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The GLS27SF512/010/020 are a 64K x8 / 128K x8 / 256Kx8 CMOS, Many-Time Programmable (MTP) low costflash, manufactured with high performance SuperFlashtechnology. The split-gate cell design and thick oxide tun-neling injector attain better reliability and manufacturabilitycompared with alternate approaches. These MTP devicescan be electrically erased and programmed at least 1000times using an external programmer with a 12V power sup-ply. They have to be erased prior to programming. Thesedevices conform to JEDEC standard pinouts for byte-widememories.
Featuring high-performance Byte-Program, theGLS27SF512/010/020 provide a Byte-Program time of 20µs. Designed, manufactured, and tested for a wide spec-trum of applications, these devices are offered with anendurance of at least 1000 cycles. Data retention is rated atgreater than 100 years.
The GLS27SF512/010/020 are suited for applications thatrequire infrequent writes and low power nonvolatile stor-age. These devices will improve flexibility, efficiency, andperformance while matching the low cost in nonvolatileapplications that currently use UV-EPROMs, OTPs, andmask ROMs.
To meet surface mount and conventional through holerequirements, the GLS27SF512 are offered in 32-leadPLCC, 32-lead TSOP, and 28-pin PDIP packages. TheGLS27SF010/020 are offered in 32-pin PDIP, 32-leadPLCC, and 32-lead TSOP packages. See Figures 3, 4,and 5 for pin assignments.
Device OperationThe GLS27SF512/010/020 are a low cost flash solutionthat can be used to replace existing UV-EPROM, OTP,and mask ROM sockets. These devices are functionally(read and program) and pin compatible with industrystandard EPROM products. In addition to EPROM func-tionality, these devices also support electrical Eraseoperation via an external programmer. They do notrequire a UV source to erase, and therefore the pack-ages do not have a window.
ReadThe Read operation of the GLS27SF512/010/020 is con-trolled by CE# and OE#. Both CE# and OE# have to below for the system to obtain data from the outputs. Oncethe address is stable, the address access time is equal tothe delay from CE# to output (TCE). Data is available at theoutput after a delay of TOE from the falling edge of OE#,assuming that CE# pin has been low and the addresses
have been stable for at least TCE-TOE. When the CE# pin ishigh, the chip is deselected and a typical standby current of10 µA is consumed. OE# is the output control and is usedto gate data from the output pins. The data bus is in highimpedance state when either CE# or OE# is high.
Byte-Program OperationThe GLS27SF512/010/020 are programmed by using anexternal programmer. The programming mode forGLS27SF010/020 is activated by asserting 11.4-12V onVPP pin, VDD = 4.5-5.5V, VIL on CE# pin, and VIH on OE#pin. The programming mode for GLS27SF512 is activatedby asserting 11.4-12V on OE#/VPP pin, VDD = 4.5-5.5V,and VIL on CE# pin. These devices are programmed byte-by-byte with the desired data at the desired address usinga single pulse (CE# pin low for GLS27SF512 and PGM#pin low for GLS27SF010/020) of 20 µs. Using the MTPprogramming algorithm, the Byte-Programming processcontinues byte-by-byte until the entire chip has been pro-grammed.
Chip-Erase OperationThe only way to change a data from a “0” to “1” is by electri-cal erase that changes every bit in the device to “1”. Unliketraditional EPROMs, which use UV light to do the Chip-Erase, the GLS27SF512/010/020 uses an electrical Chip-Erase operation. This saves a significant amount of time(about 30 minutes for each Erase operation). The entirechip can be erased in a single pulse of 100 ms (CE# pinlow for GLS27SF512 and PGM# pin for GLS27SF010/020). In order to activate the Erase mode forGLS27SF010/020, the 11.4-12V is applied to VPP and A9
pins, VDD = 4.5-5.5V, VIL on CE# pin, and VIH on OE# pin.In order to activate Erase mode for GLS27SF512, the 11.4-12V is applied to OE#/VPP and A9 pins, VDD = 4.5-5.5V,and VIL on CE# pin. All other address and data pins are“don’t care”. The falling edge of CE# (PGM# forGLS27SF010/020) will start the Chip-Erase operation.Once the chip has been erased, all bytes must be verifiedfor FFH. Refer to Figures 13 and 14 for the flowcharts.
Product Identification ModeThe Product Identification mode identifies the devices asthe GLS27SF512, GLS27SF010 and GLS27SF020 andmanufacturer as Greenliant. This mode may be accessedby the hardware method. To activate this mode forGLS27SF010/020, the programming equipment must forceVH (11.4-12V) on address A9 with VPP pin at VDD (4.5-5.5V)or VSS. To activate this mode for GLS27SF512, the pro-gramming equipment must force VH (11.4-12V) on addressA9 with OE#/VPP pin at VIL. Two identifier bytes may thenbe sequenced from the device outputs by toggling addressline A0. For details, see Tables 3 and 4 for hardware opera-tion.
FIGURE 5: Pin Assignments for 28-pin and 32-pin PDIP
TABLE 2: Pin Description
Symbol Pin Name Functions
AMS1-A0
1. AMS = Most significant addressAMS = A15 for GLS27SF512, A16 for GLS27SF010, and A17 for GLS27SF020
Address Inputs To provide memory addresses
DQ7-DQ0 Data Input/output To output data during Read cycles and receive input data during Program cyclesThe outputs are in tri-state when OE# or CE# is high.
CE# Chip Enable To activate the device when CE# is low
OE# Output Enable For GLS27SF010/020, to gate the data output buffers during Read operation
OE#/VPP Output Enable/VPP For GLS27SF512, to gate the data output buffers during Read operation and high voltage pin during Chip-Erase and programming operation
VPP Power Supply forProgram or Erase
For GLS27SF010/020, high voltage pin during Chip-Erase and programming operation 11.4-12V
VDD Power Supply To provide 5.0V supply (4.5-5.5V)
Absolute Maximum Stress Ratings (Applied conditions greater than those listed under “Absolute MaximumStress Ratings” may cause permanent damage to the device. This is a stress rating only and functional operationof the device at these conditions or conditions greater than those defined in the operational sections of this datasheet is not implied. Exposure to absolute maximum stress rating conditions may affect device reliability.)
Certain with-Pb 32-PLCC package types are capable of 240°C for 10 seconds; please consult the factory for the latest information.2. Outputs shorted for no more than one second. No more than one output shorted at a time.
TABLE 13: Program/Erase Cycle Timing Parameters for GLS27SF010/020
Symbol Parameter Min Max UnitsTCES CE# Setup Time 1 µsTCEH CE# Hold Time 1 µsTAS Address Setup Time 1 µsTAH Address Hold Time 1 µsTPRT VPP Pulse Rise Time 50 nsTVPS VPP Setup Time 1 µsTVPH VPP Hold Time 1 µsTPW PGM# Program Pulse Width 20 30 µsTEW PGM# Erase Pulse Width 100 500 msTDS Data Setup Time 1 µsTDH Data Hold Time 1 µsTVR A9 Recovery Time for Erase 1 µsTART A9 Rise Time to 12V during Erase 50 nsTA9S A9 Setup Time during Erase 1 µsTA9H A9 Hold Time during Erase 1 µs
AC test inputs are driven at VIHT (2.4 V) for a logic “1” and VILT (0.4 V) for a logic “0”. Measurement reference points forinputs and outputs are VHT (2.0 V) and VLT (0.8 V). Input rise and fall times (10% 90%) are <10 ns.
Note: VHT - VHIGHTestVLT - VLOW TestVIHT - VINPUT HIGH TestVILT - VINPUT LOW Test
Note: Valid combinations are those products in mass production or will be in mass production. Consult your Greenliant sales representative to confirm availability of valid combinations and to determine availability of new combinations.
Environmental AttributeE1 = non-Pb
Package ModifierH = 32 pins or leads
Package TypeN = PLCCP = PDIPW = TSOP (type 1, die up, 8mm x 14mm)
Note: 1. Complies with JEDEC publication 95 MS-016 AE dimensions, although some dimensions may be more stringent.2. All linear dimensions are in inches (max/min).3. Dimensions do not include mold flash. Maximum allowable mold flash is .008 inches.4. Coplanarity: 4 mils.
FIGURE 18: 32-lead Thin Small Outline Package (TSOP) 8mm x 14mmGreenliant Package Code: WH
32-tsop-WH-7
Note: 1. Complies with JEDEC publication 95 MO-142 BA dimensions,although some dimensions may be more stringent.
2. All linear dimensions are in millimeters (max/min).3. Coplanarity: 0.1 mm4. Maximum allowable mold flash is 0.15 mm at the package ends, and 0.25 mm between leads.
Note: 1. Complies with JEDEC publication 95 MO-015 AP dimensions, although some dimensions may be more stringent.2. All linear dimensions are in inches (max/min).3. Dimensions do not include mold flash. Maximum allowable mold flash is .010 inches.