Nanotechnology www.kteknano.com Quick Guide Your Source for High-Performance AFM Probes & Accessories Shop online at www.kteknano.com or contact us at: [email protected] | tel: 503-598-9828 | toll-free: 1-800-880-0172 | fax: 503-598-9721 Test Supplies Varie�es available, such as DNA, standard biological, MICA, SiC, PFM test pa�erns, etc. HOPG Pure, highly laminar graphite for atomic-scale calibra�on of AFM/STM, and also as a substrate for different samples - atomic plane surface and good conduc�vity. Calibra�on Gra�ngs Gra�ngs are available for lateral/ver�cal calibra�on, detec�on of lateral non-linearity, hysteresis, creep and cross-coupling effects, and determina�on of �p shape. Diamond Nanoindenta�on Probes Unique probes with Single Crystal Diamond �p specially designed for Nanoindenta�on, Nanoscratching, Lithography, etc. These probes are ideally suited for scratch tes�ng and long period probe life�me applica�ons. Diamond Coated Probes Diamond coated conduc�ve probes are ideal for oxida�on nanolithography and electrical AFM modes - stable, wear-resistant and excellent for con�nual use. Diamond Like Carbon Probes Diamond-like carbon probes have super sharp �ps (1-3nm) for high-resolu�on imaging. High material durability gives these probes long life �me. Top Visual Probes Excellent for precise posi�oning control and direct, real-�me observa�on of sample scanning and modifica�on process - TERS, TEFS, s-SNOM, etc. Whisker Type Probes A whisker-type focused electron beam probe specially designed for complicated surfaces, deep holes/trenches, and narrow gaps. Superior imaging quality without restric�on. Carbon Nanotube Probes Perfectly straight carbon nanotube probes available in customizable configura�ons. Long life, high aspect ra�o �p for super high resolu�on imaging. SNOM Probes These probes, made of high quality polymers, stand up to the most demanding applica�ons, including infrared and UV/visible ranges. Single Crystal Diamond Probes Sharp �p that is extremely robust, cleanable from contaminants and great for AFM imaging, topography, lithography, nanoindenta�on, and scratching experiments. Etalon Series Composite AFM probes with a stabilized design for highly specified and reliable resonant frequency and force constant parameters. A high accuracy probe that is easy to use. Silicon Probes Single crystal silicon can�levers with tetrahedral shaped �ps. Au reflec�ve coa�ng is standard. For contact, tapping, force modula�on, conduc�ve and magne�c modes.