2007-06-12 13700DF_DS_Ver3.3 Inphi Proprietary Page 1 of 14 13700DF 13 Gbps D Flip-Flop Data Sheet Applications • High-speed (up to 13 GHz) digital logic • High-speed (up to 13 Gbps) serial data transmission systems • Broadband test and measurement equipment Features • Supports data rates up to 13 Gbps • Output signal swing 1200 mVpp differential • Fast rise and fall times: 15 ps • Single –3.3 V power supply • Low power consumption: 300 mW • Available as die or in LGA package • Supports single-ended and differential operation • Evaluation board available Description The 13700DF static D flip-flop (DFF) is designed to support data rates up to 13 Gbps. The part is nominally positive-edge triggered; however, by reversing the connections to the positive and negative clock inputs, a negative-edge triggered application can be accommodated. All differential data and differential clock inputs are DC coupled and terminated on-chip with 50 Ω resistors to ground (GND). For direct-coupled applications, the differential data outputs should be terminated off chip with 50 Ω resistors to GND. For applications requiring termination to DC levels other than GND, external AC coupling to a good RF ground is required. See the application note for various termination examples. The 13700DF operates from a single –3.3 V power supply and dissipates only 300 mW (typical). The 13700DF is available in a ceramic land grid array (LGA) package or in die form. The packaged part is also available on an evaluation board with SMA connectors.
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2007-06-12 13700DF_DS_Ver3.3 Inphi Proprietary Page 1 of 14
13700DF 13 Gbps D Flip-Flop Data Sheet
Applications
• High-speed (up to 13 GHz) digital logic • High-speed (up to 13 Gbps) serial data transmission systems • Broadband test and measurement equipment
Features
• Supports data rates up to 13 Gbps • Output signal swing 1200 mVpp differential • Fast rise and fall times: 15 ps • Single –3.3 V power supply • Low power consumption: 300 mW • Available as die or in LGA package • Supports single-ended and differential operation • Evaluation board available
Description The 13700DF static D flip-flop (DFF) is designed to support data rates up to 13 Gbps. The part is nominally positive-edge triggered; however, by reversing the connections to the positive and negative clock inputs, a negative-edge triggered application can be accommodated. All differential data and differential clock inputs are DC coupled and terminated on-chip with 50 Ω resistors to ground (GND). For direct-coupled applications, the differential data outputs should be terminated off chip with 50 Ω resistors to GND. For applications requiring termination to
DC levels other than GND, external AC coupling to a good RF ground is required. See the application note for various termination examples. The 13700DF operates from a single –3.3 V power supply and dissipates only 300 mW (typical). The 13700DF is available in a ceramic land grid array (LGA) package or in die form. The packaged part is also available on an evaluation board with SMA connectors.
2007-06-12 13700DF_DS_Ver3.3 Inphi Proprietary Page 2 of 14
Block Diagram
50 Ω 50 Ω
GND
50 Ω 50 Ω
GND
DDn
CKCKn
QQn
60 Ω
GND
60 Ω
DINp
DINn
CLKINp
DOUTp
DOUTn
CLKINn
Absolute Maximum Ratings
• Stresses beyond those listed here may cause permanent damage to the device. • These are stress ratings only. Functional operation of the device at these or any other conditions beyond those
indicated in the “Operating Conditions” and “Electrical Specifications” of this datasheet is not implied. • Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
Parameter Symbol Conditions Min Max Unit
Power Supply Voltage VEE –3.6 +0.5 V Input Signals (Data & Clock) –2 +1 V Output Signals –2 +1 V Junction Temperature – Die TJ –5 +175 °C Case Temperature – Package paddle TC –15 +125 °C Shipping/Storage Temperature TSTORE –40 +125 °C Humidity RH 0 100 %
Clock and Data inputs 500 --- V Data outputs 250 --- V ESD Protection (Human Body Model) ESD Power Supply 750 --- V
Operating Conditions
Parameter Symbol Conditions Min Typ Max Unit
Power Supply Voltage VEE ± 5% Tolerance –3.465 –3.300 –3.135 V On-Chip Power Dissipation PD --- 300 410 mW Power Supply Current IEE 70 91 115 mA Operating Temperature (Junction) – Die TJ +15 --- +125 °C Operating Temperature (Case) – Package TC –5 --- +85 °C
Thermal Resistance – junction to paddle RJC (θJC) Bottom of paddle --- 60 --- °C/W
2007-06-12 13700DF_DS_Ver3.3 Inphi Proprietary Page 3 of 14
Electrical Specifications
WARNING – To prevent damage to the part: • DC power must be turned off prior to connecting or disconnecting any cables.
Electrical specifications guaranteed when the part is operated within the specified operating conditions.
Notes: 1 Inputs are designed to be a broadband match to 50 Ω impedance and are terminated with a 50 Ω resistor to GND. 2 Outputs are CML. Values are based on DC measurements. 3 Outputs are designed to be a broadband match to 50 Ω impedance and are terminated with a 60 Ω resistor to GND. 4 Valid when clock-to-data phase is near center of CPM window. 5 It should be noted that because the random and deterministic jitter of Inphi's high-speed logic parts are "in the noise"
of the measurement techniques used, these specifications are conservative. The deterministic jitter (JD) specified above is actually the peak-to-peak total jitter measured using a 231-1 PRBS data pattern. The random jitter (JR) is the RMS jitter measured on a 1010... pattern. The jitter (random and deterministic) of the source and measurement equipment was not removed from the measurement data used to derive the above specifications.
6 Values based on design simulations. 7 The setup and hold time specifications were determined from phase margin measurements and the assumption,
supported by simulation, that Set-up and Hold times are equal to within a picosecond. See timing diagram on page 4 for definition.
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2007-06-12 13700DF_DS_Ver3.3 Inphi Proprietary Page 4 of 14
Timing Diagram
DIN = DINp - DINn
DOUTn
DOUTp
50%50% CLKIN = CLKINp - CLKINn
tQ
trtf 20%
80% 20%
80%
1/fCLK
2 3 4 5 1
1 2
Set-up and Hold Time Definition
Truth Table
Inputs Outputs
DINk-1 CLKIN DOUTpk DOUTnk
L L H
H H L
Notes: DIN = DINp – DINn CLKIN = CLKINp – CLKINn H Denotes a HIGH voltage level L Denotes a LOW voltage level
Denotes a rising clock transition
2007-06-12 13700DF_DS_Ver3.3 Inphi Proprietary Page 5 of 14
Typical DC Operating Characteristics
Supply Current versus Supply Voltage with Temperature as a Parameter
80
85
90
95
100
105
3 3.1 3.2 3.3 3.4 3.5 3.6Power Supply (V)
Supp
ly C
urre
nt (m
A)
-5 C25 C85 C
Figure 1. Power supply current vs. power supply
voltage
Average VOH (>20 Devices) vs. Supply with Temperature as a Parameter
-16 -14 -12 -10 -8 -6 -4 -2 0
-3.6 -3.5 -3.4 -3.3 -3.2 -3.1 -3VEE (V)
VOH
(mV)
-52585
Figure 3. Single-ended, output high level (on
wafer) vs. power supply
OUTP Amplitude versus Supply Voltage with Temperature as a Paramater
0.60
0.63
0.66
0.69
3 3.1 3.2 3.3 3.4 3.5 3.6
Supply Voltage (V)
OU
TP A
mpl
itude
(V)
-5 C25 C85 C
Figure 2. Single-ended, peak-to-peak output
amplitude (on wafer) vs. power supply
Average Common Mode (>20 Devices) vs. Supply with Temperature as a Parameter
-325-320-315-310-305-300-295-290-285-280
-3.6 -3.5 -3.4 -3.3 -3.2 -3.1 -3
VEE (V)
VC
M (m
V)
-52585
Figure 4. Output common mode (on wafer) vs.
power supply
2007-06-12 13700DF_DS_Ver3.3 Inphi Proprietary Page 6 of 14
OUT P Random Jitter versus Supply Voltage with T emperature as a Paramater
0.205
0.210
0.215
0.220
0.225
0.230
3 3.1 3.2 3.3 3.4 3.5 3.6
Supply Voltage (V)
Ran
dom
Jitt
er (p
s)
-5 C25 C85 C
Figure 7. Output random jitter (on wafer) vs.
Power Supply; Refer to note #3 under Electrical Specifications.
OUTP Rise Time versus Supply Voltage with Temperature as a Parameter
12
13
14
15
16
17
3 3.1 3.2 3.3 3.4 3.5 3.6
Supply Voltage (V)
OU
TP R
ise
Tim
e (p
s) -5 C25 C85 C
Figure 9. Output rise time (on wafer) vs. power
supply
OUT P Deterministic Jitter versus Supply Voltage with T emperature as a Paramater
1.60
1.65
1.70
1.75
1.80
1.85
1.90
3 3.1 3.2 3.3 3.4 3.5 3.6
Supply Voltage (V)
Det
erm
inis
tic J
itter
(ps)
-5 C25 C85 C
Figure 8. Output deterministic jitter (on wafer)
vs. Power Supply; Refer to note #3 under Electrical Specifications.
OUTP Fall Time versus Supply Voltage with Temperature as a Paramater
8
9
10
11
12
13
3 3.1 3.2 3.3 3.4 3.5 3.6
Supply Voltage (V)
OU
TP F
all T
ime
(ps) -5 C
25 C85 C
Figure 10. Output fall time (on wafer) vs. power
supply
2007-06-12 13700DF_DS_Ver3.3 Inphi Proprietary Page 7 of 14
Clock to Data Phase Margin
The clock to data phase margin is defined in degrees with 360° being a full period of the clock at 12.5 Gbps. It is measured by gradually adjusting the phase of the clock input relative to the data input and looking at the error rate of the D-Flip-Flop with a bit error rate tester.. As indicated in figure 11, the 13700DF’s phase margin is large: typically 300°.
Clock Phase Margin versus Supply Voltage with Temperature as a Paramater: VIH= 0 V, VIL= -0.6 V
297 298 299 300 301 302 303 304 305 306
3 3.1 3.2 3.3 3.4 3.5 3.6Supply Voltage (V)
Clo
ck P
hase
Mar
gin
(deg
rees
)
-52585
Figure 11. Clock phase margin vs. operating conditions at 12.5 Gbps.
Set-up and Hold Times Direct measurement of the set-up and hold times is difficult because it involves accurately measuring the electrical delay of the clock and input from signal generators to the package pins and knowledge of the phase between the two signals at their respective generators. Since simulations indicate that the set-up and hold times are equal to within a picosecond, they can be determined from the phase margin. Since the phase margin is typically 300°, the typical set-up and hold times are one half of 60°/360° times 80 ps, or 6.7 ps.
2007-06-12 13700DF_DS_Ver3.3 Inphi Proprietary Page 8 of 14
Typical Return Losses All S-parameter measurements were made single-ended. S-parameters for the packaged part are not given here due to the unavailability of calibration standards for the evaluation board.
|S11| vs. Frequency (25 C, 3.3 V), 0.0 V Data Input; N=33
-40
-35
-30
-25
-20
-15
-10
-5
0
0 5 10 15 20 25 30
Frequency (GHz)
|S11
| (dB
)
Figure 12. Data Input |S11| vs. frequency of 33 die on
wafer at VEE = -3.3 V and 25° C; Input common mode = 0 V
|S11| vs. Frequency (25 C, 3.3 V), 0.0 V Clock Input; N=33
-40
-35
-30
-25
-20
-15
-10
-5
0
0 5 10 15 20 25 30
Frequency (GHz)
|S11
| (dB
)
Figure 14. Clock Input |S11| vs. frequency of 33 die
on wafer at VEE = -3.3 V and 25° C; Input common mode = 0 V
|S22| vs. Frequency (25 C, 3.3 V), DC-Coupled, Logic Low; N=33
-40
-35
-30
-25
-20
-15
-10
-5
0
0 5 10 15 20 25 30
Frequency (GHz)
|S22
| (dB
)
Figure 16. Data Output |S22| vs. frequency of 33 die
on wafer at VEE = -3.3 V and 25° C; Output in logic low state; Add 3dB margin for logic high state.
|S11| vs. Frequency, 0.0 V Data Input, All Conditions, Die #113
-40
-35
-30
-25
-20
-15
-10
-5
0
0 5 10 15 20 25 30
Frequency (GHz)
|S11
| (dB
)
-5 C 3.5 V
-5 C 3.3 V
-5 C 3.1 V
25 C 3.5 V
25 C 3.3 V
25 C 3.1 V
85 C 3.5 V
85 C 3.3 V
85 C 3.1 V
Specification
Figure 13. Data Input |S11| vs. frequency of one dice
on wafer at VEE = -3.3 V and 25° C; Input common mode = 0 V
|S11| vs. Frequency, 0.0 V Clock Input, All Conditions, Die #113
-40
-35
-30
-25
-20
-15
-10
-5
0
0 5 10 15 20 25 30
Frequency (GHz)
|S11
| (dB
)
-5 C 3.5 V
-5 C 3.3 V
-5 C 3.1 V
25 C 3.5 V
25 C 3.3 V
25 C 3.1 V
85 C 3.5 V
85 C 3.3 V
85 C 3.1 V
Specif ication
Figure 15. Clock Input |S11| vs. frequency of one
dice on wafer at VEE = -3.3 V and 25° C; Input common mode = 0 V
|S22| vs. Frequency, DC Logic Low Out, All Conditions, Die #113
-40
-35
-30
-25
-20
-15
-10
-5
0
0 5 10 15 20 25 30
Frequency (GHz)
|S22
| (dB
)
-5 C 3.5 V
-5 C 3.3 V
-5 C 3.1 V
25 C 3.5 V
25 C 3.3 V
25 C 3.1 V
85 C 3.5 V
85 C 3.3 V
85 C 3.1 V
Specification
Figure 17. Data Output |S22| vs. frequency of one
dice on wafer at VEE = -3.3 V and 25° C; Output in logic low state. Add 3dB margin for logic high state.
2007-06-12 13700DF_DS_Ver3.3 Inphi Proprietary Page 9 of 14
Die Pad Layout
Notes: 100 µm pads on 150 µm pitch 150 ± 10 µm die thickness
Visit us on the Internet at: http://www.inphi-corp.com
For each customer application, customer’s technical experts must validate all parameters. Inphi Corporation reserves the right to change product specifications contained herein without prior notice. No liability is assumed as a result of the use or application of this product. No circuit patent licenses are implied. Contact Inphi Corporation’s marketing department for the latest information regarding this product. Qualification Notification The 13700DF-S02 is fully qualified. Please contact Inphi for the qualification report. Inphi Corporation will honor the full warranty as outlined in Section 5 of Inphi’s Standard Customer Purchase Order Terms and Conditions.
2007-06-12 13700DF_DS_Ver3.3 Inphi Proprietary Page 14 of 14
Version Updates: From Version3.0 to 3.1 (dated 11/07/2005):
1. Changed Rise/Fall time reference from <25 ps to 15 ps typical in the Features section on page 1. 2. Added the ESD specifications to the Absolute Maximum Specifications table on page 2. 3. Changed the notes in the Electrical Specifications section on page 3:
a. Added “Values are based on DC measurements.” to note #1. b. Added note #3 “3 It should be noted that because the random and deterministic jitter of Inphi's
high speed logic parts are "in the noise" of the measurement techniques used, these specifications are conservative. The deterministic jitter (JD) specified above is actually the peak-to-peak total jitter measured using a 231-1 PRBS data pattern. The random jitter (JR) is the RMS jitter measured on a 1010... data pattern. The jitter (random and deterministic) of the source and measurement equipment was not removed from the measurement data used to derive the above specifications.”
4. Reformatted and added new graphs to the Typical Operating Characteristics section on pages 5 & 6. 5. Added s-parameter graphs and notes tot the Typical Return Losses section on page 7. 6. Changed the Limited Qualification Notification section on page 12 to indicate fully qualified.
From Version 3.1 to 3.2 (dated 6/28/2006):
1. Fixed minor typographical errors. 2. Absolute Maximum table (page 2):
a. Changed Input Signals’ maximum level from +0.6 to +1 V. b. Changed Output Signals’ minimum level from –1.5 to -2 V.
a. Added Setup and Hold Time parameters with specs. b. Added notes 1, 3, 6 & 7. c. Changed note numbers on parameter descriptions.
5. Added the Setup and Hold Time diagram to the Timing Diagram section (page 4). 6. Added the Clock Phase Margin section (page 7). 7. LGA Package Outline Drawing (page 11): replaced the old drawing with a new drawing. The
package height was incorrect (corrected from 60 mils to 66 mils). 8. Qualification Notification section:
a. Added the statement that the device is radiation tolerant. From Version 3.2 to 3.3 (dated 2007-06-12):