantechus.com

Technology Overview

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Advantech US, Inc. COPYRIGHT 2013 9

ADVANTECH US TECHNOLOGY

Evaporation PrintingAdditive process

Vacuum Deposition (thermal and/or e-beam)

Fine Metal Foil Shadow Masks

Depo

sition+ =

Sub 1 mil aperture Masks 1 mm Alignment Multiple Steps

+

High and Low temperature materials

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Advantech US, Inc. COPYRIGHT 2013 10

MATERIALS

• The range of materials is extensive, including pure metals, precious metals, standard alloys, oxides, nitrides, and fluorides. “Anything Evaporable”

Sample Evaporable Materials*Metals Oxides Semiconductor

Copper Nichrome Aluminum Oxide Tellurium

Nickel Nickel/Vanadium Silicon Dioxide IGZO

Aluminum Titanium ITO CdSe

Gold Silver ZnO

Indium Tin

* non-exhaustive list. Contact us about your specific material

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Advantech US, Inc. COPYRIGHT 2013 11

Fine metal foil (electro-formed) with distinct aperture features (cut outs) Nearly any shape imaginable: squares, circles, etc.

Current Mask Design specs:All feature sizes less than 1 mil (25 microns)

• Shadow mask thickness: 10 - 20 mm• Feature trace size: <10 mm• Feature spacing : ~20 mm • Mask fixed to rigid frame (held taut) • Mask cleaning: wet etch process• Mask lifetimes (> 2 years)

Proprietary Shadow Mask Management

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Advantech US, Inc. COPYRIGHT 2013 12

Proprietary Precision Alignment

Test Procedure: Align, Deposit, Remove sample and document alignment 10 timesGoal: Prove repeatable alignment

10th Deposition1st Deposition

Results: Independent alignments repeatable to within 1 micron

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Advantech US, Inc. COPYRIGHT 2013 13

SMALL METAL LINE FEATURES

15 mm

Minimum feature size : <10 mm

Minimum feature spacing: ~20 mm

Any type of substrate(rigid glass or flexible plastic)

30 mm

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Advantech US Amax Evaporation Printing™

Position Accuracy +/- 1 micron

Feature Tolerance +/- 2 microns

Smallest Feature Size < 10 microns

Mask Size 370mmx470mm (G2.5) - currently

Evaporation Precision

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Advantech US, Inc. COPYRIGHT 2013

Masks and deposited materials can be configured for specific end-user requirements

Masks

Sem

icon

duct

or

Exi

t L

oadl

ock

Masks Masks

Ent

ran

ce

Loa

dloc

k

Oxi

des

Met

als

Etc

h C

lea

n

ConceptFlexible Multi-Chamber In-Line Manufacturing

•Modular

•Loadlocks to eliminate particles

•Reduce material cross contamination

•Improve substrate cleanliness

•Quick change product by changing masks

•Low volume production runs

•Add chambers = increase throughput

•Can make many configurations of passive and active components

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Advantech US, Inc. COPYRIGHT 2013 16

AMAX MINILINE™

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ADVANTECH US INC160 INDUSTRY DRIVERIDC PARK WESTPITTSBURGH PA 15275 USAwww.advantechus.com

Build Examples

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E-PaperShadow Mask Steps

6 total process build steps

PROPRIETARY AND CONFIDENTIAL

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miniLineTM ESL Backplane Build

pre-patterned substratesemiconductorSource/Drain LeadsGate OxideCap/Cross Over OxideGate /Top Cap metalCrossover Straps

50 mmOptical Micrograph

Pixel Layout

Page 20: ADVANTECH US INC 160 INDUSTRY DRIVE RIDC PARK WEST PITTSBURGH PA 15275 USA  Evaporation Printing of Patterned Thin Films May, 2013.

TFT BuildShadow Mask Steps

7 total process build steps

PROPRIETARY AND CONFIDENTIAL

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AM-OLED TFT Circuit Build Example

V Trigger

V Data

V DD

Output Pad

T1

T2

C

D

SG

D

S

G

Glass substrate

Oxide

Semiconductor

DrainGate Oxide

Metal Gate

DrainSource

2 transistor - 1 capacitor (2T/1C) active matrix array

Array specs: 960 x 240 pixels - 115 mm diagonal

Feature size is ~ 15 um with a better than 1 um alignment

Field Effect Transistor Cross Section TFT CircuitPROPRIETARY AND CONFIDENTIAL

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Pre-Patterned Substrate

1

2

1 2 3 4 5 6 7

VDD

VTrigger

VData

PROPRIETARY AND CONFIDENTIAL

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Oxide Deposition

1

2

1 2 3 4 5 6 7 1

PROPRIETARY AND CONFIDENTIAL

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Oxide and Semiconductor

1

2

1 2 3 4 5 6 7 2

PROPRIETARY AND CONFIDENTIAL

Page 25: ADVANTECH US INC 160 INDUSTRY DRIVE RIDC PARK WEST PITTSBURGH PA 15275 USA  Evaporation Printing of Patterned Thin Films May, 2013.

Al and Ni contacts

1

2

1 2 3 4 5 6 7 3

PROPRIETARY AND CONFIDENTIAL

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Gate Oxide

1

2

1 2 3 4 5 6 7 4

PROPRIETARY AND CONFIDENTIAL

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Ni and Al strap

1

2

1 2 3 4 5 6 7 5

PROPRIETARY AND CONFIDENTIAL

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Cap Oxide

1

2

1 2 3 4 5 6 7 6

PROPRIETARY AND CONFIDENTIAL

Page 29: ADVANTECH US INC 160 INDUSTRY DRIVE RIDC PARK WEST PITTSBURGH PA 15275 USA  Evaporation Printing of Patterned Thin Films May, 2013.

Top Gate

1

2

1 2 3 4 5 6 7 7

PROPRIETARY AND CONFIDENTIAL

Page 30: ADVANTECH US INC 160 INDUSTRY DRIVE RIDC PARK WEST PITTSBURGH PA 15275 USA  Evaporation Printing of Patterned Thin Films May, 2013.

1

2

1 2 3 4 5 6 7

Output Pad

T2

T1

CapVDD

VTrigger

VDataSub Pixel

RED GREEN BLUE25

0 um

83.3 um

PROPRIETARY AND CONFIDENTIAL

Page 31: ADVANTECH US INC 160 INDUSTRY DRIVE RIDC PARK WEST PITTSBURGH PA 15275 USA  Evaporation Printing of Patterned Thin Films May, 2013.

Chip CarrierShadow Mask Steps

3 total process build steps

PROPRIETARY AND CONFIDENTIAL

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Advantech US, Inc. COPYRIGHT 2013 32

CARRIER WITH DIE

Start Finish

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Advantech US, Inc. COPYRIGHT 2013 33

Mask 1

MASK 1

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Advantech US, Inc. COPYRIGHT 2013 34

Mask 1

LAYER 1

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Advantech US, Inc. COPYRIGHT 2013 35

Mask 2

MASK 2

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Advantech US, Inc. COPYRIGHT 2013 36

Mask 2

LAYER 2

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Advantech US, Inc. COPYRIGHT 2013 37

Mask 3

MASK 3

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Advantech US, Inc. COPYRIGHT 2013 38

Mask 3

LAYER 3: BUILD COMPLETE

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ADVANTECH US INC160 INDUSTRY DRIVERIDC PARK WESTPITTSBURGH PA 15275 USAwww.advantechus.com

Markets

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Advantech US, Inc. COPYRIGHT 2013 40

MARKET APPLICATIONS

• End-user target markets– Active Matrix backplanes

• ePaper displays• OLED displays

– Printed Electronics• Electronic shelf labels (ESL) - segmented• Fine lines• Embedded active and passive components

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Advantech US, Inc. COPYRIGHT 2013 41

Note: Device fabrication in a single vacuum chamber (6 different deposition steps)

Vgate

V data

T1 T2

VddVdd

C

Vcom

Active Matrix backplanes

2T/1C circuit Mask layout Final device

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Advantech US, Inc. COPYRIGHT 2013 42

DISPLAY EXAMPLES – AMOLED

250 microns

83 microns

R G B

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Advantech US, Inc. COPYRIGHT 2013 43

EPAPER EXAMPLES: ACTIVE MATRIX ESL

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Advantech US, Inc. COPYRIGHT 2013 44

PRINTED ELECTRONICS

Beyond Backplanes• Fine Lines• Embedded Components

44

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Advantech US, Inc. COPYRIGHT 2013 45

FINE LINES – MICROLINES™

• New opportunity beyond display backplanes• Exploit ability to manufacture small feature sizes on

a variety of substrates• Chip Carriers need finer lines

– Miniaturization – space, weight and power– High speed transfer rates– Reduce number of PCB layers

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Advantech US, Inc. COPYRIGHT 2013 46

SEM OF MICROLINES CONNECTED TO VIAS

standard 10 mil via pads with 100 micron and 70 micron traces and a 50 micron space.

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Advantech US, Inc. COPYRIGHT 2013 47

SEM OF MICROLINES CONNECTED TO VIAS

4 mil pads with 2 mil vias connected with 1 mil lines

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Advantech US, Inc. COPYRIGHT 2013 48

MICROLINES

8 mm

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Advantech US, Inc. COPYRIGHT 2013 49

MICROLINES (CONT’D)

5 micron lines

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Advantech US, Inc. COPYRIGHT 2013 50

ACTIVE AND PASSIVE COMPONENTS

• Discrete components fabricated on substrates:– Resistors– Capacitors– Transistors– Diodes– Antennas

Page 51: ADVANTECH US INC 160 INDUSTRY DRIVE RIDC PARK WEST PITTSBURGH PA 15275 USA  Evaporation Printing of Patterned Thin Films May, 2013.

Technology Comparison for Active Matrix TFTsa-Si Poly-Si Organic ADV Technology

Circuit Type n-type n-type or p-type

n-type or p-type n-type, p-type possible

Stability (ΔVT) Issue More stable than a-Si

More stable than a-Si

More stable than poly-Si

VT (uniformity) High Low Low High

Mobility (cm2/Vs) 0.5 – 1.0 30-100 1 - 5 50-100

Process Annealing Temperature

No anneal T > 650C No anneal T < 450C

Manufacturability Mature New Not yet New

Cost Low High Maybe low Low

Flexible substrate Possible Uncertain Possible Promising

Shadow Mask Capable

Drive Capacity (Ion)

No

Large W/L to reduce VG

No

Small W/L at small VG

No

Large W/L to reduce VG

Yes

Small W/L atsmall VG

PROPRIETARY AND CONFIDENTIAL

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Advantech US, Inc. COPYRIGHT 2013 52

ACTIVE COMPONENTS – TFT (ESL)

Panel Summary Average St. Dev.Vth (V) 1.52 1.03

Mobility (cm2/Vs) 69 29.19Leakage Current (A) 2.97E-11 1.41E-11

Hysteresis (V) 4.79 1.05

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Advantech US, Inc. COPYRIGHT 2013 53

STEP COVERAGE

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Advantech US, Inc. COPYRIGHT 2013 54

CHARACTERISTIC IMPEDANCE (ZO) DATA

Minimum Maximum Average

4 mil 31.4 33.1 32.7

3 mil 39.6 41.4 40.3

2 mil 49.4 53.1 51.1

1.5 mil 58.4 63.9 61.5

1.0 mil 65.1 70.5 67.9

Line Parameters: 5000 Å Copper, 300 micron pitchSubstrate: 25 micron Kapton ESample Size: 10 sample lines measured per widthTest parameters: 1 MHz, Values in Ohms

Test Measurements compare well with Wheeler Formulations for Microstrips

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Advantech US, Inc. COPYRIGHT 2013 55

THICKNESS REQUIREMENTS

0 101,000

100,000

10,000,000

1,000,000,000

100,000,000,0000.01

0.1

1

10

100

1000

10000

100000

Skin Effect

CopperAluminumGoldSilverNickel

Frequency (Hz)

Mat

eria

l Thi

ckne

ss (m

icron

s)

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Advantech US, Inc. COPYRIGHT 2013 56

PASSIVE COMPONENTS - RESISTORS

25 microns (1 mil)

• Shown: test panel of resistors that are 1 mil wide connected to 1 mil lines.

• By changing the resistive material and thickness, virtually any resistance from fractional ohms to several megohms per resistor is possible

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Advantech US, Inc. COPYRIGHT 2013 57

PRELIMINARY RESISTOR DATA (0.5 MIL WIDE)

0 100 200 300 400 500 60025

26

27

28

29

30

31

32

33

34

35

Cu & NiCr Resistors on Kapton™

RESISTANCE

Resistor #

RESI

STAN

CE (O

hms)

30.0 target29.543 average

0.628 stdev

2.13% tolerance

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Advantech US, Inc. COPYRIGHT 2013 58

PASSIVE COMPONENTS - CAPACITORS

Average Measured Capacitance(pF) Tolerance

2.31pF 2%2.76pF 3%2.08pF 1%

• Parallel Plate Capacitors made with the process. • Devices were 100 square micron area with and a

dielectric layer of 3000 Å of Al2O3 with pad layers of 1000Å Al.

• Random sample of 100 capacitors on panels containing over 14,000 capacitors.

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Advantech US, Inc. COPYRIGHT 2013 59

“BALLPARK” PRICING ESTIMATES

• Mask NRE: $1,500 to $35,000 per layer– Dependent upon: Feature size, design complexity,

Overall dimensions• Set-up/prep: $500• Approx. $100/layer (affected by depo. time)

– Does not include substrate nor materials• Testing Requirements –as required

Page 60: ADVANTECH US INC 160 INDUSTRY DRIVE RIDC PARK WEST PITTSBURGH PA 15275 USA  Evaporation Printing of Patterned Thin Films May, 2013.

ADVANTECH US INC160 INDUSTRY DRIVERIDC PARK WESTPITTSBURGH PA 15275 USAwww.advantechus.com

Advantech US FacilityPittsburgh PA

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Advantech US, Inc. COPYRIGHT 2013 61

Description:21000 sqft Build Space

9000 sqft Clean Space (class 1000 and 10000)5000 sqft test and development space (non-cleanroom)7000 sqft office space

UtilitiesElectric: 500kva, 480v - 208/120vacWater/Sewage: PublicDI Water: Filtered in-houseLiquid Nitrogen: 1000 gallon external tankNatural Gas: available (currently minor usage)Chilled Water: In house

NEW FACILITY

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Advantech US, Inc. COPYRIGHT 2013 62

DEPOSITION EQUIPMENTPilot Production ManufacturerminiLine in-line process system custom

5 Chamber In-Line ProcessCapable of up to 370x470mm substrates (currently 200mmx200mm)Sputter/Etch Cleaning, Thermal, 4 e-beamExpected TACT: 10 minutesCustom sub-micron alignment stages (x,y,z, theta)

Research And Development Acquired from Kodak in-line Deposition System Plasmatron

5 Process ChambersE-Beam, Thermal, Sputter sourcesCapable of 6” square substrates

Balzers-Kurdex Box Coater Deposition System customSingle Chamber deposition, 8 inch substrate, 4 inch maskCapable of 6 masks e-beam , thermal, etch

Orion 3000 High Vacuum Deposition System customSingle Chamber Deposition, 8 inch substrate, 4 inch maskCapable of 8 masks: e-beam, thermal, etch

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Advantech US, Inc. COPYRIGHT 2013 63

PROCESS EQUIPMENT

Equipment ManufacturerRapid Thermal Annealer Modular Process Technology Corp.RGA on SCT Series Orion 3000 Deposition SystemCVC Model 601 High Vacuum Sputtering Deposition System CustomizedNeslab Model HX-750 Refrigerated Circulation ChillerAnnealerTemptronic RP350/TP2TD Hybrid EconoscopeSub-micron alignment stage(s) CustomFOG/AGF Bonding SystemUltratech Spin Rinse DryerSemi-tool Spin Rinse DryerRite Trak Developer/coaterLaminatorEnvironmental OvensSpin CoaterSub 40c Freezer ScienTemp

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TESTING EQUIPMENT

Equipment ManufacturerParameter Analyzer Value TronicsAutomatic Wafer Prober Texas InstrumentsCurve TracerManual ProberMeters for testing VariousOscilloscope TDS 3054 TecktronixOscilloscope TDS 3055 TektronixLCR Meter HP 4284A HPmicroscopes VariousSeiwa Optical PS-888 YAG Laser StationFinescan 120L CMMHitachi S520 Scanning Electron Microscope HitachiSUSS PA 300 Probe StationIntegral Vision Sharpeye Optical test stationDektak 8 Profilometer

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AUXILIARY EQUIPMENT

Equipment Manufacturer

Glove Box Controller/Sensor for OLED processing General Eastern

Dual Chamber Glove Box w/load lock for OLED processing

Equipment for Technology & Science Inc.

Vacuum Leak Detector

Laminar Flow Hood Ultrapure Technology

Milling machine Enco Manufacturing, Co.

Fisher Hamilton Safeaire flow hood 6' x 2'

Reynoldstech Wet bench

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ADVANTECH US INC160 INDUSTRY DRIVERIDC PARK WESTPITTSBURGH PA 15275 USAwww.advantechus.com

Roadmap

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COMPANY ROADMAP

• Phase I – Proof of Concept - Completed– Demonstrated 60x80 mm (100 dpi) color OLED displays and

25x35 mm (70 dpi) dot matrix ePaper displays using active matrix backplanes fabricated using evaporation printing in R&D Fab

• Phase II – Characterize In-line Manufacturability – Underway– Active matrix backplanes now being fabricated– Scale-up process– Validate performance, throughput, yield and cost assumptions– Identify modifications needed for production level equipment

• Phase III – Manufacturing - Future– Design and build manufacturing tool for production

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• Flexible substrates• Large area substrates• Higher resolution • Roll to roll manufacturing

LONG TERM VISION