1 Non-uniform Crossover in Genetic Non-uniform Crossover in Genetic Algorithm Methods to Speed up the Algorithm Methods to Speed up the Generation of Test Patterns for Generation of Test Patterns for Sequential Circuits Sequential Circuits Michael Dimopoulos - Panagiotis Linardis Department of Informatics Aristotle University of Thessaloniki Greece
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1 Non-uniform Crossover in Genetic Algorithm Methods to Speed up the Generation of Test Patterns for Sequential Circuits Michael Dimopoulos - Panagiotis.
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1
Non-uniform Crossover in Non-uniform Crossover in Genetic Algorithm Methods to Genetic Algorithm Methods to
Speed up the Generation of Test Speed up the Generation of Test Patterns for Sequential CircuitsPatterns for Sequential Circuits
Non-uniform Crossover in Non-uniform Crossover in Genetic Algorithm Methods to Genetic Algorithm Methods to
Speed up the Generation of Test Speed up the Generation of Test Patterns for Sequential CircuitsPatterns for Sequential Circuits Michael Dimopoulos - Panagiotis
Linardis
Department of InformaticsAristotle University of Thessaloniki
Greece
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Digital CircuitsDigital Circuits
CombinationalLogic: :
inputs outputs
: :M
emory
Sequential Circuit
output = f (inputs,time)
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Test GenerationTest GenerationTest GenerationTest Generation
Apply a sequence of inputs to a circuit. Observe the output response and compare the
response with a precomputed or “expected” response. Any discrepancy is said to constitute an error, the
cause of which is a physical fault.
TEST GENERATION
TESTING
In the faulty circuit, a single line/wire is S-a-0 or S-a-1.
STUCK-AT Fault Model
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Test Problem FormulationTest Problem Formulation
FSM good M=(I,O,S,δ,λ)
Problem Formulation
FSM faulty Mf=(I,Of,Sf,δf,λf)
For a given list of stuck-at faults : F={f1,f2,…,fn}
Find a sequence of input vectors V
(Test Sequence) that detects the faults in F.
outp
uts
CombinationalLogicin
put
s
: :
Memory
: :
?
outp
uts
CombinationalLogicin
put
s
: :
Memory
: :
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ATPG MethodsATPG Methods
Stuck-at Fault Model
ATPG Methods for Sequential Circuits
Deterministic
Simulation-based (random)
Automatic Test Pattern Generation (ATPG)
Genetic Algorithms
Optimum Test Set: NP-Complete problem.
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A Simple GA for ATPGA Simple GA for ATPGA Simple GA for ATPGA Simple GA for ATPG