1730 Series Transmitter Diagnostics Mode Reference … · 1730 Series Transmitter Diagnostics Mode Reference ... Take particular note of the components marked VR3, VR4, VR5, VR6,

1730 Series Transmitter

Diagnostics Mode Reference Manual

Document Revision 1.03

Diagnostics Mode v1.08

Novatech Controls 1730 Series Diagnostics Mode Reference Manual

Document Revision 1.03 Page 1 of 16 Diagnostics Mode v1.08

What is Diagnostics Mode

The 1730 Series Transmitter is a microprocessor driven controller designed by Novatech Controls that

can be pre-loaded with several different firmware versions to suit various applications.

In standard operation the 1730 Series Transmitter runs a real-time operating system; a loop of

automated tasks which involve several highly inter-connected systems. Due to this closely integrated

nature, it can be difficult to isolate and diagnose specific hardware problems. For this reason, the

purpose of the Diagnostics Mode is to halt all other processes and isolate each particular piece of

hardware or specific sub-system so that it can be individually tested.

This reference manual covers the all aspects of the Diagnostics Mode, describes how the transmitter

should respond to various tests, and provide detailed technical advice on what may be the likely cause

of various fault conditions.

Finally it must be noted that fault diagnosis will often require a high level of electronic knowledge,

access to datasheets, schematics, various equipment including a digital multimeter (DMM), Multi-

function calibrator, and for some tests an oscilloscope. Repair may require access to replacement parts

and specialised equipment including surface-mount soldering equipment.

Please read the warnings and considerations below before continuing.

High Voltage Warning

In order to test the heater and purge/cal solid state relays (SSRs) the transmitter must switch them on. This will only occur in the tests that are specifically required to test the SSRs, and should only pulse the output for a maximum of 30ms each second. During this time the outputs will be connected to live mains.

It is safe to leave oxygen probes connected during these tests, they will not be damaged or heat up

more than a few degrees. For testing the mains current feedback transformer it is actually required that

an oxygen probe is present.

Considerations Before Running the Diagnostics Mode

Be advised that while in Diagnostics Mode the transmitter will be offline and all standard operations such as reading and re-transmitting of process variables will be stopped. It may however for the purposes of testing still retransmit various signals over the 4-20mA outputs, digital communications systems, energise the relay outputs, purge/cal solenoids and heater power outputs.

Before you proceed if you have any control systems connected to the 1730 transmitter you should

disconnect these from the transmitter or consider what affect this may have if left connected.

NOTE: Before proceeding, please ensure you have read the relevant sections of the manual, have the

required electrical qualifications and have obtained any required authorization before proceeding.

Abbreviations Used Throughout this Manual

DMM – Digital Multimeter. Testing tool, supplied by the technician

MCU – Microprocessor. For the 1730 series transmitter this refers to component IC17, located

on the lower central part of the main board.



Entering Diagnostics Mode

To switch the transmitter to Diagnostics Mode you will need;

- Medium size flat head screwdriver to unscrew front case screws

- Small flat-head screw driver to change DIP switch position

Before continuing, disconnect power to the transmitter.

This should be done before opening the front case of the transmitter to eliminate the risk of electrical

shock.

After power has been disconnected, use the medium sized flat-head screwdriver to unscrew the four

screws on the front of the transmitter case. The screws are captive spring-loaded and will spring clear of

the base once fully unscrewed.

Open the case to reveal the inside electronics.

The lower left-hand side of the main PCB has a set of four DIP switches which can be accessed through a

hole in the shield (if fitted). It is not necessary to remove the EMI shield to access Diagnostics Mode,

however it may be required to remove the shield for further testing at a later stage.

While the transmitter is switched off, use a small flat-head screwdriver to move the bottom DIP switch

(labelled DIAG) to the right.

Re-connect power to the transmitter and switch on.

At this point, instead of displaying the Novatech logo and usual runtime information the display will say

‘Loading Diagnostics…’ with a version number on the second line. The version number indicates the

version of the Diagnostics Mode module compiled into the current EEPROM.

If the device powers up as described then you can skip the next chapter relating to power failure.

Total Power Failure

If the transmitter fails to power up when mains power is re-connected and switched on, you should

proceed to checking the mains circuitry for faults.

- Visually inspect the circuit board, mains power plug and mains power isolation switch SW2

checking that the connector wires and connectors are firmly inserted, and that SW2 is in the ON

position. Look for any blackened areas or scorch marks on the PCB or connectors that may

indicate a fault. Take particular note of the components marked VR3, VR4, VR5, VR6, VR7.

- Switch off the transmitter and remove the PCB fuse marked FS1 located adjacent to the main

AC-DC converter. If you find that this fuse is blown then it is very likely the Main AC-DC

converter block PS5 is damaged and will require replacement.

If PS5 is faulty it will cause FS1 to blow. If you replace blown FS1 without replacing faulty PS5 and

try switching the device back on you may notice the lights come on for about a second, then the

device going dead again as PS5 will immediately blow FS1.



Diagnostics Mode Keypad Interaction

The Diagnostics Mode consists of a series of numbered tests with user interaction being provided using

the local keypad and display.

Each individual test is designed to focus on a specific hardware component within the transmitter.

While some tests are fully automatic and non-interactive, others have several options that can be

adjusted by the operator using the keypad.

1. Function Up/Down – Change the test number

2. Option Up/Down – Change the test option

3. Enter – Toggle test option

The Option Up/Down and Enter keys perform different functions depending on the test. Please refer to

specific test application notes to see what keys are enabled for specific tests and their specific function

Pre Diagnostics Mode Tests

During the initialisation of Diagnostics Mode the transmitter performs two basic tests to confirm that

the display and keypad are functioning properly.

Testing the Display

On entering Diagnostics Mode the display test flashes a series of patterns on the display, and given that

there is no feedback to electronically confirm whether the display updated correctly it is up to the

technician to observe and determine whether the display is functioning properly.

The display test rapidly cycles through showing all pixels on, then all pixels off, then two patterns where

pixels alternate on or off. If the display contains any dead pixels, or if any regions are not updating

properly it should be immediately obvious to the technician.

The test can be repeated by power cycling the transmitter to restart Diagnostics Mode

Failure in this test would indicate a problem related to either the LCD module, the display PCB, or the

keypad/display bus buffers on the main PCB. In the majority of cases the solution would be to replace

the entire display PCB including the LCD module. It has also been observed that in some cases when

there has been voltage spiking on the mains, or if high voltage has been incorrectly applied to any of the

burner input or BFT inputs then the display bus buffer IC1 on the main PCB may be damaged.

On completion the transmitter immediately progresses to the second preliminary test.

1 2

3



Testing the Keypad

This second preliminary test will check the functionality of the interrupt driven hardware informing the

MCU when a key press is detected, as well as testing each of the physical buttons integrated into the

lexan on the front panel of the transmitter.

The transmitter will display the message ‘Press All Keys…’, and the technician should press each key on

the front panel one at a time. While being depressed, the display will indicate on the display which

button is being detected. Once all eight buttons have been individually pressed and released the

transmitter will progress to the numbered diagnostics mode tests.

The keypad inputs are transmitted to the main PCB along the same data bus as the display. Changes to

the keypad triggers an interrupt on the MCU, which causes the device to process the key press. If this

interrupt is not working properly then Diagnostics Mode will inform the technician of this fault. In this

case the keypad will continue to work in Diagnostics Mode, but will not work in the normal runtime

loop.

The cause of a keypad interrupt failure may be the SPI chip IC7 on the display PCB is damaged, or that

the transistor buffer TR1 (display PCB v1.0E and earlier) or NAND gate IC8 on the display PCB is

damaged. In either case, the easiest way to fix a keypad interrupt failure is to swap out the entire

display PCB and repeat the test.

Diagnostics Mode Tests

01. Reference Voltages Summary

Overview: This non-interactive test gives a summary of the three main voltage references as read by

the internal ADC.

Option Up/Down: no operation

Enter: no operation

The purpose of this test is to provide a quick overview of the three main ADC reference voltages as read

by the reference voltage feedback and calibration circuit. At a glance it may be possible to confirm

whether the ADC circuitry is working properly or requires further testing.

The display has a table with three rows and three columns. Each row shows the reference voltage, ADC

count number for the zero mV reference and the ADC count number for the span mV reference.

50mV 275 ± 75 3450 ± 645

200mV 275 ± 75 3450 ± 645

1200mV 275 ± 75 3450 ± 645

If all of the numbers on both the middle and right column read within tolerance then it can be safely

assumed that the voltage reference circuitry, analog channel selection circuitry, multiplexers, gain

circuitry and ADC chips are working correctly.

If any of the numbers are reading outside of the expected ranges, especially if any are reading 0 or 4095

then there is a problem with the analog circuitry.

Potential faults are the DC-DC isolated power supply PS4, the two voltage regulators IC11,IC27, the

voltage reference IC25, channel selection multiplexers IC8,IC9, gain op-amp IC14, gain select multiplexer

IC24, analog-digital converter IC23, or the analog switch IC7.



Before doing any more tests, check the four reference voltage test points on the main PCB (Ref 1.. Ref4)

and the two analog test points marked +12 & -12 above PS4 (relative to Acom)

The test point values should read:

Ideal Voltage Min mV (-5%) Max mV (+3%)

Ref1 47.2 mV 44.8 mV 48.7 mV

Ref2 189.1 mV 179.6 mV 194.8 mV

Ref3 1227 mV 1165.6 mV 1263.9 mV

Ref4 2500 mV 2375 mV 2575 mV

+12 12.0 V 11.4 V 12.6 V (±5%)

-12 -12.0 V -11.4 V -12.6 V (±5%)

In some cases where high voltage has damaged one or more components in the analog circuitry it is

possible that the damaged component may be drawing excess current and pulling the voltage

references and AVcc/AVee down. It may be necessary to systematically remove components one at a

time to identify the root cause of the problem.

The order for which the ICs are removed may depend on the history of the device. In some cases power

surges have been known to damage IC7, which in turn may damage IC25. Excess heat, or long service

life may cause PS4 to fail.

02. Reference 50mV

03. Reference 200mV

04. Reference 1200mV

05. Reference Zero

Overview: These four tests lock the analog multiplexer to the respective analog reference voltage

feedback channels. The MCU repeatedly samples the selected analog channel and displays the results

on the second line formatted in either raw ADC counts, or as an un-calibrated voltage.1

Option Up/Down: change the gain selection for the analog input.

Enter: no operation

The objective of these four tests it to confirm that the channel selection and gain select multiplexers are

working. To confirm that each channel is being selected the technician can is a DMM to measure the

differential voltage between the two test points on the PCB marked M+ and M-. If the channel selection

is working properly then the voltage measured between these two test points should be very close to

the same voltage measured between the selected reference test point and ground.

If the voltage differential does not match this voltage then there is a problem with the channel selection

circuitry. The problem may be that one of the channel selection multiplexers IC8 or IC9 is not working,

or possibly that the channel selection I/O lines between the MCU and the IC8/IC9 are not working. The

procedure for troubleshooting would be to check the port lines P8-0..2 are functioning, which may

require removing IC8/IC9. If they are working then IC8/IC9 should be replaced.

1 Un-calibrated meaning that default calibration values are used in the calculation of the voltage. The voltage

displayed should be accurate to within ±2%, any slight inaccuracy should not be taken as an indication of hardware fault.



To test the gain circuitry the technician can change the gain using the option up/down keys. The gain

multiplexer IC24 changes the feedback resistor for one of the op-amp channels on IC14, resulting in four

possible gain ranges for the analog signal into the ADC. The objective is that each reference voltage will

have one optimal gain range to amplify the analog voltage to approximately 85% of the analog

The gain for each of the gain selection channels are as follows:

Range Physical Gain Saturation Voltage

0 40.7 57.5mV

1 10.4 225.4mV

2 1.75 1334.3mV

3 1 2338.4mV

Not all gain ranges are available for all of the reference voltages, as higher gains will immediately

saturate the analog signal for the higher reference voltages. It is however possible to apply lower gains

to the lower reference channels to confirm that the gain selection is working.

If the gain selection is not working then the problem may be the gain selection multiplexer IC24, the op-

amp IC14, or possibly the gain selection I/O lines from the MCU pins P8-3..4. The procedure for

troubleshooting would be to check the I/O lines to the multiplexer are working, and then replace IC14

followed by IC24.

06. Probe 1 Temperature Input Channel

07. Probe 1 EMF Input Channel

08. Probe 2 Temperature Input Channel

09. Probe 2 EMF Input Channel

Overview: These four tests lock the analog multiplexer to the respective analog input channels. The

MCU repeatedly samples the selected analog channel and displays the results on the second line

formatted in either raw ADC counts, or as an un-calibrated voltage.2

Option Up/Down: change the gain selection for the analog input.

Enter: no operation

The objective of these four tests it to confirm that the hardware specific to the off-board analog inputs

is working. Before performing these tests it is important to confirm first that the analog input selection

and gain circuitry is working by performing diagnostics tests 02 through to 05 on the previous page.

The process is identical to the previous tests for checking the reference voltages; the channels selected

however correspond to the four analog inputs on the terminals used for oxygen EMF and temperature.

To test these channels it is necessary to have some sort of calibrated source generator connected to the

channel being tested.

For testing the temperature input channels, the signal source must be capable of simulating a K-type

thermocouple, cold junction compensated signal in the range of -50°C to 1500°C.

2 Un-calibrated meaning that default calibration values are used in the calculation of the voltage. The voltage

displayed should be accurate to within ±2%, any slight inaccuracy should not be taken as an indication of hardware fault.



For testing the probe EMF input channels, the signal source must be capable of sending a DC voltage

signal in the range of -50mV to 2000mV.

NOTE: Signals outside of the range of -50mV to 2400mV may damage the analog input circuitry.

By modulating the output from the signal generator, the transmitter should be able to quickly and

accurately reflect the voltage or temperature changes on the second line of the display.

Failure to reflect these changes would indicate some fault between the input terminals and the channel

selection multiplexer components IC8/IC9. This may be caused by broken solder joints, damaged tracks

or ancillary components such as pull-up resistors.

Both of the temperature inputs have pull-up resistors that will cause the signal to read 1371.1°C if they

are open-circuit.

10. Ambient Temperature Sensor

Overview: The transmitter has a solid-state temperature sensor IC4 that is used to monitor case

temperature and for thermocouple cold-junction compensation. The sensor is located in the top-left

corner of the main PCB directly above the input terminals for probe #1, the analog output signal is sent

directly to the MCU.


Enter: no operation

The display should indicate ambient temperature in degrees Celsius. It should read close to room

temperature, possibly a couple of degrees higher due to heat dissipated from the transmitter circuitry.

To confirm the sensor is live reading temperature, try to warm it by touching it lightly with a finger, or

cooling it using air from a can.

The output from the temperature sensor can be read using a DMM as a DC signal via the unmarked test-

point directly adjacent to IC4. The component is a Texas Instruments LM50, which should output an

analog signal of 500mV offset plus 10mV/°C. For example at 25°C the signal should be (500mV +

25x10mV = 750mV)

The order for testing this sensor would be to confirm that the component IC4 is working using a DMM

on the unmarked adjacent test-point, then check whether the signal is being transmitted to MCU pin

P10_0.

11. Ambient RH Sensor

Overview: The transmitter has a solid-state relative humidity sensor IC30 that is used for oxygen

calculations. The sensor is located in the top-left corner of the main PCB above the analog input

circuitry. The analog signal is buffered via an op-amp IC31 and attenuated using two resistors, this

signal is sent directly to the MCU.


Enter: no operation

The display should show ambient air relative humidity as percentage. The reading will vary depending

on the ambient conditions.

The output from the humidity sensor can be read using a DMM as a DC signal via the unmarked test-

point directly adjacent to IC30. The component is a Honeywell HIH-4000-002, which outputs a linearised

voltage of ~825mV @ 0% RH through to ~3.75V @ 100% RH. The signal is sent to the MCU via op-amp

IC31 to buffer the signal and R127 & R128 that attenuate the signal by 50%.



The order for troubleshooting this sensor would be to confirm that the component IC31 is working using

a DMM on the unmarked adjacent test-point, then to check the output of op-amp IC31 at each of the

output pins, then check whether the signal is being transmitter to MCU pi P10_5.

12. Reference Air Pump Current

Overview: The reference air pump drive circuitry is designed to power a small DC pump using a

controlled digital pulse. This allows the MCU to adjust the speed of the pump by modulating the output

voltage. The circuit is designed to provide a continuous current of ~100mA, with a maximum continuous

current of ~250mA. The drive circuitry has integrated load detection that is used to monitor current

usage so that the MCU can switch the pump off if the output is overloaded to prevent damage to the

drive circuitry.

Option Up/Down: increase/decrease the digital PWM pulse (pump voltage)

Enter: no operation

The display indicates both PWM (pulse with modulation) output level in percentage, as well as current

detected using the feedback system. There are in effect two symbiotic systems being tested at once;

the pump drive voltage and the current feedback system. In standard operation the pump should start

turning once the PWM level reaches a certain level, the current should also rise according to use.

It is noted that with some pumps, when the motor sticks the pump can draw considerable current.

To test the PWM output and pump voltage, remove the reference air pump and use a DMM to measure

the DC voltage across the ref pump output terminals. Use the option keys to change the PWM output

and observe the changes to the voltage displayed on the DMM. The voltage should follow a linear path

from ~0V @ 0% PWM, saturating at ~5V @ ~85% PWM output.

If the voltage on the ref pump output terminals does not respond as described when changing the PWM

output, use an oscilloscope to check the trace at test-point P1, located adjacent to R110. The trace

should show a digital pulse with a mark to space ratio corresponding to the PWM output. This trace is

input into an op-amp IC29 which drives the transistor TR9. If the digital trace is present, but no

corresponding voltage, replace TR9, test again, replace IC29 if still not working.

To test the current feedback there are several methods. The easiest option would be to use a known

working CM-15 reference air pump as supplied by Novatech. With the PWM output set to 100% the

pump should run with a smooth cadence and draw a continuous current of ~60mA. Another way to test

this would be to place a 1/4w 100 ohm resistor between the ref air pump terminals. The current drawn

should also display ~50mA @ 100% PWM.

0

1

2

3

4

5

0 25 50 75 100

Re

f P

um

p O

utp

ut

V

PWM Outout %



If the voltage output is working and current feedback is not working then check the output from the op-

amp IC29, and check MCU pin P10_1.

13. Mains Detection

Warning: This test requires a heated probe to be connected to the Heater 1 output, and will involve switching on mains power to this probe in short bursts.

Overview: Mains detection is achieved by measuring the AC current used to power the heated probe.

The transmitter measures frequency by detecting the zero crossover points of the alternating current

signal, and it calculates voltage by assuming the known impedance of the probe heater. This

assumption is easily invalidated if the device attached to Heater 1 is not a Novatech Controls supplied

model 1231 or 1234 heated probe.

Note: To enable mains power output to Probe 1 a link must be inserted between the burner input

terminals 10 &11 creating a short-circuit.


Enter: no operation

With the probe plugged into Heater 1 output and the burner input link present the transmitter should

be able to immediately detect a mains voltage and frequency.

Also note, if mains cannot be detected, first check the fuses FS2 and FS3 are not open-circuit.

If the feedback circuit is giving incorrect results then the transmitter current transformer T1 or gain

resistor R108 may be damaged. Given that the current transformers used are made to order for this

specific application, it may be difficult to obtain suitable replacements. The board may need to be

returned to Novatech Controls for repair.

If there is a fault with the mains detection circuitry then it is possible to override automatic mains

detection using options in the Calibration Menu, allowing the transmitter to continue operating.

Mains detection is also used during runtime to monitor the switching of the solid-state relay (SSR) that

regulates the probe temperature. If mains detection is not working then it is quite possible that the SSR

short-circuit protection is also not working. In this scenario, if a SSR fails short-circuit this fault may not

be detected by the analyser resulting in the probe being irreparably damaged.

14. SSR Relay Tests

Warning: This test requires a mains powered load to be connected to each of the four relay outputs in order. It will involve switching on mains power to each of the outputs in short bursts.

Overview: The transmitter contains four solid-state relays (SSRs), namely the two heater outputs and

the two purge/cal control relays. The four SSR outputs also have an electromechanical relay RL3 that is

used to isolate the mains voltage from the four SSRs. This test can be used to individually switch each

SSR and displays the ADC feedback from the current sensing circuit in raw counts.

Option Up/Down: next/previous relay

Enter: no operation

The current detection circuit measures the total AC load across all of the SSR outputs. This test is

designed to show how this load changes when each of the relays is pulsed. It can help to confirm that

the burner relay, an electromechanical relay RL3 is functioning and whether any of the four solid-state



relays have failed short-circuit. Finally it also confirms that the current transformer and feedback circuit

is working.

Note: To enable mains power output to Probe 1 a link must be inserted between the burner input

terminals 10&11 creating a short-circuit. The electromechanical relay RL3 cannot be energised without

this link being present.

The first test should be to check using a DMM whether there is any mains present on any of the four

output terminals with the burner relay is off. To switch off the burner relay press the option keys until

the display says ‘Burner Relay Off’, and when selecting this option it should be possible to hear the

contacts in the mechanical relay changing. With the burner relay off the terminals should be physically

isolated from mains, if there is any mains on the outputs with the burner off then the electromechanical

relay RL3 has failed.

The next test is to confirm that each of the solid-state relays in turn can switch mains voltage both on

and off. To test that none of the SSR have failed short-circuit, use the option keys to set the transmitter

to ‘All SSRs off’. In this position, RL3 is energised, all SSRs should be off. Plug the probe into each output

in turn and observe the ‘mA counts’ line. A normal number for no load should be ~8 counts. If this

number is significantly higher, or if plugging the heater into any one of the outputs causes this to rise

then this would be an indication that the SSR being tested has shorted.

Lastly, plug the heater into each output in turn and use the option key to enable the selected output.

While doing this observe the mA counts, which should rise to ~140 counts when switched on to indicate

that it is sensing the load of the probe heater. If this does not happen then either the SSR has failed

open-circuit, or there is a problem with the current detection circuit.

To identify whether the SSR or the current detection circuit that has failed will require some sort of

physical load that can be observed whether it is being switched on or off, such as a mains voltage neon

indicator. If the problem is with the detection circuit then it is likely the device will need to be returned

to Novatech Controls for repair.

15. BFT Analog Input

Overview: The BFT is an analog input located near the bottom-left corner of the main PCB. It is used for

some applications for ancillary readings such as measuring process pressure. The BFT measures a DC

signal in the range of 0-2500mV. Testing will require the use of a source generator capable of

outputting voltage in this range.


Enter: no operation

With the BFT open circuit, there is some internal pull-up circuitry that will hold the BFT input at some

level for PCB version 1.2 Rev G and older. This level varies slightly, but should be ~635mV. Starting with

PCB version 1.2 Rev H and newer the BFT will drop to 0mV when open circuit.

Connect an external signal generator to the BFT input and check that the voltage output from the

generator matches the display. If there is a fault then check the track between the terminal and MCU

pin P10_4.

Test input range 0-2400mV with LK2 open, the display should match the signal generator. Secondly,

place a short across LK2 and use the signal generator to test the input range 0-20mA. LK2 will place a

120 ohm resister across the terminals, so the voltage on the display should be 120x Input mA.



If there is any non-linearity while testing current with LK2 shorted, consider removing Zener diode D14

as this is the cause of any linearization problem. Some newer firmware versions include software

linearization to remove the affect of D14, however it is far easier to fix this problem with hardware.

16. 4-20mA Output 1 Calibration Test

17. 4-20mA Output 2 Calibration Test

Overview: This is a non-interactive test that can show at a simple glance whether both the 4-20mA

output circuitry and internal calibration feedback circuitry is working.

Option Up/Down: repeat the test

Enter: no operation

The 1730 transmitter has two isolated 4-20mA output channels. For testing purposes the transmitter is

capable of re-routing the output from terminals using an electromechanical relay through a fixed load

resistor and back into one of the analog inputs on the MCU. When you enter this menu, or press one of

the option keys to repeat the test, the transmitter redirects the analog input and performs a series of

automatic tests on the respective isolated 4-20mA output channel and displays the results on the

screen.

The first test involves automatically setting the output to ~4mA and reading the return signal on the ADC

in raw counts. This first reading is displayed after the word ‘Zero’ and should be in the range of

11000±7000 counts. Typically this number is ~10300.

Next the device automatically sets the output to ~20mA and reads the return signal on the ADC in raw

counts. This second reading is displayed after the word ‘Span’ and should be in the range of

43000±3000 counts. Typically this number is ~43000.

The third line will either say ‘Output OK’, ‘WARNING’ or ‘FAIL’ depending on whether the Zero and Span

numbers are within expected tolerances. If this line says ‘Output OK’ then it is safe to assume the

output is working. If the automatic testing fails then either the output circuitry is damaged, or the

feedback circuitry has failed.

If the feedback circuitry has failed then it is still possible to use the output once it has been manually

calibrated. Refer to the device Technical Manual for further information. Continue reading the next to

Diagnostic tests for information on how to determine the specific point of failure of the analog output.

18. 4-20mA Output 1 DAC Test

19. 4-20mA Output 2 DAC Test

Overview: These two tests follow on from Diagnostics test #16 & #17 and allow a more comprehensive

set of options for a technician to diagnose the specific point of failure for the two isolated analog

outputs. These tests allows each of the 4-20mA analog output channels to be manually set to specific

levels, and manipulate the cal feedback relay.

Option Up/Down: increase/decrease the 4-20mA output level as a percentage of full scale

Enter: toggle the feedback relay on or off

The two 4-20mA output channels on the 1730 transmitter have dedicated isolated hardware to convert

a 16-bit signal from the MCU into a proportional analog output. This output signal can be switched via a

feedback relay through a fixed load resistor and read by the MCU as part of the self diagnostics process,

although doing so un-couples the outputs from the terminals. The transmitter cannot monitor the

outputs during standard operation, only during calibration or diagnostics.



By using the option keys, the output level can be set as a percentage of full scale at ~25mA. Pressing the

enter key toggles the feedback resistor, which allows the technician to read the output either on the

terminals on the PCB, or via the feedback to the MCU.

In standard operation, with the cal feedback enabled, the transmitter should read ~0mA @ 0%, ~12.7mA

@ 50% and ~25mA @ 100% output, with the output current tracking a linear path between these

points.

If the outputs are not tracking as described then the first thing to check should be the analog voltage

reference points next to the DC-DC converter for the channel in question. For channel 1 this is the three

test-points labelled D1com,+12,-12 adjacent to PS3, for channel 2 this is the test-points labelled

D2com,+12,-12 adjacent to PS2. If these test points are reading correct voltages then the next thing to

test is the output terminals DMM to confirm whether the problem is with the output drive circuitry, or

the cal feedback circuitry.

Set the cal feedback to disabled, and using the DMM, check whether the analog signal can be seen on

the output terminals on the PCB. If the outputs are working, but the cal feedback is not then there is a

problem with the cal feedback. Check the cal feedback relay RL1/RL2 is switching, whether there is an

analog signal on the load resistor R27, and finally check the track between R27 and the MCU pin P10_3.

If the output is not registering an analog signal when the cal feedback is both on and off then the

problem is likely with the output drive circuitry.

The two outputs have test points, labelled D1 and D2 which are located on the PCB next to the output

power transistor TR4/TR5. Relative to the isolated digital common labelled D1com and D2com adjacent

to the respective DC-DC converter, these analog test points should give an analog signal linearly

proportional to the output level percentage. It should be scaled 0mV @ 0% output and 2500mV @

100% output, tracking a linear path for each step change between these two points. If this analog signal

is present then skip the next paragraph regarding the oscilloscope.

Using an oscilloscope, check the output signal from the MCU pin P7_4 for channel 1, pin P7_6 for

channel 2. An easy test point can be found on the resistor right before the optocouple OP5/OP6. A

digital signal with a variable mark to space ratio should be seen. This mark to space ratio should change

when the option keys are used to increase and decrease the output level percentage. If this signal is

present, next check the output of the optocouple. If the optocouple is working and there is no analog

signal on the D1/D2 test point then replace the transistor TR6/TR7 and voltage reference IC15/IC16

components as required.

0.0

4.0

8.0

12.0

16.0

20.0

24.0

0% 10% 20% 30% 40% 50% 60% 70% 80% 90% 100%

Fee

db

ack

Cu

rre

nt

mA

Channel Digital Output Level



If there is an analog signal at D1/D2, but not on the output then the problem is likely to be the power

transistor TR4/TR5 or the op-amp IC12/IC13. Check also that the light emitting diode LED4/LED5 is

working and that the legs of the LED have not become twisted inside the long standoff.

20. Digital Inputs

Overview: The digital inputs being tested include the four inputs from the dip-switch SW1, the 0.1”

jumper SW5 and the two inputs on the terminals marked ‘Flow SW’ and ‘Burner Input’.


Enter: no operation

To test each of the dip-switch inputs, toggle them each individually and confirm that the display changes

to reflect a change in the physical state. If any of these digital inputs do not work as expected then try

manually shorting the associated pins on the IC using a small piece of wire to test whether the dip-

switch is damaged. Check the tracks going back to the MCU for damage.

To check SW5 use a small jumper to short the pins, observing the state change on the display

accordingly. If this does not work as expected then check the track to the MUC pin P2_6.

To check the Flow SW and burner input use a small terminal connector to short the terminal input pins

16 & 17 for the Purge Flow Switch, and terminal input pins 10 & 11 for the burner input.

If these digital inputs fail to work as expected, check the associated circuitry and tracks to the MCU.

Both inputs have a transistor between the input and the MCU for protection. The burner input also has

two micro-fuses in series with each pin and a transient voltage suppressor across the terminals for

additional protection. If any of these devices are damaged then consider the cause for this damage

while replacing the damaged components.

21. Alarm Relays

Overview: The 1730 series has four mains-power rated alarm relays that can be programmed to

perform various functions. Each of these relays is independently controlled via the MCU. This test

individually energises each relay allowing the contacts to be tested using a DMM

Option Up/Down: select next/previous relay

Enter: no operation

As each relay is selected the relay solenoid is energised and the two terminals corresponding to that

relay should be shorted. Use a DMM to check continuity between the terminals and check that they

make a continuous circuit when the relay is energised and open circuit when the relay is de-energised.

If any of the relays fail to operate as expected, check the trace from the MCU to the transistorT10-T13

for the correct signal, then replace the relay and transistor as required.

22. LED Test – Lexan and Main PCB

Option Up/Down: select next/previous relay

Enter: no operation

This test is used to check that all the LEDs that are built into the lexan on the front of the case work, and

that the RS485 LED on the main PCB works. Cycling through each of the LEDs using the option keys

should enable each selected LED in turn to confirm that they work.

Option Up/Down: select next/previous LED

Enter: no operation



If any of the lexan LEDs are not working then check the signal on the flexible cable between the display

PCB and the lexan. The lexan itself is unserviceable, so any failed LEDs would require the replacement

of the lexan label.

23. LCD Backlight

Overview: The backlight on the LCD display can be enabled and disabled from the MCU. This test can

check what state the backlight is in, and whether it is functioning properly.

Option Up/Down: toggle the backlight on/off

Enter: no operation

If the backlight is not working then the LCD module will need replacing. The LCD module itself can be

replaced individually. Alternatively the whole display circuit board with LCD module can be ordered as a

complete assembly allowing for simple swap-out replacement.

24. RS232 Port

Overview: This non-interactive test allows for simple automated testing of the RS-232 serial

communications on the transmitter. To test the RS-232 port place a jumper between terminal pins 18 &

19 – RS-232 Tx and RS-232 Rx.


Enter: no operation

The serial port continuously transmits a string of characters, while simultaneously listening for a

response. By placing a loop between the Tx and Rx terminals the device will continuously receive the

string of characters that it transmits therefore confirming that both transmit and receive are working.

If both transmit and receive are working the words ‘Loopback ON’ will appear on the display. If these

words do not appear when there is a short between terminals then there is a problem with the Tx or Rx

circuitry.

Before testing any of the serial port circuitry, first check the voltage test-points located adjacent to PS1

marked SGnd,+12,-12. On the newer boards there is also a +5 test point added. Confirm that each of

the test points measure the correct voltage with respect to SGnd.

Testing for serial port problems will require tracing the signal output from the MCU using an

oscilloscope. The testing itself is broken down into testing the Tx circuitry first, then if it can be seen

that this works, test the Rx circuitry second.

The first test should be to observe the Tx and Rx and 485 LEDs. During this test, the 485 LED should be

off. If the 485 LED is on then check the track between resistor R38 and the MCU pin P2_4.

If the Rx LED is on when the loopback jumper is OFF then there is a problem with either the logic chips

IC18, IC19, or the optocouple OP4. Using a DMM, check some of the states of the pins. If IC18_9 and

IC18_10 are high and IC18_8 is low then likely it is not IC18. If IC19_3 is high and IC19_4 is low then

replace OP4.

With the loopback jumper OFF the Tx LED should give a short flash every second and the Rx LED should

stay off. If the Tx LED is not flashing then this suggests that the signal from the MCU is not getting as far

as the LED. Use an oscilloscope to trace the signal through OP3 and IC10 to find the problem, also

confirming that the Tx LED is working and does not have twisted legs inside the standoff.



Once the Tx LED is flashing, use the oscilloscope to test the signal on the Tx terminal #18. If you can see

the Tx LED flashing, and the signal on the Tx terminal then move on to testing the Rx circuitry. Place the

loopback jumper between the Tx and Rx terminals to continue testing.

With the loopback on the Rx LED and the Tx LED should flash on together each second. If the Rx LED is

not flashing, use the oscilloscope to test where the signal stops working by tracing it through IC10 OP4,

then IC18 & IC19 logic gates.

25. RS485 Port

Overview: These tests are designed to check the functionality of the RS485 port by individually toggling

different port lines used by the RS485 hardware. The quickest way to confirm whether the RS-485 port

is working is to configure the port for use using runtime and try polling the device using the simple

Modbus Master PC Software available to download on the Novatech Controls website. If this suggests

that there is a problem then this diagnostic test can be used to assist in isolating the problem.

Option Up/Down: toggle different port line

Enter: no operation

By toggling each port line individually it is possible using an oscilloscope to trace the oscillating signals

one at a time through each logic gate and optical component to confirm whether they are working. The

option to toggle P6_0 is used to confirm OP1 is working. The option to toggle P6_3 is used to confirm

OP2 is working by shorting the Tx and Rx pins on IC6. To test OP3 use the automatic process for testing

the RS232 port from the previous test. If all three optocouples OP1, OP2 & OP3 are shown to be

working, replace IC6.

26. EEPROM & BBRAM

Overview: This is a non-interactive test that displays the status of the three main non-volatile storage

devices present on the transmitter. It tests whether the device is present and can be successfully read.


Enter: no operation

The first item is the iButton memory device labelled RTC located on the bottom centre of the main PCB.

This device may register as either a DS1904 or DS1994 depending on when it was commissioned. If this

device fails then the real-time clock and associated timed events may fail to work properly

The second item M24512 is a flash memory component IC29 that stores all of the device calibration and

configuration. If this device fails then the transmitter will factory reset every time it is switched on.

The third item labelled AM29F010 refers to the firmware upgrade socket. It is normal for this test to fail

unless a properly programmed upgrade EEPROM is plugged into this socket. It is also not necessary for

this socket to work for standard runtime operation; only when updating the on-board firmware.

27. Watchdog Timer

Overview: This tests the internal watchdog timer in the device. If the watchdog timer works then the

device should automatically reset approximately 200 milliseconds after pressing one of the option keys

to commence the test.

Option Up/Down: commence testing the watchdog timer

Enter: no operation

The device will reset, this is the purpose of the watchdog timer. If the device resets then this test has

passed. If the device does not reset then contact Novatech Controls to discuss options.



28. ADC Calibration

This option is not currently used for testing.

1

1

2

2

3

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4

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5

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6

6

7

7

8

8

D D

C C

B B

A A

Title

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Date: 26/02/2016 Sheet ofFile: J:\Projects------------\..\1732-1 Master.SchDocDrawn By:

AI+-[0..3]AI--[0..3]

4-20out#2+4-20out#2-

P1-[0..7]

P4-[0..7]

P7-[0..7]

P8-[0..7]

P9-[0..7]

P10-[0..7]

4-20out#1+4-20out#1-

P2-[0..7]

Analog1732-3 Analog Sch.sch

RS232-RxRS232-TxRS485-RS485+

P0-[0..7]

P1-[0..7]

P4-[0..7]

P6-[0..7]

P7-[0..7]

P5-[0..7]

CNVss

Reset

P2-[0..7]

Serial digital1732-4 SerDig Sch.sch

1234

CN10

12

CN13

1234

CN2

12345

CN5

123

CN11

P0-[0..7]

P1-[0..7]

P2-[0..7]

P3-[0..7]

P4-[0..7]

P5-[0..7]

P6-[0..7]

P7-[0..7]

P8-[0..7]

P9-[0..7]

P10-[0..7]

Reset

CNVss

Micro1732-2 Micro Sch.sch

R124 4k7

TR11

D10

P3-3

R9 10M

R10 10M R29 10k

R20 10M

12345678

CN9

R2 120R

Sensor 1 + 1Sensor 1 - 2

Thermocouple 1 + 3Thermocouple 1 - 4

Sensor2 + 5Sensor2 - 6

+5v 9

Output #1+ 12Output #1- 13

Burner input 10Burner input 11

Network + 21Network - 20

Network Com 2239 Cal / Purge 240 Cal / Purge 1

38 Solenoid Com

26 Common alarm relay27 Common alarm relay

29 Process alarm relay 130 Process alarm relay 2

44 Heater 143 Heater 1

37 Mains A36 Mains N

34 Earth

R121 4k7

D9

TR10

Gnd

Gnd

P5-[0..7]

P3-2

Vcc

SSR4

SSR1

SSR2

R114 470R

R112 470R

R111 470R

R102 1k

R100 1k

R99

1k

LED8

LED7

LED10

P3-0

P3-6

P3-7

FS2

FS3Mains A

Mains NV+V-

Earth

V+

V-

PS5

Power supply ArchAPC-10S

Gnd

RS232 Rx 18RS232 Tx 19 RS232-Tx

RS232-Rx

RS485+RS485-

D3BAV99

Gnd

Gnd

RL3

Vcc

TR8

R98470R

R9710k

P9-[0..7]

P9-7

D7

AI+-[0..3]AI--[0..3]

4-20

out#

1+4-

20ou

t#1-

AI+-0

AI+-2

AI--1

D8T1R109

10k

R108 100R

Gnd

C580.1

P0-[0..7]

P1-[0..7]

P2-[0..7]

P3-[0..7]

P4-[0..7]

P7-[0..7]

P8-[0..7]

P6-[0..7]

P10-[0..7]

12

CN8

R117 680R

R120 12k

R116 150RGnd

Vcc

Gnd

Pump +Pump -

R115 1R

5

67

IC29BLM358

R106 5k6

R107 1k

C5610uF/16v Electro

Gnd

P10-1

P7-2

3

21

84

IC29ALM358

Gnd

Vcc

R119 10k

C6010uF/16v Electro

P1-4

T +-

IC4LM50 SMD

Gnd

Vcc

P10-0

P10-2

R110 10k

C591uF/16V Tant

Gnd

TR9BD140

Power

123456

CN6

Output #2+ 14Output #2- 15

4-20

out#

2+4-

20ou

t#2-

1234567

CN3

Aux TC 2 + 7Aux TC 2 - 8 AI--3

Purge flow switch 16Purge flow switch 17

LK1

P5-6

R1 10M

28 Process alarm relay 1

35Out4

Out3

In 1

In 2

FL1

RL4

RL5

SW2

12

CN12

41 Heater 242 Heater 2

LED6

R8 1k

Burner ON

Test Point +5VTest Point Dig Common

R125 0R

LED11

R1181k

Pump power

Gnd P2-7

Vcc

Gnd

SGnd

AVee

Vcc

Version 1.2 GMaster, power and terminals

Novatech Controls

1 4

123

CN4

GND

AVcc

P10-4+12 V 23BFT+ 24BFT- 25

P2-6LK5Gnd

Auxilliary link

C65

10uF/16v Tant

R122 4k7

TR12D11 RL6

Vcc

Gnd

P3-4 31 Process alarm relay 2

FS1

SSR3

R113 470R

R101 1k

LED9

P3-1

R35

10M

CNVss

Reset

C10.1

D1BAV99

R36

10k

R34120R

AVcc

LK2

Gnd

RL7TR13

R123 4k7

D12

32 Process alarm relay 333 Process alarm relay 3

Gnd

P3-5

Test point P1

P10-5

C660.1

Gnd

RH +-

IC30HIH-4000-002

R126 470R

LED12LED SMD Green

Vcc

3

21

84

LM358IC31A

5

67

LM358IC31B

R127 10k

R12

810

k

AVcc(5)

AVee(5)

C670.1

Gnd

Rel

ayN

C1

Rel

ayN

C2

POWER

B32022A3103M Y2

C68

0.01uFC69

B32922C3333K X2

C70

0.033uF

TS1Transorb-DC

VR

1V

R2

VR

3

VR

4

VR

5

VR6

VR7

1730 Series Analyser

C30.1

FS4

LittelFuse 200mA Quick Blow

FS5

TS21.5KE6.8A

R130

2k7

TR14

R129

2k7Vcc

R13110k

Gnd

C20.1

R132 2k7

Vcc

R133 2k7

TR15

R3710k

Gnd

R134 10k

D143.3V 300mW Zener

Gnd

1

1

2

2

3

3

4

4

5

5

6

6

7

7

8

8

D D

C C

B B

A A

Title

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0 14

1 5

2 6

123111

134102Vcc16

Gnd8 3 15

Vee9 0123

/En7

IC774HC4316 SMD

R41 6k8

R301k

R42 1k

R28 10k

AVcc(5)

AVee(5)

Gnd

P2-2

P2-0P2-1

Vref1

+in2

-in3

Gnd

4

/CS 5

Dout 6

CLK 7Vcc

8

LTC1286CS8IC23

10

98

IC14COPA4234UA

12

1314

IC14DOPA4234UA

5

67

IC14BOPA4234UA

3

21

411

IC14AOPA4234UA

Gnd

AVcc(5)R6010k

R5910k

R7410k

R72 10k

R731k

R85

6k8

R83 270k

R84 1k

R821k5

AVcc

GndC31 0.01uF

C34 0.01uF

AVee

Gnd

C320.01uF

R51 1k

R52 1k

C17

0.001uF

C16 0.001uF

Gnd

Gnd

C510.1

C40.1

Gnd

Gnd

C280.01uF

GndGnd

R96 22k

R89 330k

X013

X114

X215

X312

X41

X55

X62

X74

INH 6

A 11

B 10

C 9

VEE 7

X 3

VCC 16

GND 8

IC24 CD4051

Gnd

Gnd

GndAVee(5)

P8-[0..7]

AVcc(5)

X013

X114

X215

X312

X41

X55

X62

X74

INH 6

A 11

B 10

C 9

VEE 7

X 3

VCC 16

GND 8

IC8

CD4051

Gnd

Gnd

X013

X114

X215

X312

X41

X55

X62

X74

INH 6

A 11

B 10

C 9

VEE 7

X 3

VCC 16

GND 8

IC9

CD4051

AVee(5)

AVee(5)

AVcc(5)

AVcc(5)

R19100k

R15100k

R18100k

R14100k

R17100k

R13100kR12100k

R16100k

C12

0.1

C11

0.1

C24

0.1

C22

0.1

C23

0.1

C13

1uF/

16v

Tant

C9

0.1

C21

0.1

C5

0.1

C6

0.1

C7

0.1

C8

Gnd

Gnd

C10

0.1

Gnd

P8-3P8-4

R79 470RR80 6K8Gnd

IC22

Gnd

R81 4K7AVee

P9-[0..7]

P9-0

P8-0P8-1P8-2

P8-[0..7]

P9-1

P9-2

R93 27k

R94 2k2

R90 1k

Gnd

R91 3k01

46mV

180mVADC RefV 2

ADC RefV 1

Test Point ADC Ref Com

ADC RefV 31200mVR92 22k

2500mV

AVcc

P8-0P8-1P8-2

AI--[0..3]

AI+-[0..3] AI+-[0..3]

AI--[0..3]

AI+-0

AI--1

AI+-2

ADCRef

ADCRef

IC15

LM33

6-2.

5 SM

D

R684k7

R6910k

R861K

R65

27k

C18

10uF

/16v

Tan

t

Gnd

TR6BC817

C29

10uF

/16v

Tan

t

1

3

4

5

6

OP5PC-400

R31

100RVcc

5

67

IC12BLM358

R46220K

R57220K R55

220K

R49220K

LED4

3

21

84

IC12ALM358

+12

-12

DVcc2

DGnd2

DVee2

RL1

G5V2

TR4BD139

DGnd2C26

0.1

DGnd2

C36

10uF/25v TantDVcc2

DVee2+in 1-in 2

-out 3com-out 4+out 5

PS2

DU1P0-05D12

C55

10uF/25v TantGndVcc

R27

47R

Gnd

DVcc2

P7-6

P9-[0..7]

P4-[0..7] P4-[0..7]P4-6

4-20out#2+

4-20out#2-

4-20out#2+4-20out#2-

ADCRef

Touch Memory +

RTCDS1904 Gnd

R103 4k7VccP1-7

Gnd

Setup lock

Cold start

Auto/man offset

P1-0

P1-1

P1-2

P1-3

P1-[0..7]P1-[0..7]

Aux link

P2-[0..7]P2-[0..7]

LM33

6-2.

5 SM

DIC

25

GndC50

10uF/25v Tant

C150.1

AVcc

AVcc(5)

AVee+in 1-in 2


PS4

DU1P0-05D12

I C O

IC1178L05

C4910uF/25v Tant

Gnd

GndVcc

SW1

AI--3

LM33

6-2.

5 SM

DIC

16

R704k7

R7110k

R871K

R66

27k

C25

10uF

/16V

Tan

t

Gnd

TR7BC817

C30

10uF

/16V

Tan

t 1

3

4

5

6

OP6PC-400

R24

100RVcc

5

67

IC13BLM358

R47 220K

R32 220K R58

220K

R50 220K

LED5LED 3mm

3

21

84

IC13ALM358

+12

-12

DVcc1

DGnd1

DVee1

RL2

G5V2

TR5BD139

DGnd1C27

0.1

DGnd1C48

10uF/25v Tant

DVee1+in 1-in 2


PS3

DU1P0-05D12

C46

10uF/25v TantGndVcc

DVcc1

P7-4

P7-[0..7]P7-[0..7]

P4-5

4-20out#1+

4-20out#1-

4-20out#1+

4-20out#1-

P10-[0..7] P10-[0..7]

C4310uF/25v Tant

Gnd

Gnd

R1110k

Test point D1

Test point D2

P2-3

I C O

IC2779L05

C540.1

Gnd

AVee(5)

Test point M+

Test point M-

Test point ADC

D4BAV99

D5

BAV99

ADCRef

R884k7

Vcc

P8-5

Novatech Controls

2 4Analogue inputs and outputs Version 1.2 G

P10-3

TR3BC817

TR2BC817

R33

4k7

R45

4k7Gnd

Gnd

C19

C20


C571uF/35v Tant

C61 1uF/35v Tant

DVcc1

D13

3.3V 300mW Zener

1

1

2

2

3

3

4

4

5

5

6

6

7

7

8

8

D D

C C

B B

A A

Title

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Date: 26/02/2016 Sheet ofFile: J:\Projects------------\..\1732-4 SerDig Sch.SchDrawn By:

P7-[0..7] P7-[0..7]

Vcc

P7-1

P7-0

LED2

R2210k

R53 1K R261k

R43 47kR78 470R

R61

1k

R21 10k

R62 100k

R54

10k

R25100R

5

67

IC10BLM1458 SMD

3

21

84

LM1458 SMDIC10A

SVcc(5)

SGnd

SGnd

SGnd

SVeeSVee

SVcc

SGnd

R40 2k2

RX

Tx

R76

470R

R77

1K

Vcc

Gnd

GndSGnd

SGnd

SGnd

LED3

SVcc(5)

R56

47k

SVcc(5)

12345678910

CN7

CON-10

P6-3

P6-0

P6-2R39

1k

R44330R

P6-[0..7]

Tx4

TXen3

/RXen2

Rx1 NET- 7

NET+ 6

Vcc

8G

nd5

SP485CSIC6

Vcc

R48 27kSVcc

LK3

SGndC44

10uF/25v Tant

C520.1

SVcc

SVcc(5)

SVee

SGnd

12

IC19A

74HC04

D2BAV99

1

3

4

5

6OP3PC-400

1

3

4

5

6

OP1PC-400

1

3

4

5

6

OP2PC-400

SVcc(5)

SVcc(5)Vcc

R23 470R

Gnd

RS232-Tx

RS232-Rx

RS485+

RS485-

P6-4P6-5P6-6

P6-7

P5-5P5-0

Gnd

Vcc

Deb

ug p

ort

Seria

l por

t

+in1 -in2

-out3 com-out4 +out5

PS1DU1P0-05D12

ICO

IC26 78L05

C4510uF/25v Tant

SGnd

GndVcc

P6-[0..7]

P4-[0..7]

P0-[0..7]

P4-[0..7]

P0-[0..7]

P4-0

P4-4P4-2

P4-3

P0-0P0-1P0-2P0-3P0-4P0-5P0-6P0-7

RS485+

RS485-

RS232-Rx

RS232-Tx

Vcc

P1-6

R41k

Vcc

RS232

RS485

P4-7

R5 1kVcc

D12 1Q 19

D23 2Q 18

D34 3Q 17

D45 4Q 16

D56 5Q 15

D67 6Q 14

D78 7Q 13

D89 8Q 12

OE1

LE11

IC3 74HC573

D12 1Q 19

D23 2Q 18

D34 3Q 17

D45 4Q 16

D56 5Q 15

D67 6Q 14

D78 7Q 13

D89 8Q 12

OE1

LE11

IC5 74HC573

Gnd

Gnd

P0-0P0-1P0-2P0-3P0-4P0-5P0-6P0-7

P0-0P0-1P0-2P0-3P0-4P0-5P0-6P0-7

P5-2

P5-3

A012

A111

A210

A39

A48

A57

A66

A75

A827

A926

A1023

A1125

A124

A1328

A1429

A153

/CE22 /OE24

DO 13

D1 14

D2 15

D3 17

D4 18

D5 19

D6 20

D7 21

A162

/WE31

A1730

IC229F020B FLASH

P4-1

P5-[0..7]

R631k

RS485

R67

1K

Gnd

LED1

R38 1kVcc

SGnd

34

IC19B74HC04

1

3

4

5

6

OP4PC-400

Vcc

4

56

IC18B

74HC00

1

23

IC18A

74HC00

12

1311

IC18D

74HC00

9

108

IC18C

74HC00

P2-4

P5-[0..7] Gnd

Front panel cable

12345678910111213141516

CN1

Reset-Debug

8 9

IC19D74HC04

56

IC19C74HC04

10 11

IC19E74HC04

12 13

IC19F74HC04

Novatech ControlsSerial comms and digital I/O Version 1.2 G

3 4

+5 v

Keypad interupt

SPI SO

SPI SI

LCD E pinCommon Gnd LED

+3v to buffer

SPI SCK

SPI /CS

Common Gnd logic

+5 v

A01

A12

A33

Vss

4

SDA 5

SCL 6

/WC 7

Vcc

8 IC28M24512

Gnd

Gnd

P5-1

Gnd

P1-5

P1-[0..7] P1-[0..7]

Gnd 2

1

3

14 74LCX125MIC1A

5

4

6

74LCX125MIC1B

9

10

8

74LCX125MIC1C

12

13

11

74LCX125MIC1D

P5-7

R7 4k7

TR1

GndR6 10k

R31k

+5 v

Common Gnd logic

Common Gnd logic

CNVssReset Reset

CNVss

R1051k

R1041k

P2-[0..7]P2-[0..7]


SPI Reset

1

1

2

2

3

3

4

4

5

5

6

6

7

7

8

8

D D

C C

B B

A A

Title

Number RevisionSize

A3

Date: 26/02/2016 Sheet ofFile: J:\Projects------------\..\1732-2 Micro Sch.SchDrawn By:

P10/D8 80

P11/D9 79

P12/D10 78

P13/D11 77

P14/D12 76

P33/A11 59

P34/A12 58

P35/A13 57

P36/A14 56

P76/TA3OUT24

P70/TXD2/TA0OUT/SDA30

P71/RXD2/TA0IN/SCL/TB5IN29

P72/CLK2/TA1OUT/V28

P15/D13/INT3 75

P16/D14/INT4 74

P17/D15/INT5 73

P00/D0 88

P01/D1 87

P02/D2 86

P03/D3 85

P04/D4 84

P05/D5 83

P27/A7(D7/D6) 65

P77/TA3IN23

RES12

VSS

64

P30/A8(-/D7) 63

P31/A9 61

P32/A10 60

XIN

15

XO

UT

13

P73/CTS2/RTS2/TA1IN/V27

P23/A3(D3/D2) 69

P21/A1(D1/D0) 71P20/A0(D0/-) 72

P74/TA2OUT/W26

P22/A2(D2/D1) 70

P67/TXD131

P62/RXD036P61/CLK037

P25/A5(D5/D4) 67

P26/A6(D6/D5) 66

P66/RXD132P65/CLK133P64/CTS1/RTS1/CTS0/CLKS134

P87/XCIN10

P86/XCOUT11

P85/NMI17P84/INT218P83/INT119P82/INT020P81/TA4IN/U21P80/TA4OUT/U22

P63/TXD035

P60/CTS0/RTS038

P24/A4(D4/D3) 68

P75/TA2IN/W25

AV

SS96

CN

VSS

9

BY

TE8

VREF98

AV

CC

99

P06/D6 82

P07/D7 81

P37/A15 55

P53/BCLK 43

P54/HLDA 42

P55/HOLD 41

P56/ALE 40

P47/CS3 47

P50/WRL/WR 46

P51/WRH/BHE 45

P52/RD 44

P43/A19 51

P41/A17 53P40/A16 54

P42/A18 52

P45/CS1 49

P46/CS2 48

P44/CS0 50

P57/RDY/CLKOUT 39

VSS

14

VC

C16

VC

C62

P97/ADTRG/SIN4100P96/ANEX1/SOUT41P95/ANEX0/CLK42P94/DA1/TB4IN3P93/DA0/TB3IN4P92/TB2IN/SOUT35P91/TB1IN/SIN36P90/TB0IN/CLK37

P107/AN7/KI389P106/AN6/KI290P105/AN5/KI191P104/AN4/KI092P103/AN393P102/AN294P101/AN195P100/AN097

IC17M16C62P

P0-0

P0-1

P0-2

P0-3

P0-4

P0-5

P0-6

P0-7

P0-[0..7]P0-[0..7]

P1-0

P1-1

P1-2

P1-3

P1-4

P1-5

P1-6

P1-7

P1-[0..7]P1-[0..7]

P2-0

P2-1

P2-2

P2-3

P2-[0..7]P2-[0..7]

P3-0

P3-1

P3-2

P3-3

P3-4

P3-6

P3-7

P3-[0..7]P3-[0..7]

P4-0

P4-1

P4-2

P4-3

P4-4

P4-5

P4-6

P4-7

P4-[0..7]P4-[0..7]

P5-0

P5-2

P5-3

P5-5

P5-6

P5-[0..7]P5-[0..7]

P6-0

P6-2

P6-3

P6-4

P6-5

P6-6

P6-7

P6-[0..7] P6-[0..7]

P7-0

P7-1

P7-2

P7-4

P7-6

P7-[0..7] P7-[0..7]

P8-0

P8-1

P8-2

P8-3

P8-4

P8-[0..7] P8-[0..7]

P9-0

P9-1

P9-2

P9-7

P9-[0..7] P9-[0..7]

P10-0

P10-1

P10-2

P10-3

P10-4

P10-[0..7] P10-[0..7]

Vcc

Gnd

C42

10uF/16v Tant

C41

0.1

C53

0.1

C14

0.1

Gnd

C470.1

R95100kD6

BAV99

LK4

Gnd

Vcc

XL1 32kHz

XL212mHz

C3818pF

C3318pF

C3933pF

C3533pF

Gnd

Gnd

P2-7

R6410k

Gnd

R75

10k

P8-5

ADCRef

P2-6

P5-1

P5-7

P10-5

Novatech ControlsMicroprocessor Version 1.2 G

4 4

Reset

CNVss

CNVss

Reset

P3-5

P2-4

P2-5

P5-4

P10-6

P10-7

P9-3

P9-4

P9-5

P9-6

P7-3

P7-5

P7-7

P6-1

Reset


Revision Changelog:

Version 1.03 (04-May-2016)

Modified ADC counts values in test 01. Reference Voltages Summary

Version 1.02 (May 2016)

Added chapter on total power failure

Version 1.00 (Feb 2016)

Initial Release of this document, revised from several other technical documents.

1730 Series Transmitter Diagnostics Mode Reference … · 1730 Series Transmitter Diagnostics Mode Reference ... Take particular note of the components marked VR3, VR4, VR5, VR6,

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