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http://dx.doi.org/10.1109/GLOCOMW.2013.6825032http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6820092 -
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http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6597908http://dx.doi.org/10.1109/IFOST.2013.6616855 -
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http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6844760http://dx.doi.org/10.1109/CCGrid.2014.81 -
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http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6767438http://dx.doi.org/10.1109/ICACT.2014.6779008 -
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http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6917613http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6917613http://dx.doi.org/10.1109/InfoSEEE.2014.6947857 -
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http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=5993482http://dx.doi.org/10.1109/ICCSN.2011.6014716 -
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http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6132468http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6132468http://dx.doi.org/10.1109/CloudCom.2011.39 -
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http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6297597http://dx.doi.org/10.1109/CSIP.2012.6309055 -
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http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=5676248http://dx.doi.org/10.1109/PDGC.2010.5679900 -
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http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=71http://ieeexplore.ieee.org/xpl/tocresult.jsp?isnumber=5739684http://dx.doi.org/10.1109/TPDS.2010.183http://www.computer.org/ -
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http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6524211http://dx.doi.org/10.1109/CSNT.2013.97 -
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http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=5581173http://dx.doi.org/10.1109/ISSA.2010.5588290 -
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http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6070513http://dx.doi.org/10.1109/ICSMC.2011.6083866 -
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http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6362338http://dx.doi.org/10.1109/ICSMC.2012.6377874 -
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http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6238218http://dx.doi.org/10.1109/CyberSec.2012.6246174 -
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http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6754623http://dx.doi.org/10.1109/WCCCT.2014.53 -
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http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6527367http://dx.doi.org/10.1109/UKSim.2013.39 -
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http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6018838http://dx.doi.org/10.1109/DSR.2011.6026885 -
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http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6034549http://dx.doi.org/10.1109/CCIS.2011.6045072 -
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http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=5703185http://dx.doi.org/10.1109/EUC.2010.114 -
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http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6132196http://dx.doi.org/10.1109/WICT.2011.6141351 -
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http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=5461675http://dx.doi.org/10.1109/INFCOM.2010.5462173 -
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http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6709841http://dx.doi.org/10.1109/ICCSCE.2013.6719955
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