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Active Fault Level Management Jonathan Berry LCNF Conference 25 th October 2012
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Active Fault Level Management Jonathan Berry LCNF Conference 25 th October 2012.

Dec 15, 2015

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Page 1: Active Fault Level Management Jonathan Berry LCNF Conference 25 th October 2012.

Active Fault Level Management

Jonathan BerryLCNF Conference25th October 2012

Page 2: Active Fault Level Management Jonathan Berry LCNF Conference 25 th October 2012.

Agenda

• Why monitor Fault Level?• Development and testing of an active FL

monitoring device• Next steps for the Project

Page 3: Active Fault Level Management Jonathan Berry LCNF Conference 25 th October 2012.

Why Monitor Fault Level?

UK energy policy

More generation

sources being

connected in distribution networks

Increased fault levels

Existing equipment

ratings becoming exceeded

Substantial infrastructure

investment

Major operational restrictions

Inability to connect new generation

Page 4: Active Fault Level Management Jonathan Berry LCNF Conference 25 th October 2012.

Increased Fault Level knowledge

Enhanced network

operational decision making

Existing equipment

ratings NOT exceeded

Increased operational regimes for customers

Substantial infrastructure

investment

Major operational restrictions

Inability to connect new generation

Why Monitor Fault Level?

Page 5: Active Fault Level Management Jonathan Berry LCNF Conference 25 th October 2012.

• Move from natural disturbance to artificial disturbance detection

• Device to create an artificial, non-customer affecting, disturbance

Development of an Active System

5

S&C IntelliRupter

Page 6: Active Fault Level Management Jonathan Berry LCNF Conference 25 th October 2012.

Active FLM Testing

IntelliRupter

Current TransformersVoltage Transformers

Inductor

PM7000 - FLM

Page 7: Active Fault Level Management Jonathan Berry LCNF Conference 25 th October 2012.

Active FLM test results

Fault Level ResultsPredicted Actual Error

Peak 30.63kA 31.34kA 2.26%RMS 12.72kA 13.10kA 2.90%

Page 8: Active Fault Level Management Jonathan Berry LCNF Conference 25 th October 2012.

Harmonic and Voltage test results

17:22:36.62419/07/12 17:22:36.93119/07/126.3606.3806.400

Voltage (kV) MaximumMinimumAveragekV RMS of Van 6.417 6.353 6.406kV RMS of Vbn 6.398 6.343 6.388kV RMS of Vcn 6.397 6.385 6.393

20:33:23.05419/07/12 20:33:23.38019/07/1223.15 23.20 23.25 23.30Time 326 millisecs (ss)-10.0000.00010.000

Voltage (kV) 2.04.0

Value (%) MaximumMinimumAverage% THD of Vab 4.7 0.4 1.1% THD of Vcb 2.2 0.5 0.8Input Vab (V1) (Waveform) 15.787 -15.764 -0.026Input Vcb (V3) (Waveform) 15.777 -15.756 0.132Harmonic distortion caused by FLMVoltage fluctuation caused by FLM

Both tests were carried out using the factory acceptance test arrangement

• Maximum voltage fluctuation is 1% in a 300ms timeframe• This result is ER P28 compliant

• Maximum Total Harmonic Distortion is 4.7% in a 300ms timeframe• This result is ER G5/4 compliant

• Fault Level prediction accuracy within 4.5%

Page 9: Active Fault Level Management Jonathan Berry LCNF Conference 25 th October 2012.

Development and Next Steps

Natural disturbance monitoring

• Utilise network events to monitor changes in voltage and current

• Fault Level data stored for analysis

Artificial disturbance monitoring

• Utilise artificial events to create changes in voltage and current

• Determine Fault Level in real-time

Real-time Fault Level monitoring

Page 10: Active Fault Level Management Jonathan Berry LCNF Conference 25 th October 2012.

Thank you

www.westernpowerinnovation.co.uk

Jonathan BerryInnovation & Low Carbon Networks Engineer

[email protected] 258 671 / 0121 6 239459